TWI490085B - Keep the pad - Google Patents

Keep the pad Download PDF

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Publication number
TWI490085B
TWI490085B TW098132165A TW98132165A TWI490085B TW I490085 B TWI490085 B TW I490085B TW 098132165 A TW098132165 A TW 098132165A TW 98132165 A TW98132165 A TW 98132165A TW I490085 B TWI490085 B TW I490085B
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TW
Taiwan
Prior art keywords
holding
resin sheet
foaming
layer portion
polyurethane resin
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TW098132165A
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Chinese (zh)
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TW201109119A (en
Inventor
Yoshihide Kawamura
Tomohiro Iwao
Ayako Sato
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Fujibo Holdings Inc
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Publication of TW201109119A publication Critical patent/TW201109119A/en
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Publication of TWI490085B publication Critical patent/TWI490085B/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • B24B41/068Table-like supports for panels, sheets or the like

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)

Description

保持墊 Hold pad

本發明係有關於一種保持墊,特別是有關於一種具備保持被研磨物用保持面的樹脂薄片的保持墊。此樹脂薄片係透過濕式凝固法而形成有縱型發泡。 The present invention relates to a holding mat, and more particularly to a holding mat having a resin sheet for holding a holding surface for an object to be polished. This resin sheet is formed into a vertical foam by a wet coagulation method.

目前,半導體用矽晶圓(WF)、平行平面板(FPD)用玻璃基板或者是硬碟用基板等各種材料(被研磨物)的表面(加工面),為提升其平坦性,因而使用具備對向配置的二個平台之研磨機進行研磨加工。於此等被研磨物中,就半導體用矽晶圓(WF)而言,由於需伴隨著所應用之攜帶型機器等的小型化,有效率地製作基板,因此提供作為研磨加工之被研磨物則有大型化的傾向。另外,就FPD用玻璃基板而言,為對應於FPD本身的大型化,薄板化,其被研磨物之玻璃基板亦有大型化、薄板化的傾向。就此種大型化、薄板化之被研磨物而言,針對其平坦性之要求度亦隨之越來越高。 At present, the surface (processed surface) of various materials (the object to be polished) such as a semiconductor wafer for wafer (WF), a glass plate for parallel plane (FPD), or a substrate for a hard disk is used to improve the flatness. The grinding machine for the two platforms arranged is ground. In the above-mentioned object to be polished, a semiconductor wafer (WF) is required to be manufactured with a small size of a portable device or the like, and the substrate is efficiently produced. There is a tendency to increase in size. In addition, in the glass substrate for FPD, the glass substrate of the object to be polished tends to be large and thin, in order to increase the size of the FPD itself. In the case of such a large-sized, thin-plated object to be polished, the requirement for flatness is also increasing.

舉例來說,當要將被研磨物進行單面研磨加工時,在研磨機的其中之一平台上裝設研磨墊,而在另一平台上,被研磨物則保持成與研磨墊對向。於研磨加工時,於被研磨物與研磨墊間,供給含有研磨粒子(磨粒)的研磨漿,朝被研磨物施加研磨壓力(按壓力)。為避免因被研磨物與平台間的接觸而受到損傷,通常是在保持被研磨物用的平台上,裝設有保持墊。亦即,藉由保持墊以在研 磨處理中,暫時保持被研磨物。 For example, when the object to be polished is subjected to single-side grinding, a polishing pad is mounted on one of the platforms of the grinding machine, and on the other platform, the object to be polished is kept opposite to the polishing pad. At the time of the polishing process, a polishing slurry containing abrasive particles (abrasive grains) is supplied between the workpiece and the polishing pad, and a polishing pressure (pressing force) is applied to the workpiece. In order to avoid damage due to contact between the object to be polished and the platform, a holding mat is usually mounted on the platform for holding the object to be polished. That is, by keeping the mat in progress During the grinding process, the object to be polished is temporarily held.

習知技術係有如日本特開2006-62059號公報所揭露的一種使用具備有藉由濕式凝固法所形成的發泡構造的軟質的胺基甲酸酯薄片(樹脂薄片)的保持墊,以於上述研磨處理作為保持墊使用。在藉由濕式凝固法所形成的胺基甲酸酯薄片中,由於表面層(表層)的表面(保持面)具有平滑性,故被研磨物之保持性優異。此外,在比表面層還內側上,形成有橫跨大致厚度全體的大小的縱型發泡。因此,在遭受研磨加工時的研磨壓力而壓縮時,可藉此縱型發泡發揮緩衝性。當緩衝性過低時,因研磨壓力而使被研磨物所承受的應力產生不均勻現象,造成應力集中在朝保持墊側陷入的被研磨物的凸部上,此應力集中部分會因過度研磨而造成研磨不均的問題。反之,當縱型發泡的緩衝性增高時,被研磨物所承受的應力較不易產生不均勻現象,雖然可藉此提高被研磨物的表面平滑性,但卻同時會有因陷入程度變大而造成保持墊本身也有被研削的可能性。因此,通常在濕式凝固法中,係透過樹脂的選定及各種添加劑來調整發泡的尺寸或形成狀態等。 A conventionally disclosed technique is a holding pad using a soft urethane sheet (resin sheet) having a foaming structure formed by a wet coagulation method as disclosed in Japanese Laid-Open Patent Publication No. 2006-62059. The above polishing treatment is used as a holding mat. In the urethane sheet formed by the wet coagulation method, since the surface (holding surface) of the surface layer (surface layer) has smoothness, the retained property of the object to be polished is excellent. Further, a vertical foam having a size spanning substantially the entire thickness is formed on the inner side of the surface layer. Therefore, when it is compressed by the polishing pressure at the time of grinding processing, the longitudinal foaming can be used as a cushioning property. When the cushioning property is too low, the stress applied to the object to be polished is uneven due to the polishing pressure, and the stress is concentrated on the convex portion of the object to be stuck which is caught toward the holding pad side, and the stress concentration portion is excessively ground. And the problem of uneven grinding. On the other hand, when the cushioning property of the vertical foaming is increased, the stress applied to the object to be polished is less likely to cause unevenness, and although the surface smoothness of the object to be polished can be improved, the degree of sinking is also increased. As a result, the holding mat itself has the possibility of being ground. Therefore, in the wet coagulation method, the size of the foaming, the state of formation, and the like are usually adjusted by the selection of the resin and various additives.

然而,習知的藉由濕式凝固法所取得的胺基甲酸酯薄片中,因為形成有縱型發泡,所以會在形成發泡的部分與發泡間的樹脂的部分產生密度不均之問題產生。因此,在發泡形成部分和樹脂部分,於研磨加工時而被施加研磨壓力時的壓縮變形量會隨之不同,係無法充分滿足針對上述那種薄板化、大型化的被研磨物的高度平坦性的要求。亦即,當在保持墊上具有密度不均現象的同時,施加於被研磨物之應力的大小也會局部地相異,所以會變得難以遍及加工面的整體區域進行均一地研磨加工,而有損面內均一性 。若可減低壓縮變形量之不均,而可提高保持面之平坦性精度,則可滿足對被研磨物之高度面內均一性的要求。 However, in the urethane sheet obtained by the wet coagulation method, since the longitudinal foaming is formed, density unevenness occurs in the portion where the foamed portion and the foamed resin are formed. The problem arises. Therefore, in the foam forming portion and the resin portion, the amount of compressive deformation when the polishing pressure is applied during the polishing process is different, and the height of the object to be polished which is thinned and enlarged as described above cannot be sufficiently satisfied. Sexual requirements. That is, while the density unevenness is present on the holding mat, the magnitude of the stress applied to the object to be polished is locally different, so that it becomes difficult to uniformly grind the entire area of the processed surface, and there is In-plane uniformity . If the unevenness of the amount of compression deformation can be reduced, and the flatness accuracy of the holding surface can be improved, the requirement for the in-plane uniformity of the height of the object to be polished can be satisfied.

鑒於上述習知問題,本發明之其中一目的就是在提供一種保持墊,特別是可提高保持面的平坦性精度,且提升被研磨物的面內均一性的一種保持墊。 In view of the above-mentioned conventional problems, it is an object of the present invention to provide a retaining mat, in particular, a retaining mat which can improve the flatness accuracy of the retaining surface and improve the in-plane uniformity of the workpiece.

為解決上述課題,本發明的保持墊係具備有一樹脂薄片,此樹脂薄片具有藉由濕式凝固法所形成的縱型發泡,及可用以保持被研磨物之保持面。其特徵在於,上述樹脂薄片是自前述保持面的背面至朝向內側的厚度全體10%份量為止的範圍內,形成前述發泡的底部。且自前述背面至朝向內側的厚度全體10%份量,與前述背面相平行的剖面,和自前述背面至朝向內側的厚度全體40%份量,與前述背面相平行的剖面,此兩剖面所包挾的下層部的空隙率,係介於70%以上95%以下。 In order to solve the above problems, the holding mat of the present invention comprises a resin sheet having a vertical foam formed by a wet coagulation method and a holding surface for holding the object to be polished. In the above-described resin sheet, the foamed bottom portion is formed within a range from the back surface of the holding surface to the inner thickness of 10% by weight. And a total of 10% of the thickness from the back surface to the inner side, a cross section parallel to the back surface, and a total thickness of 40% from the back surface to the inner side, and a cross section parallel to the back surface, the two sections are covered. The porosity of the lower layer portion is 70% or more and 95% or less.

本發明中,由於樹脂薄片在保持面之背面側中,具有一定厚度份量的下層部的空隙率為介於70%以上95%以下,所以可藉由此下層部,以確保緩衝性,使得施加於被研磨物的負荷可得以分散,因而可減輕伴隨著研磨加工而被壓縮時的下層部的發泡形狀變化,對被研磨物所產生之負擔,進而可提高保持面的平坦性精度使被研磨物的面內均一性提升。 In the present invention, since the porosity of the lower layer portion having a certain thickness portion of the resin sheet on the back surface side of the holding surface is 70% or more and 95% or less, the lower layer portion can be used to secure the cushioning property. Since the load on the object to be polished can be dispersed, the foaming shape change in the lower layer portion when compressed by the polishing process can be reduced, and the load on the object to be polished can be increased, and the flatness accuracy of the holding surface can be improved. The in-plane uniformity of the abrasive increases.

