TW201334655A - Method for forming substrate fixation hole - Google Patents

Method for forming substrate fixation hole Download PDF

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TW201334655A
TW201334655A TW102105050A TW102105050A TW201334655A TW 201334655 A TW201334655 A TW 201334655A TW 102105050 A TW102105050 A TW 102105050A TW 102105050 A TW102105050 A TW 102105050A TW 201334655 A TW201334655 A TW 201334655A
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Taiwan
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substrate
layer
filler
conductor
hole
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TW102105050A
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Chinese (zh)
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TWI488555B (en
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Tsukasa Matsuzawa
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Eastern Kk
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  • Laser Beam Processing (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

The present invention provides a method for forming a fixation hole on the substrate of the package by inserting a pin between a substrate fixation hole and a wiring pattern formed on the substrate surface so as to acquire a highly precise fixation hole for the substrate. Wherein an incident laser beam L is introduced to scan a filler layer 5 which is exposed to a first port pattern 8, from a first conductor pattern 6a side along the edge 8a of the first port pattern 8 so as to eliminate the filler layer 5 and form a bottomed ditch 11 with a second conductor layer 7 as its bottom. Afterwards the dummy part of the substrate 12 the region where the filler layer 5 being encircled by the bottomed ditch 11 and the region where the second conductor layer 7 being laminated are eliminated by squeezing operation thereby forming the sophisticated substrate fixation hole 10.

Description

基板基準孔之加工方法 Substrate reference hole processing method

本發明係關於基板基準孔之加工方法,係用以設置於例如印刷配線之基板上,在零件安裝時將基板定位之基板基準孔之加工方法。 The present invention relates to a method for processing a substrate reference hole, which is a method for processing a substrate reference hole for positioning a substrate on a substrate such as a printed wiring.

近年來半導體封裝用印刷配線板上,通常設有稱為非通孔的貫通孔,其孔壁面未施有鍍層,而亦非導通性者。此貫通孔乃為一種屬於當印刷配線板製造程序中,進行切斷基板或切開加工時,插入決定基板位置所用定位銷之插入孔,係用於各種加工之基準者。又,當於基板上安裝電子零件時,亦可做為設定基板位置所用定位銷的插入孔。 In recent years, a printed wiring board for a semiconductor package is usually provided with a through hole called a non-through hole, and the hole wall surface is not plated, and is not conductive. This through hole is an insertion hole for inserting a positioning pin for determining the position of the substrate when the substrate is cut or cut in the manufacturing process of the printed wiring board, and is used as a reference for various processes. Moreover, when an electronic component is mounted on a substrate, it can also be used as an insertion hole for setting a positioning pin for the substrate position.

一般而言,做為基準用的非通孔加工,係利用以NC控制的機械鑽進行,但非通孔與配線圖形之間的偏差卻達50 μm以上。基板外形或切開加工與配線圖形之偏差如能更小,則配線圖形與加工部間的距離可以縮小,亦可使圖形接近基板外形,或縮小成品尺寸。又,在電子零件安裝程序中,為了使基板安置時穩定圖形位置,亦可穩定安 裝機器的圖像辨識而易於對準。因此工程界要求須減小做為加工基準的基板基準孔與配線圖形間的偏差。 In general, the non-through hole machining used as a reference is performed by a mechanical drill controlled by NC, but the deviation between the non-through hole and the wiring pattern is 50 μm or more. If the deviation of the substrate shape or the slitting process from the wiring pattern is smaller, the distance between the wiring pattern and the processing portion can be reduced, and the pattern can be made close to the substrate shape or the finished product size can be reduced. Moreover, in the electronic component mounting program, in order to stabilize the pattern position when the substrate is placed, it is also stable. The image recognition of the machine is easy to align. Therefore, the engineering community has required to reduce the deviation between the substrate reference hole and the wiring pattern as a processing reference.

舉例而言,在以雷射加工在配線基板上開設貫通孔之方法中,有人提議將依配線圖形設有開口的相似光罩和設有與此開口重合的開口之接觸光罩相疊合後,以雷射光掃描而開孔的方法(專利文獻1)。 For example, in a method of forming a through hole in a wiring substrate by laser processing, it has been proposed to superimpose a similar photomask provided with an opening according to the wiring pattern and a contact mask provided with an opening overlapping the opening. A method of opening a hole by scanning with a laser beam (Patent Document 1).

〔既有技術文獻〕 [existing technical literature]

〔專利文獻1〕:特開2001-127397號公報。 [Patent Document 1]: JP-A-2001-127397.

