TW201109119A - Supporting pad - Google Patents
Supporting pad Download PDFInfo
- Publication number
- TW201109119A TW201109119A TW98132165A TW98132165A TW201109119A TW 201109119 A TW201109119 A TW 201109119A TW 98132165 A TW98132165 A TW 98132165A TW 98132165 A TW98132165 A TW 98132165A TW 201109119 A TW201109119 A TW 201109119A
- Authority
- TW
- Taiwan
- Prior art keywords
- holding
- sheet
- resin sheet
- polyurethane resin
- foaming
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
- B24B41/068—Table-like supports for panels, sheets or the like
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Abstract
Description
201109119 六、發明說明: 【發明所屬之技術領域】 本發明係有關於一種保持墊,特別是有關於一種 具備保持被研磨物用保持面的樹脂薄片的保持墊。此 樹脂薄片係透過濕式凝固法而形成有縱型發泡。 【先前技術】 目刖,半導體用石夕晶圓(WF)、平行平面板(fpd) 用玻璃基板或者是硬碟用基板等各種材料(被研磨物) 的表面(加工面),為提升其平坦性,因而使用具備對 向配置的二個平台之研磨機進行研磨加工。於此等被 =磨物中,就半導體用矽晶圓(WF)而言,由於需伴隨 著所應用之攜帶型機器等的小型化,有效率地製作基 板,因此提供作為研磨加工之被研磨物則有大型化的[Technical Field] The present invention relates to a holding mat, and more particularly to a holding mat having a resin sheet for holding a holding surface for an object to be polished. This resin sheet is formed into a longitudinal foam by a wet coagulation method. [Prior Art] The surface (processed surface) of various materials (objects to be polished) such as a glass substrate for a semiconductor or a substrate for a hard disk (Fpd) for use in semiconductors is improved. Flatness is thus performed by using a grinder having two platforms arranged in opposite directions. In the above-mentioned semiconductor wafers, the semiconductor wafer (WF) is required to be manufactured as a polishing process because it is required to be compacted in accordance with the miniaturization of the portable device or the like to be applied. Large-scale
傾向。另外,就FPD用玻璃基板而言,為對應於FPD 本身的大型化,薄板化,其被研磨物之玻璃基板亦有 大型化、薄板化的傾向。就此種大型化、薄板化之被 7磨物而言,針對其平坦性之要求度亦隨之越來越 南〇 舉例來5兒,當要將被研磨物進行單面研磨加工 時’在研磨機的其中之一平台上裝設研磨墊,而在另 一平台上’被研磨物則保持成與研磨墊對向,於研磨 加工時’於被研磨物與研磨墊間,供給含有研磨粒子 (磨粒)的研磨漿’朝被研磨物施加研磨壓力(按壓 力)°為避免因被研磨物與平台間的接觸而受到損 傷’通常是在保持被研磨物用的平台上,裝設有保持 塾。亦即,藉由保持墊以在研磨處理中,暫時保持被 201109119 研磨物。 ^習知技術係有如日本特開2006_62059號公報所 的一種使用具備有藉由濕式凝固法所形成的發 f構造的軟質的胺基甲酸酯薄片(樹脂薄片)的保 ^ ’以於上述研磨處理作為保持墊使用。在藉由 =法所形成的胺基甲酸§旨薄片巾,由於表面層^ 2)的表面(保持面)具有平滑性,故被研磨物之保持性 巧。此外,在比表面層還内側上,形成有橫跨大致 eliiS大小的縱型發泡。因此’在遭受研磨加工 :的:磨壓力而壓縮時,可藉此縱型發泡發揮緩衝 ’因研㈣力而使被研磨物所承 生不均勻現象,造成應力集中在朝保持塾 ,入的被研磨物的凸部上,此應力集中部分會 又:磨而造成研磨不均的問題。反之,當縱型. 的緩衝性增而時’被研磨物所承受的應力較不易產生 :句勻見t雖然可藉此提尚被研磨物的表面平 二二但卻同時會有因陷入程度變大而造成保持墊 也^研削的可能性。因此,通常在濕式凝固法中身 :=旨等的選定及各種添加劑來調整發泡的尺寸 中,,濕式凝固法所取得的胺基甲酸 ”分與發泡間的樹脂的部分產生密度不均之: 產因此,在發泡形成部分和樹脂部分,於研磨= 工時而被施加研磨壓力時的壓縮變形量合 :法ΐ分滿足針對上述那種薄板化;型化的、 被研磨物的焉度平坦性的要求。亦即,當在保持墊上 4 201109119 具有密度不均現象的同時,施加於被研磨物之應力 大小也會局部地相異,所以會變得難以遍及加:面的 整體區域進行均-地研磨加工,而有損面㈣一性。 若可減低壓縮變形量之不均,而可提高保持面之平坦 性精度,則可滿足對被研磨物之高度面内均一性的要 求。 【發明内容】 雲於上述習知問題,本發明之其中—目的就是在 提供-種保持墊’特別是可提高保持面的平坦性精 度,且提升被研磨物的面内均一性的一種保持墊。 為解決上述課題,本發明的保持墊係具備有一樹 脂薄片,此樹脂薄 所具有之保持面可用以保持被研 磨物’其保持面係藉由濕式凝固法所形成的縱型發 泡。其特徵在於,上述樹脂薄片是自前述保持面的背 面至朝向内側的厚度全體10%份量為止的範圍内形 成前述發泡的底部。且自前述背面至朝向内侧的厚度 ,體10%份量’與前述背面相平行的剖面,和自前: 背面至朝向内側的厚度全體40%份量,與前述背面相 平行的剖面,此兩剖面所包挾的下層部的空 介於70%以上95%以下。 本發明中,由於樹脂薄片在保持面之背面侧中, 具有一定厚度份量的下層部的空隙率為介於7〇 上㈣以下’所以可藉由此下層部,以確保緩衝性, 使得施加於被研磨物的負荷可得以分散,因而可減_ 伴隨著研磨加工而被壓縮時的下層部的發泡形狀變 化,對被研磨物所產生之負擔,進*可提高保持面的 201109119 平坦性精度使被研磨物的面内均一性提升。 在此情況下,樹脂薄片在與自保持面算起朝向内 侧的厚度全體10%份量,與保持面平行的剖面上,由 發泡所形成之孔之平均孔徑設定為A,且於下層部 中’與保持面平行的剖面上’由發泡所形成之孔之最 大孔徑設定為B時,則比值B/A較佳為介於2〇〜5〇 的範圍。此外,自保持面起算朝向内侧的厚度全體 10 /。伤畺,與保持面平行的剖面,和自前述保持面起 算朝向内側的厚度全體40%份量’與前述保持面相平 行的剖面’此兩剖面所包挾的上層部的空隙率可介於 35%以上55%以下。樹脂薄片的下層部的空隙率較佳 為介於75%以上90%以下,而,上層部的空隙率較佳為 介於40%以上50%以下。於樹脂薄片的下層部上,^ 與保持面平行的剖面當中的每單位面積,顯示因發泡 所形成的孔的總面積的比率為最大時的剖面,其比率 的最大值可介於80%以上95%以下。樹脂薄片亦可以 聚胺酯樹脂形成。在樹脂薄片的各發泡間的聚胺酯樹 脂亦可形成微多孔狀。此時,可將聚胺酯樹脂的1 〇 〇 % 模量值设定為低於20Mpa者較佳。亦可在樹脂薄片 的背面側上,再塗布用以裝設於研磨機上所需的黏著 材。此時,亦可在樹脂薄片和黏著材間,再貼合用以 支撐樹脂薄片用的支撐材。 根據本發明,由於樹脂薄片在保持面的背面側中 具有一定厚度份量的下層部的空隙率係介於7〇%以 上95%以下,所以藉由下層部,可確保其緩衝性使 得施加於被研磨物上的負荷可得以分散,因而可減輕 201109119 伴隨著研磨加工而被壓縮時的下層部的發泡形狀變 化,對被研磨物所產生之負擔,進而可達到提高 面的平坦性精度使被研磨物的面内均一性提升的 果。 夕 【實施方式】 以下’兹參照圖式,針對適用本發明之保持 實施形態進行說明。 本實施形態之保持墊的結構係如第丨圖所示,本 實施形態中保持墊10,具備胺基甲酸酯薄片2以作 為聚胺酯樹脂製的樹脂薄片。聚胺基曱酸酯薄片2係 藉由濕式凝固法形成,具有保持被研磨物用的保持面 Sh ° 胺基曱酸酯薄片2,係具有在横跨保持面Sh將 近數μιη左右的厚度範圍内,形成有緻密的微多孔的 表面層2a。亦即,表面層2a具有微多孔構造。在比 胺基甲酸酯薄片2的表面層“較為内侧(内部)上,形 成多個略均等分散狀態的發泡3。發泡3的大小,約 為橫跨胺基甲酸酯薄片2的大約厚度全體之大小,在 厚度方向上形成為縱長狀且帶有圓形的圓錐狀。胺基 甲酉文g曰薄片2因具有表面層2a,所以在保持面Sh上, 未形成發泡3的開口。此外,在胺基甲酸酯薄片2中, 從保持面Sh的背面(以下,稱為背面Sr。)至朝向内 側厚度全體10%份量為止的範圍内,形成有發泡3 的底部。在發泡3彼此間的聚胺酯樹脂中,形成有比 發泡3還小的微多孔(未圖示)。在胺基甲酸酯薄片2 中’表面層2a的微多孔、發泡3及微多孔呈網目狀 201109119 地相互連通,且具有發泡是 發泡構造。 以形成連續發泡狀的連續 在„酸醋薄片2中,自背面心起算朝向内 貝目距疋厚度全體的1G%份量的與背面Sr平行的气 面,和在朝向内側相距是厚度全體的概份量的與& 面Sr平订的剖面,此兩剖面所包挟的下層部p 隙率,係調整為介於70%以上95%以下。亦即, ^甲丨f酯薄片2的厚度設定為t時,自背面Sr朝向 内側:广的厚度份量的剖面,和朝向内側相距 的厚度份量的剖面’此㈣面所包挾的下層部& 中,基於發泡3的空隙率是介於75〜95%的範圍。相 對=,自保持ssh車月向内側相距是厚度全體的ι〇% 伤里的與保持面Sh平行的剖面,和朝向内侧相距是 厚度全體的40%份量的與保持面%平行的剖面,此 兩剖面所包挾的上層部押的空隙率,係調整為介於 =以上55/〇以下。亦即’自保持面%起算朝向内 側相距O.lt的厚度份量的剖面,和朝向内側相距 的厚度份量的剖面,此兩剖面所包挾的上層部孙 中’根據發泡3的空隙率是介於35〜55%的範圍。此 種上層部P b或下層部P r的空隙率可透過所使用的聚 胺酯樹脂的選定、濕式凝固法的條件設定而加以調整 (詳如後述)。 此外’在胺基甲酸醋薄片2中,自保持面讪起 算朝向内側相距是厚度全㈣1〇%份量的與保持面 sh平行的剖面上,具有根據發泡3所形成的孔,當 該孔之平均孔徑設定為A的同時,下層部巧盥背面 8 201109119tendency. In addition, the glass substrate for FPD tends to be large and thin, and the glass substrate of the object to be polished tends to be larger and thinner in accordance with the increase in size of the FPD itself. In the case of such a large-scale, thin-plated 7-grinding material, the requirement for flatness is also becoming more and more important. For example, when the object to be ground is subjected to single-side grinding, 'in the grinding machine One of the platforms is provided with a polishing pad, and on the other platform, the object to be polished is kept opposite to the polishing pad, and during the grinding process, the abrasive particles are supplied between the object to be polished and the polishing pad. The slurry of the granules is subjected to a grinding pressure (pressing force) to the object to be ground. In order to avoid damage due to contact between the object and the platform, it is usually placed on a platform for holding the object to be polished. . That is, by holding the mat to temporarily hold the 201109119 abrasive in the grinding process. In the above-mentioned Japanese Patent Application Laid-Open No. 2006-62059, a soft urethane sheet (resin sheet) having a hair fring structure formed by a wet coagulation method is used. The grinding treatment is used as a holding mat. In the sheet towel of the amino acid formic acid formed by the = method, since the surface (holding surface) of the surface layer 2) has smoothness, the object to be polished is retained. Further, on the inner side of the surface layer, vertical foaming having a size of approximately eliiS is formed. Therefore, when subjected to grinding processing: when the pressure is compressed, the longitudinal foaming can be used to buffer the 'inferiority of the workpiece due to the force of the grinding (four) force, causing the stress to concentrate on the enthalpy. On the convex portion of the object to be polished, this stress concentration portion may again be caused by grinding and causing uneven grinding. On the other hand, when the cushioning property of the vertical type increases, the stress on the object to be polished is less likely to occur: although the sentence uniformity t can be used to raise the surface of the object to be polished, but at the same time, there is a degree of collapse. It becomes larger and causes the possibility that the pad is also ground. Therefore, in the wet solidification method, the selection of the body and the various additives are used to adjust the size of the foam, and the density of the portion of the amino acid obtained by the wet coagulation method and the resin between the foams is not. In the case of the foam forming portion and the resin portion, the amount of compressive deformation when the grinding pressure is applied during the grinding = working time is equal to the thinning of the above-mentioned type; The requirement of the flatness of the twist. That is, when the density of the unevenness on the holding mat 4 201109119 is different, the stress applied to the object to be polished is locally different, so it becomes difficult to apply the surface: The whole area is subjected to the uniform-ground grinding process and the damaged surface (four). If the unevenness of the compression deformation can be reduced and the flatness accuracy of the holding surface can be improved, the