在此情況下,樹脂薄片在與自保持面算起朝向內側的厚度全體10%份量,與保持面平行的剖面上,由發泡所形成之孔之平均孔徑設定為A,且於下層部中,與保持面平行的剖面上,由發泡所 形成之孔之最大孔徑設定為B時,則比值B/A較佳為介於20~50的範圍。此外,自保持面起算朝向內側的厚度全體10%份量,與保持面平行的剖面,和自前述保持面起算朝向內側的厚度全體40%份量,與前述保持面相平行的剖面,此兩剖面所包挾的上層部的空隙率可介於35%以上55%以下。樹脂薄片的下層部的空隙率較佳為介於75%以上90%以下,而上層部的空隙率較佳為介於40%以上50%以下。於樹脂薄片的下層部上,在與保持面平行的剖面當中的每單位面積,顯示因發泡所形成的孔的總面積的比率為最大時的剖面,其比率的最大值可介於80%以上95%以下。樹脂薄片亦可以聚胺酯樹脂形成。在樹脂薄片的各發泡間的聚胺酯樹脂亦可形成微多孔狀。此時,可將聚胺酯樹脂的100%模量值設定為低於20Mpa者較佳。亦可在樹脂薄片的背面側上,再塗布用以裝設於研磨機上所需的黏著材。此時,亦可在樹脂薄片和黏著材間,再貼合用以支撐樹脂薄片用的支撐材。 In this case, the resin sheet has a thickness of 10% of the entire thickness from the self-supporting surface, and the average pore diameter of the pores formed by foaming is set to A in the cross section parallel to the holding surface, and is in the lower layer portion. , on the section parallel to the holding surface, by the foaming station When the maximum aperture of the formed hole is set to B, the ratio B/A is preferably in the range of 20 to 50. In addition, the total thickness of the inner surface is 10% by weight, the cross section parallel to the holding surface, and the thickness of the inner side from the holding surface are 40%, and the cross section parallel to the holding surface is included in the two sections. The void ratio of the upper portion of the crucible may be between 35% and 55%. The porosity of the lower portion of the resin sheet is preferably from 75% to 90%, and the void ratio in the upper portion is preferably from 40% to 50%. In the lower layer portion of the resin sheet, the cross-sectional area in which the ratio of the total area of the pores formed by the foaming is maximum is shown per unit area in the cross section parallel to the holding surface, and the maximum value of the ratio may be 80%. Above 95%. The resin sheet can also be formed of a polyurethane resin. The polyurethane resin in the respective foams of the resin sheet may also be formed in a microporous shape. At this time, it is preferred to set the 100% modulus value of the polyurethane resin to less than 20 MPa. It is also possible to apply an adhesive material for mounting on a grinder on the back side of the resin sheet. At this time, a support material for supporting the resin sheet may be bonded between the resin sheet and the adhesive.

根據本發明,由於樹脂薄片在保持面的背面側中具有一定厚度份量的下層部的空隙率係介於70%以上95%以下,所以藉由下層部,可確保其緩衝性,使得施加於被研磨物上的負荷可得以分散,因而可減輕伴隨著研磨加工而被壓縮時的下層部的發泡形狀變化,對被研磨物所產生之負擔,進而可達到提高保持面的平坦性精度使被研磨物的面內均一性提升的效果。 According to the present invention, since the porosity of the lower layer portion having a certain thickness portion of the resin sheet on the back surface side of the holding surface is 70% or more and 95% or less, the cushioning property can be ensured by the lower layer portion, so that it is applied to the Since the load on the polishing material can be dispersed, the foaming shape change in the lower layer portion when compressed by the polishing process can be reduced, and the load on the object to be polished can be increased, and the flatness accuracy of the holding surface can be improved. The effect of the in-plane uniformity of the abrasive.

2、12‧‧‧胺基甲酸酯薄片 2, 12.‧ ‧ urethane sheets

2a、12a‧‧‧表面層 2a, 12a‧‧‧ surface layer

3、13‧‧‧發泡 3, 13‧‧‧ foaming

7‧‧‧雙面膠帶 7‧‧‧Double-sided tape

8‧‧‧剝離紙 8‧‧‧ peeling paper

10、20‧‧‧保持墊 10, 20‧‧‧ Keep pad

Sh‧‧‧保持面 Sh‧‧‧ Keep face

Sr‧‧‧背面 Sr‧‧‧Back

Ph‧‧‧上層部 Ph‧‧‧Upper Department

Pr‧‧‧下層部 Pr‧‧‧ Lower Department

第1圖 係表示適用於本發明之實施形態的保持墊之剖面示意圖;第2圖 係表示構成實施形態的保持墊的胺基甲酸酯薄片中的發 泡之形成狀態之示意圖,其中,第2(A)圖係為胺基甲酸酯薄片的厚度方向之剖面圖,而第2(B)圖係分別表示於第2(A)圖中B-B剖面上發泡所形成的孔的示意說明圖,而第2(C)圖係分別表示於第2(A)圖中C-C剖面上發泡所形成的孔的示意說明圖;第3圖 係表示習知的保持墊之剖面示意圖;第4圖 係表示構成習知的保持墊的胺基甲酸酯薄片中的發泡之形成狀態之示意圖,其中,第4(A)圖係為胺基甲酸酯薄片的厚度方向之剖面圖,而第4(B)圖係分別表示於第4(A)圖中B-B剖面上發泡所形成的孔的示意說明圖,而第4(C)圖係分別表示於第4(A)圖中C-C剖面上發泡所形成的孔的示意說明圖;以及第5圖 係表示相對於自構成保持墊的胺基甲酸酯薄片的保持面起算的厚度,此厚度範圍中各個剖面上,因發泡所形成的孔的開口率之曲線比較圖。 Fig. 1 is a schematic cross-sectional view showing a holding mat suitable for use in an embodiment of the present invention; and Fig. 2 is a view showing the hair in a urethane sheet constituting the holding mat of the embodiment. A schematic view of the state of formation of the bubble, wherein the second (A) diagram is a cross-sectional view in the thickness direction of the urethane sheet, and the second (B) diagram is shown in the BB section in the second (A) diagram, respectively. FIG. 2(C) is a schematic explanatory view showing a hole formed by foaming on the CC section in FIG. 2(A), and FIG. 3 is a schematic view showing a hole formed by foaming on the CC section; BRIEF DESCRIPTION OF THE DRAWINGS FIG. 4 is a schematic view showing a state of formation of foam in a urethane sheet constituting a conventional holding mat, wherein the fourth (A) diagram is an aminocarboxylic acid. A cross-sectional view of the thickness direction of the ester sheet, and a fourth (B) diagram showing a schematic view of the pores formed by foaming on the BB section in the fourth (A) diagram, respectively, and the fourth (C) diagram is respectively A schematic view showing pores formed by foaming on the CC cross section in the fourth (A) diagram; and Fig. 5 is a graph showing thickness with respect to the holding surface of the urethane sheet constituting the holding mat, A graph comparing the aperture ratios of the holes formed by the foaming in each of the thickness ranges.

以下,茲參照圖式,針對適用本發明之保持墊的實施形態進行說明。 Hereinafter, an embodiment in which the holding mat of the present invention is applied will be described with reference to the drawings.

本實施形態之保持墊的結構係如第1圖所示,本實施形態中保持墊10,具備胺基甲酸酯薄片2以作為聚胺酯樹脂製的樹脂薄片。聚胺基甲酸酯薄片2係藉由濕式凝固法形成,具有保持被研磨物用的保持面Sh。 In the present embodiment, the holding mat 10 is provided with a urethane sheet 2 as a resin sheet made of a polyurethane resin. The polyurethane sheet 2 is formed by a wet coagulation method and has a holding surface Sh for holding the object to be polished.

胺基甲酸酯薄片2,係具有在橫跨保持面Sh將近數μm左右的厚度範圍內,形成有緻密的微多孔的表面層2a。亦即,表面層2a具有微多孔構造。在比胺基甲酸酯薄片2的表面層2a較為內側(內部)上,形成多個略均等分散狀態的發泡3。發泡3的大小,約為橫跨 胺基甲酸酯薄片2的大約厚度全體之大小,在厚度方向上形成為縱長狀且帶有圓形的圓錐狀。胺基甲酸酯薄片2因具有表面層2a,所以在保持面Sh上,未形成發泡3的開口。此外,在胺基甲酸酯薄片2中,從保持面Sh的背面(以下,稱為背面Sr。)至朝向內側厚度全體10%份量為止的範圍內,形成有發泡3的底部。在發泡3彼此間的聚胺酯樹脂中,形成有比發泡3還小的微多孔(未圖示)。在胺基甲酸酯薄片2中,表面層2a的微多孔、發泡3及微多孔呈網目狀地相互連通,且具有發泡是以形成連續發泡狀的連續發泡構造。 The urethane sheet 2 has a surface layer 2a in which a dense microporous layer is formed in a thickness range of approximately several μm across the holding surface Sh. That is, the surface layer 2a has a microporous structure. A plurality of foams 3 in a slightly uniform dispersion state are formed on the inner side (inside) of the surface layer 2a of the urethane sheet 2 . The size of foam 3 is about straddle The urethane sheet 2 has a thickness of approximately the entire thickness of the urethane sheet 2, and is formed in a longitudinal shape in a thickness direction and has a circular conical shape. Since the urethane sheet 2 has the surface layer 2a, the opening of the foam 3 is not formed on the holding surface Sh. In the urethane sheet 2, the bottom portion of the foam 3 is formed in a range from the back surface of the holding surface Sh (hereinafter referred to as the back surface Sr) to the entire thickness of the inner surface by 10%. In the polyurethane resin foamed between the three, a microporous (not shown) smaller than the foaming 3 is formed. In the urethane sheet 2, the microporous, foamed 3, and microporous of the surface layer 2a communicate with each other in a mesh shape, and foaming is a continuous foaming structure in which a continuous foaming state is formed.

