ATE519123T1 - Kontaktstift für einen prüfkopf mit vertikalen prüfnadeln mit verbesserter schrubb-bewegung - Google Patents
Kontaktstift für einen prüfkopf mit vertikalen prüfnadeln mit verbesserter schrubb-bewegungInfo
- Publication number
- ATE519123T1 ATE519123T1 AT08425075T AT08425075T ATE519123T1 AT E519123 T1 ATE519123 T1 AT E519123T1 AT 08425075 T AT08425075 T AT 08425075T AT 08425075 T AT08425075 T AT 08425075T AT E519123 T1 ATE519123 T1 AT E519123T1
- Authority
- AT
- Austria
- Prior art keywords
- contact
- vertical
- contact pin
- test
- needles
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP08425075A EP2088443B1 (de) | 2008-02-08 | 2008-02-08 | Kontaktstift für einen Prüfkopf mit vertikalen Prüfnadeln mit verbesserter Schrubb-Bewegung |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE519123T1 true ATE519123T1 (de) | 2011-08-15 |
Family
ID=39591189
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT08425075T ATE519123T1 (de) | 2008-02-08 | 2008-02-08 | Kontaktstift für einen prüfkopf mit vertikalen prüfnadeln mit verbesserter schrubb-bewegung |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP2088443B1 (de) |
AT (1) | ATE519123T1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ITMI20102125A1 (it) * | 2010-11-16 | 2012-05-17 | Technoprobe Spa | Sonda di contattatura per testa di misura di dispositivi elettronici |
ITMI20110615A1 (it) * | 2011-04-12 | 2012-10-13 | Technoprobe Spa | Testa di misura per un apparecchiatura di test di dispositivi elettronici |
JP5832371B2 (ja) * | 2012-05-14 | 2015-12-16 | 三菱電機株式会社 | コンタクトプローブ |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5952843A (en) * | 1998-03-24 | 1999-09-14 | Vinh; Nguyen T. | Variable contact pressure probe |
IT1317517B1 (it) * | 2000-05-11 | 2003-07-09 | Technoprobe S R L | Testa di misura per microstrutture |
US7148709B2 (en) | 2004-05-21 | 2006-12-12 | Microprobe, Inc. | Freely deflecting knee probe with controlled scrub motion |
US7759949B2 (en) | 2004-05-21 | 2010-07-20 | Microprobe, Inc. | Probes with self-cleaning blunt skates for contacting conductive pads |
US7733101B2 (en) | 2004-05-21 | 2010-06-08 | Microprobe, Inc. | Knee probe having increased scrub motion |
-
2008
- 2008-02-08 AT AT08425075T patent/ATE519123T1/de not_active IP Right Cessation
- 2008-02-08 EP EP08425075A patent/EP2088443B1/de not_active Not-in-force
Also Published As
Publication number | Publication date |
---|---|
EP2088443B1 (de) | 2011-08-03 |
EP2088443A1 (de) | 2009-08-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |