TW201525476A - Substrates detecting system - Google Patents

Substrates detecting system Download PDF

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Publication number
TW201525476A
TW201525476A TW102148803A TW102148803A TW201525476A TW 201525476 A TW201525476 A TW 201525476A TW 102148803 A TW102148803 A TW 102148803A TW 102148803 A TW102148803 A TW 102148803A TW 201525476 A TW201525476 A TW 201525476A
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Taiwan
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substrate
adsorption
air
holes
module
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TW102148803A
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Chinese (zh)
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Bily Wang
Kuei-Pao Chen
Hsin-Cheng Chen
Chi-Ying Peng
Ming-Chih Cheng
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Youngtek Electronics Corp
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Priority to TW102148803A priority Critical patent/TW201525476A/en
Publication of TW201525476A publication Critical patent/TW201525476A/en

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Abstract

A substrates detecting System comprise, a stored device, a carrying device, a first substrates adsorption stage and a first detected device. At least one substrate placed on the stored device. The carrying device carries the substrates between the stored device and the first substrates adsorption stage. The first substrates adsorption stage movably disposed on a first guide rail. The first detected device detects the substrates which dispose on the first substrates adsorption stage.

Description

基板檢測系統 Substrate detection system

本發明乃是關於一種基板檢測系統,特別是有關於一種可快速而精準地對基板進行檢測的基板檢測系統。 The present invention relates to a substrate inspection system, and more particularly to a substrate inspection system that can quickly and accurately detect a substrate.

電路板成品檢測是生產流程中的重要環節,成品檢測中最重要地莫過於電性導線的檢測。傳統的電路板測試需要依靠作業員的手工操作,對於那些電路比較簡單、測試訊號比較少的電路板來說,手工操作尚能滿足要求,但隨著電子技術的進步,電路越來越複雜,測試訊號越來越多,產品的生命週期越來越短、小批量、多品種的產品任務比較多,手工操作的電路板測試方法不僅效率低,且容易出錯,已不能滿足快速高品質生產的競爭需求。緣此,本發明人有感上述問題之可改善,乃潛心研究並配合學理之運用,而提出一種設計合理且有效改善上述問題之本發明。 The inspection of finished circuit boards is an important part of the production process. The most important thing in the inspection of finished products is the detection of electrical wires. The traditional circuit board test relies on the manual operation of the operator. For those circuit boards with relatively simple circuits and less test signals, the manual operation can still meet the requirements, but with the advancement of electronic technology, the circuit becomes more and more complicated. More and more test signals, product life cycle is shorter and shorter, small batch, multi-variety product tasks are more, manual circuit board test methods are not only inefficient, and easy to make mistakes, can not meet the fast high-quality production Competitive demand. Accordingly, the present inventors have felt that the above problems can be improved, and that the present invention has been deliberately studied and used in conjunction with the theory, and a present invention which is reasonable in design and effective in improving the above problems has been proposed.

本發明之主要目的在於提供一種基板檢測系統,其利用載運裝置快速地進行基板的裝載,且配合第一基板吸附載台,而可有效地將基板定位,以可透過第一檢測裝置進行精準地相關電路導線的檢測,進而可解決習知技術中利用人工,無法快速而精準地進行基板相關導線的檢測,而無法滿足快速高品質生產的競爭需求的問題。 The main object of the present invention is to provide a substrate detecting system that rapidly loads a substrate by using a carrier device and cooperates with the first substrate to adsorb the stage, thereby effectively positioning the substrate so as to be accurately transmitted through the first detecting device. The detection of the relevant circuit wires can solve the problem that the conventional technology can not quickly and accurately detect the related wires of the substrate, and cannot meet the competition demand of fast high-quality production.

為了實現上述目的,本發明提供一種基板檢測系統,其包含:一置料裝置、一載運裝置、一第一基板吸附載台及一第一檢測裝置。置料裝置用以置放至少一基板。載運裝置用以載運置放於 置料裝置的基板。第一基板吸附載台可活動地設置於一第一導軌上,用以吸附載運裝置所置放的基板。第一檢測裝置用以檢測置設於第一基板吸附載台的基板。 In order to achieve the above object, the present invention provides a substrate detecting system comprising: a loading device, a carrier device, a first substrate adsorption stage and a first detecting device. The loading device is configured to place at least one substrate. The carrier is used to carry the carrier The substrate of the loading device. The first substrate adsorption stage is movably disposed on a first guide rail for adsorbing the substrate placed by the carrier device. The first detecting device is configured to detect a substrate disposed on the first substrate adsorption stage.

本發明的有益效果為:可以有效提升基板的檢測效率及其成效,進而達到快速而高品質生產的競爭需求。 The invention has the beneficial effects that the detection efficiency of the substrate and the effect thereof can be effectively improved, thereby achieving the competitive demand for rapid and high-quality production.

為了能更進一步瞭解本為達成既定目的所採取之技術、方法及功效,請參閱以下有關本發明之詳細說明、圖式,相信本發明之目的、特徵與特點,當可由此得以深入且具體之瞭解,然而所附圖式僅提供參考與說明用,並非用來對本發明加以限制者。 In order to further understand the techniques, methods and effects of the present invention in order to achieve the intended purpose, reference should be made to the detailed description and drawings of the present invention. It is to be understood that the appended claims are not intended to