封裝用的印刷基板,須儘量減少安裝零件時的反翹與扭曲,或尺寸走樣,因此有提高剛性的傾向。因此,基板材料中大量混入稱為填料的無機物微粒子,或使用膨脹係數較小而具有高結晶性的玻璃纖維。其結果於以雷射光經插入銷通過插入口照射基板之場合,由於玻璃布與樹脂之加工性有所差異,雷射照射部位,尤其是孔壁面的樹脂成為被挖亂的狀態而呈很不平整,於是孔的尺寸參差不齊。又,於以金屬模具實施沖壓加工之場合,容易發生沖壓機破損或磨耗之問題。 The printed circuit board for packaging must have a tendency to improve the rigidity by minimizing the warpage and distortion when mounting the components, or by sizing the dimensions. Therefore, a large amount of inorganic fine particles called fillers are mixed in the substrate material, or glass fibers having a small expansion coefficient and high crystallinity are used. As a result, when the laser light is irradiated through the insertion port through the insertion pin, the processing property of the glass cloth and the resin is different, and the laser irradiation portion, particularly the resin on the hole wall surface, is in a state of being scrambled. Flat, so the size of the holes is uneven. Further, in the case where the press working is performed by a metal mold, the problem of breakage or abrasion of the press is likely to occur.

又,在將電子零件安裝於封裝用基板上之際,須將基板以定位銷固定於金屬模具,此時為了因應基板的伸縮,常將插入孔形成長孔。基板上加工形成長孔亦以機械鑽進行。此時係將鑽器的加工位置稍移而開孔,但因係 在已開孔的近傍再開孔,以致鑽器的位置相牴觸,無法達成高精度的加工。雖有利用金屬模具做沖壓加工的方法,但須準備價格昂貴的金屬模具。首要者應為以低成本形成位置精度高的長孔。 Further, when the electronic component is mounted on the package substrate, the substrate must be fixed to the mold by the positioning pin. In this case, the insertion hole is often formed into a long hole in order to cope with the expansion and contraction of the substrate. The processing of the long holes on the substrate is also performed by a mechanical drill. At this time, the processing position of the drill is slightly moved to open the hole, but the system is The hole is opened in the near hole of the hole, so that the position of the drill is in contact with each other, and high-precision machining cannot be achieved. Although there is a method of using a metal mold for stamping, it is necessary to prepare an expensive metal mold. The first priority should be to form long holes with high positional accuracy at low cost.

本發明之目的為解決上揭先前技術的問題,提供一種基板基準孔的加工方法,其能維持封裝用基板所要求的剛性,提高雷射光開孔的加工性,並提高基板定位用基板基準孔與基板表面的配線圖形間之位置精度。 An object of the present invention is to solve the problems of the prior art and to provide a method for processing a substrate reference hole which can maintain the rigidity required for a substrate for packaging, improve the workability of the laser light opening, and improve the substrate reference hole for substrate positioning. Positional accuracy between the wiring pattern on the surface of the substrate.

為了達成上揭目的,本發明之基板基準孔之加工方法具有下列構成,為其特徵。 In order to attain the above object, the method for processing a substrate reference hole of the present invention has the following constitution and is characterized.

亦即,穿孔開設貫通孔於其絕緣樹脂基材兩面具有導電層之基板的開孔程序;充填用以埋填該貫通孔的充填劑,以閉塞該貫通孔的程序;研磨該充填劑,而與形成於該基板兩面的導電層全面均勻平坦化的程序;在基板兩面連續施行無電解金屬鍍覆及電場金屬鍍覆,以形成覆蓋該充填劑之第1,第2導體層的程序;將積層於該充填劑層的第1導電層蝕刻去除,以形成第1導體圖形,同時形成第1開口圖形以露出墊底的該充填劑層的程序;將該第2導電層蝕刻去除,以形成露出墊底之該充填劑層的第2開口圖形,而形成對向於該第1開口圖形之第2導體圖形的程序;從該第1導體層側以該第1導體層為光罩,將雷射光沿該第1開口圖形之緣部照射掃描露出於該第1開口圖形之該充填 劑層而去除,以形成以該第2導體層為底部之有底溝的程序;及押壓該有底溝所包圍之至少該充填劑層及積層有該第2導體層的基板不需部份而去除,以形成基板基準孔的程序。而該基板基準孔尺寸與位置,係決定於去除該充填劑層後之該有底溝上形成有該第1開口圖形之該第1導電層的孔尺寸與位置,為其特徵。 That is, the perforation is provided with an opening procedure for the substrate having the conductive layer on both sides of the insulating resin substrate; the filling agent for filling the through hole is filled to block the through hole; and the filler is ground. a program for uniformly and uniformly flattening the conductive layers formed on both surfaces of the substrate; performing electroless metal plating and electric field metal plating on both surfaces of the substrate to form a program for covering the first and second conductor layers of the filler; a step of etching the first conductive layer laminated on the filler layer to form a first conductor pattern, and forming a first opening pattern to expose the filler layer of the underlayer; and etching the second conductive layer to form an exposed portion Forming a second opening pattern of the filler layer on the bottom of the underlayer to form a second conductor pattern facing the first opening pattern; and using the first conductor layer as a mask from the first conductor layer side to emit laser light Scanning and exposing the filling to the first opening pattern along the edge of the first opening pattern Removing the agent layer to form a bottomed trench having the second conductive layer as a bottom; and pressing at least the filler layer surrounded by the bottomed trench and the substrate on which the second conductive layer is laminated The procedure of removing the substrate to form a substrate reference hole. The size and position of the reference hole of the substrate are determined by the size and position of the hole of the first conductive layer on which the first opening pattern is formed on the bottomed groove after removing the filler layer.

