TW200949433A - Layered photosensitive-resin product - Google Patents
Layered photosensitive-resin product Download PDFInfo
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- TW200949433A TW200949433A TW97150274A TW97150274A TW200949433A TW 200949433 A TW200949433 A TW 200949433A TW 97150274 A TW97150274 A TW 97150274A TW 97150274 A TW97150274 A TW 97150274A TW 200949433 A TW200949433 A TW 200949433A
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- photosensitive resin
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
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- Chemical Kinetics & Catalysis (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Materials For Photolithography (AREA)
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- Manufacturing Of Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
200949433 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種將能夠藉由鹼性水溶液顯影之感光性 樹脂組合物積層於支持層上而形成之感光性樹脂積層體、 使用該感光性樹脂積層體於基板上形成光阻圖案之方法、 - 及該光阻圖案之用途。更詳細而言,本發明係關於一種感 .光性樹脂組合物,該感光性樹脂組合物提供適用於印刷布 線板之製造,可撓性印刷布線板之製造,ic晶片搭載用導 ❹ 線架(以下稱為導線架)之製造,金屬掩模(metal mask)製造 等金屬箔精密加工,BGA(Ball Grid Array,球柵陣列)或 CSP(Chip Size Package,晶片尺寸封裝)等半導體封裝製 造,以TAB(Tape Automated Bonding,捲帶自動接合)或 COF(Chip On Film:將半導體1C配置於膜狀之微細布線板 上者)為代表之捲帶基板之製造,半導體凸塊之製造,平 板顯示器領域中之IT〇(Indium Tin Oxide,氧化銦錫)電 極、定址電極(address electrode)或電磁波遮罩等構件之製 ® it的光阻圖案。 【先前技術】 _ 先前,印刷布線板係利用光微影法(photolithography)而 製造的。所謂光微影法係指如下方法:將感光性樹脂組合 物塗布於基板上,進行圖案曝光而使該感光性樹脂組合物 之曝光部聚合硬化,利用顯影液去除未曝光部而於基板上 形成光阻圖案,並實施蝕刻或鍍敷處理而形成導線 (conductor pattern)後,將該光阻圖案自該基板上剝離去 136982.doc 200949433 除,藉此於基板上形成導線。 於上述之光微影法中,當將感光性樹脂組合物塗布於基 板上時,使用如下方法中之任一者:將光阻劑溶液塗布於 基板上並使其乾燥的方法;或者將依序積層有支持層、由 感光性樹脂組合物所形成之層(以下亦稱為「感光性樹脂 層」)及視需要之保護層的感光性樹脂積層體(以下亦稱為 「乾膜光阻」)積層於基板上的方法。另外,於印刷布線 板之製造中’大多使用後者之乾膜光阻。 以下’就使用上述之乾膜光阻製造印刷布線板之方法加 以簡單說明。 首先’於乾膜光阻具有保護層例如聚乙烯膜之情形時, 將其自感光性樹脂層上剝離。繼而,使用貼合機(laminat〇r) 於基板例如銅箔積層板(c〇pper clad iarninate)上依照該基 板、感光性樹脂層、支持體之順序將感光性樹脂層及支持 體加以積層。繼而,經由具有布線圖案之光罩,利用超高 壓水銀燈所發出之包含i線(365 nm)之紫外線對該感光性樹 脂層進行曝光,藉此使曝光部分聚合硬化。繼而,將支持 層例如聚對苯二甲酸乙二酯剝離。接著,利用顯影液例如 八有弱驗性之水溶液將感光性樹脂層之未曝光部分溶解或 分散去除’從而於基板上形成光阻圖案。 作為使用以上述方式所形成之基板上的光阻圖案來製作 金屬導線之方法,大致分為兩種方法,即利用蝕刻去除未 被光阻層包覆之金屬部分之方法與利用鍍敷來鍍上金屬之 方法。特別是最近自步驟之簡便性考慮多使用前者之方 136982.doc 200949433 法。 於利用蝕刻去除金屬部分之方法中,用硬化光阻膜來覆 蓋基板之貫通孔(通孔,through h〇le)或用以進行層間連接 之導孔(via hole),藉此來避免孔内之金屬受到蝕刻。該方 法被稱為蓋孔法。於银刻步驟中,例如使用氣化銅、氣化 鐵、銅氨錯合物溶液。 伴隨近年來之印刷布線板中之布線布線間隔之微細化, ^良率較佳地製造狹小間距之圖案,要求乾膜光阻具有高 解析性與同蓋孔性。作為提高解析性之方法,藉由使乾膜 光阻變薄可簡單地提高解析性,但存在以下問題·因顯影 步驟、蝕刻步驟之噴射而導致膜對物理外力之抗力變弱, 由此於顯影步驟、蝕刻步驟中無法保護通孔、導孔(蓋孔 性不佳)。 於專利文獻1中,揭示有因感光性樹脂組合物中之不飽 彳化0物中二官能單體較多而優異之光阻。然而,僅對不 聲絲化合物中之三官能單體之比例進行了描述,而存在於 某範圍内蓋孔性不佳之問題。關於專利文獻1,將於比較 例中後述。 於專利文獻2中,揭示有因感光性樹脂組合物中之不飽 和化合物係四官能單體而優異之光阻。然而於使用該等 光阻之直接繪圖曝光中,存在蓋孔性不佳之問題。 於專利文獻3中,揭示有因感光性樹脂組合物中之不飽 #化〇物中之三官能單體而優異之光阻。然而,於藉由使 5等光阻之薄膜進行直接緣圖曝光中,存在蓋孔性不佳 136982.doc 200949433 之問題。 然而’於感光性樹脂組合物中包含較多該等多官能單體 之情形時’亦存在顯影時產生油狀之凝聚物之問題。 因此,業界要求一種即便於直接繪圖曝光中蓋孔性亦良 好、另外顯影時之凝聚物非油狀者,且粉狀之凝聚物亦較 少者。 [專利文獻1]曰本專利特開平11 — 119422號公報 [專利文獻2]曰本專利特開2000-347400號公報 [專利文獻3]曰本專利特開2002-228871號公報 【發明内容】 [發明所欲解決之問題] 本發明之目的在於提供一種感光性樹脂積層體,該感光 性樹脂積層體即便於感光性樹脂層之厚度薄至3〜15 時、 且即便於利用直接繪圖曝光進行曝光時,蓋孔性亦良好而 且顯影時不產生油狀凝聚物,且粉狀之凝聚物亦較少。 [解決問題之技術手段] 上述課題可藉由本發明之以下構成而達成。 即,本發明係如下者。 