TWI403785B - - Google Patents

Info

Publication number
TWI403785B
TWI403785B TW98127694A TW98127694A TWI403785B TW I403785 B TWI403785 B TW I403785B TW 98127694 A TW98127694 A TW 98127694A TW 98127694 A TW98127694 A TW 98127694A TW I403785 B TWI403785 B TW I403785B
Authority
TW
Taiwan
Prior art keywords
finished product
lcd panel
panel half
whole lcd
image
Prior art date
Application number
TW98127694A
Other languages
English (en)
Chinese (zh)
Other versions
TW201107817A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW98127694A priority Critical patent/TW201107817A/zh
Publication of TW201107817A publication Critical patent/TW201107817A/zh
Application granted granted Critical
Publication of TWI403785B publication Critical patent/TWI403785B/zh

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
TW98127694A 2009-08-18 2009-08-18 Image inspection apparatus TW201107817A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW98127694A TW201107817A (en) 2009-08-18 2009-08-18 Image inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98127694A TW201107817A (en) 2009-08-18 2009-08-18 Image inspection apparatus

Publications (2)

Publication Number Publication Date
TW201107817A TW201107817A (en) 2011-03-01
TWI403785B true TWI403785B (enExample) 2013-08-01

Family

ID=44835403

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98127694A TW201107817A (en) 2009-08-18 2009-08-18 Image inspection apparatus

Country Status (1)

Country Link
TW (1) TW201107817A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI609188B (zh) * 2015-09-25 2017-12-21 矽品精密工業股份有限公司 檢測設備及其檢測方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102331633A (zh) * 2011-09-21 2012-01-25 深超光电（深圳）有限公司 一种用于检测阵列绕线的母基板及其检测方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5459594A (en) * 1994-06-01 1995-10-17 Mitsubishi Denki Kabushiki Kaisha Apparatus for inspecting on-off states of a scattering-type liquid crystal display panel
US7428049B2 (en) * 2006-06-09 2008-09-23 Fujifilm Corporation Apparatus and method for inspecting film defect
US7439757B2 (en) * 2005-08-30 2008-10-21 Lg Display Co., Ltd. Apparatus and method for inspecting liquid crystal display

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5459594A (en) * 1994-06-01 1995-10-17 Mitsubishi Denki Kabushiki Kaisha Apparatus for inspecting on-off states of a scattering-type liquid crystal display panel
US7439757B2 (en) * 2005-08-30 2008-10-21 Lg Display Co., Ltd. Apparatus and method for inspecting liquid crystal display
US7428049B2 (en) * 2006-06-09 2008-09-23 Fujifilm Corporation Apparatus and method for inspecting film defect

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI609188B (zh) * 2015-09-25 2017-12-21 矽品精密工業股份有限公司 檢測設備及其檢測方法

Also Published As

Publication number Publication date
TW201107817A (en) 2011-03-01

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Legal Events

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MC4A Revocation of granted patent