in-plane uniformity of the object to be polished can be satisfied. [Explanation] [Summary of the Invention] The cloud is in the above-mentioned conventional problems, and the object of the present invention is to provide a kind of holding pad, in particular, to improve the flatness accuracy of the holding surface and to improve the in-plane of the object to be polished. In order to solve the above problems, the holding mat of the present invention is provided with a resin sheet having a holding surface which can be used to keep the object to be polished, which is formed by a wet coagulation method. In the longitudinal direction of the resin sheet, the foamed bottom portion is formed in a range from the back surface of the holding surface to the inner side by 10% by weight. The thickness from the back surface to the inner side is 10% of the body's cross section parallel to the back surface, and 40% of the total thickness from the back side to the inner side, a section parallel to the back surface, and the space of the lower part of the two sections is 70% In the present invention, the resin sheet has a porosity of 7 〇 (four) or less in the lower layer portion of the holding surface on the back surface side of the holding surface, so that the lower layer portion can be used to secure the buffer. Sexuality, so that the load applied to the object to be polished can be dispersed, so that the foaming shape of the lower layer portion when compressed by the grinding process can be reduced, and the pair is ground. In addition, the in-plane uniformity of the object to be polished can be improved by the accuracy of the flatness of the surface of the surface of the surface of the surface of the surface of the surface of the surface of the surface. On the cross section parallel to the holding surface, the average pore diameter of the pore formed by the foaming is set to A, and the maximum pore diameter of the pore formed by the foaming in the lower cross section of the 'parallel to the holding surface' is set to B. In addition, the ratio B/A is preferably in the range of 2 〇 to 5 。. Further, the entire thickness of the inner surface from the holding surface is 10 /. The flaw, the section parallel to the holding surface, and the orientation from the holding surface 40% of the thickness of the inner side is 'the cross section parallel to the holding surface'. The porosity of the upper layer portion covered by the two cross sections may be 35% or more and 55% or less. The void ratio of the lower portion of the resin sheet is preferably It is 75% or more and 90% or less, and the void ratio of the upper layer portion is preferably 40% or more and 50% or less. On the lower layer portion of the resin sheet, the area per unit area in the cross section parallel to the holding surface shows the ratio at which the ratio of the total area of the pores formed by the foaming is maximum, and the maximum value of the ratio may be 80%. Above 95%. The resin sheet may also be formed of a polyurethane resin. The polyurethane resin in the respective foaming of the resin sheet may also be formed into a microporous shape. In this case, it is preferred to set the 1 〇 〇 % modulus value of the polyurethane resin to less than 20 MPa. It is also possible to apply an adhesive material for mounting on a grinder on the back side of the resin sheet. At this time, a support material for supporting the resin sheet may be bonded between the resin sheet and the adhesive. According to the present invention, since the porosity of the lower layer portion having a certain thickness portion in the back surface side of the holding surface is between 7% and 95%, the cushioning property can be ensured by the lower layer portion. The load on the polishing material can be dispersed, so that the foaming shape change of the lower layer portion when the film is compressed by the polishing process can be reduced, and the burden on the object to be polished can be improved, thereby improving the flatness accuracy of the surface. The effect of the in-plane uniformity of the abrasive. [Embodiment] Hereinafter, a holding embodiment to which the present invention is applied will be described with reference to the drawings. The structure of the holding mat of the present embodiment is as shown in the figure. In the present embodiment, the holding mat 10 is provided with a urethane sheet 2 as a resin sheet made of a polyurethane resin. The polyamino phthalate sheet 2 is formed by a wet coagulation method, and has a holding surface Sh ° urethane phthalate sheet 2 for holding an object to be polished, and has a thickness of about several μηη across the holding surface Sh. Within the range, a dense microporous surface layer 2a is formed. That is, the surface layer 2a has a microporous structure. A plurality of foams 3 in a slightly uniform dispersion state are formed on the inner side (inside) of the surface layer of the urethane sheet 2. The size of the foam 3 is approximately the width of the urethane sheet 2 The size of the entire thickness is approximately long in the thickness direction and has a rounded conical shape. The amine-based methacrylate sheet 2 has a surface layer 2a, so that no foaming is formed on the holding surface Sh. In the urethane sheet 2, the foam 3 is formed in a range from the back surface of the holding surface Sh (hereinafter referred to as the back surface Sr) to the inner thickness of 10% by weight. In the polyurethane resin between the foams 3, micropores (not shown) smaller than the foaming 3 are formed. In the urethane sheet 2, 'the microporous surface layer 2a, foam 3 And the microporous mesh-like shape 201109119 is connected to each other and has a foaming structure. In order to form a continuous foaming shape, in the vinegar sheet 2, the 1G from the back core is oriented toward the inner thickness of the inner shell. % of the air surface parallel to the back Sr, and the distance from the inside is Almost the entire amount of the & Sr stitch sectional plane, the two p-sectional view of the package porosity lower nip portion, based adjusted to be between 70% to 95% or more. That is, when the thickness of the ?-f-ester sheet 2 is set to t, the section from the back surface Sr toward the inside: a section having a wide thickness portion and a section of the thickness portion facing the inner side 'the lower layer portion & In the case, the void ratio based on the foaming 3 is in the range of 75 to 95%.相对 , , 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车 车The void ratio of the upper layer of the two sections is adjusted to be less than or equal to 55/〇. That is, the section from the thickness of the thickness of the inside of the holding surface % to the inside of the O.lt, and the section of the thickness of the portion facing the inner side, the upper part of the two sections is covered by the void ratio of the foaming 3 Between 35~55% range. The void ratio of the upper layer portion Pb or the lower layer portion Pr can be adjusted by the selection of the polyurethane resin to be used and the conditions of the wet solidification method (described later). Further, in the urethane sheet 2, the cross section from the holding surface is a section which is parallel to the holding surface sh in a thickness of all (four) 1% by weight, and has a hole formed according to the foaming 3, when the hole The average aperture is set to A while the lower part is clever on the back 8 201109119