1‧‧‧基板檢測系統 1‧‧‧Substrate inspection system

10‧‧‧置料裝置 10‧‧‧Feeding device

11‧‧‧第一基板置放區 11‧‧‧First substrate placement area

111、121‧‧‧可活動載台 111, 121‧‧‧ movable stage

12‧‧‧第二基板置放區 12‧‧‧Second substrate placement area

20‧‧‧載運裝置 20‧‧‧Carriage

201‧‧‧吸附載台 201‧‧‧Adsorption platform

202‧‧‧吸附孔 202‧‧‧Adsorption holes

21‧‧‧活動載臂 21‧‧‧Active arm

22‧‧‧防疊片裝置 22‧‧‧Anti-stacking device

221‧‧‧彈性夾持臂 221‧‧‧Flexible clamping arm

30、30’‧‧‧第一基板吸附載台 30, 30'‧‧‧First substrate adsorption stage

300‧‧‧第一導軌 300‧‧‧First rail

301‧‧‧載台本體 301‧‧‧station body

3011‧‧‧吸附孔 3011‧‧‧Adsorption holes

3012‧‧‧第一溝槽 3012‧‧‧First trench

3013‧‧‧第二溝槽 3013‧‧‧Second trench

302‧‧‧第一氣道 302‧‧‧First airway

3021‧‧‧第一氣孔 3021‧‧‧First vent

303‧‧‧第二氣道 303‧‧‧Second airway

3031‧‧‧第二氣孔 3031‧‧‧second vent

31、31’‧‧‧第一阻氣模組 31, 31'‧‧‧ first gas barrier module

311‧‧‧主氣道 311‧‧‧Main airway

3111‧‧‧主氣孔 3111‧‧‧ main air hole

311’‧‧‧次氣道 311'‧‧‧ airway

3111’‧‧‧次氣孔 3111’‧‧‧ vents

3112、3112’‧‧‧抽氣孔 3112, 3112'‧‧‧ Venting holes

312、312’‧‧‧阻氣單元 312, 312'‧‧‧ gas blocking unit

313、313’‧‧‧操作單元 313, 313'‧‧‧ operating unit

32‧‧‧第二阻氣模組 32‧‧‧Second gas barrier module

321‧‧‧操作部 321‧‧‧Operation Department

322‧‧‧軸體 322‧‧‧Axis

323‧‧‧阻隔單元 323‧‧‧Block unit

324‧‧‧連通空間 324‧‧‧Connected space

33‧‧‧擋板 33‧‧‧Baffle

34‧‧‧傾斜裝置 34‧‧‧ tilting device

40‧‧‧第一檢測裝置 40‧‧‧First detection device

50‧‧‧第二基板吸附載台 50‧‧‧Second substrate adsorption stage

500‧‧‧第二導軌 500‧‧‧Second rail

501‧‧‧載台本體 501‧‧‧station body

5011‧‧‧吸附孔 5011‧‧‧Adsorption holes

5012‧‧‧第一溝槽 5012‧‧‧First groove

5013‧‧‧第二溝槽 5013‧‧‧second trench

60‧‧‧基板翻轉裝置 60‧‧‧Substrate turning device

61‧‧‧第一夾爪模組 61‧‧‧First jaw module

611‧‧‧第一夾爪 611‧‧‧First jaw

612‧‧‧第二夾爪 612‧‧‧second jaw

62‧‧‧第二夾爪模組 62‧‧‧Second jaw module

621‧‧‧第一夾爪 621‧‧‧First jaw

622‧‧‧第二夾爪 622‧‧‧second jaw

63‧‧‧支撐架 63‧‧‧Support frame

70‧‧‧第二檢測裝置 70‧‧‧Second detection device

A‧‧‧基板 A‧‧‧Substrate

圖1為本發明的基板檢測系統的第一實施例的示意圖。 1 is a schematic view of a first embodiment of a substrate inspection system of the present invention.

圖2為本發明的基板檢測系統的第一實施例的載運裝置及防疊片裝置的示意圖。 2 is a schematic view of a carrier device and an anti-stacking device of a first embodiment of the substrate inspection system of the present invention.

圖3為本發明的基板檢測系統的第一實施例的第一檢測裝置及第一基板吸附載台的示意圖。 3 is a schematic view showing a first detecting device and a first substrate adsorption stage of the first embodiment of the substrate detecting system of the present invention.

圖4為本發明的基板檢測系統的第一實施例的第一基板吸附載台的部分上視透視圖。 4 is a partial top perspective view of the first substrate adsorption stage of the first embodiment of the substrate inspection system of the present invention.

圖5為本發明的基板檢測系統的第一實施例的第一基板吸附載台的部分剖視圖。 Figure 5 is a partial cross-sectional view showing a first substrate adsorption stage of the first embodiment of the substrate inspection system of the present invention.

圖6為本發明的基板檢測系統的第一實施例的另一態樣的第一基板吸附載台的示意圖。 6 is a schematic view of a first substrate adsorption stage of another aspect of the first embodiment of the substrate inspection system of the present invention.

圖7為本發明的基板檢測系統的第一實施例的另一態樣的第一基板吸附載台的上視透視圖。 Figure 7 is a top perspective view of a first substrate adsorption stage of another aspect of the first embodiment of the substrate inspection system of the present invention.

圖8為本發明的基板檢測系統的第二實施例的示意圖。 Figure 8 is a schematic illustration of a second embodiment of a substrate inspection system of the present invention.

圖9為本發明的基板檢測系統的第二實施例的第二檢測裝置及基板翻轉裝置的示意圖。 9 is a schematic view showing a second detecting device and a substrate inverting device of a second embodiment of the substrate detecting system of the present invention.

〔第一實施例〕 [First Embodiment]

請一併參閱圖1至圖7,其為本發明的基板檢測系統的第一實施例的示意圖。如圖1所示,基板檢測系統1包含:一置料裝置10、一載運裝置20、一第一基板吸附載台30及一第一檢測裝置40。置料裝置10包含一第一基板置放區11及一第二基板置放區12;舉例來說,第一基板置放區11可以放置待檢測的基板A,而第二基板置放區12可以是放置已檢測完成的基板A,在實際應用中,更可以是依據第一檢測裝置40所檢測出的結果,設計例如是基板再檢測區、基板毀壞區等等的。第一基板置放區11及第二基板置放區12可以是分別設置有一可活動載台111、121,用以置放至少一待檢測或是已檢測完成的基板A,而可隨著基板A的數量多寡而升降可活動載台的高度。 Please refer to FIG. 1 to FIG. 7 together, which are schematic diagrams of a first embodiment of a substrate inspection system of the present invention. As shown in FIG. 1, the substrate detecting system 1 includes a loading device 10, a carrier device 20, a first substrate adsorption stage 30, and a first detecting device 40. The loading device 10 includes a first substrate placement area 11 and a second substrate placement area 12; for example, the first substrate placement area 11 can place the substrate A to be inspected, and the second substrate placement area 12 The substrate A that has been inspected may be placed. In practical applications, it may be based on the result detected by the first detecting device 40, such as a substrate re-detection area, a substrate destruction area, and the like. The first substrate placement area 11 and the second substrate placement area 12 may be respectively provided with a movable stage 111, 121 for placing at least one substrate A to be detected or detected, and the substrate may be The number of A can be raised and lowered to the height of the movable stage.