在胺基甲酸酯薄片2中,自背面Sr起算朝向內側相距是厚度全體的10%份量的與背面Sr平行的剖面,和在朝向內側相距是厚度全體的40%份量的與背面Sr平行的剖面,此兩剖面所包挾的下層部Pr的空隙率,係調整為介於70%以上95%以下。亦即,當胺基甲酸酯薄片2的厚度設定為t時,自背面Sr朝向內側相距0.1t的厚度份量的剖面,和朝向內側相距0.4t的厚度份量的剖面,此兩剖面所包挾的下層部Pr中,基於發泡3的空隙率是介於75~95%的範圍。相對地,自保持面Sh朝向內側相距是厚度全體的10%份量的與保持面Sh平行的剖面,和朝向內側相距是厚度全體的40%份量的與保持面Sh平行的剖面,此兩剖面所包挾的上層部Ph的空隙率,係調整為介於35%以上55%以下。亦即,自保持面Sh起算朝向內側相距0.1t的厚度份量的剖面,和朝向內側相距0.4t的厚度份量的剖面,此兩剖面所包挾的上層部Ph中,根據發泡3的空隙率是介於35~55%的範圍。此種上層部Pb或下層部Pr的空隙率可透過所使用的聚胺酯樹脂的選定、濕式凝固法的條件設定而加以調整(詳如 後述)。 In the urethane sheet 2, a cross section parallel to the back surface Sr is 10% of the total thickness from the back surface Sr, and a 40% portion of the entire thickness is parallel to the back surface Sr. In the cross section, the porosity of the lower portion Pr surrounded by the two sections is adjusted to be 70% or more and 95% or less. That is, when the thickness of the urethane sheet 2 is set to t, a cross section of a thickness portion of 0.1 t from the back surface Sr toward the inner side, and a thickness portion of a thickness of 0.4 t toward the inner side, the two sections are covered. In the lower layer portion Pr, the void ratio based on the foaming 3 is in the range of 75 to 95%. In contrast, the self-retaining surface Sh is a cross section parallel to the holding surface Sh of 10% of the entire thickness of the holding surface Sh, and a cross section parallel to the holding surface Sh of 40% of the total thickness in the inner side. The porosity of the upper portion Ph of the package is adjusted to be between 35% and 55%. That is, a cross section of a thickness portion which is 0.1 t inward from the holding surface Sh, and a cross section which is 0.4 t in thickness toward the inner side, and the void ratio of the foaming 3 in the upper portion Ph of the two cross sections It is in the range of 35 to 55%. The void ratio of the upper layer portion Pb or the lower layer portion Pr can be adjusted by the selection of the polyurethane resin to be used and the condition setting of the wet solidification method (for example, Later).

此外,在胺基甲酸酯薄片2中,自保持面Sh起算朝向內側相距是厚度全體的10%份量的與保持面Sh平行的剖面上,具有根據發泡3所形成的孔,當該孔之平均孔徑設定為A的同時,下層部Pr與背面Sr平行的剖面當中的每單位面積,顯示因發泡3所形成的孔的總面積的比率(以下,稱為開口率。)為最大值的剖面,此剖面上形成有孔,該孔之最大孔徑設定為B時,則最大孔徑B對平均孔徑A之比值B/A係調整為介於20~50的範圍。亦即,具有發泡孔徑是形成鄰近保持面Sh的發泡的平均孔徑的20~50倍大小的發泡,此種發泡是形成在下層部Pr中的開口率是顯示為最大值的剖面上。此外,開口率的最大值可調整為介於80%以上95%以下。 Further, in the urethane sheet 2, a section formed by the foaming 3 is formed on the cross section which is parallel to the holding surface Sh by 10% of the total thickness from the holding surface Sh, and the hole is formed by the foaming 3 When the average pore diameter is set to A, the ratio of the total area of the pores formed by the foaming 3 (hereinafter referred to as the aperture ratio) per unit area in the cross section in which the lower layer portion Pr is parallel to the back surface Sr is the maximum value. In the cross section, a hole is formed in the cross section, and when the maximum aperture of the hole is set to B, the ratio B/A of the maximum aperture B to the average aperture A is adjusted to be in the range of 20 to 50. That is, the foaming aperture is a foam having a size of 20 to 50 times that of the foamed average pore diameter adjacent to the holding surface Sh, and the foaming is a section in which the opening ratio formed in the lower layer portion Pr is the maximum value. on. Further, the maximum value of the aperture ratio can be adjusted to be 80% or more and 95% or less.

在此種胺基甲酸酯薄片2中,相較於鄰近保持面Sh與保持面Sh平行的剖面上所形成的孔,鄰近背面Sr與背面Sr平行的剖面上所形成的孔,係形成相互接近的狀態。如第2(A)圖所示,鄰近保持面Sh自保持面Sh起算相距胺基甲酸酯薄片2的厚度t的10%份量的位置,亦即,朝向內側在0.1t份量的位置(箭頭B的位置),而鄰近背面Sr自背面Sr起算朝向內側相距0.1t份量的位置(箭頭C的位置)。在此情況,如第2(B)圖所示,鄰近保持面Sh的B-B線剖面中,藉由發泡3所形成的孔是呈相互疏離。反之,如第2(C)圖所示,鄰近背面Sr的C-C線剖面中藉由發泡3所形成的孔是呈相互接近。 In the urethane sheet 2, the pores formed in the cross section parallel to the back surface Sr and the back surface Sr are formed in comparison with the pores formed in the cross section parallel to the holding surface Sh and the holding surface Sh. Close state. As shown in Fig. 2(A), the position adjacent to the holding surface Sh from the holding surface Sh is 10% of the thickness t of the urethane sheet 2, that is, the position toward the inner side at the amount of 0.1 t parts (arrow) The position of B is adjacent to the back surface Sr from the back surface Sr from the position of 0.1 t parts toward the inner side (the position of the arrow C). In this case, as shown in Fig. 2(B), in the cross section of the line B-B adjacent to the holding surface Sh, the holes formed by the foaming 3 are alienated from each other. On the other hand, as shown in Fig. 2(C), the holes formed by the foaming 3 in the C-C line cross section adjacent to the back surface Sr are close to each other.

此外,保持墊10為,在胺基甲酸酯薄片2的背面Sr側上,貼合有作為黏著材的雙面膠帶7,用以將保持墊10裝設於研磨機。雙面膠帶7具有未圖示的基材,在基材的兩面上分別形成有丙烯酸系黏著劑等感壓型黏著劑層(未圖示)。基材是使用例如聚對苯二甲 酸乙二酯(以下,簡稱為PET。)製薄膜等可撓性薄膜。雙面膠帶7是藉由基材的一面側上的黏著劑層,而與胺基甲酸酯薄片2貼合,另一面側(胺基甲酸酯薄片2之相反側)的黏著劑層的表面則由剝離紙8所覆蓋。此外,就本實施形態而言,此雙面膠帶7的基材也可兼用作為支撐胺基甲酸酯薄片2用的支撐材。 Further, in the holding mat 10, a double-sided tape 7 as an adhesive material is bonded to the back surface Sr side of the urethane sheet 2 to mount the holding mat 10 to the grinder. The double-sided tape 7 has a substrate (not shown), and a pressure-sensitive adhesive layer (not shown) such as an acrylic adhesive is formed on both surfaces of the substrate. The substrate is used, for example, polyparaphenylene A flexible film such as a film made of ethylene glycol diester (hereinafter abbreviated as PET). The double-sided tape 7 is an adhesive layer which is bonded to the urethane sheet 2 by the adhesive layer on one side of the substrate, and the adhesive layer of the other side (the opposite side of the urethane sheet 2) The surface is covered by a release paper 8. Further, in the present embodiment, the base material of the double-sided tape 7 may also serve as a support for supporting the urethane sheet 2.

以下,將就保持墊之製造方式進行說明,保持墊10是將藉由濕式凝固法形成的胺基甲酸酯薄片2與雙面膠帶7相互貼合所製造而成。亦即,係包含,調製聚胺酯樹脂溶液的準備步驟、於成膜基材上塗布聚胺酯樹脂溶液,並於凝固液中,使聚胺酯樹脂溶液凝固再生成聚胺酯樹脂的凝固再生步驟、將薄片狀的聚胺酯樹脂加以洗淨,並使其乾燥的洗淨/乾燥步驟以及貼合所取得之胺基甲酸酯薄片2和雙面膠帶7的層壓步驟等製作保持墊10。以下,茲依照各步驟順序進行說明之。 Hereinafter, the manufacturing method of the holding mat will be described. The holding mat 10 is produced by bonding the urethane sheet 2 formed by the wet coagulation method and the double-sided tape 7 to each other. That is, the preparation step of preparing the polyurethane resin solution, coating the polyurethane resin solution on the film-forming substrate, and solidifying the polyurethane resin solution in the coagulating liquid to form a polyurethane resin reconstitution step, and flaking the polyurethane The holding mat 10 is prepared by washing the resin, drying and drying the drying/drying step, and laminating the obtained urethane sheet 2 and the double-sided tape 7. Hereinafter, the description will be made in accordance with the order of each step.

準備步驟係為混合聚胺酯樹脂、可溶解聚胺酯樹脂的水混和性有機溶媒及添加劑,將聚胺酯樹脂溶解。可列舉N,N-二甲基甲醯胺(以下,簡稱為DMF。)或N,N-二甲基乙醯胺(DMAc)等作為有機溶媒,本實施形態中係使用DMF作為有機溶媒。聚胺酯樹脂可自聚酯系、聚醚系、聚碳酸酯系等樹脂中選擇其中一種來使用。當考慮要形成上述的發泡構造時,則可於DMF中溶解有20重量%的聚胺酯樹脂的樹脂溶液中,使用B型旋轉黏度計於25℃下所測定的黏度較佳為選定黏度介於5~10Pa.s的範圍間的樹脂來使用。此外,所使用的聚胺酯樹脂較佳為具有低於20MPa的100%模量值,此聚胺酯樹脂可於DMF中溶解成為介於10~30重量%的範圍。此外,作為添加劑,因為要控制發泡3的尺寸或數量(個數),故 可使用碳黑等顏料、促進發泡的親水性添加劑、使聚胺酯樹脂的再生穩定化的疏水性添加劑等。將所得之溶液在減壓環境下,進行脫泡而取得聚胺酯樹脂溶液。 The preparation step is to dissolve the polyurethane resin by mixing a polyurethane resin, a water-miscible organic solvent capable of dissolving the polyurethane resin, and an additive. N,N-dimethylformamide (hereinafter abbreviated as DMF) or N,N-dimethylacetamide (DMAc) may be mentioned as an organic solvent. In the present embodiment, DMF is used as an organic solvent. The polyurethane resin can be used by selecting one of a resin such as a polyester type, a polyether type, or a polycarbonate type. When it is considered that the foaming structure described above is to be formed, the viscosity of the resin solution which is soluble in 20% by weight of the polyurethane resin in the DMF is preferably selected at 25 ° C using a B-type rotational viscometer. 5~10Pa. Resin between the range of s is used. Further, the polyurethane resin to be used preferably has a 100% modulus value of less than 20 MPa, and the polyurethane resin can be dissolved in DMF to be in the range of 10 to 30% by weight. Further, as an additive, since the size or the number (number) of the foam 3 is to be controlled, A pigment such as carbon black, a hydrophilic additive that promotes foaming, a hydrophobic additive that stabilizes regeneration of the polyurethane resin, and the like can be used. The obtained solution was defoamed under reduced pressure to obtain a polyurethane resin solution.