依照上揭構成,將充填於貫通孔之充填劑層上所積層之第1導體層,於形成第1導體圖形同時去除,即可形成第1開口圖形,以利加工所希望形狀之基板基準孔,可得與配線圖形間之位置精度非常高(±15 μm以下)之基板基準孔(非通孔)。尤其基板基準孔位置,係取決於除去充填劑層後有底溝上形成有第1開口圖形之第1導體層尺寸與位置,因此可提高基板基準孔與第1導體圖形間之位置精度。 According to the above configuration, the first conductor layer which is laminated on the filler layer of the through-hole is formed by removing the first conductor pattern, and the first opening pattern can be formed to facilitate the processing of the substrate reference hole of a desired shape. A substrate reference hole (non-via) with a very high positional accuracy (±15 μm or less) between the wiring patterns is available. In particular, the position of the substrate reference hole depends on the size and position of the first conductor layer on which the first opening pattern is formed in the bottom groove after the removal of the filler layer, so that the positional accuracy between the substrate reference hole and the first conductor pattern can be improved.

又,以該第1導體層做為光罩,從第1導體層側的第1開口圖形露出的充填劑層上,將雷射光沿第1開口圖形的緣部照射掃描,即可將其去除而形成有底溝。將已以押壓方式去除該有底溝所圍繞之至少充填劑層及積層有第2導體層之基板不需要部份,即可形成具有所希望形狀之孔於基板上,是以可以良好效率形成大於雷射光孔徑之圓形孔與長孔等。 Further, the first conductor layer is used as a mask, and the laser light is irradiated along the edge of the first opening pattern from the filler layer exposed on the first opening pattern on the first conductor layer side, thereby removing the laser beam. The bottom ditch is formed. The at least a filler layer surrounded by the bottomed trench and the unnecessary portion of the substrate on which the second conductive layer is laminated may be removed by pressing, so that a hole having a desired shape can be formed on the substrate, so that the efficiency can be improved. A circular hole, a long hole, and the like which are larger than the laser light aperture are formed.

又,將形成有第1開口圖形之第1導體層做為光罩,照射雷射光而形成有底溝,再將該有底溝所包圍之基 板不需要部份押壓去除而形成基板基準孔,即可達成加工形狀與設計值幾乎相同之開孔,而並不須使用金屬模具可輕易達成加工目的。又,因形成容易以雷射加工的充填劑層,因而不致於使基板基準孔壁面粗糙,除形成配線圖形之外,同時形成位置精度良好且加工精密的基板基準孔。 Further, the first conductor layer on which the first opening pattern is formed is used as a mask, and the bottom groove is formed by irradiating the laser light, and the base surrounded by the bottom groove is formed. The plate does not need to be partially pressed to form the substrate reference hole, so that the hole having the same shape and design value can be obtained, and the processing purpose can be easily achieved without using a metal mold. Further, since the filler layer which is easily processed by laser is formed, the substrate reference hole wall surface is not roughened, and in addition to the formation of the wiring pattern, the substrate reference hole having excellent positional accuracy and precision is formed.

又,因將有底溝之底部做為第2導體圖形,故當進行雷射加工時,亦不致於使有底溝所包圍之充填劑層從基板脫落,或脫落的充填劑層成為垃圾,影響下一次雷射加工時之基板加工位置。 Moreover, since the bottom of the bottomed groove is used as the second conductor pattern, when the laser processing is performed, the filler layer surrounded by the bottomed groove is not peeled off from the substrate, or the falling filler layer becomes garbage. Affects the substrate processing position during the next laser processing.

該充填劑層最好屬於充填物用之熱硬化性填孔用墨水,以濾篩方式塗佈,加熱硬化形成者。熱硬化性填孔用墨水為了提高被填充的通孔內鍍銅之連接可靠性,含有二氧化矽等無機物粒子(充填物),即可使其熱膨脹係數接近於使用玻璃布之絕緣樹脂基材。充填於墨水的充填物,通常屬於二氧化矽等無機物,所以充填物與樹脂對雷射的加工性大有不同。然而由於充填物尺寸很小(例如50 μm以下),雷射加工性產生差異的領域非常小,因此較之以玻璃布與樹脂製成的基板,其雷射加工後加工面之粗糙度較小,表示其加工性良好。 The filler layer is preferably a thermosetting hole-filling ink for a filler, which is applied by a sieve method and heat-hardened. In order to improve the connection reliability of copper plating in the filled via hole, the thermosetting hole-filling ink contains inorganic particles (filler) such as cerium oxide, so that the coefficient of thermal expansion is close to that of the insulating resin substrate using glass cloth. . The filler filled in the ink usually belongs to an inorganic substance such as cerium oxide, so that the filler and the resin have a large difference in processability to the laser. However, due to the small size of the filler (for example, 50 μm or less), the field of laser processing difference is very small, so the roughness of the processed surface after laser processing is smaller than that of the substrate made of glass cloth and resin. , indicating that its processability is good.