Si*平行的剖面當中的每單 成的孔的總面積的比率(以下面:二因= =面=面上形成有孔,該孔之最大孔= 為B時,騎大孔徑B對平均孔徑a之 調整為介於20〜50的範圍。亦即,具 项^ 成鄰近保持面Sh的發泡的平均孔徑的加〜^^ 此種發泡是形成在下層部pr中的開口口 顯不為最大值的剖面上。此外,開口率的最大值可調 整為介於80%以上95%以下。 S° sh 種胺基甲酸酯薄片2 $,她於鄰近保持面 ”保持面%平行的剖面上所形成的孔,鄰近背面 Sr與背面Sr平行的剖面上所形成的孔,係形成相互 接近的狀態。如第2(A)圖所示,鄰近保持面Sh自保 持f Sh起算相距胺基甲酸酯薄片2的厚度1的1〇% 份量的位置即,朝向内侧在〇u份量的位置(箭 頭B的位置),而鄰近背面Sr自背面心起算朝向内 側相距0. it份量的位置(箭頭c的位置)^在此情況, 如第2(B)圖所示,鄰近保持面北的B_B線剖面中, 藉由發泡3所形成的孔是呈相互疏離。反之,如第 2(C)圖所示,鄰近背面Sr的c_c線剖面中藉由發泡3 所形成的孔是呈相互接近。 此外,保持墊10為,在胺基甲酸酯薄片2的背 面Sr側上’貼合有作為黏著材的雙面膠帶7,用以將 保持墊10裝設於研磨機。雙面膠帶7具有未圖示的 基材,在基材的兩面上分別形成有丙烯酸系黏著劑等 感壓型黏著劑層(未圖示)^基材是使用例如聚對笨二 201109119 甲酸乙二酯(以下,簡稱為PET。)製薄膜等可撓性薄 膜。雙面膠帶7是藉由基材的一面侧上的黏著劑層, 而與胺基甲酸酯薄片2貼合,另一面側(胺基甲酸酯 薄片2之相反側)的黏著劑層的表面則由剝離紙8所 覆蓋。此外’就本實施形態而言,此雙面膠帶7的美 材也可兼用作為支撐胺基曱酸酯薄片2用的支樓材= 以下,將就保持墊之製造方式進行說明,保持墊 1 〇是將藉由濕式凝固法形成的胺基甲酸g旨薄片2與 雙面膠帶7相互貼合所製造而成。亦即,係包含,調 製聚胺醋樹脂溶液的準備步驟、於成膜基材上塗布聚 胺酯樹脂溶液,並於凝固液中,使聚胺酯樹脂溶液凝 固再生成聚胺酯樹脂的凝固再生步驟、將薄片狀的聚 胺酯樹脂加以洗淨,並使其乾燥的洗淨/乾燥步驟以 及貼合所取得之胺基甲酸酯薄片2和雙面膠帶7的層 壓步驟專製作保持整1 〇。以下,茲依照各步驟順序 進行說明之。 準備步驟係為混合聚胺酯樹脂、可溶解聚胺醋樹 脂的水混和性有機溶媒及添加劑,將聚胺酯樹脂溶 解。可列舉Ν,Ν·二甲基曱醯胺(以下,簡稱為DMF。) 或N,N-二曱基乙醯胺(DMAc)等作為有機溶媒, 本實施形態中係使用DMF作為有機溶媒。聚胺酯樹 月曰可自聚醋系、聚系、聚碳酸酯系等樹脂中選擇其 中一種來使用。當考慮要形成上述的發泡構造時,則 可於DMF中溶解有20重量%的聚胺酯樹脂的樹脂溶 液中,使用B型旋轉黏度計於2fC下所測定的黏度 較佳為選定黏度介於5〜l〇pa.s的範圍間的樹脂來使 201109119 用。此外,所使用的聚胺酯樹脂較佳為具有低於 2〇MPa的100%模量值,此聚胺酯樹脂可於DMF中溶 解成為介於10〜30重量%的範圍。此外,作為添加 劑,因為要控制發泡3的尺寸或數量(個數),故可使 用碳黑等顏料、促進發泡的親水性添加劑、使聚胺酯 樹脂的再生穩定化的疏水性添加劑等。將所得之溶液 在減壓環境下,進行脱泡而取得聚胺酯樹脂溶液。 於凝固再生步驟中,將準備步驟中所得之聚胺酯 樹脂溶液,於常溫下利用刀式塗布機等塗布裝置,於 帶狀的成膜基材上略均一地塗布成薄片狀。此時,可 透過調整刀式塗布機等與成膜基材間的間隙 (clearance),來調整樹脂溶液之塗布厚度(塗布 量)。成膜基材可使用樹脂製薄膜、布率、不織布等, 於本實施形態中則是使用PET製薄膜。 將塗布於成膜基材上的聚胺酯樹脂溶液,連續地 引導至對聚胺酯樹脂而言為不良溶媒的以水為主要 成分的凝固液(水系凝固液)中。為了調整聚胺酯樹 脂的再生速度,亦可於凝固液中添加DMF或DMF 以外的極性溶媒等有機溶媒,但於本實施形態中,則 是使用水。於凝固液中,首先,在聚胺酯樹脂溶液與 凝固液間的界面形成皮膜,在接近皮膜的聚胺酯樹脂 中,形成可構成表面層2a用的微多孔。接著,藉由 聚胺酯樹脂溶液中的DMF的朝凝固液中的擴散以及 對聚胺酯樹脂中水的浸入的調和現象,而進行再生具 有連續發泡構造的聚胺酯樹脂。此時,由於成膜基材 的PET製薄膜,水(凝固液)無法浸透,故在表面The ratio of the total area of each single hole in the Si* parallel profile (below: two factors = = face = hole formed on the face, the maximum hole of the hole = B, riding the large aperture B to the average aperture The adjustment of a is in the range of 20 to 50. That is, the addition of the average pore diameter of the foam adjacent to the holding surface Sh is such that the foam is formed in the opening of the lower layer portion pr. In addition, the maximum opening ratio can be adjusted to be between 80% and 95%. S° sh urethane sheet 2 $, she is adjacent to the holding surface" The hole formed in the cross section, the hole formed in the cross section parallel to the back surface Sr and the back surface Sr is in a state of being close to each other. As shown in Fig. 2(A), the adjacent holding surface Sh is separated from the holding f sh The position of the thickness 1 of the urethane sheet 2 is 1 〇 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置 位置(Position of arrow c) ^ In this case, as shown in Fig. 2(B), in the section of the B_B line adjacent to the north of the holding surface, The holes formed by the foaming 3 are alienated from each other. Conversely, as shown in Fig. 2(C), the holes formed by the foaming 3 in the c_c line section adjacent to the back surface Sr are close to each other. In the holding mat 10, a double-sided tape 7 as an adhesive material is attached to the back surface Sr side of the urethane sheet 2 to mount the holding mat 10 to the grinder. In the base material shown, a pressure-sensitive adhesive layer (not shown) such as an acrylic adhesive is formed on both surfaces of the substrate. The base material is, for example, Poly Pair 2, 201109119 ethylene formate (hereinafter, simply referred to as PET.) A flexible film such as a film. The double-sided tape 7 is bonded to the urethane sheet 2 by an adhesive layer on one side of the substrate, and the other side (urethane) The surface of the adhesive layer on the opposite side of the sheet 2 is covered with the release paper 8. Further, in the present embodiment, the beauty material of the double-sided tape 7 can also be used as the supporting amine phthalate sheet 2 Branch material = below, will explain the way to keep the pad, keep the pad 1 〇 will be wet The urethane formed by the solid method is prepared by laminating the sheet 2 and the double-sided tape 7. That is, the preparation step of preparing the polyurethane resin solution, and coating the polyurethane resin solution on the film-forming substrate And a coagulation regeneration step of coagulating the polyurethane resin solution to form a polyurethane resin in the coagulating liquid, washing the flaky polyurethane resin, drying and drying the drying/drying step, and bonding the obtained amine group A The lamination step of the acid ester sheet 2 and the double-sided tape 7 is specifically made to maintain a uniform enthalpy. Hereinafter, the steps will be described in the order of the steps. The preparation steps are a mixture of a polyurethane resin and a water-miscible organic resin capable of dissolving the polyurethane resin. The solvent and the additive dissolve the polyurethane resin. As an organic solvent, hydrazine, dimethyl decylamine (hereinafter abbreviated as DMF) or N,N-dimercaptoacetamide (DMAc) may be used. In the present embodiment, DMF is used as an organic solvent. Polyurethane tree The ruthenium can be selected from one of resins such as polyacetal, poly, and polycarbonate. When it is considered that the foaming structure described above is to be formed, the viscosity of the resin solution which is soluble in 20% by weight of the polyurethane resin in the DMF is preferably selected to be 5 at a viscosity of 2 °C using a B-type rotational viscometer. ~l〇pa.s range of resin to make 201109119 use. Further, the polyurethane resin to be used preferably has a 100% modulus value of less than 2 MPa, and the polyurethane resin can be dissolved in DMF to be in the range of 10 to 30% by weight. Further, as the additive, since the size or the number (number) of the foam 3 is to be controlled, a pigment such as carbon black, a hydrophilic additive for promoting foaming, and a hydrophobic additive for stabilizing the regeneration of the polyurethane resin can be used. The obtained solution was defoamed under reduced pressure to obtain a polyurethane resin solution. In the coagulation and regeneration step, the polyurethane resin solution obtained in the preparation step is applied to the strip-shaped film-forming substrate in a sheet form at a normal temperature by a coating device such as a knife coater. At this time, the coating thickness (coating amount) of the resin solution can be adjusted by adjusting the clearance between the knife coater and the like and the film formation substrate. As the film-forming substrate, a resin film, a cloth ratio, a nonwoven fabric or the like can be used. In the present embodiment, a film made of PET is used. The polyurethane resin solution applied to the film-forming substrate is continuously guided to a coagulating liquid (aqueous coagulating liquid) containing water as a main component of the polyurethane resin. In order to adjust the rate of regeneration of the polyurethane resin, an organic solvent such as a polar solvent other than DMF or DMF may be added to the coagulating liquid. However, in the present embodiment, water is used. In the coagulating liquid, first, a film is formed at the interface between the polyurethane resin solution and the coagulating liquid, and a microporous layer which can constitute the surface layer 2a is formed in the polyurethane resin close to the film. Next, the polyurethane resin having a continuous foaming structure is regenerated by the diffusion of DMF in the polyurethane resin solution into the coagulating liquid and the incorporation of water into the polyurethane resin. At this time, since the PET film formed on the film-forming substrate, water (coagulating liquid) cannot penetrate, so on the surface
[S 11 201109119 2a側發生DMF與水的置換,成膜基材側係形成較表 面層2a侧還大的發泡3。 於此’茲就隨聚胺酯樹脂的再生而伴隨而來的發 泡形成進行說明。在聚胺酯樹脂上,因為凝集力變 大’因而在接近皮臈的聚胺酯樹脂中,急速地進行再 生’而形成表面層2a。於本實施形態中,是使用ι〇〇% 模量值低於20MPa的聚胺酯樹脂。且顯示此聚胺酯 樹脂溶液的黏度介於5〜l〇pa.s的範圍。亦即,使用 低模量的聚胺酯樹脂溶解成低黏度的聚胺酯樹脂溶 液。因此’在表面層2a形成後,凝固前的聚胺酯樹 月曰溶液中之聚胺酯樹脂移動至表面層側並凝集的 同時,在成膜基材側則伴隨著聚胺酯樹脂量的減少, 因此與表面層2a侧相比,係形成肥大化的發泡3。 換吕之,與上層部Ph相比於下層部Pr中,因發泡3 肥大化,而促使空隙率變大。再者,自DMF的聚胺 酯樹脂溶液而來的脱溶媒,亦即,藉由DMF與水間 的置換,而形成表面層2a、發泡3及微多孔,表面 層2a的微多孔、發泡3及微多孔係呈網目狀地相互 連通。此外,由於聚胺酯樹脂於成膜基材上可再生, 所以在與成膜基材的表面接觸而形成的背面&中, 未形成發泡3的開口。 在洗淨/乾燥步驟中,將於再生步驟中所再生的 聚胺醋樹脂,以水等之洗淨液中洗淨,以除去殘留在 聚胺醋樹脂中的卿|,使其乾燥。於聚胺醋樹脂 =乾燥中’本實施形態是使料用内含熱源圓筒的圓 筒乾燥機。透過使聚胺酿樹脂沿著圓筒的圓周面通過 12 201109119 而乾燥。將所獲得之胺基甲酸醋薄4 2捲取成捲轴 狀。 於層愿步驟中,係用以貼合藉濕式凝固法所製 胺基甲酸酯薄片2與雙面膠帶7。此時,讓胺基甲酸 酯薄片2的背面Sr與雙面膠帶7貼合。接下來,再 裁切成圓形或多角形等所預期的形狀、尺寸後,再進 行確認是否有損傷或附著有髒污或異物等的檢查 完成保持墊10。 — 其次,茲對本實施形態的保持墊1〇所達到之 果作用等進行說明。 ,為使說明便於理解,兹就藉由習知濕式凝固法所 形成的胺基甲酸醋薄片的發泡構造進行說明。於習知 的濕式凝固法中,☆ PET製薄膜等的成膜基材上所 塗布的聚胺醋樹脂溶液係於水等凝固液中進行凝 固。因此,如第3圖所示,在構成習知的保持塾⑼ 的,基甲酸醋薄片12中’相較於濕式凝固時初期所 =的表面層12a還為内侧上’形成有橫跨胺基甲酸 ^片12厚度全體的多量發泡13。此發泡13在保 女面sh侧的孔徑較背面Sr側的孔經還小,沿著厚度 方向於垂直方向上所形成。 餘Ϊ外’在胺基甲酸自1薄片12中,鄰近保持面Sh, :、二面Sh平行的剖面上所形成的孔,與鄰近背面 二、背面Sr平行的剖面上所形成的孔,此兩種孔 乂 2呈相互疏離。*於發泡13在背面Sr側的孔 =比在保持面Sh側的孔經還大,所以疏離的程度 會在保持面Sh側變大。亦即,如第4㈧圖所示,鄰 201109119 近保持面Sh ’與保持面sh朝向内側相距胺基曱酸酯 薄片12的厚度的1〇%份量的位置(箭頭b的位置), 而鄯近背面Sr,則與背面Sr朝向内側相距胺基甲酸 西曰薄片12的厚度的10%份量内侧的位置(箭頭c的位 置)在此情況下’如第4(B)圖所示,鄰近保持面Sh 的b-b線剖面上,根據發泡13所形成的孔係形成疏 離如第4(C)圖所示,鄰近背面Sr的C-C線剖面上, 根據發泡13所形成的孔亦形成疏離。