於凝固再生步驟中,將準備步驟中所得之聚胺酯樹脂溶液,於常溫下利用刀式塗布機等塗布裝置,於帶狀的成膜基材上略均一地塗布成薄片狀。此時,可透過調整刀式塗布機等與成膜基材間的間隙(clearance),來調整樹脂溶液之塗布厚度(塗布量)。成膜基材可使用樹脂製薄膜、布帛、不織布等,於本實施形態中則是使用PET製薄膜。 In the coagulation and regeneration step, the polyurethane resin solution obtained in the preparation step is applied to the strip-shaped film-forming substrate in a sheet form at a normal temperature by a coating device such as a knife coater. At this time, the coating thickness (coating amount) of the resin solution can be adjusted by adjusting the clearance between the knife coater and the like and the film formation substrate. A film made of a resin, a cloth, a non-woven fabric or the like can be used as the film-forming substrate, and in the present embodiment, a film made of PET is used.

將塗布於成膜基材上的聚胺酯樹脂溶液,連續地引導至對聚胺酯樹脂而言為不良溶媒的以水為主要成分的凝固液(水系凝固液)中。為了調整聚胺酯樹脂的再生速度,亦可於凝固液中添加DMF或DMF以外的極性溶媒等有機溶媒,但於本實施形態中,則是使用水。於凝固液中,首先,在聚胺酯樹脂溶液與凝固液間的界面形成皮膜,在接近皮膜的聚胺酯樹脂中,形成可構成表面層2a用的微多孔。接著,藉由聚胺酯樹脂溶液中的DMF的朝凝固液中的擴散以及對聚胺酯樹脂中水的浸入的調和現象,而進行再生具有連續發泡構造的聚胺酯樹脂。此時,由於成膜基材的PET製薄膜,水(凝固液)無法浸透,故在表面層2a側發生DMF與水的置換,成膜基材側係形成較表面層2a側還大的發泡3。 The polyurethane resin solution applied to the film-forming substrate is continuously guided to a coagulating liquid (aqueous coagulating liquid) containing water as a main component of the polyurethane resin. In order to adjust the regeneration rate of the polyurethane resin, an organic solvent such as a polar solvent other than DMF or DMF may be added to the coagulation liquid. However, in the present embodiment, water is used. In the coagulating liquid, first, a film is formed at the interface between the polyurethane resin solution and the coagulating liquid, and microporous which can constitute the surface layer 2a is formed in the polyurethane resin close to the film. Next, the polyurethane resin having a continuous foaming structure is regenerated by the diffusion of DMF in the polyurethane resin solution into the coagulating liquid and the incorporation of water into the polyurethane resin. At this time, since the water (coagulating liquid) of the film-forming substrate is not allowed to permeate, the DMF and the water are replaced on the surface layer 2a side, and the film-forming substrate side is formed to have a larger surface than the surface layer 2a side. Bubble 3.

於此,茲就隨聚胺酯樹脂的再生而伴隨而來的發泡形成進行說明。在聚胺酯樹脂上,因為凝集力變大,因而在接近皮膜的聚胺酯樹脂中,急速地進行再生,而形成表面層2a。於本實施形態中,是使用100%模量值低於20MPa的聚胺酯樹脂。且顯示此聚胺酯樹 脂溶液的黏度介於5~10Pa.s的範圍。亦即,使用低模量的聚胺酯樹脂溶解成低黏度的聚胺酯樹脂溶液。因此,在表面層2a形成後,凝固前的聚胺酯樹脂溶液中之聚胺酯樹脂移動至表面層2a側並凝集的同時,在成膜基材側則伴隨著聚胺酯樹脂量的減少,因此與表面層2a側相比,係形成肥大化的發泡3。換言之,與上層部Ph相比於下層部Pr中,因發泡3肥大化,而促使空隙率變大。再者,自DMF的聚胺酯樹脂溶液而來的脫溶媒,亦即,藉由DMF與水閒的置換,而形成表面層2a、發泡3及微多孔,表面層2a的微多孔、發泡3及微多孔係呈網目狀地相互連通。此外,由於聚胺酯樹脂於成膜基材上可再生,所以在與成膜基材的表面接觸而形成的背面Sr中,未形成發泡3的開口。 Here, the foam formation accompanying the regeneration of the polyurethane resin will be described. In the polyurethane resin, since the cohesive force is increased, the polyurethane layer resin close to the film is rapidly regenerated to form the surface layer 2a. In the present embodiment, a polyurethane resin having a 100% modulus value of less than 20 MPa is used. And show this polyurethane tree The viscosity of the lipid solution is between 5 and 10 Pa. The scope of s. That is, a low-viscosity polyurethane resin solution is dissolved using a low-modulus polyurethane resin. Therefore, after the formation of the surface layer 2a, the polyurethane resin in the polyurethane resin solution before solidification moves to the side of the surface layer 2a and aggregates, and the amount of the polyurethane resin decreases with the surface of the film-forming substrate side, and thus the surface layer 2a Compared to the side, foaming 3 is formed. In other words, in the lower layer portion Pr compared to the upper layer portion Ph, the void ratio is increased due to the enlargement of the foaming 3 . Further, the desolvent from the DMF urethane resin solution, that is, the surface layer 2a, the foam 3 and the microporous are formed by DMF and water replacement, and the surface layer 2a is microporous and foamed. And the microporous system is connected to each other in a mesh shape. Further, since the polyurethane resin is recyclable on the film-forming substrate, the opening of the foam 3 is not formed in the back surface Sr formed in contact with the surface of the film-forming substrate.

在洗淨/乾燥步驟中,將於再生步驟中所再生的聚胺酯樹脂,以水等之洗淨液中洗淨,以除去殘留在聚胺酯樹脂中的DMF後,使其乾燥。於聚胺酯樹脂的乾燥中,本實施形態是使用具用內含熱源圓筒的圓筒乾燥機。透過使聚胺酯樹脂沿著圓筒的圓周面通過而乾燥。將所獲得之胺基甲酸酯薄片2捲取成捲軸狀。 In the washing/drying step, the polyurethane resin to be regenerated in the regeneration step is washed with a washing liquid such as water to remove DMF remaining in the polyurethane resin, and then dried. In the drying of the polyurethane resin, in the present embodiment, a cylinder dryer having a heat source containing cylinder is used. It is dried by passing the polyurethane resin along the circumferential surface of the cylinder. The obtained urethane sheet 2 was taken up in a roll shape.

於層壓步驟中,係用以貼合藉濕式凝固法所製成胺基甲酸酯薄片2與雙面膠帶7。此時,讓胺基甲酸酯薄片2的背面Sr與雙面膠帶7貼合。接下來,再裁切成圓形或多角形等所預期的形狀、尺寸後,再進行確認是否有損傷或附著有髒污或異物等的檢查,即完成保持墊10。 In the laminating step, the urethane sheet 2 and the double-sided tape 7 which are formed by the wet coagulation method are attached. At this time, the back surface Sr of the urethane sheet 2 is bonded to the double-sided tape 7. Next, after cutting into a desired shape and size such as a circle or a polygon, it is checked whether there is damage or adhesion of dirt or foreign matter, that is, the holding pad 10 is completed.

其次,茲對本實施形態的保持墊10所達到之效果作用等進行說明。 Next, the effect and the like achieved by the holding mat 10 of the present embodiment will be described.

為使說明便於理解,茲就藉由習知濕式凝固法所形成的胺基甲酸酯薄片的發泡構造進行說明。於習知的濕式凝固法中,於PET製薄膜等的成膜基材上所塗布的聚胺酯樹脂溶液係於水等凝固液中進行凝固。因此,如第3圖所示,在構成習知的保持墊20的胺基甲酸酯薄片12中,相較於濕式凝固時初期所形成的表面層12a還為內側上,形成有橫跨胺基甲酸酯薄片12厚度全體的多量發泡13。此發泡13在保持面Sh側的孔徑較背面Sr側的孔徑還小,沿著厚度方向於垂直方向上所形成。 In order to facilitate the understanding of the description, the foaming structure of the urethane sheet formed by the conventional wet coagulation method will be described. In the conventional wet coagulation method, the polyurethane resin solution applied to a film-forming substrate such as a PET film is solidified in a coagulating liquid such as water. Therefore, as shown in Fig. 3, in the urethane sheet 12 constituting the conventional holding mat 20, the surface layer 12a formed at the initial stage during wet solidification is also on the inner side, and is formed across The urethane sheet 12 has a large amount of foam 13 in its entirety. The diameter of the foam 13 on the holding surface Sh side is smaller than the diameter of the back surface Sr side, and is formed in the vertical direction along the thickness direction.

此外,在胺基甲酸酯薄片12中,鄰近保持面Sh,與保持面Sh平行的剖面上所形成的孔,與鄰近背面Sr,與背面Sr平行的剖面上所形成的孔,此兩種孔任一種皆呈相互疏離。由於發泡13在背面Sr側的孔徑是比在保持面Sh側的孔徑還大,所以疏離的程度會在保持面Sh側變大。亦即,如第4(A)圖所示,鄰近保持面Sh,與保持面Sh朝向內側相距胺基甲酸酯薄片12的厚度的10%份量的位置(箭頭B的位置),而鄰近背面Sr,則與背面Sr朝向內側相距胺基甲酸酯薄片12的厚度的10%份量內側的位置(箭頭C的位置)。在此情況下,如第4(B)圖所示,鄰近保持面Sh的B-B線剖面上,根據發泡13所形成的孔係形成疏離。如第4(C)圖所示,鄰近背面Sr的C-C線剖面上,根據發泡13所形成的孔亦形成疏離。C-C線剖面上,所形成的孔中,雖較B-B線剖面上所形成的孔還接近,但與構成上述的保持墊10的胺基甲酸酯薄片2的鄰近背面Sr的剖面上所形成的孔相比,係呈疏離地形成(參照第2(C)圖)。在此種胺基甲酸酯薄片12中,考量與上述之胺基甲酸酯薄片2中的上層部Ph、下層部Pr同樣的區域,上層部的空隙率係30~45%左右,下層部的空 隙率係70%以下左右。 Further, in the urethane sheet 12, a hole formed in a cross section parallel to the holding surface Sh adjacent to the holding surface Sh, and a hole formed in a cross section parallel to the back surface Sr and the back surface Sr, Any one of the holes is alienated from each other. Since the diameter of the foam 13 on the side of the back surface Sr is larger than the diameter of the hole on the side of the holding surface Sh, the degree of the detachment becomes larger on the side of the holding surface Sh. That is, as shown in Fig. 4(A), adjacent to the holding surface Sh, the holding surface Sh is directed toward the inner side by a distance of 10% of the thickness of the urethane sheet 12 (the position of the arrow B), and adjacent to the back surface. Sr is a position (the position of the arrow C) on the inner side of the back surface Sr from the inner side of the thickness of the urethane sheet 12 by 10%. In this case, as shown in Fig. 4(B), the hole formed in accordance with the foam 13 is formed in the cross section of the line B-B adjacent to the holding surface Sh. As shown in Fig. 4(C), the hole formed in accordance with the foam 13 is also formed in the C-C line cross section adjacent to the back surface Sr. In the CC line section, the hole formed is closer to the hole formed in the BB line section, but is formed on the cross section adjacent to the back surface Sr of the urethane sheet 2 constituting the above-mentioned holding pad 10. The pores are formed in an alienated manner (see Fig. 2(C)). In the urethane sheet 12, the same ratio as the upper layer portion Ph and the lower layer portion Pr in the urethane sheet 2 described above is considered, and the porosity of the upper layer portion is about 30 to 45%, and the lower layer portion is used. Null The gap ratio is about 70% or less.