載運裝置20可以是機械連接於至少一活動載臂21,而可活動地於X或Y方向移動以及上下移動,以將置放於第一基板置放區11的基板A載運至第一基板吸附載台30,或是將已檢測完成的基板A由第一基板吸附載台30載運至第二基板置放區12;且載運裝置20可以是包含有一吸附載台201及數個吸附孔202,以透過吸附的方式載運基板A;在另外的實施態樣中,載運裝置20亦可以是透過夾爪的方式進行基板A的載運。第一基板吸附載台30可活動地設置於第一導軌300上,而可活動地做線性位移,以將由載運裝置20所置放的基板A載運至鄰近第一檢測裝置40的位置,以供第一檢測裝置40進行檢測。第一檢測裝置40可以是包含有感光耦合元件(Charge-coupled Device,CCD),用以對基板A的表面進行檢測。其中,基板A較佳地可以是電路基板。 The carrier device 20 may be mechanically coupled to the at least one movable carrier 21 and movably movable in the X or Y direction and moved up and down to carry the substrate A placed on the first substrate placement area 11 to the first substrate for adsorption. The stage 30 is configured to carry the substrate A that has been inspected by the first substrate adsorption stage 30 to the second substrate placement area 12; and the carrier device 20 may include an adsorption stage 201 and a plurality of adsorption holes 202. The substrate A is carried by adsorption. In another embodiment, the carrier device 20 may carry the substrate A by means of a jaw. The first substrate adsorption stage 30 is movably disposed on the first guide rail 300 and is movably linearly displaced to carry the substrate A placed by the carrier device 20 to a position adjacent to the first detecting device 40 for The first detecting device 40 performs detection. The first detecting device 40 may include a photosensitive-coupled device (CCD) for detecting the surface of the substrate A. The substrate A may preferably be a circuit substrate.

如圖2所示,載運裝置20更可以包含有一防疊片裝置22,其可以包含有一感測模組(圖未示)及一彈性夾持臂221。載運裝置20 的吸附載台201吸附基板A後,可以是先將基板A旋轉而直立設置,以使基板A可進入兩個彈性夾持臂221間,而推抵其中一個彈性夾持臂221,藉以透過判斷彈性夾持臂221受推抵後的位移量,以藉由感測模組判讀出基板A的厚度,據以判斷載運裝置20是否載運單一個基板A,而可有效地避免載運裝置20同時載運兩片基板A,進而造成其中一基板A無法被第一基板吸附載台30吸附,而掉落的問題。較佳地,更可以是於彈性夾持臂221的前端與基板A接觸的地方設置膠輪,以避免基板A碰撞彈性夾持臂221而毀壞的問題。 As shown in FIG. 2, the carrier device 20 further includes an anti-lamination device 22, which may include a sensing module (not shown) and an elastic clamping arm 221. Carrier device 20 After the adsorption stage 201 adsorbs the substrate A, the substrate A may be rotated and arranged upright so that the substrate A can enter between the two elastic clamping arms 221 and push against one of the elastic clamping arms 221 to pass through the judgment. The amount of displacement of the elastic clamping arm 221 after being pushed to determine the thickness of the substrate A by the sensing module, thereby determining whether the carrier device 20 carries a single substrate A, thereby effectively preventing the carrier device 20 from being carried simultaneously The two substrates A further cause a problem that one of the substrates A cannot be adsorbed by the first substrate adsorption stage 30 and falls. Preferably, the rubber wheel is disposed at a position where the front end of the elastic clamping arm 221 is in contact with the substrate A to avoid the problem that the substrate A collides with the elastic clamping arm 221 to be destroyed.

如圖3所示,第一基板吸附載台30包含一載台本體301、第一阻氣模組31、數個第二阻氣模組32、一擋板33及一傾斜裝置34。載台本體301具有數個規則排列的吸附孔3011。第一阻氣模組31設置於載台本體301的一側,其包含一操作單元313,用以可選擇地關閉至少一列X方向的吸附孔3011。各個第二阻氣模組32分別設置於載台本體301的另一側,其包含一操作部321,用以可選擇地關閉至少一排Y方向的吸附孔3011。傾斜裝置34機械連接載台本體301,而可選擇地使載台本體301呈現傾斜狀態。擋板33設置於載台本體301的側邊,而可於載台本體301呈現傾斜狀態時,抵靠基板A,以避免基板A滑落。 As shown in FIG. 3 , the first substrate adsorption stage 30 includes a stage body 301 , a first gas barrier module 31 , a plurality of second gas barrier modules 32 , a baffle 33 , and a tilting device 34 . The stage body 301 has a plurality of regularly arranged adsorption holes 3011. The first gas barrier module 31 is disposed on one side of the stage body 301 and includes an operation unit 313 for selectively closing at least one column of the adsorption holes 3011 in the X direction. Each of the second gas barrier modules 32 is disposed on the other side of the stage body 301, and includes an operation portion 321 for selectively closing at least one row of the adsorption holes 3011 in the Y direction. The tilting device 34 mechanically connects the stage body 301, and optionally causes the stage body 301 to assume a tilted state. The baffle 33 is disposed on the side of the stage body 301, and can abut against the substrate A when the stage body 301 is in an inclined state to prevent the substrate A from slipping.

如圖4所示,其為第一基板吸附載台30的上視透視圖。載台本體301包含數個分別平行於X方向設置第一氣道302及數個平行於Y方向設置的第二氣道303。第一氣道302包含數個第一氣孔3021,第二氣道303包含數個第二氣孔3031,且各第二氣孔3031分別對應與一個吸附孔3011相連通,且各列第一氣道302的各第一氣孔3021分別與各排第二氣道303相互連通,亦即各排第二氣道303的各第二氣孔3031分別與其中一列第一氣道302相連通。其中,各第一氣道302及各第二氣道303可以是形成於載台本體 301內的通道,亦可以是設置於載台本體301下方的獨立氣管。 As shown in FIG. 4, it is a top perspective view of the first substrate adsorption stage 30. The stage body 301 includes a plurality of first air passages 302 disposed parallel to the X direction and a plurality of second air passages 303 disposed parallel to the Y direction. The first air passage 302 includes a plurality of first air holes 3021, the second air passage 303 includes a plurality of second air holes 3031, and each of the second air holes 3031 corresponds to one of the adsorption holes 3011, and each of the first air passages 302 of each column One of the air holes 3021 communicates with each of the second air passages 303, that is, the second air holes 3031 of the second air passages 303 of each row communicate with one of the first air passages 302, respectively. The first air channel 302 and each of the second air channels 303 may be formed on the stage body. The passage in 301 may also be an independent air tube disposed below the stage body 301.