C-C線剖面上, 所形成的孔中,雖較B_B線剖面上所形成的孔還接 近,但與構成上述的保持墊10的胺基甲酸酯薄片2 的鄰近背面Sr的剖面上所形成的孔相比,係呈疏離 地形成(參照第2(C)圖在此種胺基甲酸酯薄片12 中’考量與上述之胺基甲酸酯薄片2中的上層部ph、 下層部Pr同樣的區域,上層部的空隙率係3〇~45%左 右,下層部的空隙率係70%以下左右。 就使用此種胺基曱酸酯薄片12的習知的保持塾 20而言’在形成發泡13的部分和發泡n間的樹脂 部分間會發生密度不均現象。因此,發泡形成部分和 樹脂部分,在研磨加工時,受到研磨壓力時的壓縮變 形量相異,因而變得難以滿足針對被研磨物所要求的 高度平坦度。亦即,在保持墊20中,因發生密度不 均現象,使得施加於被研磨物上的應力的大小也會局 部地相異’所以會變得難以遍及將被研磨物之加工面 的整體區域地進行均一地研磨加工。因此,以保持墊 20係無法充分滿足針對上述傾向薄板化、大型化為 目的之半導體用WF及FPD用玻璃基板所要求之高 201109119 精度的平坦性。 就使用此種胺基甲酸酯薄片丨2習知的保持墊2〇 而言,當進行研磨加工時,而施加研磨壓力時,由於 被研磨物會陷入保持墊20側,因具有緩衝性的胺基 甲酸酯薄片12壓縮,而對研磨物產生應力。在保持 墊20的密度是不均的情況下,亦即,在發泡13的形 成上有不均之情況下,在各密度不均部分上施加於 被研磨物的應力大小亦隨之不同。因此,施予被研磨 物的按壓力,區域性地變換,因而難以將被研磨物的 加工面,橫跨全區域進行均一地研磨加工。其結果 為,進行研磨加工後的被研磨物中,例如,在外緣部 與中央部間的研磨裕度不同,而產生所謂外緣壓陷的 現象。換言之,會因以保持墊20保持被研磨物,進 行研磨加工,而損及加工面的平坦性。由上可知,習 知的保持墊20,無法充分滿足達到高集積化無缺陷 的基層配線或顯示咼晝質影像等需求為目的的半導 體用WF或FPD用玻璃基板所要求之高精度的平坦 性。 相對地,於本實施形態中,由於構成保持墊1〇 的胺基甲酸酯薄片2的背面Sr朝向内侧相距是厚度t 的10%份量(O.lt份量),與背面Sr平行的剖面,和在 朝向内側相距是40%份量(〇.4t份量),與背面Sr平行 的剖面,此兩剖面所包挾的下層部Pr的空隙率,可 調整介於70%以上95%以下。此外,纟自保持面处 朝向内側相距是厚度全體10%份量,與保持面811平 行的剖面上,有藉由發泡3所形成的孔,可將此孔的 15 201109119 平均孔徑5又疋為A ’而在下層部ρΓ中,與背面^平 行的剖面當中,顯示開口率為最大值的剖面上,亦形 成有孔,可將此孔的最大孔徑設定為B,則比值B/a 可調整為介於20〜50的範圍。亦即,具有發泡孔徑是 形成鄰近保持面Sh的發泡的平均孔徑的2〇〜5〇倍大 小的發泡,此種發泡是形成在下層部Pr中的開口率 是顯示為最大值的剖面上。因此,柔軟的發泡3可多 量地形成的下層部Pr,可扮演空氣緩衝的角色,可使 施加在被研磨物上的壓力(研磨壓力)易於分散。此 外,伴隨著研磨加工而遭壓縮時,因應施加在被研磨 物上的壓力,使得下層部Pr的發泡形狀壓縮變形, 藉以配合被研磨物的翹曲、起伏,可減低對被研磨物 的負擔(反向應力)’故能高度地提升被研磨物的平坦 性。當考慮需確保在下層部pr的壓縮變形量時,則 適宜將下層部Pr的空隙率調整為介於75〜9〇%的範 圍。 此外,在本實施形態中,下層部Pr上,在與背 面Sr平行的剖面當中的每單位面積,顯示因發泡3 所形成的孔的總面積的比率,亦即開口率的最大值可 調整成介於80%以上95%以下。因此,在下層部pr, 特別疋在鄰近月面Sr處,發泡3的孔徑呈肥大化, 進而可確保充分的緩衝性。藉此,由於在研磨加工時 對被研磨物之應力可加以均等化,故可圖謀提升平坦 性。而與下層部Pr的空隙率同樣地,當考慮確保壓 縮變形量時,則宜將開口率調整成介於82〜9〇%的範 圍。 201109119 再者,在本實施形態中,自胺基甲酸酯薄片2的 保持面Sh起算朝向内侧相距是厚度t的1〇%份量 (O.lt份量),與保持面Sh平行的剖面,和朝向内侧相 距是40%份量(〇.4t份量)的,與保持面Sh平行的剖 面,此兩剖面所包挾的上層部Ph的空隙率,係可調 整成介於35%以上55%以下。因此’相較於下層部 Pr,由於聚胺醋樹脂的隔壁形成厚壁,因而可確保剛 性,故能抑制在研磨加工時,被研磨物朝保持墊侧陷 入。當保持墊的剛性不足而致使被研磨物陷入變大 時,在研磨加工時,會發生保持墊(胺基甲酸酯薄片) 本身被研削的情況。相對地,由於保持墊1〇可抑制 被研磨物之陷入,故能在胺基曱酸酯薄片2不被研削 之下’繼續進行研磨加工。就上層部Ph的空隙率未 滿35%而言’雖剛性提高會使硬度變高,但反而難以 &升平坦性。當考慮以提升平坦性的觀念來確保剛性 時’則宜將上層部Ph的空隙率調整成介於4〇〜5〇% 的範圍。 再者’在本實施形態中,由於胺基曱酸醋薄片2 具有上述之發泡構造’所以在上層部Ph確保可具有 抑制被研磨物之陷入所需的剛性,而在下層部Pr確 保可具有針對被研磨物之應力均等化所需的緩衝 性’所以能藉由單片的胺基曱酸酯薄片2來兼顧剛性 和緩衝性。雖然亦可貼合具剛性的樹脂薄片和具緩衝 性的樹脂薄片的構成,但此情況下,於研磨加工時, 有時會發生二片樹脂薄片相互剝離的情形。因此,以 保持塾10而言’透過胺基甲酸酯薄片2兼備有剛[S 11 201109119 The replacement of DMF and water occurs on the 2a side, and the film formation substrate side forms foam 3 which is larger than the surface layer 2a side. Here, the formation of foam accompanying the regeneration of the polyurethane resin will be described. In the polyurethane resin, since the cohesive force becomes large, the surface layer 2a is formed by rapidly regenerating in the polyurethane resin close to the skin. In the present embodiment, a polyurethane resin having a 〇〇% % modulus value of less than 20 MPa is used. It is also shown that the viscosity of the polyurethane resin solution is in the range of 5 to 1 〇pa.s. That is, a low-viscosity polyurethane resin solution is dissolved in a low-viscosity polyurethane resin solution. Therefore, after the formation of the surface layer 2a, the polyurethane resin in the polyurethane resin lapis solution before solidification moves to the surface layer side and aggregates, and the amount of the polyurethane resin decreases with the surface layer on the film-forming substrate side. Compared with the 2a side, foaming 3 is formed. In the case of the lower layer portion Pr, the void ratio is increased due to the enlargement of the foaming 3 as compared with the upper layer portion Ph. Further, the desolvent from the DMF polyurethane resin solution, that is, the surface layer 2a, the foam 3 and the micropores are formed by the substitution between DMF and water, and the surface layer 2a is microporous and foamed. And the microporous system is connected to each other in a mesh shape. Further, since the polyurethane resin is recyclable on the film-forming substrate, the opening of the foam 3 is not formed in the back surface formed in contact with the surface of the film-forming substrate. In the washing/drying step, the polyamine vinegar resin to be regenerated in the regeneration step is washed with a washing liquid such as water to remove the residual resin remaining in the polyurethane resin and dried. In the case of polyamine resin = drying, this embodiment is a cylindrical dryer containing a heat source cylinder. Drying is carried out by passing the polyamine brewing resin along the circumferential surface of the cylinder through 12 201109119. The obtained carbamic acid vinegar thin 4 2 was taken into a reel shape. In the layering step, the urethane sheet 2 and the double-sided tape 7 produced by the wet coagulation method are attached. At this time, the back surface Sr of the urethane sheet 2 was bonded to the double-sided tape 7. Next, after cutting into a desired shape and size such as a circle or a polygon, it is checked whether there is damage or adhesion of dirt or foreign matter, and the holding pad 10 is completed. — Next, the effect achieved by the holding mat 1本 of the present embodiment will be described. In order to facilitate the understanding of the description, the foaming structure of the amino formate vinegar sheet formed by the conventional wet coagulation method will be described. In the conventional wet coagulation method, the polyamine vinegar resin solution applied to the film-forming substrate such as a PET film is condensed in a coagulating liquid such as water. Therefore, as shown in Fig. 3, in the urethane sheet 12 constituting the conventional holding crucible (9), the surface layer 12a at the initial stage of the wet coagulation is also formed on the inner side to form a trans-amine. A large amount of foam 13 of the entire thickness of the base formic acid sheet 12 was obtained. The foam 13 has a smaller aperture on the sh side of the face of the female face than the hole on the side of the back Sr, and is formed in the vertical direction along the thickness direction. In the outer layer of the carbamic acid from the first sheet 12, a hole formed in a section parallel to the holding surface Sh, : the two sides Sh, and a hole formed in a section parallel to the back surface 2 and the back surface Sr, The two apertures 2 are alienated from each other. * The hole of the foam 13 on the side of the back surface Sr is larger than the hole of the side of the holding surface Sh, so that the degree of the separation becomes larger on the side of the holding surface Sh. That is, as shown in Fig. 4 (A), the neighboring 201109119 near holding surface Sh' and the holding surface sh are oriented inwardly from the position of the thickness of the urethane sheet 12 by 1% by weight (the position of the arrow b), and the vicinity The back surface Sr is located inside the 10% portion of the thickness of the bismuth carbazate sheet 12 toward the inside of the back surface Sr (the position of the arrow c). In this case, as shown in the fourth (B) diagram, the adjacent holding surface On the bb line cross section of Sh, the pores formed according to the foam 13 are separated as shown in Fig. 4(C), and the pores formed by the foam 13 are also formed in the CC line cross section adjacent to the back surface Sr. In the CC line section, the hole formed is closer to the hole formed in the cross section of the B_B line, but is formed on the cross section adjacent to the back surface Sr of the urethane sheet 2 constituting the above-described holding pad 10. The pores are formed in an alienated manner (see the second (C) diagram in the urethane sheet 12 in consideration of the same as the upper layer portion ph and the lower layer portion Pr in the above-described urethane sheet 2). In the region, the porosity of the upper layer is about 3 to 45%, and the porosity of the lower layer is about 70% or less. In the case of the conventional retention crucible 20 using such an aminophthalate sheet 12, Density unevenness occurs between the portion of the foam 13 and the resin portion between the foamed n. Therefore, the foamed portion and the resin portion are different in the amount of compressive deformation when subjected to the polishing pressure during the polishing process, and thus become It is difficult to satisfy the height