就使用此種胺基甲酸酯薄片12的習知的保持墊20而言,在形成發泡13的部分和發泡13間的樹脂部分間會發生密度不均現象。因此,發泡形成部分和樹脂部分,在研磨加工時,受到研磨壓力時的壓縮變形量相異,因而變得難以滿足針對被研磨物所要求的高度平坦度。亦即,在保持墊20中,因發生密度不均現象,使得施加於被研磨物上的應力的大小也會局部地相異,所以會變得難以遍及將被研磨物之加工面的整體區域地進行均一地研磨加工。因此,以保持墊20係無法充分滿足針對上述傾向薄板化、大型化為目的之半導體用WF及FPD用玻璃基板所要求之高精度的平坦性。 In the conventional holding mat 20 using the urethane sheet 12, density unevenness occurs between the portion where the foam 13 is formed and the resin portion between the foams 13. Therefore, the foam forming portion and the resin portion are different in the amount of compressive deformation when subjected to the polishing pressure during the polishing process, and thus it becomes difficult to satisfy the height flatness required for the object to be polished. That is, in the holding mat 20, the density unevenness occurs, and the magnitude of the stress applied to the object to be polished is locally different, so that it becomes difficult to spread over the entire area of the processed surface of the object to be polished. The ground is uniformly ground. Therefore, the high-precision flatness required for the glass substrate for WF and FPD for semiconductors for the purpose of thinning and increasing the size of the above-mentioned tends is not sufficiently satisfied.

就使用此種胺基甲酸酯薄片12習知的保持墊20而言,當進行研磨加工時,而施加研磨壓力時,由於被研磨物會陷入保持墊20側,因具有緩衝性的胺基甲酸酯薄片12壓縮,而對研磨物產生應力。在保持墊20的密度是不均的情況下,亦即,在發泡13的形成上有不均之情況下,在各密度不均部分上,施加於被研磨物的應力大小亦隨之不同。因此,施予被研磨物的按壓力,區域性地變換,因而難以將被研磨物的加工面,橫跨全區域進行均一地研磨加工。其結果為,進行研磨加工後的被研磨物中,例如,在外緣部與中央部間的研磨裕度不同,而產生所謂外緣壓陷的現象。換言之,會因以保持墊20保持被研磨物,進行研磨加工,而損及加工面的平坦性。由上可知,習知的保持墊20,無法充分滿足達到高集積化無缺陷的基層配線或顯示高畫質影像等需求為目的的半導體用WF或FPD用玻璃基板所要求之高精度的平坦性。 In the case of the holding mat 20 which is conventionally used for the urethane sheet 12, when the polishing process is performed, when the polishing pressure is applied, the object to be polished is caught on the side of the holding mat 20 due to the buffering amine group. The formate flakes 12 are compressed to stress the abrasive. In the case where the density of the holding mat 20 is uneven, that is, in the case where the foaming 13 is unevenly formed, the stress applied to the object to be polished is different in each density uneven portion. . Therefore, the pressing force applied to the object to be polished is changed in a regional manner, so that it is difficult to uniformly polish the processed surface of the object to be polished across the entire region. As a result, in the object to be polished after the polishing process, for example, the polishing margin between the outer edge portion and the center portion is different, and a phenomenon of so-called outer edge depression occurs. In other words, the polishing pad is held by the holding mat 20, and the polishing process is performed to impair the flatness of the machined surface. As is apparent from the above, the conventional holding mat 20 cannot sufficiently satisfy the high-precision flatness required for the glass substrate for WF or FPD for semiconductors, which is required for high-integration, defect-free base wiring or display of high-quality images. .

相對地,於本實施形態中,由於構成保持墊10的胺基甲酸酯薄片 2的背面Sr朝向內側相距是厚度t的10%份量(0.1t份量),與背面Sr平行的剖面,和在朝向內側相距是40%份量(0.4t份量),與背面Sr平行的剖面,此兩剖面所包挾的下層部Pr的空隙率,可調整介於70%以上95%以下。此外,在自保持面Sh朝向內側相距是厚度全體10%份量,與保持面Sh平行的剖面上,有藉由發泡3所形成的孔,可將此孔的平均孔徑設定為A,而在下層部Pr中,與背面Sr平行的剖面當中,顯示開口率為最大值的剖面上,亦形成有孔,可將此孔的最大孔徑設定為B,則比值B/A可調整為介於20~50的範圍。亦即,具有發泡孔徑是形成鄰近保持面Sh的發泡的平均孔徑的20~50倍大小的發泡,此種發泡是形成在下層部Pr中的開口率是顯示為最大值的剖面上。因此,柔軟的發泡3可多量地形成的下層部Pr,可扮演空氣緩衝的角色,可使施加在被研磨物上的壓力(研磨壓力)易於分散。此外,伴隨著研磨加工而遭壓縮時,因應施加在被研磨物上的壓力,使得下層部Pr的發泡形狀壓縮變形,藉以配合被研磨物的翹曲、起伏,可減低對被研磨物的負擔(反向應力),故能高度地提升被研磨物的平坦性。當考慮需確保在下層部Pr的壓縮變形量時,則適宜將下層部Pr的空隙率調整為介於75~90%的範圍。 In contrast, in the present embodiment, the urethane sheet constituting the holding mat 10 is formed. The back surface Sr of 2 has a thickness of 10% by weight (0.1 t part) toward the inner side, a cross section parallel to the back surface Sr, and a cross section which is 40% by weight (0.4 t portion) in the direction of the inner side, and is parallel to the back surface Sr. The porosity of the lower portion Pr surrounded by the two sections can be adjusted to be 70% or more and 95% or less. Further, the distance from the holding surface Sh toward the inner side is 10% of the total thickness, and in the cross section parallel to the holding surface Sh, there is a hole formed by the foaming 3, and the average pore diameter of the hole can be set to A, and In the lower layer portion Pr, in the cross section parallel to the back surface Sr, a hole having a maximum aperture ratio is formed, and a hole is also formed. The maximum aperture of the hole can be set to B, and the ratio B/A can be adjusted to be 20 Range of ~50. That is, the foaming aperture is a foam having a size of 20 to 50 times that of the foamed average pore diameter adjacent to the holding surface Sh, and the foaming is a section in which the opening ratio formed in the lower layer portion Pr is the maximum value. on. Therefore, the lower portion Pr which can be formed in a large amount by the soft foam 3 can play the role of air cushioning, and the pressure (grinding pressure) applied to the workpiece can be easily dispersed. Further, when compressed by the polishing process, the foamed shape of the lower layer portion Pr is compressed and deformed in accordance with the pressure applied to the object to be polished, thereby coping with the warpage and undulation of the object to be polished, thereby reducing the object to be polished. The burden (reverse stress) can greatly improve the flatness of the object to be polished. When it is considered that the amount of compressive deformation of the lower layer portion Pr is to be secured, the void ratio of the lower layer portion Pr is preferably adjusted to be in the range of 75 to 90%.

此外,在本實施形態中,下層部Pr上,在與背面Sr平行的剖面當中的每單位面積,顯示因發泡3所形成的孔的總面積的比率,亦即開口率的最大值可調整成介於80%以上95%以下。因此,在下層部Pr,特別是在鄰近背面Sr處,發泡3的孔徑呈肥大化,進而可確保充分的緩衝性。藉此,由於在研磨加工時對被研磨物之應力可加以均等化,故可圖謀提升平坦性。而與下層部Pr的空隙率同 樣地,當考慮確保壓縮變形量時,則宜將開口率調整成介於82~90%的範圍。 Further, in the present embodiment, the ratio of the total area of the holes formed by the foaming 3, that is, the maximum value of the aperture ratio, can be adjusted per unit area in the cross section parallel to the back surface Sr in the lower layer portion Pr. It is between 80% and 95%. Therefore, in the lower layer portion Pr, particularly adjacent to the back surface Sr, the pore diameter of the foaming 3 is enlarged, and sufficient cushioning property can be ensured. Thereby, since the stress on the object to be polished can be equalized during the polishing process, the flatness can be improved. And the void ratio of the lower layer Pr For example, when considering the amount of compression deformation, it is preferable to adjust the aperture ratio to be in the range of 82 to 90%.

再者,在本實施形態中,自胺基甲酸酯薄片2的保持面Sh起算朝向內側相距是厚度t的10%份量(0.1t份量),與保持面Sh平行的剖面,和朝向內側相距是40%份量(0.4t份量)的,與保持面Sh平行的剖面,此兩剖面所包挾的上層部Ph的空隙率,係可調整成介於35%以上55%以下。因此,相較於下層部Pr,由於聚胺酯樹脂的隔壁形成厚壁,因而可確保剛性,故能抑制在研磨加工時,被研磨物朝保持墊側陷入。當保持墊的剛性不足而致使被研磨物陷入變大時,在研磨加工時,會發生保持墊(胺基甲酸酯薄片)本身被研削的情況。相對地,由於保持墊10可抑制被研磨物之陷入,故能在胺基甲酸酯薄片2不被研削之下,繼續進行研磨加工。就上層部Ph的空隙率未滿35%而言,雖剛性提高會使硬度變高,但反而難以提升平坦性。當考慮以提升平坦性的觀念來確保剛性時,則宜將上層部Ph的空隙率調整成介於40~50%的範圍。 In the present embodiment, the distance from the holding surface Sh of the urethane sheet 2 to the inner side is 10% by weight (0.1 t part) of the thickness t, and the cross section parallel to the holding surface Sh is spaced apart from the inner side. It is a cross section parallel to the holding surface Sh of 40% by weight (0.4 t part), and the void ratio of the upper layer Ph surrounded by the two cross sections can be adjusted to be 35% or more and 55% or less. Therefore, since the partition wall of the polyurethane resin is thicker than the lower layer portion Pr, the rigidity can be ensured, so that the object to be polished can be prevented from sinking toward the holding mat side during the polishing process. When the rigidity of the holding mat is insufficient to cause the object to be polished to become large, the holding mat (urethane sheet) itself may be ground during the polishing process. In contrast, since the holding mat 10 can suppress the sinking of the object to be polished, the polishing process can be continued without the urethane sheet 2 being ground. When the porosity of the upper layer portion Ph is less than 35%, the rigidity is increased to increase the rigidity, but it is difficult to improve the flatness. When it is considered to ensure rigidity by the concept of improving flatness, it is preferable to adjust the void ratio of the upper layer portion Ph to be in the range of 40 to 50%.