第一阻氣模組31包含一主氣道311、一阻氣單元312及一操作單元313,主氣道311包含數個主氣孔3111及一抽氣孔3112,各主氣孔3111分別與各第一氣道302相連通,抽氣孔3112與一抽氣裝置(圖未示)相連接。阻氣單元312可活動地設置於主氣道311中;操作單元313外露於第一阻氣模組31外,且與阻氣單元312機械連接,藉以控制調整阻氣單元312於主氣道311中的位置。其中,阻氣單元312可以是活塞等,可完全密封阻隔氣體的構件;第一阻氣模組31可以是與載台本體301一體形成,又或者可以是兩個可拆卸的獨立構件。 The first air blocking module 31 includes a main air channel 311, a gas blocking unit 312 and an operating unit 313. The main air channel 311 includes a plurality of main air holes 3111 and an air discharging hole 3112. The main air holes 3111 and the first air channel 302 respectively. In communication, the air vent 3112 is coupled to an air extracting device (not shown). The gas blocking unit 312 is movably disposed in the main air passage 311; the operating unit 313 is exposed outside the first gas blocking module 31, and is mechanically connected to the gas blocking unit 312, thereby controlling the adjustment of the gas blocking unit 312 in the main air passage 311. position. The gas blocking unit 312 may be a piston or the like, and completely seal the gas blocking member; the first gas blocking module 31 may be integrally formed with the stage body 301, or may be two detachable independent members.

舉例來說,阻氣單元312可以是設置於與主氣道311設置有抽氣孔3112的相反端,當阻氣單元312未遮蔽任何主氣孔3111而設置於主氣道311的一端時,各主氣孔3111與抽氣孔3112相連通,而使各個與主氣孔3111相連通的第一氣道302,所對應連通的各列X方向的吸附孔3011呈現具有吸附力的狀態;當阻氣單元312受操作單元313操作,向抽氣孔3112移動,而遮蔽其中一主氣孔3111時,被遮蔽的主氣孔3111及位於阻氣單元312後方而遠離抽氣孔3112的主氣孔3111,受阻氣單元312的阻隔,而無法與抽氣孔3112相連通,進而使其所對應的該列X方向的吸附孔3011不具有吸附力,而達到關閉X方向吸附孔3011的作用。 For example, the gas blocking unit 312 may be disposed at an opposite end of the main air passage 311 with the air venting hole 3112. When the gas blocking unit 312 is not shielded from any main air hole 3111 and disposed at one end of the main air passage 311, each main air hole 3111 The air venting holes 3112 are connected to each other, and the first air passages 302 communicating with the main air holes 3111 are respectively in a state in which the adsorption holes 3011 of the respective columns in the X direction are in a state of having an adsorption force; when the gas blocking unit 312 is subjected to the operation unit 313 When the operation moves to the air vent 3112 and shields one of the main air holes 3111, the blocked main air hole 3111 and the main air hole 3111 located behind the gas blocking unit 312 and away from the air venting hole 3112 are blocked by the gas blocking unit 312, and cannot be The suction holes 3112 are in communication, and the corresponding adsorption holes 3011 in the X direction of the column do not have an adsorption force, and the effect of closing the X-direction adsorption holes 3011 is achieved.

換言之,阻氣單元312與抽氣孔3112分別設置於主氣道311的兩端時,在操作單元313未移動時,各列X方向的吸附孔3011呈現具有吸附力的狀態,而隨著操作單元313逐漸向抽氣孔3112靠近的同時,相對應於操作單元313的該列X方向的吸附孔3011被阻氣單元312阻隔,而不具有吸附力,亦即操作單元313經過的各列X方向的吸附孔3011皆被阻氣單元312阻隔而不具吸附力。值得一提的是,圖式中是以抽氣孔與阻氣單元分別設置於氣道 兩端為例,但實際應用並不侷限於此,亦可以是兩者設置於氣道相同的一端,而其阻氣單元的操作方式,則與本實施例所述的方式相反。 In other words, when the gas blocking unit 312 and the air venting holes 3112 are respectively disposed at both ends of the main air passage 311, when the operating unit 313 is not moved, the adsorption holes 3011 of the respective rows X direction exhibit a state of having an adsorption force, and with the operation unit 313 While gradually approaching the air vent 3112, the adsorption hole 3011 corresponding to the column X direction of the operation unit 313 is blocked by the gas blocking unit 312 without the adsorption force, that is, the adsorption in the X direction of each column through which the operation unit 313 passes. The holes 3011 are all blocked by the gas blocking unit 312 without adsorption force. It is worth mentioning that in the figure, the air vent and the gas blocking unit are respectively arranged in the airway. The two ends are taken as an example, but the practical application is not limited thereto, and the two may be disposed at the same end of the air passage, and the operation mode of the gas blocking unit is opposite to that described in the embodiment.

各第二阻氣模組32包含一軸體322及數個間隔設置的阻隔單元323,且軸體322外露於載台本體301的一端為操作部321,而各個阻隔單元323間形成有一連通空間324。在實際應用中,各阻隔單元323可以是與軸體322一體成形,或是另外套設於軸體322上的獨立構件,且各阻隔單元323更可以選擇性地配合設置有密封橡圈。當第二阻氣模組32的操作部321受壓時,各阻隔單元323對應阻隔各第二氣孔3031與第一氣孔3021間的連通,而阻隔吸附孔3011與第一氣道302的連通,藉以關閉第二阻氣模組32所對應的該排Y方向的吸附孔3011,使其不具有吸附力。 Each of the second gas barrier modules 32 includes a shaft body 322 and a plurality of spaced apart barrier units 323, and one end of the shaft body 322 exposed to the stage body 301 is an operation portion 321 , and a communication space is formed between each of the barrier units 323 . 324. In a practical application, each of the blocking units 323 may be integrally formed with the shaft body 322 or a separate member that is additionally sleeved on the shaft body 322, and each of the blocking units 323 may be selectively provided with a sealing rubber ring. When the operation portion 321 of the second gas barrier module 32 is pressed, each of the blocking units 323 blocks the communication between the second air holes 3031 and the first air holes 3021, thereby blocking the communication between the adsorption holes 3011 and the first air passage 302. The adsorption hole 3011 of the row Y direction corresponding to the second gas barrier module 32 is closed so as not to have an adsorption force.