形成基板基準孔時,最好能使形成有第1開口圖形的第1導體層的孔尺寸成為最小。 When forming the substrate reference hole, it is preferable to minimize the size of the hole of the first conductor layer on which the first opening pattern is formed.

亦即調整雷射加工條件,使形成有第1開口圖 形的第1導體層的孔尺寸成為基板基準孔的最小尺寸,如此形成時,當插入銷插入於基板基準孔之際,由於最小尺寸的第1開口圖形之開口部成為基準,由是對固定基板用銷針可高精度的定位形成於基板上的第1導體圖形。 That is, the laser processing conditions are adjusted so that the first opening pattern is formed. The hole size of the first conductor layer is the smallest dimension of the substrate reference hole. When the insertion pin is inserted into the substrate reference hole, the opening of the first opening pattern of the smallest dimension serves as a reference. The pin for the substrate can accurately position the first conductor pattern formed on the substrate.

形成有底溝之底部的第2導體圖形外形尺寸,最好形成大於所對向之第1開口圖形之外形尺寸。 Preferably, the outer shape of the second conductor pattern forming the bottom of the bottom groove is formed to be larger than the outer opening pattern of the first opening pattern.

藉此,只要剝除第2導體圖形與充填劑層,或充填劑層及絕緣樹脂基材的黏著,即可輕易去除有底溝所包圍之基板不需要部份。於此所謂外形尺寸,係指導體圖形,或開口圖形外側輪廓線所包圍中形狀對比部份的長度而言。 Thereby, the unnecessary portion of the substrate surrounded by the bottom groove can be easily removed by peeling off the second conductor pattern and the filler layer, or the adhesion between the filler layer and the insulating resin substrate. The so-called external dimensions are the length of the contrasting portion of the guide body pattern or the outer contour of the open pattern.

該基板不需要部份,可藉由押壓部材的押壓,空氣壓力的施加,或施加含有振動的任何外力,使第2導體圖形與充填劑層,或充填劑層及絕緣樹脂基材互相剝離而去除。如此,可輕易去除基板不需要的部份。 The substrate does not require a portion, and the second conductor pattern and the filler layer, or the filler layer and the insulating resin substrate may be mutually exchanged by pressing of the pressing member, application of air pressure, or application of any external force containing vibration. Stripped and removed. In this way, unnecessary portions of the substrate can be easily removed.

形成第1開口圖形及第2導體圖形後,至少對第1導體層各形成以鍍鎳層及鍍金層之積層後,以形成有第1開口圖形之第1導體層做為光罩,照射雷射光於充填劑層。 After forming the first opening pattern and the second conductor pattern, at least the first conductor layer is formed by laminating a nickel plating layer and a gold plating layer, and then the first conductor layer having the first opening pattern is formed as a mask to illuminate the light. The light is incident on the filler layer.

藉此,由於提高第1開口圖形周圍之導體層反射率,可減輕對雷射光照射部的第1導體層及其下之充填劑層的傷害,因而第1導體層可以較薄。 Thereby, since the reflectance of the conductor layer around the first opening pattern is increased, damage to the first conductor layer of the laser light irradiation portion and the underfill layer can be reduced, and thus the first conductor layer can be made thin.

依照上述之發明,在維持封裝用基板應有之剛性下,提高雷射光的開孔加工性,提供基板定位用基板基準孔與基板表面之配線圖形間,具有甚高位置精度的基板基準孔加工方法。 According to the invention described above, the drilling processability of the laser light is improved while maintaining the rigidity of the package substrate, and the substrate reference hole processing with high positional accuracy is provided between the substrate positioning substrate reference hole and the wiring pattern on the substrate surface. method.

1‧‧‧絕緣樹脂基材 1‧‧‧Insulating resin substrate

2‧‧‧導電層(銅箔層) 2‧‧‧ Conductive layer (copper foil layer)

3‧‧‧兩面銅版基板 3‧‧‧Two-sided copper plate substrate

4‧‧‧貫通孔 4‧‧‧through holes

5‧‧‧充填劑層 5‧‧‧Fill layer

6‧‧‧第1導體層 6‧‧‧1st conductor layer

6a‧‧‧第1導體圖形 6a‧‧‧1st conductor pattern

7‧‧‧第2導體層 7‧‧‧2nd conductor layer

7a、7b‧‧‧第2導體圖形 7a, 7b‧‧‧2nd conductor pattern

8‧‧‧第1開口圖形 8‧‧‧1st opening graphic

8a‧‧‧第1開口圖形之線部 8a‧‧‧The line of the first open figure

10‧‧‧基板基準孔 10‧‧‧Substrate reference hole

11‧‧‧有底溝 11‧‧‧ with bottom ditch

12‧‧‧基板不需要的部份 12‧‧‧Unwanted parts of the substrate

13‧‧‧配線圖形 13‧‧‧ wiring pattern

14‧‧‧封裝用基板 14‧‧‧Package substrate

15‧‧‧押壓部材 15‧‧‧Pressing parts

第1圖為表示封裝用基板之基板基準孔加工程序的斷面圖。 Fig. 1 is a cross-sectional view showing a substrate reference hole processing program for a package substrate.