再者,在本實施形態中,由於胺基甲酸酯薄片2具有上述之發泡構造,所以在上層部Ph確保可具有抑制被研磨物之陷入所需的剛性,而在下層部Pr確保可具有針對被研磨物之應力均等化所需的緩衝性,所以能藉由單片的胺基甲酸酯薄片2來兼顧剛性和緩衝性。雖然亦可貼合具剛性的樹脂薄片和具緩衝性的樹脂薄片的構成,但此情況下,於研磨加工時,有時會發生二片樹脂薄片相互剝離的情形。因此,以保持墊10而言,透過胺基甲酸酯薄片2兼備有剛性與緩衝性,進而可圖謀提升被研磨物的平坦性。 Further, in the present embodiment, since the urethane sheet 2 has the above-described foaming structure, it is ensured that the upper layer portion Ph can have rigidity required to suppress the sinking of the object to be polished, and the lower layer portion Pr can be secured. Since the cushioning property required for equalizing the stress of the workpiece is obtained, the rigidity and cushioning properties can be achieved by the single urethane sheet 2 alone. Although a rigid resin sheet and a cushioning resin sheet may be bonded together, in this case, the two resin sheets may be peeled off from each other during the polishing process. Therefore, in the holding mat 10, the urethane sheet 2 has both rigidity and cushioning properties, and the flatness of the object to be polished can be improved.

此外,在本實施形態中,雖例示了具備有聚胺酯樹脂製的胺基甲 酸酯薄片2之保持墊10,但本發明並非受限於此。亦可使用例如聚乙烯等之樹脂以取代聚胺酯樹脂,只要是可藉由濕式凝固法,形成上述的發泡構造的樹脂即可適用。 Further, in the present embodiment, an amine group made of a polyurethane resin is exemplified. The pad 10 of the acid ester sheet 2 is held, but the invention is not limited thereto. A resin such as polyethylene may be used instead of the polyurethane resin, and any resin which can form the above-described foaming structure by a wet coagulation method can be used.

此外,在本實施形態中雖例示一種是貼合胺基甲酸酯薄片2和具有基材的雙面膠帶7的構成的保持墊10,但本發明並非受限於此。只要具備胺基甲酸酯薄片2和裝設於研磨機用的黏著材的保持墊,即可使用作為保持墊,例如亦可取代雙面膠帶7,而僅將各種黏著劑塗布於胺基甲酸酯薄片2(的背面Sr)。此外,在本實施形態中雖例示了雙面膠帶7的基材可兼作為保持墊10的支撐材的例子,但本發明並非受限於此。亦可作成在胺基甲酸酯薄片2和雙面膠帶7間,貼合有其他的支撐材。可例舉PET製等的薄膜或不織布等來作為此種支撐材,並無任何特別制限。 Further, in the present embodiment, the holding mat 10 in which the urethane sheet 2 and the double-sided tape 7 having the substrate are bonded is exemplified, but the present invention is not limited thereto. As long as the urethane sheet 2 and the holding mat for the adhesive for the grinder are provided, it can be used as a holding mat, for example, instead of the double-sided tape 7, and only various adhesives can be applied to the amine base. Acid sheet 2 (back side Sr). Further, in the present embodiment, the base material of the double-sided tape 7 can be exemplified as the support material of the holding mat 10, but the present invention is not limited thereto. It is also possible to form a support material between the urethane sheet 2 and the double-sided tape 7. A film made of PET or the like, a nonwoven fabric or the like can be exemplified as such a support material, and there is no particular limitation.

再者,本實施形態中雖未特別提及,但在藉由濕式凝固法所形成的胺基甲酸酯薄片2的厚度不均變大時,為使保持面Sh與背面Sr可呈平行,宜將背面Sr側事先利用擦光或切割等方法進行平滑化。如此一來,可進一步提升保持面Sh的平坦性。 Further, in the present embodiment, although the thickness unevenness of the urethane sheet 2 formed by the wet coagulation method is increased, the holding surface Sh and the back surface Sr may be parallel. It is preferable to smooth the back Sr side by polishing or cutting in advance. In this way, the flatness of the holding surface Sh can be further improved.

其次,茲就依據本實施形態所製作而成保持墊10的實施例進行說明。並一併記載為進行比較用所製作的比較例。 Next, an embodiment in which the holding mat 10 is produced according to the present embodiment will be described. Also, it is described as a comparative example produced for comparison.

實施例1 Example 1

於實施例1中,在胺基甲酸酯薄片2的製作中,所採用的樹脂的100%模量值是低於10MPa的聚酯MDI(methylene diphenyl diisocyanate,二苯基甲烷二異氰酸酯)之聚胺酯樹脂,對於DMF中以18重量%的比例溶解後,對聚胺酯樹脂添加1重量%的親水 性添加劑,並對聚胺酯樹脂添加5重量%的碳黑而調製出以B型旋轉黏度計測定具有3.3Pa.s的黏度的聚胺酯樹脂溶液。在塗布聚胺酯樹脂溶液時,將塗布裝置的間隙設定成0.7mm。在PET製薄膜的成膜基材上,塗布聚胺酯樹脂溶液後,浸漬於溫度25℃的水(凝固液)中,使聚胺酯樹脂得以完全再生。在洗淨/乾燥後,於所取得的胺基甲酸酯薄片2的背面Sr側進行擦光,使擦光面上貼合雙面膠帶7而完成保持墊10的製造。 In Example 1, in the preparation of the urethane sheet 2, the 100% modulus of the resin used was a polyester MDI (methylene diphenyl diisocyanate, diphenylmethane diisocyanate) having a modulus of less than 10 MPa. Resin, after dissolving in a ratio of 18% by weight in DMF, adding 1% by weight of hydrophilicity to the polyurethane resin Additives, and add 5% by weight of carbon black to the polyurethane resin to prepare a 3.3-fold measured by a B-type rotational viscometer. s viscosity of the polyurethane resin solution. When the polyurethane resin solution was applied, the gap of the coating device was set to 0.7 mm. The polyurethane resin solution was applied onto a film-forming substrate of a PET film, and then immersed in water (coagulating liquid) at a temperature of 25 ° C to completely regenerate the polyurethane resin. After washing/drying, the back surface Sr side of the obtained urethane sheet 2 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding mat 10.

實施例2 Example 2

於實施例2中,使用與實施例1相同的聚胺酯樹脂,對於DMF中以20重量%的比例溶解後,對聚胺酯樹脂添加1重量%的親水性添加劑,並對聚胺酯樹脂添加5重量%的碳黑而調製出以B型旋轉黏度計測定具有5.3Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝置的間隙設定成1.0mm。在成膜基材上塗布聚胺酯樹脂溶液後,浸漬於溫度10℃的水中,使聚胺酯樹脂得以完全再生。在洗淨/乾燥後,於所取得的胺基甲酸酯薄片2的背面Sr側進行擦光,使擦光面上貼合雙面膠帶7而完成保持墊10的製造。 In Example 2, the same polyurethane resin as in Example 1 was used, and after dissolving in a ratio of 20% by weight in DMF, 1% by weight of a hydrophilic additive was added to the polyurethane resin, and 5% by weight of carbon was added to the polyurethane resin. Black and modulated to have a B-type rotational viscometer with 5.3 Pa. s viscosity of the polyurethane resin solution. The gap of the coating device was set to 1.0 mm. After coating the polyurethane resin solution on the film-forming substrate, it was immersed in water at a temperature of 10 ° C to completely regenerate the polyurethane resin. After washing/drying, the back surface Sr side of the obtained urethane sheet 2 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding mat 10.

實施例3 Example 3

於實施例3中,使用與實施例1相同的聚胺酯樹脂,對於DMF中以21重量%的比例溶解後,對聚胺酯樹脂添加3重量%的親水性添加劑,並對聚胺酯樹脂添加5重量%的碳黑而調製出以B型旋轉黏度計測定具有8.2Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝置的間隙設定成1.0mm。在成膜基材上塗布聚胺酯樹脂溶液後,浸漬於溫度10℃的水中,使聚胺酯樹脂得以完全再生。在洗淨/乾燥後,於所取得的胺基甲酸酯薄片2的背面Sr側進行擦光,使擦光面 上貼合雙面膠帶7而完成保持墊10的製造。 In Example 3, the same polyurethane resin as in Example 1 was used, and after dissolving in a ratio of 21% by weight in DMF, 3% by weight of a hydrophilic additive was added to the polyurethane resin, and 5% by weight of carbon was added to the polyurethane resin. Black and modulated to have a B-type rotational viscometer with 8.2Pa. s viscosity of the polyurethane resin solution. The gap of the coating device was set to 1.0 mm. After coating the polyurethane resin solution on the film-forming substrate, it was immersed in water at a temperature of 10 ° C to completely regenerate the polyurethane resin. After washing/drying, the surface of the obtained urethane sheet 2 is polished to the side of the Sr side to make a polished surface. The manufacture of the holding mat 10 is completed by attaching the double-sided tape 7 thereto.

實施例4 Example 4

於實施例4中,使用與實施例1相同的聚胺酯樹脂,對於DMF中以21重量%的比例溶解後,對聚胺酯樹脂添加5重量%的親水性添加劑,並對聚胺酯樹脂添加5重量%的碳黑而調製出以B型旋轉黏度計測定具有7.9Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝置的間隙設定成1.0mm。在成膜基材上塗布聚胺酯樹脂溶液後,浸漬於溫度25℃的水中,使聚胺酯樹脂得以完全再生。在洗淨/乾燥後,於所取得的胺基甲酸酯薄片2的背面Sr側進行擦光,使擦光面上貼合雙面膠帶7而完成保持墊10的製造。 In Example 4, the same polyurethane resin as in Example 1 was used, and after dissolving in a ratio of 21% by weight in DMF, 5% by weight of a hydrophilic additive was added to the polyurethane resin, and 5% by weight of carbon was added to the polyurethane resin. Black and prepared with a B-type rotational viscometer measured with 7.9Pa. s viscosity of the polyurethane resin solution. The gap of the coating device was set to 1.0 mm. After coating the polyurethane resin solution on the film-forming substrate, it was immersed in water at a temperature of 25 ° C to completely regenerate the polyurethane resin. After washing/drying, the back surface Sr side of the obtained urethane sheet 2 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding mat 10.