如圖4及圖5所示,當第二阻氣模組32的操作部321受拉,而使軸體322及各阻隔單元323於第二氣道303中移動,以使各阻隔單元323間的連通空間324對應位於第二氣孔3031與第一氣孔3021間時,各第二氣孔3031可透過該連通空間324與該第一氣孔3021相連通,而使各吸附孔3011與第一氣道302及主氣道311相連通,進而使各吸附孔3011具有吸附力。特別一提的是,於本實施例中,是以按壓第二阻氣模組32的操作部321為關閉對應的該排Y方向的吸附孔3011,而以抽拉第二阻氣模組32的操作部321為開啟吸附孔3011為例,但實際應用中,亦可以是配合第二阻氣模組32的各阻隔單元323、各第二氣孔3031及各第一氣孔3021的設計,改以按壓操作部321時為開啟吸附孔3011,抽拉操作部321時為關閉吸附孔3011。又,在另外的實施中,亦可以是使第二阻氣模組32的兩端皆外露於載台本體301外,亦即第二阻氣模組32具有兩個外露的操作部321,藉以使用者可以只透過按壓的方式進行吸附孔3011的啟閉。 As shown in FIG. 4 and FIG. 5, when the operating portion 321 of the second gas barrier module 32 is pulled, the shaft body 322 and the blocking units 323 are moved in the second air passage 303 so as to be between the respective blocking units 323. When the communication space 324 is located between the second air hole 3031 and the first air hole 3021, the second air holes 3031 can communicate with the first air hole 3021 through the communication space 324, and the adsorption holes 3011 and the first air channel 302 and the main The air passages 311 are in communication, and each of the adsorption holes 3011 has an adsorption force. In particular, in the embodiment, the second gas barrier module 32 is pulled by pressing the operation portion 321 of the second gas barrier module 32 to close the corresponding adsorption hole 3011 of the row Y direction. The operation unit 321 is exemplified by the opening of the adsorption hole 3011. However, in practical applications, the design of each of the blocking unit 323, the second air holes 3031, and the first air holes 3021 of the second gas barrier module 32 may be used. When the operation portion 321 is pressed, the adsorption hole 3011 is opened, and when the operation portion 321 is pulled, the adsorption hole 3011 is closed. In addition, in another implementation, both ends of the second gas barrier module 32 may be exposed outside the carrier body 301, that is, the second gas barrier module 32 has two exposed operation portions 321 . The user can open and close the adsorption hole 3011 only by pressing.

請一併參閱圖6及圖7,其為第一基板吸附載台的另一實施態樣,如圖所示,第一基板吸附載台30’可以包含有兩個相同內部結構的第一阻氣模組31、31’,其分別設置於載台本體301的X及Y方向的一側,藉以分別控制關閉至少一列X方向的吸附孔3011及至少一排Y方向的吸附孔3011。其中,關於第一阻氣模組31的內部結構及其相關作動關係,與前述所載相同,於此不多加贅述,於此僅簡單敘述第一阻氣模組31’,為利區分以下將以不同的名詞及鏢號敘明。如圖7所示,第一阻氣模組31’包含一次氣道311’、一阻氣單元312’及一操作單元313’。該次氣道311’包含數個次氣孔3111’及一抽氣孔3112’,且各次氣孔3111’分別連通於各第二氣道303。阻氣單元312’與操作單元313’機械性連接,而受操作單元313’控制,以選擇性地阻隔其中一次氣孔3111’。 Please refer to FIG. 6 and FIG. 7 , which are another embodiment of the first substrate adsorption stage. As shown, the first substrate adsorption stage 30 ′ may include two first resistors having the same internal structure. The gas modules 31, 31' are respectively disposed on one side of the stage body 301 in the X and Y directions, thereby respectively controlling at least one column of the adsorption holes 3011 in the X direction and at least one row of the adsorption holes 3011 in the Y direction. The internal structure of the first gas barrier module 31 and its related actuation relationship are the same as those described above, and will not be further described herein. Only the first gas barrier module 31' will be briefly described herein. Expressed by different nouns and darts. As shown in Fig. 7, the first gas barrier module 31' includes a primary air passage 311', a gas blocking unit 312', and an operating unit 313'. The secondary air passage 311' includes a plurality of secondary air holes 3111' and one air suction hole 3112', and each of the secondary air holes 3111' communicates with each of the second air passages 303. The gas blocking unit 312' is mechanically coupled to the operating unit 313' and is controlled by the operating unit 313' to selectively block one of the air holes 3111'.

誠如上述,實際的基板A檢測過程可以是:首先,透過載運裝置20由置料裝置10的第一基板置放區11載運基板A,並透過防疊片裝置22,以判斷載運裝置20是否僅載運單一片基板A,隨後載運裝置20將該基板A置放於第一基板吸附載台30,此時第一基板吸附載台30可以是平行於水平線而未傾斜,而當基板A設置於載台本體301上後,傾斜裝置34則控制使載台本體301傾斜,而使基板A的一側抵靠於擋板33;隨後,第一基板吸附載台30於第一導軌300上移動,而使基板A對應於第一檢測裝置40,以進行基板A的表面檢測作業;當檢測完成後,載運裝置20則可以將該基板A載運回原始鄰近於載運裝置20的位置,以使載運裝置20將基板A載運置放於置料裝置10的第二基板置放區12,以完成基板檢測作業。 As described above, the actual substrate A detection process may be: first, the substrate A is carried by the first substrate placement area 11 of the loading device 10 through the carrier device 20, and passed through the anti-lamination device 22 to determine whether the carrier device 20 is Only the single substrate A is carried, and then the carrier A is placed on the first substrate adsorption stage 30. At this time, the first substrate adsorption stage 30 may be parallel to the horizontal line without tilting, and when the substrate A is disposed on After the stage body 301 is mounted, the tilting device 34 controls the tilting of the stage body 301 such that one side of the substrate A abuts against the shutter 33; subsequently, the first substrate adsorption stage 30 moves on the first rail 300, And the substrate A corresponds to the first detecting device 40 to perform the surface detecting operation of the substrate A; when the detecting is completed, the carrying device 20 can carry the substrate A back to the original position adjacent to the carrying device 20, so that the carrying device The substrate A is carried and placed in the second substrate placement area 12 of the loading device 10 to complete the substrate inspection operation.