第2圖為基準孔的斷面照相圖。 Figure 2 is a cross-sectional photograph of the reference hole.

下文中參照附圖,具體說明本發明之實施形態。 Embodiments of the present invention will be specifically described below with reference to the accompanying drawings.

茲參照第1(A)~(J)圖,說明形成基準孔於封裝用基板上之加工方法,及製造程序。 Referring to Figures 1(A) to (J), a method of forming a reference hole on a substrate for packaging and a manufacturing procedure will be described.

如第1(A)圖所示,準備兩面銅版基板3,其絕緣樹脂基材1(例如環氧樹脂基板)之兩面具有導電層(銅箔層)2。在此兩面銅版基板3上,以如第1(B)圖所示之鑽器等做機械加工穿設貫通孔4(開孔程序)。 As shown in Fig. 1(A), a double-sided cliche substrate 3 is prepared, and a conductive layer (copper foil layer) 2 is provided on both surfaces of an insulating resin substrate 1 (e.g., an epoxy resin substrate). On the double-sided copper plate substrate 3, a through hole 4 (opening process) is machined by a drill or the like as shown in Fig. 1(B).

其次如第1(C)圖所示,施加充填劑於貫通孔4內而將其封閉。充填劑5係以含有充填物之熱硬化性填孔用墨水,利用濾篩方法塗佈後加熱硬化而形成充填劑層5。 Next, as shown in Fig. 1(C), a filler is applied to the through hole 4 to close it. The filler 5 is formed by coating with a hot hardenable hole-filling ink containing a filler, and then heat-hardening by a sieve method to form a filler layer 5.

其次如第1(D)圖所示,研磨充填劑層5而與形 成於基板兩面之導電層2全面平坦化。充填劑最好使用高度含有優於對貫通孔有充填性及研磨性之細小粒徑(例如50 μm以下)之充填物的填孔用墨水。 Next, as shown in Fig. 1(D), the filler layer 5 is polished to completely planarize the conductive layer 2 formed on both surfaces of the substrate. As the filler, it is preferable to use a hole-filling ink which is highly filled with a filler having a fine particle diameter (for example, 50 μm or less) which is more excellent in filling and polishing properties to the through holes.

其次如第1(E)圖所示,連續施行無電解鍍銅及電場鍍銅於基板兩面,各形成第1與第2導體層6,7,以覆蓋充填劑層5及與此鄰接的導電層2之兩面(雙重鍍)。厚度塗佈於導體層2之第1,第2導體層6,7形成如以下所說明之第1開口圖形與第2導體圖形。 Next, as shown in the first (E) diagram, electroless copper plating and electric field copper plating are continuously applied to both surfaces of the substrate, and the first and second conductor layers 6, 7 are formed to cover the filler layer 5 and the adjacent conductive material. Two sides of layer 2 (double plating). The first and second conductor layers 6, 7 having a thickness applied to the conductor layer 2 form a first opening pattern and a second conductor pattern as described below.

其次於第1(F)圖中,在形成第1,第2導體層6,7後,進行蝕刻,以同時形成配線圖形與第1開口圖形8及第2導體圖形7b於基板兩面。具體而言,將蝕刻用光罩(乾膜等)積層於第1,第2導體層6,7後,同時將配線圖形與第1開口圖形8(例如圓形)露光。其次將第2導體圖形7b(例如圓形)露光後,進行顯像形成蝕刻用光罩的圖形。之後,進行蝕刻而形成第1開口圖形8與第2導體圖形7b及第1、2導體圖形6a、7a。亦即,藉由去除積層於充填於貫通孔4之充填劑層5的第1導體層6,形成加工基準孔10所需之第1開口圖形8,露出墊底之出填劑層5,藉由去除第2導體層7,以形成直徑較為大的第2導體圖形7b。藉此,於形成配線圖形於基板兩面同時,亦可形成第1開口圖形8及第2導體圖形7b。 Next, in the first (F) diagram, after the first and second conductor layers 6, 7 are formed, etching is performed to simultaneously form the wiring pattern and the first opening pattern 8 and the second conductor pattern 7b on both surfaces of the substrate. Specifically, after the etching mask (dry film or the like) is laminated on the first and second conductor layers 6 and 7, the wiring pattern and the first opening pattern 8 (for example, a circular shape) are exposed. Next, the second conductor pattern 7b (for example, a circular shape) is exposed, and then a pattern for forming an etching mask is developed. Thereafter, etching is performed to form the first opening pattern 8 and the second conductor pattern 7b and the first and second conductor patterns 6a and 7a. That is, the first opening pattern 8 required for processing the reference hole 10 is formed by removing the first conductor layer 6 laminated on the filler layer 5 filled in the through hole 4, thereby exposing the filler layer 5 at the bottom of the substrate. The second conductor layer 7 is removed to form a second conductor pattern 7b having a relatively large diameter. Thereby, the first opening pattern 8 and the second conductor pattern 7b can be formed simultaneously with the formation of the wiring pattern on both surfaces of the substrate.