flatness required for the object to be polished. That is, in the holding mat 20, the density unevenness occurs, so that the magnitude of the stress applied to the object to be polished is locally different. It is difficult to spread the entire processing surface of the object to be polished The uniform polishing process is performed in the area. Therefore, the flatness of the high-precision 201109119 required for the semiconductor WF and FPD glass substrates for the purpose of thinning and increasing the thickness of the above-mentioned tends is not sufficient. The urethane sheet 习 2 is a conventional holding mat 2 ,, when the polishing process is performed, when the polishing pressure is applied, the object to be polished is caught on the side of the holding mat 20, because of the cushioning amine group The acid ester sheet 12 is compressed to cause stress on the abrasive. In the case where the density of the holding mat 20 is uneven, that is, in the case where the foaming 13 is unevenly formed, the uneven density portion is present. The magnitude of the stress applied to the object to be polished is also different. Therefore, the pressing force applied to the object to be polished is changed regionally, so that it is difficult to uniformly polish the processed surface of the object to be polished across the entire region. As a result, in the workpiece to be polished after polishing, for example, the polishing margin between the outer edge portion and the center portion is different, and a phenomenon of so-called outer edge depression occurs. In other words, it is maintained. 20, the object to be polished is polished, and the flatness of the machined surface is impaired. As is apparent from the above, the conventional holding mat 20 cannot sufficiently satisfy the requirements of achieving high integration, defect-free base wiring, or displaying enamel images. The high-precision flatness required for the glass substrate for WF or FPD for semiconductors is relatively high. In the present embodiment, the back surface Sr of the urethane sheet 2 constituting the holding mat 1 is oriented inward. 10% by weight of the thickness t (O.lt portion), a section parallel to the back surface Sr, and a section which is 40% by weight (〇.4t parts) in the direction of the inside, and a section parallel to the back surface Sr, which is surrounded by the two sections The porosity of the lower layer portion Pr can be adjusted to be 70% or more and 95% or less. Further, the distance from the holding surface to the inner side is 10% of the total thickness, and the cross section parallel to the holding surface 811 is formed by foaming 3 The hole formed may be 疋 疋 15 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 Can make the most of this hole When the large aperture is set to B, the ratio B/a can be adjusted to be in the range of 20 to 50. That is, the foamed pore size is a foam having a size of 2 〇 to 5 〇 which forms a foamed average pore diameter adjacent to the holding surface Sh, and the foaming ratio is such that the opening ratio formed in the lower layer portion Pr is shown as a maximum value. On the profile. Therefore, the lower portion Pr which can be formed by the soft foaming 3 can play the role of air cushioning, and the pressure (grinding pressure) applied to the workpiece can be easily dispersed. Further, when compressed by the grinding process, the foamed shape of the lower layer portion Pr is compressed and deformed in accordance with the pressure applied to the workpiece, whereby the warpage and the undulation of the object to be polished are combined to reduce the object to be polished. The burden (reverse stress)' can highly improve the flatness of the object to be polished. When it is considered that the amount of compressive deformation in the lower layer portion pr is to be secured, it is preferable to adjust the void ratio of the lower layer portion Pr to be in the range of 75 to 9 %. Further, in the present embodiment, the ratio of the total area of the holes formed by the foaming 3, that is, the maximum value of the aperture ratio, can be adjusted per unit area of the cross section parallel to the back surface Sr in the lower layer portion Pr. It is between 80% and 95%. Therefore, in the lower layer portion pr, particularly adjacent to the moon surface Sr, the pore diameter of the foaming 3 is enlarged, thereby ensuring sufficient cushioning property. Thereby, since the stress on the object to be polished can be equalized during the polishing process, the flatness can be improved. On the other hand, in consideration of the void ratio of the lower portion Pr, it is preferable to adjust the aperture ratio to a range of 82 to 9 % when considering the amount of compression deformation. In the present embodiment, the distance from the holding surface Sh of the urethane sheet 2 to the inner side is 1% by weight of the thickness t (0.1 part by weight), a cross section parallel to the holding surface Sh, and The inner side is 40% by weight (〇4t parts), and the cross section parallel to the holding surface Sh, and the void ratio of the upper layer Ph surrounded by the two sections can be adjusted to be 35% or more and 55% or less. Therefore, since the partition wall of the polyurethane resin is thicker than the lower layer portion Pr, the rigidity can be ensured, so that the object to be polished can be prevented from entering the holding mat side during the polishing process. When the rigidity of the holding mat is insufficient to cause the object to be polished to become large, the holding mat (urethane sheet) itself may be ground during the grinding process. On the other hand, since the holding mat 1〇 suppresses the sinking of the object to be polished, the polishing process can be continued without the amine phthalate sheet 2 being ground. When the porosity of the upper layer portion Ph is less than 35%, the increase in rigidity causes the hardness to be high, but it is difficult to achieve flatness. When it is considered to ensure rigidity by the concept of improving flatness, it is preferable to adjust the void ratio of the upper portion Ph to be in the range of 4 〇 to 5 〇%. Further, in the present embodiment, since the amino citrate sheet 2 has the above-described foaming structure, it is ensured that the upper layer portion Ph can have rigidity required to suppress the sinking of the workpiece, and the lower portion Pr can be secured. Since it has the cushioning property required for the equalization of the stress of the object to be polished, it is possible to achieve both rigidity and cushioning property by the single-piece amine phthalate sheet 2. Although a rigid resin sheet and a cushioning resin sheet may be bonded together, in this case, the two resin sheets may be peeled off from each other during polishing. Therefore, in order to maintain 塾10, the permeable urethane sheet 2 has both
F 17 201109119 與緩衝性’進而可圖謀提升被研磨物的平坦性β 此外,在本實施形態中,雖例示了具備有聚胺酯 樹脂製的胺基甲酸酯薄片2之保持墊1〇,但本發明 並非受限於此。亦可使用例如聚乙烯等之樹脂以^代 聚胺酯樹脂,只要是可藉由濕式凝固法,形成上述的 發泡構造的樹脂即可適用。 此外,在本實施形態十雖例示一種是貼合胺基甲 酸酯薄片2和具有基材的雙面膠帶7的構成的保持墊 10,但本發明並非受限於此。只要具備胺基甲酸酯薄 片2和裝設於研磨機用的黏著材的保持墊,即可使用 作為保持墊,例如亦可取代雙面膠帶7,而僅將各種 黏著劑塗布於胺基甲酸酯薄片2(的背面Sr)。此外, 在本實施形態中雖例示了雙面膠帶7的基材可兼作 為保持墊10的支撐材的例子,但本發明並非受限於 此。亦可作成在胺基甲酸酯薄片2和雙面膠帶7間, 貼合有其他的支撐材。可例舉PET製等的薄膜或曰不 織布等來作為此種支撐材,並無任何特別制限。 再者’本實施形態中雖未特別提及,但在藉由渴 式滅固法所形成的胺基甲酸酯薄# 2的厚度不均變 大時亩為使保持面S h與背面s r可呈平行,宜將背面 Γ貝1事先利用擦光或切割等方法進行平滑化。如此一 來,可進一步提升保持面Sh的平坦性。 Π) 就依據本實施形態所製作而成保持墊 製作H:4行說明。並一併記載為進行比較用所 實施例1 201109119 於實施例1中,在胺基甲酸酯薄片2的製作 中’所採用的樹脂的1〇〇〇/0模量值是低於1〇MPa的聚 酯 MDI(methylene diphenyl diisocyanate,二苯基甲烧 一異氰酸酯)之聚胺醋樹脂’對於DMF中以18重量 %的比例溶解後,對聚胺酯樹脂添加丨重量%的親水 性添加劑,並對聚胺酯樹脂添加5重量%的碳黑而調 I出以B型旋轉黏度計測定具有3.3Pa· s的黏度的聚 胺酯樹脂溶液。在塗布聚胺酯樹脂溶液時,將塗布裝 置的間隙設定成0.7mm。在PET製薄膜的成膜基材 上’塗布聚胺酯樹脂溶液後,浸潰於溫度25¾的水(凝 固液)中’使聚胺酯樹脂得以完全再生。在洗淨/乾 燥後’於所取得的胺基甲酸酯薄片2的背面Sr侧進 行擦光,使擦光面上貼合雙面膠帶7而完成保持塾 10的製造。 實施例2 於實施例2中’使用與實施例丨相同的聚胺酯樹 脂,對於DMF中以20重量%的比例溶解後,對聚胺 酉曰樹脂添加1重;ϊ %的親水性添加劑,並對聚胺g旨樹 脂添加5重量%的碳黑而調製出以b型旋轉黏度計測 定具有5.3Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝 置的間隙設定成1.0mm。在成膜基材上塗布聚胺酯樹 脂溶液後’浸潰於溫度10°C的水中’使聚胺醋樹脂 得以完全再生。在洗淨/乾燥後,於所取得的胺基甲 酸酯薄片2的背面Sr側進行擦光,使擦光面上貼合 雙面膠帶7而完成保持墊1〇的製造。 實施例3 201109119 於實施例3中,使用與實施例!相同的聚胺酯樹 脂,對於DMF中以21重量%的比例溶解後,對聚胺 酯樹脂添加3重量%的親水性添加劑,並對聚胺酯樹 脂添加5重量°/〇的碳黑而調製出以b型旋轉黏度計測 定具有8.2Pa*s的黏度的聚胺酯樹脂溶液。將塗布裝 置的間隙設定成1.0mm。在成膜基材上塗布聚胺酯樹 月曰洛液後’浸潰於溫度1 的水中,使聚胺醋樹脂 得以完全再生。