TW200951446A - Probe unit - Google Patents
Probe unitInfo
- Publication number
- TW200951446A TW200951446A TW098103566A TW98103566A TW200951446A TW 200951446 A TW200951446 A TW 200951446A TW 098103566 A TW098103566 A TW 098103566A TW 98103566 A TW98103566 A TW 98103566A TW 200951446 A TW200951446 A TW 200951446A
- Authority
- TW
- Taiwan
- Prior art keywords
- movable base
- probe unit
- move
- guided
- elastic deformation
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Measuring Leads Or Probes (AREA)
- Liquid Crystal (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008025048A JP2009186262A (ja) | 2008-02-05 | 2008-02-05 | プローブユニット |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200951446A true TW200951446A (en) | 2009-12-16 |
Family
ID=41069661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW098103566A TW200951446A (en) | 2008-02-05 | 2009-02-04 | Probe unit |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2009186262A (ko) |
KR (1) | KR20090086037A (ko) |
TW (1) | TW200951446A (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI614548B (zh) * | 2013-10-28 | 2018-02-11 | 高雄晶傑達光電科技股份有限公司 | 點燈測試裝置 |
TWI739508B (zh) * | 2020-07-09 | 2021-09-11 | 京元電子股份有限公司 | 具水平調整模組之測試設備 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103472601B (zh) * | 2013-09-02 | 2016-06-15 | 京东方科技集团股份有限公司 | 一种检测设备及检测方法 |
KR102593612B1 (ko) * | 2016-06-02 | 2023-10-26 | 주식회사 탑 엔지니어링 | 프로브 장치 |
JP2020118682A (ja) * | 2019-01-23 | 2020-08-06 | 日置電機株式会社 | 信号処理ユニットおよび測定装置 |
WO2020153163A1 (ja) * | 2019-01-23 | 2020-07-30 | 日置電機株式会社 | 信号処理ユニットおよび測定装置 |
JP7271283B2 (ja) * | 2019-04-16 | 2023-05-11 | 株式会社日本マイクロニクス | 検査用接続装置 |
CN110187151A (zh) * | 2019-06-21 | 2019-08-30 | 东莞市沃德精密机械有限公司 | 无线充电装置的线圈排线测试设备 |
KR102141535B1 (ko) * | 2020-03-03 | 2020-08-05 | 장용철 | 멀티 플라잉 프로브 테스터 |
KR102136689B1 (ko) * | 2020-03-03 | 2020-07-22 | 장용철 | 탈부착이 가능한 프로브 베이스를 구비하는 플라잉 프로브 테스터 |
-
2008
- 2008-02-05 JP JP2008025048A patent/JP2009186262A/ja active Pending
-
2009
- 2009-02-04 KR KR1020090008784A patent/KR20090086037A/ko not_active Application Discontinuation
- 2009-02-04 TW TW098103566A patent/TW200951446A/zh unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI614548B (zh) * | 2013-10-28 | 2018-02-11 | 高雄晶傑達光電科技股份有限公司 | 點燈測試裝置 |
TWI739508B (zh) * | 2020-07-09 | 2021-09-11 | 京元電子股份有限公司 | 具水平調整模組之測試設備 |
Also Published As
Publication number | Publication date |
---|---|
KR20090086037A (ko) | 2009-08-10 |
JP2009186262A (ja) | 2009-08-20 |
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