實施例5 Example 5

於實施例5中,使用與實施例1相同的聚胺酯樹脂,對於DMF中以21.5重量%的比例溶解後,對聚胺酯樹脂添加1重量%的親水性添加劑,並對聚胺酯樹脂添加5重量%的碳黑而調製出以B型旋轉黏度計測定具有9.5Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝置的間隙設定成1.2mm。在成膜基材上塗布聚胺酯樹脂溶液後,浸漬於溫度10℃的水中,使聚胺酯樹脂得以完全再生。在洗淨/乾燥後,於所取得的胺基甲酸酯薄片2的背面Sr側進行擦光,使擦光面上貼合雙面膠帶7而完成保持墊10的製造。 In Example 5, the same polyurethane resin as in Example 1 was used, and after dissolving in a ratio of 21.5 wt% in DMF, 1% by weight of a hydrophilic additive was added to the polyurethane resin, and 5% by weight of carbon was added to the polyurethane resin. Black and prepared to have a B-type rotational viscometer with 9.5Pa. s viscosity of the polyurethane resin solution. The gap of the coating device was set to 1.2 mm. After coating the polyurethane resin solution on the film-forming substrate, it was immersed in water at a temperature of 10 ° C to completely regenerate the polyurethane resin. After washing/drying, the back surface Sr side of the obtained urethane sheet 2 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding mat 10.

比較例1 Comparative example 1

於比較例1中,使用與實施例1相同的聚胺酯樹脂,對於DMF中以21重量%的比例溶解後,對聚胺酯樹脂添加1重量%的親水性添加劑,並對聚胺酯樹脂添加5重量%的碳黑而調製出以B型旋轉黏度計測定具有8.2Pa.s的黏度的聚胺酯樹脂溶液。將塗布裝置的間 隙設定成0.7mm。在成膜基材上塗布聚胺酯樹脂溶液後,浸漬於溫度25℃的水中,使聚胺酯樹脂得以完全再生。在洗淨/乾燥後,於所取得的胺基甲酸酯薄片12的背面Sr側進行擦光,使擦光面上貼合雙面膠帶7而完成保持墊20的製造。亦即,比較例1的保持墊20係為習知的保持墊(亦可參閱第3圖)。 In Comparative Example 1, the same polyurethane ester resin as in Example 1 was used, and after dissolving in a ratio of 21% by weight in DMF, 1% by weight of a hydrophilic additive was added to the polyurethane resin, and 5% by weight of carbon was added to the polyurethane resin. Black and modulated to have a B-type rotational viscometer with 8.2Pa. s viscosity of the polyurethane resin solution. Intercoating device The gap is set to 0.7 mm. After coating the polyurethane resin solution on the film-forming substrate, it was immersed in water at a temperature of 25 ° C to completely regenerate the polyurethane resin. After washing/drying, the back surface Sr side of the obtained urethane sheet 12 is polished, and the double-sided tape 7 is bonded to the polishing surface to complete the production of the holding mat 20. That is, the holding mat 20 of Comparative Example 1 is a conventional holding mat (see also FIG. 3).

針對所取得的各實施例及比較例1的胺基甲酸酯薄片,對上層部Ph及下層部Pr的空隙率、開口率的最大值以及表示最大發泡孔徑對最小發泡孔徑之比的發泡孔徑比(Max/Min)等進行測定。空隙率的測定係以下述方式進行。亦即,使用三次元量側X射線電腦斷層攝影裝置(大和科學株式會社(YAMATO SCIENTIFIC)製,TDM1000-IS/SP)進行掃描剖面,取得自保持面Sh相距10μm間隔的連續斷層影像。將所取得之斷層影像,以SEM用影像解析軟體「Scandium」(Olympus Soft-Imaging Solutions社製)讀取,進行影像處理俾取得各個濃淡不一的影像。針對各個濃淡不一的影像,分別將濃部作為開口部,以使濃度範圍(門檻值)能與影像一致的方式進行目視設定,透過將濃部作為開口部加以累積,求得平均觀測面積所占的總開口面積之比例以作為開口率。接著,分別求出自上層部Ph、下層部Pr的區域中的斷層影像所求得之開口率的和後,再除以上層部Ph、下層部Pr的觀測面積的和之後的百分率,以作為空隙率。此種的空隙率的取得,亦可利用例如可利用擦光、切割方式從胺基甲酸酯薄片的表面研削各一定厚度份量,透過SEM或顯微鏡等來觀察研削加工表面而求得空隙率的方法來作為簡易方法。開口率的最大值是由空隙率的測定中所求得之開口率而得以求出。發泡孔徑比係以如下述方式求出。亦即 ,使用「Scandium」算出形成在自保持面Sh朝向內側相距是厚度全體的10%份量,且與保持面Sh平行的剖面中的3.3mm2的範圍的開口的平均開口徑,以此作為最小發泡孔徑。使用「Scandium」算出在下層部Pr的區域,顯示開口率的最大值的剖面中的3.3mm2的範圍,且未與觀測區域的交界相接的開口當中的最大開口徑,以此作為最大發泡孔徑。求出最大發泡孔徑對最小發泡孔徑的比值,以作為發泡孔徑比。由於最小發泡孔徑、最大發泡孔徑分別與上述的平均孔徑A、最大孔徑B相對應,所以發泡孔徑比係可用以表示上述比值B/A。於以下表1中,列出各實施例及比較例1的空隙率、開口率的最大值、發泡孔徑比的測定結果。 With respect to the obtained urethane sheets of the respective Examples and Comparative Example 1, the void ratio of the upper layer portion Ph and the lower layer portion Pr, the maximum value of the aperture ratio, and the ratio of the maximum foaming pore diameter to the minimum foaming pore diameter were The foaming pore ratio (Max/Min) or the like was measured. The measurement of the void ratio was carried out in the following manner. In other words, a scanning profile was performed using a three-dimensional side X-ray computed tomography apparatus (YAMATO SCIENTIFIC, TDM1000-IS/SP), and a continuous tomographic image with a distance of 10 μm from the holding surface Sh was obtained. The obtained tomographic image was read by the SEM image analysis software "Scandium" (manufactured by Olympus Soft-Imaging Solutions Co., Ltd.), and image processing was performed to obtain images of different shades. For each of the images of different shades, the rich portion is used as an opening, and the concentration range (threshold value) can be visually set so as to match the image, and the concentrated portion is accumulated as an opening portion to obtain an average observed area. The ratio of the total open area is taken as the aperture ratio. Then, the sum of the aperture ratios obtained from the tomographic images in the region of the upper layer portion Ph and the lower layer portion Pr is obtained, and the percentage after the sum of the observed areas of the upper layer portion Ph and the lower layer portion Pr is determined as Void rate. In order to obtain the void ratio, for example, it is possible to grind the thickness of the urethane sheet by polishing or cutting, and to observe the surface of the urethane by a SEM or a microscope to obtain a void ratio. The method is used as an easy method. The maximum value of the aperture ratio is obtained from the aperture ratio obtained by measuring the porosity. The foaming aperture ratio was determined as follows. that is By using "Scandium", the average opening diameter of the opening in the range of 3.3 mm 2 in the cross section parallel to the holding surface Sh is 10% of the total thickness from the holding surface Sh, and the minimum opening diameter is calculated. Aperture. Using Scandium, the range of 3.3 mm 2 in the cross section showing the maximum value of the aperture ratio in the region of the lower layer portion Pr, and the maximum opening diameter among the openings not in contact with the boundary of the observation region are calculated as the maximum foaming. Aperture. The ratio of the maximum foaming pore diameter to the minimum foaming pore diameter was determined as the foaming pore diameter ratio. Since the minimum foaming pore diameter and the maximum foaming pore diameter correspond to the above-described average pore diameter A and maximum pore diameter B, respectively, the foaming pore diameter ratio can be used to express the above ratio B/A. Table 1 below shows the measurement results of the void ratio, the maximum aperture ratio, and the foaming pore ratio of each of Examples and Comparative Example 1.

如表1所示,在比較例1的胺基甲酸酯薄片中,上層部Ph的空隙率為41.4%,下層部Pr的空隙率為68.6%。此外,由第5圖可明確得知,自表面起算的厚度越大,亦即,雖然越接近背面Sr,開口率越變越大,但其開口率最大也僅75%左右。相對地,在實施例1~實施例5的各胺基甲酸酯薄片2中,上層部Ph的空隙率介於38.3%~50.2%的範圍,下層部Pr的空隙率則介於77.2~88.3%的範圍。此外,在實施例1的胺基甲酸酯薄片2中,由第5圖可明確得 知,顯示在橫跨下層部Pr的厚度區域內的100μm以上的厚度的剖面,連續地超過80%的開口率。由此可知,在各實施例的胺基甲酸酯薄片2中,上層部Ph的空隙率與比較例1屬同一程度,而且在下層部Pr的空隙率大。再者,由發泡孔徑比的測定結果,可明白於比較例1中,下層部Pr中的最大發泡孔徑相對於鄰近保持面Sh的平均開口徑為18.7倍,相對地在各實施例中則顯示為34.0~38.2倍的尺寸。 As shown in Table 1, in the urethane sheet of Comparative Example 1, the void ratio of the upper layer portion Ph was 41.4%, and the void ratio of the lower layer portion Pr was 68.6%. Further, as is clear from Fig. 5, the larger the thickness from the surface, that is, the closer the opening Sr is, the larger the aperture ratio is, but the aperture ratio is at most about 75%. On the other hand, in each of the urethane sheets 2 of the first to fifth embodiments, the void ratio of the upper layer portion Ph is in the range of 38.3% to 50.2%, and the void ratio of the lower layer portion Pr is between 77.2 and 88.3. The range of %. Further, in the urethane sheet 2 of Example 1, it can be clearly confirmed from Fig. 5. It is understood that the cross section having a thickness of 100 μm or more across the thickness region of the lower layer portion Pr continuously exceeds an aperture ratio of 80%. As a result, in the urethane sheet 2 of each of the examples, the void ratio of the upper layer portion Ph was the same as that of the comparative example 1, and the void ratio of the lower layer portion Pr was large. Further, from the measurement results of the foaming aperture ratio, it can be understood that in Comparative Example 1, the maximum opening diameter of the lower foaming portion Pr in the lower layer portion Pr is 18.7 times with respect to the adjacent opening surface Sh, which is relatively the same in each of the examples. It is displayed as a size of 34.0~38.2 times.