在洗淨/乾燥後,於所取得的胺基甲 酸醋薄片2的背面Sr側進行擦光,使擦光面上貼合 雙面膠帶7而完成保持塾1〇的製造。 實施例4 於實施例4中,使用與實施例1相同的聚胺酯樹 脂’對於DMF中以21重量%的比例溶解後,對聚胺 酯樹脂添加5重量%的親水性添加劑’並對聚胺酯樹 脂添加5重量%的碳黑而調製出以b型旋轉黏度計測 定具有7.9Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝 置的間隙設定成1.0mm。在成膜基材上塗布聚胺酯樹 脂溶液後,浸潰於溫度25。(:的水中,使聚胺酯樹脂 得以完全再生。在洗淨/乾燥後,於所取得的胺基曱 酸酿薄片2的背面Sr侧進行擦光,使擦光面上貼合 雙面膠帶7而完成保持墊1〇的製造。 實施例5 於實施例5中,使用與實施例1相同的聚胺酯樹 脂,對於DMF中以21.5重量%的比例溶解後,對聚 胺酯樹脂添加1重量%的親水性添加劑,並對聚胺酯 樹脂添加5重量%的碳黑而調製出以b型旋轉黏度計 20 201109119 測定具有9.5Pa.s的黏度的聚胺酯樹脂溶液。將塗布 裝置的間隙設定成l‘2mm。在成膜基材上塗布聚胺醋 樹脂溶液後,浸潰於溫度l〇°C的水中,使聚胺醋樹 脂得以完全再生。在洗淨/乾燥後’於所取得的胺基 甲酸酯薄片2的背面Sr側進行擦光,使擦光面上貼 合雙面膠帶7而完成保持墊10的製造。 比較例1 於比較例1中,使用與實施例1相同的聚胺酯樹 脂,對於DMF中以21重量%的比例溶解後,對聚胺 酉曰樹脂添加1重量%的親水性添加劑,並對聚胺自旨樹 脂添加5重量%的碳黑而調製出以3型旋轉黏度計測 定具有8.2Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝 置的間隙設定成0.7mm。在成膜基材上塗布聚胺酯樹 月曰/合液後,次潰於溫度25。(:的水中,使聚胺酯樹脂 得以完全再生。在洗淨/乾燥後,於所取得的胺基甲 酸酯薄片12的背面Sr側進行擦光,使擦光面上貼合 雙面膠帶7而完成保持墊20的製造。亦即,比較例 1的保持墊20係為習知的保持墊(亦可參閱第3圖)。 針對所取得的各實施例及比較例1的胺基甲酸 酉曰薄片,對上層部Ph及下層部pr的空隙率、開口率 的最大值以及表示最大發泡孔徑對最小發泡孔徑之 比的發泡孔徑比(Max/Min)等進行測定。空隙率的測 定係以下述方式進行。亦即,使用三次元量側X射 線電腦斷層攝f彡裝置(大和科學株式會社(YAMATO SCIENTIFIC)製,TDM10()(MS/Sp)騎掃描剖面, 取得自保持面Sh相距1()μηι間隔的連續斷層影像 201109119 將所取得之斷層影像,卩SEM用 r Sca„dium J(01ympus s〇ft.Imaging s;luti ^ 二得各個濃淡不-的“二 …的影像,分別將濃部作為開口部,以 吏/辰度靶圍(門檻值)能與影像一致的方 =定,透過將濃部作為開口部加以累積,求 f面積所占的總開Π面積之比例以作為開。- 下層部Pr的區域中的斷 層“象所求付之開口率的和後,再除以上層部仙、 下層部Pr的觀測面積的和之後的百分率,以 空隙率的取得’亦可利用例如可利用; 先、切割方式從胺基甲酸醋薄片的表面研削各一定厚 度份量,透過SEM或顯微鏡等來觀察研削加工 而求得空隙率的方法來作為簡易方法。開口率的最大 值疋由空隙率的測定中所求得之開口率而得以求 出。發泡孔徑比係以如下述方式求出。亦即,使用 「SCandium」算出形成在自保持面沾朝向内側相距 是厚度全體的10%份量,且與保持面Sh平行的剖面 中的3.3mm2的範圍的開口的平均開口徑,以此作為 最小發泡孔徑。使用「Scandium」算出在下層部份 的區域,顯示開口率的最大值的剖面中的3 3曰麵2的 範圍,且未與觀測區域的交界相接的開口當中的最大 開口徑,以此作為最大發泡孔徑。求出最大泡 對最小發泡孔徑的比值,以作為發泡孔徑比。由於最 小發泡孔徑、最大發泡孔徑分別與上述的平均孔徑 A、最大孔徑B相對應,所以發泡孔徑比係可用以表 22 201109119 示上述比值B/A。 較例1的空隙率、 定結果。 表1 於以下表1中,列出各實施例及比 開口率的最大值、發泡孔徑比的測F 17 201109119 and the cushioning property, the flatness of the object to be polished can be improved. Further, in the present embodiment, the holding mat 1 of the urethane sheet 2 made of a polyurethane resin is exemplified. The invention is not limited to this. Further, a resin such as polyethylene may be used to form a polyurethane resin, and any resin which can form the above-described foam structure by a wet coagulation method can be used. Further, in the tenth embodiment, the holding mat 10 in which the urethane sheet 2 and the double-sided tape 7 having the substrate are bonded is exemplified, but the present invention is not limited thereto. As long as the urethane sheet 2 and the holding mat for the adhesive for the grinder are provided, it can be used as a holding mat, for example, instead of the double-sided tape 7, and only various adhesives can be applied to the amine base. Acid sheet 2 (back side Sr). Further, in the present embodiment, the base material of the double-sided tape 7 can be exemplified as the support material for holding the mat 10, but the present invention is not limited thereto. It is also possible to form a support material between the urethane sheet 2 and the double-sided tape 7. A film made of PET or the like, or a non-woven fabric or the like can be exemplified as the support material, and there is no particular limitation. Further, although not specifically mentioned in the present embodiment, when the thickness unevenness of the urethane thin film #2 formed by the thirst quenching method becomes large, the acre is the holding surface Sh and the rear surface sr It may be parallel, and it is preferable to smooth the back mussel 1 by polishing or cutting in advance. In this way, the flatness of the holding surface Sh can be further improved. Π) According to the embodiment, the holding mat is produced by H: 4 lines. Further, it is described as Comparative Example 1 201109119. In Example 1, the resin used in the preparation of the urethane sheet 2 has a 1 〇〇〇/0 modulus value of less than 1 〇. MPa polyester MDI (methylene diphenyl diisocyanate, diphenylmethane monoisocyanate) polyamine vinegar resin is dissolved in DMF at a ratio of 18% by weight, and a hydrophilic additive of 丨% by weight is added to the polyurethane resin, and The polyurethane resin was added with 5% by weight of carbon black, and a polyurethane resin solution having a viscosity of 3.3 Pa·s was measured by a Brookfield viscometer. When the polyurethane resin solution was applied, the gap of the coating device was set to 0.7 mm. After the polyurethane resin solution was applied onto the film-forming substrate of the PET film, it was immersed in water (condensation liquid) at a temperature of 253⁄4 to completely regenerate the polyurethane resin. After the washing/drying, the side of the back surface Sr of the obtained urethane sheet 2 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding crucible 10. Example 2 In Example 2, 'the same polyurethane resin as in Example , was used, and after dissolving in a ratio of 20% by weight in DMF, 1 weight of a polyamine resin was added; ϊ% of a hydrophilic additive, and Polyamine g was added to the resin to add 5% by weight of carbon black to prepare a polyurethane resin solution having a viscosity of 5.3 Pa.s as measured by a b-type rotational viscometer. The gap of the coating device was set to 1.0 mm. The polyurethane resin was coated on the film-forming substrate and then "immersed in water at a temperature of 10 ° C" to completely regenerate the polyurethane resin. After washing/drying, the obtained urethane sheet 2 is polished on the back surface Sr side, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding mat 1〇. Example 3 201109119 In Example 3, use and examples! The same polyurethane resin was dissolved in a ratio of 21% by weight in DMF, and 3% by weight of a hydrophilic additive was added to the polyurethane resin, and 5 weight/min of carbon black was added to the polyurethane resin to prepare a b-type rotational viscosity. A polyurethane resin solution having a viscosity of 8.2 Pa*s was measured. The gap of the coating device was set to 1.0 mm. The polyurethane resin was coated on the film-forming substrate and then immersed in water of temperature 1 to completely regenerate the polyurethane resin. After washing/drying, the back side Sr side of the obtained urethane sheet 2 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the crucible. Example 4 In Example 4, the same polyurethane resin as in Example 1 was used. After dissolving in a ratio of 21% by weight in DMF, 5% by weight of a hydrophilic additive was added to the polyurethane resin' and 5 weights were added to the polyurethane resin. The carbon black of % was prepared to prepare a polyurethane resin solution having a viscosity of 7.9 Pa.s as measured by a b-type rotational viscometer. The gap of the coating device was set to 1.0 mm. After coating the polyurethane resin solution on the film-forming substrate, it was immersed at a temperature of 25. In the water of (:, the polyurethane resin is completely regenerated. After washing/drying, the obtained S-side of the amino phthalic acid-pulverized sheet 2 is polished, and the double-sided tape 7 is bonded to the polishing surface. The production of the holding mat 1 was completed. Example 5 In Example 5, the same polyurethane resin as in Example 1 was used, and after dissolving in a ratio of 21.5 wt% in DMF, 1% by weight of a hydrophilic additive was added to the polyurethane resin. And adding 5% by weight of carbon black to the polyurethane resin to prepare a polyurethane resin solution having a viscosity of 9.5 Pa.s by a b-type rotational viscometer 20 201109119. The gap of the coating device was set to 1 '2 mm. After coating the polyamine vinegar resin solution on the substrate, it is immersed in water at a temperature of 10 ° C to completely regenerate the polyurethane resin. After washing/drying, the obtained urethane sheet 2 is obtained. The back side Sr side was polished, and the double-sided tape 7 was bonded to the polishing surface to complete the manufacture of the holding mat 10. Comparative Example 1 In Comparative Example 1, the same polyurethane resin as in Example 1 was used, and in the DMF, 21 was used. After the proportion by weight is dissolved A 1% by weight of a hydrophilic additive was added to the polyamine oxime resin, and 5% by weight of carbon black was added to the polyamine resin to prepare a polyurethane resin solution having a viscosity of 8.2 Pa.s