此外,形成第1,2導體圖形6a,7a後,亦可再形成鍍鎳層及鍍金層之積層於第1導體層6上。藉此,由於 提高第1開口圖形8周圍之第1導體層6的反射率,則於進行後述之照射雷射光於充填劑層5進行開孔加工時,可減輕做為雷射照射部的第1導體層6及其下之充填劑層5所受的傷害,而得以形成較薄之第1導體層6。結果形成配線圖形所用銅厚度可以較薄,而得以施加較細配線圖形之蝕刻。此外,鍍鎳層及鍍金層可積層形成於至少施行雷射加工之第1導體層6側,但鍍金屬加工上,亦可再積層形成於第2導體層7側。 Further, after the first and second conductor patterns 6a and 7a are formed, a nickel plating layer and a gold plating layer may be further formed on the first conductor layer 6. Taking this When the reflectance of the first conductor layer 6 around the first opening pattern 8 is increased, the first conductor layer 6 serving as the laser irradiation portion can be reduced when the laser beam is irradiated on the filler layer 5 to be described later. The damage to the underfill layer 5 and the underlying layer 1 is formed to form a thin first conductor layer 6. As a result, the thickness of the copper used to form the wiring pattern can be made thinner, and the etching of the thin wiring pattern can be applied. Further, the nickel plating layer and the gold plating layer may be formed on the side of the first conductor layer 6 on which the laser processing is performed at least, but the metal plating may be further formed on the second conductor layer 7 side.

其次如第1(G)圖所示,從第1導體層6側由第1開口圖形8露出之充填劑層5上,以第1導體層6做為光罩,沿著第1開口圖形8之緣部8a(參照第1(F)圖)以掃描方式照射雷射光L而去除充填劑層5,並形成以第2導體圖形7b(含導電層2)為底之有底溝11。雷射加工所使用之雷射光有激元雷射、YAG雷射、二氧化碳雷射等。 Next, as shown in the first (G) diagram, the first conductor layer 6 is used as a mask on the filler layer 5 exposed from the first opening pattern 8 on the first conductor layer 6 side, along the first opening pattern 8. The edge portion 8a (see Fig. 1(F)) irradiates the laser light L by scanning to remove the filler layer 5, and forms the bottomed trench 11 having the second conductor pattern 7b (including the conductive layer 2) as a base. Laser light used in laser processing includes excimer lasers, YAG lasers, and carbon dioxide lasers.

其次如第1(H)圖所示,此為雷射加工後之基板斷面,做為有底溝11底部的第2導體圖形7b側外徑,較第1開口圖形8之外形尺寸(內徑)為大,而較第2導體圖形7b之外形尺寸(直徑)為小。如此,基板基準孔10的孔尺寸,成為形成有第1開口圖形8的第1導體層6的孔尺寸(外形尺寸)為最小。結果,於插入定位銷於基板基準孔10之際,以形成有最小徑之第1開口圖形8之第1導體層6開口部為基準,可與第1導體圖形6a之間進行高精度定位。 Next, as shown in Fig. 1(H), this is the cross-section of the substrate after the laser processing, and the outer diameter of the second conductor pattern 7b at the bottom of the bottomed trench 11 is smaller than the outer shape of the first opening pattern 8 (inside) The diameter is large, and the outer shape (diameter) is smaller than the second conductor pattern 7b. As described above, the hole size of the substrate reference hole 10 is the smallest (outer dimension) of the first conductor layer 6 on which the first opening pattern 8 is formed. As a result, when the positioning pin is inserted into the substrate reference hole 10, the first conductor pattern 6 having the smallest diameter is formed as a reference, and the first conductor pattern 6a can be positioned with high precision.

其次如第1(I)圖所示,將有底溝11所包圍之充填劑5積層,第2導體層7積層的基板不需要部份(孔中央部)12,以押壓方式去除而形成基板基準孔10。基板不需要部份12除了藉由押壓部材15(押壓銷)之押壓以外,尚可由空氣壓力之施加,或包含振動等任何外力之施加,使第2導體層7與充填劑層5相剝離而去除。此時如第1(H)圖所示,第2導體圖形7b處於與充填劑層5以些微的重疊領域積層(黏著)的狀態。因此,得以輕易去除基板不需要部份12。此外,端視雷射加工條件及第2導體圖形7b之配置情形,第2導體圖形7b或可與充填劑層5及絕緣樹脂基材1積層。 Next, as shown in Fig. 1(I), the filler 5 surrounded by the bottom groove 11 is laminated, and the substrate (the central portion of the hole) 12 which is laminated on the second conductor layer 7 is removed by pressing. Substrate reference hole 10. The substrate unnecessary portion 12 may be subjected to the pressing of the pressing member 15 (the pressing pin), or may be applied by air pressure or any external force including vibration to cause the second conductor layer 7 and the filler layer 5 to be applied. The phase is peeled off and removed. At this time, as shown in the first (H) diagram, the second conductor pattern 7b is in a state of being laminated (adhered) to the filler layer 5 in a slightly overlapping region. Therefore, the unnecessary portion 12 of the substrate can be easily removed. Further, the second conductor pattern 7b may be laminated with the filler layer 5 and the insulating resin substrate 1 in the case of the laser processing conditions and the arrangement of the second conductor pattern 7b.