關於研磨性能評估,使用各實施例及比較例中的保持墊,於下述的研磨條件下,進行液晶顯示器用玻璃基板(470mm×370mm×0.7mm)的研磨加工,利用依日本工業規格(JIS B 0601:’82)為基準的方法,自濾波紋中心起伏求得平坦度a。在平坦度a的測定中,係使用表面粗度形狀測定機(株式會社東京精密製,surfcom480A),依下述的測定條件進行測定。自起因於基板表面的凹凸所獲得之測定曲線,算出相鄰的凸部(山部)與凸部間的寬度W及凸部和凹部(谷部)間的高度S,並作成以寬度W為橫軸,高度S為縱軸的散布圖。自散布圖求出一次方程式S=aW的近似直線,將斜度a設為研磨加工後之最終的平坦度a。因平坦性越高,則寬度W變大,高度S變小,故當斜度a越小時則平坦性則越顯優異。 For the evaluation of the polishing performance, the glass substrate for liquid crystal display (470 mm × 370 mm × 0.7 mm) was polished under the following polishing conditions using the holding mats of the respective Examples and Comparative Examples, and the Japanese Industrial Standard (JIS) was used. B 0601: '82) is a reference method in which the flatness a is obtained from the fluctuation of the corrugated center. In the measurement of the flatness a, the measurement was carried out according to the following measurement conditions using a surface roughness measuring machine (manufactured by Tokyo Seimi Co., Ltd., surfcom 480A). The width W between the adjacent convex portion (mountain portion) and the convex portion and the height S between the convex portion and the concave portion (valley portion) are calculated from the measurement curve obtained by the unevenness on the surface of the substrate, and the width W is calculated. On the horizontal axis, the height S is a scatter diagram of the vertical axis. The approximate straight line of the equation S=aW is obtained from the scattergram, and the slope a is set to the final flatness a after the grinding process. The higher the flatness, the larger the width W and the smaller the height S. Therefore, the flatness is more excellent when the slope a is smaller.

研磨條件 Grinding condition

使用研磨機:OSCAR研磨機(SPEEDFAM社製,SP-1200) Grinding machine: OSCAR grinding machine (SP-DFAM, SP-1200)

研磨速度(旋轉數):61rpm Grinding speed (number of revolutions): 61 rpm

加工壓力:76gf/cm2 Processing pressure: 76gf/cm 2

研磨漿:鈰漿 Grinding slurry: mash

研磨時間:30min Grinding time: 30min

波紋中心起伏測定條件 Corrugated center undulation measurement conditions

評估長度:90mm Evaluation length: 90mm

測定速度:3.0mm/s Measuring speed: 3.0mm/s

中斷值:0.8~8.0mm Interrupt value: 0.8~8.0mm

薄膜種類別:2RC Film species category: 2RC

測定範圍:±40.0μm Measuring range: ±40.0μm

傾斜補償:平滑曲線 Tilt compensation: smooth curve

如表1所示,在使用比較例1的保持墊20進行研磨加工中,顯示加工後的玻璃基板的平坦度a為0.0007。相對地,在使用實施例1~實施例5的各保持墊10進行的研磨加工中,顯示平坦度a為0.0003~0.0005,無論何者皆較比較例1更為優異的結果。因此可明確得知,藉由濕式凝固法所形成的發泡3,在上部層Ph的空隙率是形成介於35~55%的範圍,而在下部層Pr的空隙率則是形成介於70~95%的範圍。藉由使用具備有此發泡3的胺基甲酸酯薄片2的保持墊10,可提高保持面Sh的平坦性精度,同時提升被研磨物之面內均一性。 As shown in Table 1, in the polishing process using the holding mat 20 of Comparative Example 1, the flatness a of the glass substrate after the processing was shown to be 0.0007. On the other hand, in the polishing process using each of the holding mats 10 of the first to fifth embodiments, the flatness a was displayed to be 0.0003 to 0.0005, which was superior to the comparative example 1 . Therefore, it is clear that the foaming ratio formed by the wet solidification method is such that the void ratio in the upper layer Ph is in the range of 35 to 55%, and the void ratio in the lower layer Pr is formed in the range. 70~95% range. By using the holding mat 10 having the urethane sheet 2 having the foaming 3, the flatness accuracy of the holding surface Sh can be improved, and the in-plane uniformity of the object to be polished can be improved.

本發明乃提供一種能提高保持面之平坦性精度,且提升被研磨物的面內均一性之保持墊,故在保持墊的製造、販售上具有貢獻,係為極具產業利用性之發明。 The present invention provides a holding mat which can improve the flatness accuracy of the holding surface and improve the in-plane uniformity of the object to be polished, and thus contributes to the manufacture and sale of the holding mat, and is an industrially useful invention. .

以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。 The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.

2‧‧‧胺基甲酸酯薄片 2‧‧‧Carbamate flakes

2a‧‧‧表面層 2a‧‧‧Surface

3‧‧‧發泡 3‧‧‧Foaming

7‧‧‧雙面膠帶 7‧‧‧Double-sided tape

8‧‧‧剝離紙 8‧‧‧ peeling paper

10、20‧‧‧保持墊 10, 20‧‧‧ Keep pad

Sh‧‧‧保持面 Sh‧‧‧ Keep face

Sr‧‧‧背面 Sr‧‧‧Back

Ph‧‧‧上層部 Ph‧‧‧Upper Department

Pr‧‧‧下層部 Pr‧‧‧ Lower Department

Claims (8)

一種保持墊,係包含:一樹脂薄片,該樹脂薄片具有藉由濕式凝固法所形成縱型之一發泡,並具有保持被研磨物之一保持面,其中,該樹脂薄片,係自該保持面的一背面,朝向內側相距是該厚度全體的10%份量為止的範圍內,形成該發泡之底部,其中,該樹脂薄片係為具有自該背面朝向內側相距是該厚度全體的10%份量,與該背面平行的一剖面,及朝向內側相距是厚度全體的40%,與該背面平行的另一剖面所包挾的一下層部;以及自該保持面朝向內側相距該厚度全體的10%份量,與該保持面平行的一剖面,及朝向內側相距40%份量,與該保持面平行的另一剖面所包挾的一上層部的單片的薄片,其中,該下層部的空隙率係介於70%以上95%以下,且該上層部的空隙率係介於35%以上55%以下,該樹脂薄片中該發泡彼此間的樹脂係形成微多孔狀,且該發泡與微多孔係呈網目狀地相互連通。 A holding mat comprising: a resin sheet having a longitudinal shape foam formed by a wet coagulation method and having a holding surface for holding the object to be polished, wherein the resin sheet is from the resin sheet The bottom surface of the holding surface is formed in a range from 10% by weight of the entire thickness to the inner side, and the resin sheet is formed to have a distance of 10% of the entire thickness from the back surface toward the inner side. a portion, a cross section parallel to the back surface, and a distance from the inside to the inside is 40% of the entire thickness, a lower layer portion covered by another cross section parallel to the back surface; and 10 from the holding surface toward the inside from the entire thickness % by weight, a cross section parallel to the holding surface, and a 40% by weight of the inner side, a single piece of the upper layer portion covered by another cross section parallel to the holding surface, wherein the lower layer portion has a void ratio The content is 70% or more and 95% or less, and the porosity of the upper layer portion is 35% or more and 55% or less. In the resin sheet, the resin between the foams forms a microporous shape, and the foaming and micro-foaming Porous system Shape with each other. 如申請專利範圍第1項所述之保持墊,其中,該樹脂薄片,係在該保持面朝向內側相距是該厚度全體的10%份量,與該保持面平行的一剖面上,因該發泡所形成的一孔,該孔之平均孔徑係為A,且在該下層部的與該保持面平行的另一剖面上,因該發泡所形成另一孔,且該另一孔的最大孔徑係為B時,則比值B/A係介於20~50的範圍。 The holding mat according to the first aspect of the invention, wherein the resin sheet has a distance of 10% of the entire thickness of the holding surface, and a cross section parallel to the holding surface, the foaming a hole formed having an average pore size of A, and on another cross section of the lower layer portion parallel to the holding surface, another hole is formed by the foaming, and the maximum pore diameter of the other hole When the system is B, the ratio B/A system is in the range of 20 to 50. 如申請專利範圍第2項所述之保持墊,其中,於該樹脂薄片中, 該下層部的空隙率係介於75%以上90%以下,且該上層部的空隙率係介於40%以上50%以下。 The holding mat according to claim 2, wherein in the resin sheet, The porosity of the lower layer portion is 75% or more and 90% or less, and the porosity of the upper layer portion is 40% or more and 50% or less. 如申請專利範圍第2項所述之保持墊,其中,於該樹脂薄片的下層部,與該保持面平行的剖面中的每單位面積,顯示因該發泡所形成的孔的總面積的一比率為最大時之一剖面,該剖面之該比率的最大值係介於80%以上95%以下。 The holding mat according to the second aspect of the invention, wherein the lower layer portion of the resin sheet has a total area of the hole formed by the foaming per unit area in a cross section parallel to the holding surface The profile is one of the largest profiles, and the maximum of the ratio of the profile is between 80% and 95%. 如申請專利範圍第2項所述之保持墊,其中,該樹脂薄片係由一聚胺酯樹脂所形成。 The holding mat of claim 2, wherein the resin sheet is formed of a polyurethane resin. 如申請專利範圍第5項所述之保持墊,其中,該聚胺酯樹脂的100%模量值係低於20MPa。 The holding mat of claim 5, wherein the polyurethane resin has a 100% modulus value of less than 20 MPa. 如申請專利範圍第1項所述之保持墊,其中,更包含一黏著材係塗布於該該樹脂薄片之該背面側上,以將該樹脂薄片裝設於研磨機。 The holding mat according to claim 1, wherein an adhesive material is further coated on the back side of the resin sheet to mount the resin sheet in a grinder. 如申請專利範圍第7項所述之保持墊,其中,更包含一支撐材,係貼合於該樹脂薄片與該黏著材間,以支撐該樹脂薄片。 The holding mat of claim 7, further comprising a support material attached between the resin sheet and the adhesive material to support the resin sheet.
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