as measured by a 3-type rotational viscometer. The gap of the coating device was set to 0.7 mm. After the polyurethane substrate was coated on the film-forming substrate, the mixture was melted at a temperature of 25. In the water, the polyurethane resin was completely regenerated. Thereafter, the back surface Sr side of the obtained urethane sheet 12 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding mat 20. That is, the holding mat 20 of Comparative Example 1 is completed. It is a conventional holding mat (see also Fig. 3). The void ratio and the aperture ratio of the upper layer portion Ph and the lower layer portion pr are obtained for each of the obtained examples and the urethane bismuth hydride sheet of Comparative Example 1. The maximum value and the foaming pore ratio (Max/Min) indicating the ratio of the maximum foaming pore diameter to the minimum foaming pore diameter were measured. The void ratio was measured in the following manner. That is, a three-dimensional side X-ray computer was used. Fault imaging device (Dahe Science Co., Ltd. (YAMATO SCIENTIFIC) system, TDM10() (MS/Sp) riding scanning profile, obtaining continuous tomographic image from the holding surface Sh at a distance of 1 () μηι 201109119 The obtained tomographic image, 卩SEM with r Sca„dium J ( 01ympus s〇ft.Imaging s;luti ^ Two images of each of the two shades, the thick part is used as the opening part, and the target range (threshold value) can be consistent with the image. By accumulating the rich portion as the opening portion, the ratio of the total open area occupied by the f area is obtained as the opening. - The fault in the region of the lower portion Pr is "like the sum of the aperture ratios to be paid, and then removed. The ratio of the sum of the observed area of the upper layer portion and the lower layer portion Pr to the subsequent area can be utilized, for example, by using, for example, cutting a certain thickness portion from the surface of the urethane sheet by the cutting method, and passing through the SEM. A method of obtaining a void ratio by observing a grinding process, such as a microscope, is used as a simple method. The maximum value of the aperture ratio is determined by the aperture ratio obtained by measuring the void ratio. The foaming aperture ratio was determined as follows. In other words, the average opening diameter of the opening in the range of 3.3 mm 2 in the cross section parallel to the holding surface Sh is calculated by using "SCandium", which is 10% of the total thickness of the self-retaining surface. Foaming aperture. The "Scandium" is used to calculate the range of the 3 3 face 2 in the section showing the maximum value of the aperture ratio in the region of the lower layer, and the maximum opening diameter among the openings which are not in contact with the boundary of the observation region. Maximum foaming aperture. The ratio of the maximum bubble to the minimum foaming aperture was determined as the foaming aperture ratio. Since the minimum foaming pore diameter and the maximum foaming pore diameter correspond to the above average pore diameter A and maximum pore diameter B, respectively, the foaming pore diameter ratio can be expressed by the above-mentioned ratio B/A in Table 22 201109119. The porosity and the result of Comparative Example 1. Table 1 In Table 1 below, the respective examples and the ratio of the opening ratio and the foaming aperture ratio are listed.
上部層Ph下部層Pr開孔率發泡孔徑比平坦度Upper layer Ph lower layer Pr open porosity foaming aperture ratio flatness
取呵不,在比較例1的胺基甲酸酯薄片中, 上層邻Ph的空隙率為41.4%,下層部pr的空隙率為 68.6%。此外,由第5圖可明確得知,自表面起算的 旱度越大亦即,雖然越接近背面心,開口率越變越 大’但其開口率最大也僅75%左右。相對地,在實施 例1〜實施例5的各胺基甲酸酯薄片2 ♦,上層部凡 的空隙率介於38.3%〜5〇 2%的範圍,下層部&的空 隙率則介於77·2〜88·3%的範圍。此外,在實施例! 的胺基甲酸酯薄片2中,由第5圖可明確得知,顯示 在橫跨下層部Pr的厚度區域内的ΙΟΟμιη以上的厚度 的剖面,連續地超過8〇%的開口率。由此可知,在各 實施例的胺基甲酸酯薄片2中,上層部ph的空隙率 與比較例1屬同一程度,而且在下層部汧的空隙率 大。再者,由發泡孔徑比的測定結果,可明白於比較 23 201109119 例1中’下層部Pi· t的最大發泡孔徑相對於鄰近保 持面sh的平均開口徑為18 7倍,相對地在各實施例 中則顯示為34.0〜38.2倍的尺寸。 關於研磨性能評估,使用各實施例及比較例中的 保持塾,於下述的研磨條件下,進行液晶顯示器用玻 璃基板( 470mmx370mmx0.7mm)的研磨加工,利用 依曰本工業規格(JIS B 〇6〇1:,82)為基準的方 法,自濾波紋中心起伏求得平坦度a。在平坦度a的 測定中,係使用表面粗度形狀測定機(株式會社東亨 ,密製’ SUrfc〇m480A),依下述的測定條件進行測 疋。自起因於基板表面的凹凸所獲得之測定曲線,算 出相鄰的凸部(山部)與凸部間的寬度W及凸部和 =部(谷部)間的高度s,並作成以寬度冒為橫軸, 呵度S為縱軸的散布圖。自散布圖求出一次方程式 s aW的近似直線,將斜度a設為研磨加工後之最終 =平坦度a。因平坦性越高,則寬度w變大,高度s 變J故¥斜度a越小時則平坦性則越顯優異。 研磨條件 使用研磨機:OSCAR研磨機(SPEEDFAM社製 SP-1200) 研磨速度(旋轉數):61 rpm 加工壓力:76gf/cm2 研磨漿:鈽漿 研磨時間:30min 波、纹中心起伏測定條件 評估長度:90mm 24 201109119 測定速度:3.0mm/s 中斷值:0.8〜8.Omm 薄膜種類別:2RC 測定範圍:±40.0μιη 傾斜補償··平滑曲線 如表1所示,在使用比較例丨的保持墊2〇進行 研磨加工中,顯示加工後的玻璃基板的平坦度&為 〇.〇〇〇7。相對地,在使用實施例卜實施例5的各保 持墊10進行的研磨加工中,顯示平坦度a 0.0003 G.GGG5’無論何者皆較比較例i更為優異的^ 果。因此可明確得知,藉由濕式凝固法所形成的發= 3,在上㈣Ph的空隙率是形成介於35〜55%的範 圍,而在下部層Pr _空隙率則是形成介於7〇〜95 範圍。藉由使用具備有此發泡3的胺基甲酸醋 的保持IMG’可提高保持面处的平坦性精度, 提升被研磨物之面内均一性。 本發明乃提供一種能提高保持面之平坦性 度,且提升被研磨物的面内均一性之保持塾,: 製造、販售上具有貢獻,係為極具產業利用性 、以上所述僅為舉例性,而非為限制性者。任何未 脫離本發明之精神與範鳴,而對其進行之等效 變更’均應包含於後附之申請專利範圍巾。… 【圖式簡單說明】 第1圖係表示適用於本發明之實施形態Μ料q 25 201109119 面示意圖; 第2圖係表示構成實施形態的保持墊的胺基甲酸醋薄 片中的發泡之形成狀態之示意圖,其中,第2(A) 圖係為胺基甲酸酯薄片的厚度方向之剖面 圖,而第2(B)圖係分別表示於第2(A)圖中B_B 剖面上發泡所形成的孔的示意說明圖,而第 2(C)圖係分別表示於第2(A)圖中c_c剖面上發 泡所形成的孔的示意說明圖; 第3圖係表示習知的保持墊之剖面示意圖; 第4圖係表示構成習知的保持墊的胺基曱酸酯薄片中 的發泡之形成狀態之示意圖,其中,第4(A) 圖係為胺基甲酸酯薄片的厚度方向之剖面 圖’而第4(B)圖係分別表示於第4(A)圖中B-B 剖面上發泡所形成的孔的示意說明圖,而第 4(C)圖係分別表示於第4(A)圖中C-C剖面上發 泡所形成的孔的示意說明圖;以及 第5圖 係表示相對於自構成保持墊的胺基曱酸酯薄片 的保持面起算的厚度,此厚度範圍中各個剖面 上’因發泡所形成的孔的開口率之曲線比較 圖。 【主要元件符號說明】 2、 12 :胺基曱酸酯薄片; 2a、12a:表面層; 3、 13 :發泡; 26 201109119 7 :雙面膠帶; 8 :剝離紙; 10、20 :保持墊; Sh :保持面;Further, in the urethane sheet of Comparative Example 1, the void ratio of the upper layer adjacent Ph was 41.4%, and the void ratio of the lower layer portion pr was 68.6%. Further, as is clear from Fig. 5, the greater the degree of drought from the surface, that is, the closer the back center is, the larger the aperture ratio is, but the aperture ratio is only about 75% at the maximum. In contrast, in each of the urethane sheets 2 to ♦ of Examples 1 to 5, the void ratio of the upper layer portion is in the range of 38.3% to 5〇2%, and the void ratio of the lower layer portion & 77·2~88·3% range. Also, in the embodiment! In the urethane sheet 2, as is clear from Fig. 5, the cross section showing the thickness of ΙΟΟμη or more in the thickness region across the lower layer portion Pr continuously exceeds an aperture ratio of 8〇%. From the urethane sheet 2 of each of the examples, the void ratio of the upper layer portion ph was the same as that of the comparative example 1, and the porosity of the lower layer portion was large. Furthermore, from the measurement results of the foaming aperture ratio, it can be understood that in Comparative Example 23 201109119, the maximum opening diameter of the lower layer Pi·t is 18 7 times relative to the adjacent holding surface sh, which is relatively In each of the examples, it was shown to be 34.0 to 38.2 times the size. With respect to the evaluation of the polishing performance, the glass substrate for liquid crystal display (470 mm x 370 mm x 0.7 mm) was polished under the following polishing conditions using the holding crucible in each of the examples and the comparative examples, and the industrial standard (JIS B 〇) was used. 6〇1:, 82) is the reference method, and the flatness a is obtained from the fluctuation of the corrugated center. In the measurement of the flatness a, the surface roughness measuring machine (East Heng, manufactured by "Essence", SURfc〇m480A) was used, and the measurement was carried out according to the following measurement conditions. The width W between the convex portion (mountain portion) and the convex portion and the height s between the convex portion and the = portion (valley portion) are calculated from the measurement curve obtained by the unevenness on the surface of the substrate, and the width s is calculated For the horizontal axis, the degree S is the scatter diagram of the vertical axis. The approximate straight line of the equation s aW is obtained from the scatter plot, and the slope a is set to the final = flatness a after the grinding process. The higher the flatness, the larger the width w and the higher the height s. Therefore, the smaller the slope a, the more excellent the flatness. Grinding conditions using a grinder: OSCAR grinder (SP-1200 manufactured by SPEEDFAM) Grinding speed (number of revolutions): 61 rpm Processing pressure: 76 gf/cm2 Grinding slurry: grind grinding time: 30 min Wave, grain center undulation measurement condition evaluation length :90mm 24 201109119 Measurement speed: 3.0mm/s Interruption value: 0.8~8.Omm Film type: 2RC Measurement range: ±40.0μιη Tilt compensation··Smooth curve as shown in Table 1, using the holding pad of the comparative example In the polishing process, the flatness of the glass substrate after processing is shown as 〇.