經過以上之程序,以雷射光照射露出於第1開口圖形8之充填劑層5而去除之,並形成以第2導體圖形7b為底部之有底溝11,將有底溝11所包圍之充填劑層5、第2導體層7積層的基板不需要部份12去除。由是如第1(J)圖所示,完成同時形成有基板基準孔10及配線圖形13的封裝用基板14的製造。 Through the above procedure, the filler layer 5 exposed to the first opening pattern 8 is irradiated with laser light to be removed, and the bottomed groove 11 having the second conductor pattern 7b as a bottom is formed, and the bottomed groove 11 is filled. The substrate layered by the agent layer 5 and the second conductor layer 7 does not need to be removed by the portion 12. As shown in the first (J) diagram, the packaging substrate 14 on which the substrate reference hole 10 and the wiring pattern 13 are simultaneously formed is completed.

又,將藉由蝕刻所形成的導體圖形做為光罩加工有底溝11,以押壓方式去除有底溝11所包圍的充填劑層5積層及第2導體層7積層的基板不需要部份12,藉此形成基板基準孔10,即可不必準備高價的金屬模具,而輕易進行圓孔、甚至長孔及其他所希望形狀的孔狀加工。 Further, the conductor pattern formed by the etching is used as the mask-processed bottomed groove 11, and the layer of the filler layer 5 surrounded by the bottomed groove 11 and the substrate unnecessary portion of the second conductor layer 7 are removed by pressing. By forming the substrate reference hole 10 by this, it is possible to easily perform round hole processing, even long holes, and other hole-like processing of a desired shape without preparing an expensive metal mold.

第2(a)圖為封裝用基板14的基板基準孔10雷射 光入射面側的平面照相圖,第2(b)、(c)圖為含基板基準孔10的半斷面照相圖,第2(d)圖為基板基準孔之雷射光入射面平面照相圖。 2(a) is a substrate reference hole 10 laser for the package substrate 14 A plan view of the light incident surface side, a second half view of the substrate reference hole 10 in the second (b) and (c), and a plan view of the laser light incident surface of the substrate reference hole in the second (d) .

如第2(b)、(c)圖所示,藉由形成較易以雷射加工的充填劑層5,即可避免基板基準孔10孔壁面淪為粗糙,而得以形成基準孔10與配線圖形14位置精度良好,加工精密的基準孔10。 As shown in the second (b) and (c), by forming the filler layer 5 which is easy to be processed by laser, the hole wall surface of the substrate reference hole 10 can be prevented from being rough, and the reference hole 10 and the wiring can be formed. The pattern 14 has a good positional accuracy and is machined with a precision reference hole 10.

此外,本發明中雖然使用熱硬化性填孔用墨水為充填劑,但亦可使用其他以高密度充填有粒徑細膩的充填物,其貫通性、充填性、研磨性及雷射加工性優良的絕緣樹脂材料。 Further, in the present invention, although the thermosetting hole-filling ink is used as a filler, other fillers having a fine particle size filled with a high density may be used, and the penetration property, the filling property, the polishing property, and the laser processability are excellent. Insulating resin material.

1‧‧‧絕緣樹脂材 1‧‧‧Insulating resin

2‧‧‧導電層 2‧‧‧ Conductive layer

3‧‧‧基板 3‧‧‧Substrate

4‧‧‧貫通孔 4‧‧‧through holes

5‧‧‧充填劑層 5‧‧‧Fill layer

6‧‧‧第1導體層 6‧‧‧1st conductor layer

6a‧‧‧第1導體圖形 6a‧‧‧1st conductor pattern

7‧‧‧第2導體層 7‧‧‧2nd conductor layer

7a、7b‧‧‧第2導體圖形 7a, 7b‧‧‧2nd conductor pattern

8‧‧‧第1開口圖形 8‧‧‧1st opening graphic

8a‧‧‧圖形8之緣部 8a‧‧‧The edge of the figure 8

L‧‧‧雷射光 L‧‧‧Laser light

10‧‧‧基板基準孔 10‧‧‧Substrate reference hole

11‧‧‧有底溝 11‧‧‧ with bottom ditch

12‧‧‧基板不需要部份 12‧‧‧The substrate does not need part

13‧‧‧配線圖形 13‧‧‧ wiring pattern

14‧‧‧封裝用基板 14‧‧‧Package substrate

15‧‧‧押壓部材 15‧‧‧Pressing parts

Claims (6)