〔第二實施例〕 [Second embodiment]

請一併參閱圖8及圖9,其為本發明的基板檢測系統的第二實施例的示意圖。如圖8所示,基板檢測系統2包含:一置料裝置 10、一載運裝置20、一第一基板吸附載台30、一第一檢測裝置40、一第二基板吸附載台50、一基板翻轉裝置60及一第二檢測裝置70。關於置料裝置10、載運裝置20、第一基板吸附載台30及第一檢測裝置40的相關連接關係與前述實施例相同,與此不多加贅述。本實施例特別說明的是,基板檢測系統2更可以包含有一與第一導軌300平行設置的第二導軌500,而第二基板吸附載台50可活動地設置於該第二導軌500上;其中第二基板吸附載台50的詳細結構可以是與前述實施例所載的第一基板吸附載台30相同,亦可以是僅具有數個吸附孔5011的基板承載裝置。 Please refer to FIG. 8 and FIG. 9 together, which are schematic diagrams of a second embodiment of the substrate detecting system of the present invention. As shown in FIG. 8, the substrate detecting system 2 includes: a loading device 10. A carrier device 20, a first substrate adsorption stage 30, a first detecting device 40, a second substrate adsorption stage 50, a substrate inverting device 60, and a second detecting device 70. The connection relationship between the loading device 10, the carrier device 20, the first substrate adsorption stage 30, and the first detecting device 40 is the same as that of the above-described embodiment, and will not be described again. In this embodiment, the substrate detecting system 2 further includes a second rail 500 disposed in parallel with the first rail 300, and the second substrate adsorption stage 50 is movably disposed on the second rail 500; The detailed structure of the second substrate adsorption stage 50 may be the same as that of the first substrate adsorption stage 30 described in the foregoing embodiment, or may be a substrate carrying device having only a plurality of adsorption holes 5011.

如圖9所示(為利清楚顯示基板翻轉裝置60,於圖示中省略第一檢測裝置40及第二檢測裝置70的繪示),基板翻轉裝置60設置於第一導軌300及第二導軌500的一端,其包含有一第一夾爪模組61、一第二夾爪模組62及一支撐架63,支撐架63可以是橫跨於第一導軌300及第二導軌500設置,且支撐架63的左右兩內側分別設置有一第一夾爪模組61及一第二夾爪模組62,且第一夾爪模組61鄰近於第一基板吸附載台30設置,而第二夾爪模組62鄰近於第二基板吸附載台50設置。第二檢測裝置70可以是相對於第一檢測裝置40而鄰近於第二基板吸附載台50設置,用以檢測第二基板吸附載台50上的基板A。 As shown in FIG. 9 (in order to clearly show the substrate inverting device 60, the illustration of the first detecting device 40 and the second detecting device 70 is omitted in the drawing), the substrate inverting device 60 is disposed on the first rail 300 and the second rail. One end of the 500 includes a first jaw module 61, a second jaw module 62 and a support frame 63. The support frame 63 can be disposed across the first rail 300 and the second rail 500 and supported. A first jaw module 61 and a second jaw module 62 are respectively disposed on the left and right inner sides of the frame 63, and the first jaw module 61 is disposed adjacent to the first substrate adsorption stage 30, and the second jaw is disposed. The module 62 is disposed adjacent to the second substrate adsorption stage 50. The second detecting device 70 may be disposed adjacent to the second substrate adsorption stage 50 with respect to the first detecting device 40 for detecting the substrate A on the second substrate adsorption stage 50.

進一步地說,第一夾爪模組61可以包含有數個第一夾爪611及數個相對應第一夾爪611設置的第二夾爪612;而第二夾爪模組62相同地可以包含有數個第一夾爪621及數個相對應第一夾爪611設置的第二夾爪612;第一基板吸附載台30的載台本體301對應於數個第一夾爪611及數個第二夾爪612具有數個第一溝槽3012及數個第二溝槽3013;相同地,第二基板吸附載台50的載台本體501亦可以具有數個第一溝槽5012及數個第二溝槽5013。 Further, the first jaw module 61 may include a plurality of first jaws 611 and a plurality of second jaws 612 corresponding to the first jaws 611; and the second jaw modules 62 may equally include There are a plurality of first jaws 621 and a plurality of second jaws 612 corresponding to the first jaws 611; the stage body 301 of the first substrate adsorption stage 30 corresponds to the plurality of first jaws 611 and several The second jaw 612 has a plurality of first grooves 3012 and a plurality of second grooves 3013. Similarly, the stage body 501 of the second substrate adsorption stage 50 may have a plurality of first grooves 5012 and a plurality of Two grooves 5013.

當第一檢測裝置40檢測完第一基板吸附載台30上的基板A後,第一基板吸附載台30移動至鄰近第一夾爪模組61的位置,而第一夾爪模組61的第一夾爪611及第二夾爪612對應伸入第一溝槽3012及第二溝槽3013中,以將基板A由第一基板吸附載台30夾起。隨後,透過第二夾爪模組62將基板A由第一夾爪模組61抓取後,置放於第二基板吸附載台50,而達到將基板A翻面的目的,進而可使基板A的另一側面受第二檢測裝置70進行檢測,而可達到檢測基板A正反面的功效。其中,在較佳的實施中,更可於鄰近第二基板吸附載台50處設置有另一載運裝置(圖未示),藉以對應與原載運裝置20相互配合,而將經檢測後的基板A設置於置料裝置10相對應的基板置放區。 After the first detecting device 40 detects the substrate A on the first substrate adsorption stage 30, the first substrate adsorption stage 30 moves to a position adjacent to the first jaw module 61, and the first jaw module 61 The first jaw 611 and the second jaw 612 project into the first groove 3012 and the second groove 3013 to sandwich the substrate A from the first substrate adsorption stage 30. Then, the substrate A is grasped by the first jaw module 61 through the second jaw module 62, and then placed on the second substrate adsorption stage 50, thereby achieving the purpose of turning the substrate A over, thereby enabling the substrate. The other side of A is detected by the second detecting means 70, and the effect of detecting the front and back sides of the substrate A can be achieved. In a preferred implementation, another carrier device (not shown) may be disposed adjacent to the second substrate adsorption stage 50, so as to cooperate with the original carrier device 20, and the detected substrate is matched. A is disposed in a substrate placement area corresponding to the loading device 10.