〇〇〇7. On the other hand, in the polishing process using each of the holding mats 10 of the Example 5, the flatness a 0.0003 G.GGG5' was displayed to be superior to Comparative Example i. Therefore, it can be clearly understood that the hair formed by the wet coagulation method = 3, the void ratio in the upper (four) Ph is formed in the range of 35 to 55%, and the porosity in the lower layer Pr_ is formed in the range of 7 〇~95 range. By maintaining the IMG' using the urethane urethane having the foaming 3, the flatness accuracy at the holding surface can be improved, and the in-plane uniformity of the object to be polished can be improved. The present invention provides a method for improving the flatness of the holding surface and improving the in-plane uniformity of the object to be polished, and contributes to manufacturing and sales, and is highly industrially applicable. By way of example, and not as a limitation. Any equivalent changes made without departing from the spirit and scope of the present invention shall be included in the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view showing the structure of the embodiment of the present invention, q 25 201109119; and Fig. 2 is a view showing the formation of foam in the urethane sheet which constitutes the holding mat of the embodiment. A schematic diagram of a state in which the second (A) diagram is a cross-sectional view in the thickness direction of the urethane sheet, and the second (B) diagram shows the foaming on the B_B section in the second (A) diagram, respectively. A schematic illustration of the formed pores, and a second (C) diagram showing a schematic view of the pores formed by foaming on the c_c section in the second (A) diagram; FIG. 3 shows a conventional retention. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 4 is a schematic view showing a state of formation of foam in an amino phthalate sheet constituting a conventional holding mat, wherein the 4 (A) diagram is a urethane sheet. FIG. 4(B) is a schematic explanatory view showing a hole formed by foaming on the BB section in FIG. 4(A), and FIG. 4(C) is respectively shown in the figure. 4(A) is a schematic explanatory view of a hole formed by foaming on the CC section; and FIG. 5 is a view showing a hole with respect to the self-constituting holding pad Yue holding surface of the base sheet of the starting esters of thickness, this thickness range in the respective cross-sectional 'graph comparing FIG hole opening rate is due to the foam formed. [Description of main component symbols] 2, 12: Amino phthalate flakes; 2a, 12a: surface layer; 3, 13: foaming; 26 201109119 7: double-sided tape; 8: release paper; 10, 20: retaining pad Sh : Keep the face;
Sr :背面;Sr: the back;
Ph :上層部;以及 Pr :下層部。Ph : upper part; and Pr : lower part.
Claims (1)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009204004A JP5587576B2 (en) | 2009-09-03 | 2009-09-03 | Holding pad |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201109119A true TW201109119A (en) | 2011-03-16 |
TWI490085B TWI490085B (en) | 2015-07-01 |
Family
ID=43648975
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW098132165A TWI490085B (en) | 2009-09-03 | 2009-09-23 | Keep the pad |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5587576B2 (en) |
KR (1) | KR101595149B1 (en) |
CN (1) | CN102574267B (en) |
TW (1) | TWI490085B (en) |
WO (1) | WO2011027412A1 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011235385A (en) * | 2010-05-10 | 2011-11-24 | Teijin Cordley Ltd | Suction pad |
EP2899226B1 (en) * | 2013-03-19 | 2017-05-10 | LG Chem, Ltd. | Method for preparing polyurethane support pad |
KR101527348B1 (en) * | 2014-03-04 | 2015-06-09 | 대원화성 주식회사 | Holding pad having enhanced durability |
JP6311186B2 (en) * | 2014-04-04 | 2018-04-18 | 富士紡ホールディングス株式会社 | Polishing pad and manufacturing method thereof |
CN105269451A (en) * | 2014-07-02 | 2016-01-27 | 大元化成株式会社 | Maintaining pad having high-precision flatness |
JP6940363B2 (en) * | 2017-10-10 | 2021-09-29 | 富士紡ホールディングス株式会社 | Holding pad and its manufacturing method |
JP7323401B2 (en) * | 2019-09-25 | 2023-08-08 | 富士紡ホールディングス株式会社 | Polishing pad, method for producing same, and method for producing abrasive product |
JP7474087B2 (en) | 2020-03-19 | 2024-04-24 | 富士紡ホールディングス株式会社 | Holding pad, manufacturing method thereof, and manufacturing method of polished product |
JP7553256B2 (en) | 2020-03-19 | 2024-09-18 | 富士紡ホールディングス株式会社 | Holding pad, manufacturing method thereof, and manufacturing method of polished product |
JP7518716B2 (en) | 2020-09-29 | 2024-07-18 | 富士紡ホールディングス株式会社 | Holding Pad |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6458475A (en) * | 1987-08-25 | 1989-03-06 | Rodeele Nitta Kk | Grinding pad |
JP3149340B2 (en) * | 1995-08-22 | 2001-03-26 | ロデール・ニッタ株式会社 | Polishing pad |
JP4373152B2 (en) * | 2003-07-17 | 2009-11-25 | 東レコーテックス株式会社 | Polishing sheet |
JP2005224888A (en) * | 2004-02-12 | 2005-08-25 | Nitta Haas Inc | Holding material of polishing workpiece |
JP4566660B2 (en) * | 2004-08-30 | 2010-10-20 | 富士紡ホールディングス株式会社 | Polishing cloth for finish polishing and method for manufacturing polishing cloth |
JP4455230B2 (en) * | 2004-08-30 | 2010-04-21 | 富士紡ホールディングス株式会社 | Holding pad and method of manufacturing the holding pad |
US8075372B2 (en) * | 2004-09-01 | 2011-12-13 | Cabot Microelectronics Corporation | Polishing pad with microporous regions |
JP5004429B2 (en) * | 2005-03-17 | 2012-08-22 | 富士紡ホールディングス株式会社 | Retainer |
JP4034320B2 (en) * | 2005-05-24 | 2008-01-16 | 富士紡ホールディングス株式会社 | Holding pad |
JP4562598B2 (en) * | 2005-07-04 | 2010-10-13 | 富士紡ホールディングス株式会社 | Polishing cloth |
US20070141312A1 (en) * | 2005-12-21 | 2007-06-21 | James David B | Multilayered polishing pads having improved defectivity and methods of manufacture |
TWI350565B (en) * | 2007-04-30 | 2011-10-11 | San Fang Chemical Industry Co | Composite sheet for mounting a workpiece and the method for making the same |
JP5501561B2 (en) * | 2007-11-12 | 2014-05-21 | 富士紡ホールディングス株式会社 | Holding pad |
-
2009
- 2009-09-03 JP JP2009204004A patent/JP5587576B2/en active Active
- 2009-09-23 TW TW098132165A patent/TWI490085B/en active
- 2009-09-24 KR KR1020127004057A patent/KR101595149B1/en active IP Right Grant
- 2009-09-24 WO PCT/JP2009/004792 patent/WO2011027412A1/en active Application Filing
- 2009-09-24 CN CN200980161122.6A patent/CN102574267B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN102574267A (en) | 2012-07-11 |
JP2011051075A (en) | 2011-03-17 |
CN102574267B (en) | 2015-03-25 |
TWI490085B (en) | 2015-07-01 |
KR101595149B1 (en) | 2016-02-17 |
WO2011027412A1 (en) | 2011-03-10 |
JP5587576B2 (en) | 2014-09-10 |
KR20120073200A (en) | 2012-07-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW201109119A (en) | Supporting pad | |
TWI415712B (en) | Polishing pad | |
TWI597126B (en) | Polishing pad and method for making the same | |
JP5733497B2 (en) | Double pore structure polishing pad | |
TWI432287B (en) | Keep the pad | |
JP6608239B2 (en) | Polishing pad | |
JP2007260884A (en) | Polishing cloth | |
TWI635930B (en) | Holding pad | |
JP4948935B2 (en) | Polishing cloth | |
JP5975335B2 (en) | Polishing pad and manufacturing method thereof | |
JP5324998B2 (en) | Holding pad | |
JP5520062B2 (en) | Holding pad | |
JP5923368B2 (en) | Polishing pad sheet and manufacturing method thereof, polishing pad and manufacturing method thereof, and polishing method | |
JP2007260855A (en) | Abrasive cloth for finishing | |
JP7081915B2 (en) | Polishing holder | |
TWI827778B (en) | Polishing pad and method of manufacturing same | |
JP5970287B2 (en) | Polishing cloth | |
JP5274285B2 (en) | Polishing pad manufacturing method | |
JP6587464B2 (en) | Polishing pad | |
JP2024049003A (en) | Polishing pad and manufacturing method of the same | |
TW200846138A (en) | Polishing pad, use thereof and method for making the same | |
JP2011067924A (en) | Holding pad |