一種基板基準孔之加工方法,包含:穿孔開設貫通孔於其絕緣樹脂基材兩面具有導電層之基板的開孔程序;充填用以埋填該貫通孔的充填劑,以封閉該貫通孔的程序;研磨該充填劑,而與形成於該基板兩面的導電層全面均勻平坦化的程序;在基板兩面連續施行無電解金屬鍍及電場金屬鍍,以形成覆蓋該充填劑之第1、第2導電層的程序;將積層於該充填劑層的第1導電層蝕刻去除,以形成第1導體圖形,同時形成第1開口圖形以露出墊底的該充填劑層的程序;將該第2導電層蝕刻去除,以形成露出墊底之該充填劑層的第2開口圖形,而形成對向於該第1開口圖形之第2導體圖形的程序;從該第1導體層側以該第1導體層為光罩,將雷射光沿該第1開口圖形之緣部照射掃描露出於該第1開口圖形之該充填劑層而去除,以形成該第2導體層為底部之有底溝的程序;及押壓該有底溝所包圍之至少該充填劑層及積層有該第2導體層的基板不需要部份而去除,以形成基板基 準孔的程序;其中該基板基準孔尺寸與位置,係決定於去除該充填劑層後之該有底溝上形成有該第1開口圖形之該第1導電層的孔之尺寸與位置。 A method for processing a substrate reference hole, comprising: a hole opening process of piercing a substrate having a conductive layer on both sides of the insulating resin substrate; and filling a filling agent for filling the through hole to close the through hole a procedure of grinding the filler to uniformly and uniformly planarize the conductive layers formed on both sides of the substrate; continuously performing electroless metal plating and electric field metal plating on both sides of the substrate to form first and second conductive layers covering the filling agent; a program of a layer; a process of etching a first conductive layer laminated on the filler layer to form a first conductor pattern while forming a first opening pattern to expose the filler layer of the underlayer; etching the second conductive layer Removing the second opening pattern of the filler layer exposing the bottom of the underlayer to form a second conductor pattern facing the first opening pattern; and forming the first conductor layer from the first conductor layer side a mask that irradiates the laser beam along the edge of the first opening pattern and scans the filler layer exposed in the first opening pattern to form a bottomed groove having a bottom portion of the second conductor layer; and pressing The bottomed groove surrounds the filler is at least of the laminate layer does not need to have a substrate portion of the second conductive layer is removed, the substrate to form the group The procedure of the quasi-hole; wherein the size and position of the reference hole of the substrate are determined by the size and position of the hole of the first conductive layer on which the first opening pattern is formed on the bottomed trench after removing the filler layer. 如申請專利範圍第1項之基板基準孔之加工方法,其中所述充填劑層,係使用充填物用之熱硬化性填孔用墨水為充填劑,以濾篩方法塗佈,加熱硬化所形成者。 The method for processing a substrate reference hole according to the first aspect of the invention, wherein the filler layer is formed by using a hot hardenable hole-filling ink for a filler as a filler, coating by a sieve method, and heat hardening. By. 如申請專利範圍第1或2項之基板基準孔之加工方法,其中所述基板基準孔之形成,係使形成有該第1開口圖形之該第1導體層的孔尺寸為最小尺寸者。 The method for processing a substrate reference hole according to the first or second aspect of the invention, wherein the substrate reference hole is formed such that a size of a hole of the first conductor layer on which the first opening pattern is formed is a minimum size. 如申請專利範圍第1項之基板基準孔之加工方法,其中形成該有底溝底部之該第2導體圖形的外形尺寸,係較大於所對向之該第1開口圖形的外形尺寸。 The method of processing a substrate reference hole according to claim 1, wherein an outer dimension of the second conductor pattern forming the bottom of the bottomed trench is larger than an outer dimension of the first opening pattern. 如申請專利範圍第1項之基板基準孔之加工方法,其中所述基板不需要部份,係藉由押壓部材的押壓,空氣壓力的施加,或施加含有振動的任何外力,使該第2導體圖形與該充填劑層,或該充填劑層及絕緣樹脂基材互相剝離而去除。 The method for processing a substrate reference hole according to the first aspect of the invention, wherein the substrate does not require a portion, the pressing force of the pressing member, the application of air pressure, or the application of any external force containing vibration, so that the first The 2 conductor pattern and the filler layer or the filler layer and the insulating resin substrate are peeled off from each other and removed. 如申請專利範圍第1項之基板基準孔之加工方法,於形成第1開口圖形及第2導體圖形後,至少對該第1導體層各形成以鍍鎳層及鍍金層之積層後,透過該第1開口圖形照射雷射光於該充填劑層。 The method for processing a substrate reference hole according to the first aspect of the invention, after forming the first opening pattern and the second conductor pattern, forming a layer of a nickel plating layer and a gold plating layer on each of the first conductor layers, and then transmitting the layer The first opening pattern illuminates the laser light onto the filler layer.
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