TW201107817A - Image inspection apparatus - Google Patents
Image inspection apparatus Download PDFInfo
- Publication number
- TW201107817A TW201107817A TW98127694A TW98127694A TW201107817A TW 201107817 A TW201107817 A TW 201107817A TW 98127694 A TW98127694 A TW 98127694A TW 98127694 A TW98127694 A TW 98127694A TW 201107817 A TW201107817 A TW 201107817A
- Authority
- TW
- Taiwan
- Prior art keywords
- image
- liquid crystal
- finished product
- crystal panel
- module
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 11
- 239000004973 liquid crystal related substance Substances 0.000 claims abstract description 65
- 239000000523 sample Substances 0.000 claims abstract description 10
- 230000007547 defect Effects 0.000 claims abstract description 7
- 239000011265 semifinished product Substances 0.000 claims description 49
- 238000001514 detection method Methods 0.000 claims description 21
- 239000000047 product Substances 0.000 claims description 8
- 239000007788 liquid Substances 0.000 claims description 5
- 238000005520 cutting process Methods 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 abstract description 6
- 239000000463 material Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000013078 crystal Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 206010035148 Plague Diseases 0.000 description 2
- 241000607479 Yersinia pestis Species 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000036632 reaction speed Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98127694A TW201107817A (en) | 2009-08-18 | 2009-08-18 | Image inspection apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98127694A TW201107817A (en) | 2009-08-18 | 2009-08-18 | Image inspection apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201107817A true TW201107817A (en) | 2011-03-01 |
| TWI403785B TWI403785B (enExample) | 2013-08-01 |
Family
ID=44835403
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW98127694A TW201107817A (en) | 2009-08-18 | 2009-08-18 | Image inspection apparatus |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201107817A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI578059B (zh) * | 2011-09-21 | 2017-04-11 | 深超光電（深圳）有限公司 | 一種用於檢測陣列繞線之母基板及其檢測方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI609188B (zh) * | 2015-09-25 | 2017-12-21 | 矽品精密工業股份有限公司 | 檢測設備及其檢測方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07325009A (ja) * | 1994-06-01 | 1995-12-12 | Mitsubishi Electric Corp | 散乱型液晶パネルの点灯検査装置 |
| KR101147120B1 (ko) * | 2005-08-30 | 2012-05-25 | 엘지디스플레이 주식회사 | Ｌｃｄ 검사 장비 및 ｌｃｄ 검사 방법 |
| JP4960026B2 (ja) * | 2006-06-09 | 2012-06-27 | 富士フイルム株式会社 | フイルムの欠陥検査装置及びフイルムの製造方法 |
-
2009
- 2009-08-18 TW TW98127694A patent/TW201107817A/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI578059B (zh) * | 2011-09-21 | 2017-04-11 | 深超光電（深圳）有限公司 | 一種用於檢測陣列繞線之母基板及其檢測方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI403785B (enExample) | 2013-08-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MC4A | Revocation of granted patent |