誠如上述,具體地說,基板A的檢測過程可以是,首先透過載運裝置20由置料裝置10的第一基板置放區11吸附待測基板A,透過防疊片裝置22檢測後,將其置放於第一基板吸附載台30,透過傾斜裝置34使載台本體301傾斜後,沿第一導軌300移動至鄰近第一檢測裝置40的位置,以使基板A受第一檢測裝置40檢測;隨後,透過第一夾爪模組61抓取基板A,再透過第二夾爪模組62抓取基板A,並將基板A設置於第二基板吸附載台50,而使基板A的另一面受第二檢測裝置70進行檢測,最後再透過另一載運裝置或是原始的載運裝置20將雙面檢測後的基板A載運至置料裝置10的第二基板置放區12或是相對應的基板置放區(例如:基板毀壞區、基板再檢測區等),藉以完成單一基板的檢測作業。 As described above, specifically, the detection process of the substrate A may be: first, the substrate A to be tested is adsorbed by the first substrate placement area 11 of the loading device 10 through the carrier device 20, and after being detected by the anti-lamination device 22, After being placed on the first substrate adsorption stage 30, the stage body 301 is tilted by the tilting device 34, and then moved along the first rail 300 to a position adjacent to the first detecting device 40, so that the substrate A is subjected to the first detecting device 40. After the substrate A is grasped by the first jaw module 61, the substrate A is grasped by the second jaw module 62, and the substrate A is placed on the second substrate adsorption stage 50, so that the substrate A is The other side is detected by the second detecting device 70, and finally the substrate A after double-sided detection is carried to the second substrate placement area 12 or the phase of the loading device 10 through another carrier device or the original carrier device 20. Corresponding substrate placement area (for example, substrate destruction area, substrate re-detection area, etc.), thereby completing the detection operation of a single substrate.

惟以上所述僅為本創作的較佳實施例,非意欲侷限本創作的專利保護範圍,故舉凡運用本創作說明書及圖式內容所為的等效變化,均同理皆包含於本創作的權利保護範圍內,合予陳明。 However, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of patent protection of the present creation. Therefore, the equivalent changes of the present specification and the contents of the schema are all included in the right of the creation. Within the scope of protection, it is given to Chen Ming.

1‧‧‧基板檢測系統 1‧‧‧Substrate inspection system

10‧‧‧置料裝置 10‧‧‧Feeding device

11‧‧‧第一基板置放區 11‧‧‧First substrate placement area

111、121‧‧‧可活動載台 111, 121‧‧‧ movable stage

12‧‧‧第二基板置放區 12‧‧‧Second substrate placement area

20‧‧‧載運裝置 20‧‧‧Carriage

201‧‧‧吸附載台 201‧‧‧Adsorption platform

202‧‧‧吸附孔 202‧‧‧Adsorption holes

21‧‧‧活動載臂 21‧‧‧Active arm

22‧‧‧防疊片裝置 22‧‧‧Anti-stacking device

30‧‧‧第一基板吸附載台 30‧‧‧First substrate adsorption stage

300‧‧‧第一導軌 300‧‧‧First rail

301‧‧‧載台本體 301‧‧‧station body

3011‧‧‧吸附孔 3011‧‧‧Adsorption holes

33‧‧‧擋板 33‧‧‧Baffle

34‧‧‧傾斜裝置 34‧‧‧ tilting device

40‧‧‧第一檢測裝置 40‧‧‧First detection device

A‧‧‧基板 A‧‧‧Substrate

Claims (10)

一種基板檢測系統,其包含:一置料裝置,其用以置放至少一基板;一載運裝置,其用以載運置放於該置料裝置的該基板;一第一基板吸附載台,其可活動地設置於一第一導軌上,用以吸附該載運裝置所置放的該基板;以及一第一檢測裝置,其用以檢測置設於該第一基板吸附載台的該基板。 A substrate detecting system comprising: a loading device for arranging at least one substrate; a carrier device for carrying the substrate placed on the loading device; and a first substrate absorbing platform; The substrate is movably disposed on a first rail for adsorbing the substrate disposed by the carrier device; and a first detecting device is configured to detect the substrate disposed on the first substrate adsorption stage. 如請求項1所述的基板檢測系統,進一步更包含一第二基板吸附載台、一基板翻轉裝置及一第二檢測裝置,該第二基板吸附載台可活動地設置於一第二導軌上,而該第二導軌鄰近該第一導軌設置,該基板翻轉裝置用以翻轉該第一基板吸附載台上的該基板,並將翻轉後的該基板置放於該第二基板吸附載台,以使該基板受該第二檢測裝置檢測。 The substrate detecting system of claim 1, further comprising a second substrate adsorption stage, a substrate inverting device and a second detecting device, wherein the second substrate adsorption stage is movably disposed on a second rail And the second rail is disposed adjacent to the first rail, the substrate inverting device is configured to invert the substrate on the first substrate adsorption stage, and the inverted substrate is placed on the second substrate adsorption stage. The substrate is detected by the second detecting device. 如請求項2所述的基板檢測系統,其中該基板翻轉裝置包含一第一夾爪模組及一第二夾爪模組,該第一夾爪模組與該第二夾爪模組相對應的分別鄰近於該第一導軌及該第二導軌的一側設置;其中,該第一夾爪模組用以夾取設置於該第一基板吸附載台的該基板,該第二夾爪模組用以夾取該第一夾爪模組的該基板,並將該基板設置於該第二基板吸附載台。 The substrate detecting system of claim 2, wherein the substrate inverting device comprises a first jaw module and a second jaw module, the first jaw module corresponding to the second jaw module The first jaw module is configured to clamp the substrate disposed on the first substrate adsorption stage, and the second jaw mold is disposed adjacent to the first rail and the second rail. The group is configured to clamp the substrate of the first jaw module, and the substrate is disposed on the second substrate adsorption stage. 如請求項3所述的基板檢測系統,其中該第一夾爪模組及該第二夾爪模組分別包含至少一組夾爪,且該第一基板吸附載台及該第二基板吸附載台的一載台本體分別包含至少一組可對應容置該夾爪的溝槽。 The substrate detecting system of claim 3, wherein the first jaw module and the second jaw module respectively comprise at least one set of jaws, and the first substrate adsorption stage and the second substrate adsorption load Each of the stages of the stage includes at least one set of grooves corresponding to the jaws. 如請求項2至4其中任一項所述的基板檢測系統,其中該第一基板吸附載台及該第二基板吸附載台分別包含一擋板,且該第一基板吸附載台及該第二基板吸附載台分別連接一傾斜裝置, 該傾斜裝置用以使該第一基板傾斜裝置及該第二基板吸附載台的該載台本體傾斜,而使設置於該載台本體上的該基板的一側邊抵靠於該擋板。 The substrate detecting system according to any one of claims 2 to 4, wherein the first substrate adsorption stage and the second substrate adsorption stage respectively comprise a baffle, and the first substrate adsorption stage and the first The two substrate adsorption stages are respectively connected to a tilting device, The tilting device is configured to tilt the first substrate tilting device and the stage body of the second substrate adsorption stage, and abutting one side of the substrate disposed on the stage body against the baffle. 如請求項2至4其中任一項所述的基板檢測系統,其中該第一基板吸附載台及該第二基板吸附載台分別包含一第一阻氣模組、數個第二阻氣模組及數個吸附孔,該第一阻氣模組可選擇地啟閉至少一列X方向的該些吸附孔,而各該第二阻氣模組可選擇第啟閉至少一排Y方向的該些吸附孔。 The substrate detecting system according to any one of claims 2 to 4, wherein the first substrate adsorption stage and the second substrate adsorption stage respectively comprise a first gas barrier module and a plurality of second gas barrier modules And a plurality of adsorption holes, the first gas barrier module selectively opening and closing at least one column of the adsorption holes in the X direction, and each of the second gas barrier modules may select at least one row of the Y direction Some adsorption holes. 如請求項6所述的基板檢測系統,其中該第一基板吸附載台及該第二基板吸附載台進一步分別包含:一主氣道,其與一抽氣裝置相連接,且該主氣道包含數個主氣孔;數個第一氣道,各該第一氣道分別與該主氣道的各該主氣孔相連通,且各該第一氣道包含數個第一氣孔;以及數個第二氣道,各該第二氣道包含數個第二氣孔,各該第二氣孔分別對應與一排的該些吸附孔相連通,且各該第一氣道的各該第一氣孔分別對應與該第二氣道相連通;其中,該第一阻氣模組可活動地設置於該主氣道中,以可選擇地關閉至少一主氣孔,各該第二阻氣模組分別設置於各該第二氣道中,以可選擇地關閉至少一該第二氣孔。 The substrate detecting system of claim 6, wherein the first substrate adsorption stage and the second substrate adsorption stage further comprise: a main air channel connected to an air suction device, and the main air channel includes a plurality of first air passages, each of the first air passages being respectively connected to each of the main air holes of the main air passage, and each of the first air passages includes a plurality of first air holes; and a plurality of second air passages, each of which The second air passage includes a plurality of second air holes, each of the second air holes respectively corresponding to the plurality of the adsorption holes, and each of the first air holes of each of the first air channels respectively communicate with the second air passage; The first gas barrier module is movably disposed in the main air passage to selectively close at least one main air hole, and each of the second gas blocking modules is disposed in each of the second air passages to be selectable. At least one of the second air holes is closed. 如請求項2至4其中任一項所述的基板檢測系統,其中該第一基板吸附載台及該第二基板吸附載台進一步分別包含一第一阻氣模組、一第二阻氣模組及數個吸附孔,該第一阻氣模組可選擇地啟閉至少一列X方向的該些吸附孔,而該第二阻氣模組可選擇第啟閉至少一排Y方向的該些吸附孔。 The substrate detecting system according to any one of claims 2 to 4, wherein the first substrate adsorption stage and the second substrate adsorption stage further comprise a first gas barrier module and a second gas barrier module, respectively And the plurality of adsorption holes, the first gas barrier module selectively opens and closes at least one column of the adsorption holes in the X direction, and the second gas barrier module can select at least one row of the Y direction Adsorption holes. 如請求項8所述基板檢測系統,其中該第一基板吸附載台及該第二基板吸附載台進一步分別包含: 一主氣道,其與一抽氣裝置相連接,且該主氣道包含數個主氣孔;數個第一氣道,各該第一氣道分別與X方向各列的該些吸附孔相連通,且各該第一氣道分別與各該主氣孔相連通;一次氣道,其與該抽氣裝置相連接,且該次氣道包含數個次氣孔;以及數個第二氣道,各該第二氣道分別與Y方向各排的該些吸附孔相連通,且各該第二氣道分別與各該次氣孔相連通;其中,該第一阻氣模組可活動地設置於該主氣道中,以可選擇地關閉至少一該主氣孔,該第二阻氣模組設置於該次氣道中,以可選擇地關閉至少一該次氣孔。 The substrate detecting system of claim 8, wherein the first substrate adsorption stage and the second substrate adsorption stage further comprise: a main air passage, which is connected to an air suction device, and the main air passage includes a plurality of main air holes; a plurality of first air passages, each of the first air passages being respectively connected to the adsorption holes in each row of the X direction, and each The first air passage is respectively connected to each of the main air holes; a primary air passage is connected to the air suction device, and the secondary air passage includes a plurality of secondary air holes; and a plurality of second air passages, each of the second air passages respectively and Y The plurality of adsorption holes are connected to each other, and each of the second air passages is respectively connected to each of the secondary air holes; wherein the first gas blocking module is movably disposed in the main air passage to selectively close The at least one main air hole, the second gas blocking module is disposed in the secondary air passage to selectively close the at least one secondary air hole. 如請求項2至4其中任一項所述的基板檢測系統,進一步包含一防疊片裝置,其包含一感測模組及至少一彈性夾持臂;當該載運裝置將其所載運的該基板,置放於該夾持模組時,該基板抵頂該彈性夾持臂,而該感測模組據以感測該基板的厚度。 The substrate detecting system of any one of claims 2 to 4, further comprising an anti-lamination device comprising a sensing module and at least one elastic clamping arm; when the carrier device carries the carrier When the substrate is placed on the clamping module, the substrate abuts the elastic clamping arm, and the sensing module senses the thickness of the substrate.
TW102148803A 2013-12-27 2013-12-27 Substrates detecting system TW201525476A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105785177A (en) * 2016-03-14 2016-07-20 苏州精濑光电有限公司 OLED panel detection apparatus
CN110420864A (en) * 2019-07-15 2019-11-08 中导光电设备股份有限公司 A kind of ULED screen substrate detection/measuring device and its application method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105785177A (en) * 2016-03-14 2016-07-20 苏州精濑光电有限公司 OLED panel detection apparatus
CN110420864A (en) * 2019-07-15 2019-11-08 中导光电设备股份有限公司 A kind of ULED screen substrate detection/measuring device and its application method
CN110420864B (en) * 2019-07-15 2023-10-13 中导光电设备股份有限公司 ULED screen substrate detection/measurement equipment

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