1· 一種感光性樹脂積層體,其特徵在於:其係積層有至 少支持層及感光性樹脂層而成者,並且該感:性樹:層係 包含感光性樹脂組合物, 該感光性樹脂組合物包含:至少 (a) 驗溶性樹脂25〜64質量%; (b) 具有光可聚合之不飽和雙鍵之化合物; 136982.doc 200949433 (c)光聚合起始劑0.1〜20質量%;且 進而滿足以下之(i)、(Π)及(m): (1)作為上述00具有光可聚合之不飽和雙鍵之化合 物,包含相對於感光性樹脂組合物之總量為3〇〜55質量% 的選自以下述通式(I)所表示之化合物及以下述通式(ιι)所 表示之化合物所組成之群中的至少一種者: [化1][Technical Field] The present invention relates to a photosensitive resin laminate formed by laminating a photosensitive resin composition which can be developed by an aqueous alkaline solution on a support layer, and using the photosensitivity A method of forming a photoresist pattern on a substrate by a resin laminate, and - the use of the photoresist pattern. More specifically, the present invention relates to a photosensitive resin composition which is suitable for the manufacture of a printed wiring board, the manufacture of a flexible printed wiring board, and the use of an ic wafer mounting guide. Fabrication of wireframes (hereinafter referred to as leadframes), precision machining of metal foils such as metal masks, semiconductor packages such as BGA (Ball Grid Array) or CSP (Chip Size Package) Manufacture of a tape substrate represented by TAB (Tape Automated Bonding) or COF (Chip On Film) in which a semiconductor 1C is disposed on a film-shaped fine wiring board, and manufacture of a semiconductor bump A photoresist pattern of a component such as an IT (Indium Tin Oxide) electrode, an address electrode, or an electromagnetic wave mask in the field of flat panel displays. [Prior Art] _ Previously, printed wiring boards were manufactured by photolithography. The photolithography method is a method in which a photosensitive resin composition is applied onto a substrate, pattern exposure is performed, and the exposed portion of the photosensitive resin composition is polymerized and cured, and the unexposed portion is removed by a developing solution to form a substrate. After the photoresist pattern is formed by etching or plating to form a conductor pattern, the photoresist pattern is stripped from the substrate to remove 136982.doc 200949433, thereby forming a wire on the substrate. In the photolithography method described above, when the photosensitive resin composition is applied onto a substrate, any of the following methods may be used: a method of applying a photoresist solution onto a substrate and drying it; or A photosensitive resin laminate having a support layer, a layer formed of a photosensitive resin composition (hereinafter also referred to as "photosensitive resin layer"), and an optional protective layer (hereinafter also referred to as "dry film photoresist") ") A method of laminating on a substrate. Further, in the manufacture of printed wiring boards, the latter dry film photoresist is often used. Hereinafter, a method of manufacturing a printed wiring board using the dry film resist described above will be briefly described. First, when the dry film photoresist has a protective layer such as a polyethylene film, it is peeled off from the photosensitive resin layer. Then, the photosensitive resin layer and the support are laminated on the substrate, for example, a copper foil laminate, in the order of the substrate, the photosensitive resin layer, and the support, using a laminator. Then, the photosensitive resin layer was exposed by ultraviolet rays containing i-line (365 nm) emitted from an ultrahigh pressure mercury lamp through a mask having a wiring pattern, whereby the exposed portion was polymerized and cured. Then, a support layer such as polyethylene terephthalate is peeled off. Next, the unexposed portion of the photosensitive resin layer is dissolved or dispersed by a developing solution such as an aqueous solution having a weakity to form a photoresist pattern on the substrate. As a method of fabricating a metal wire using a photoresist pattern on a substrate formed in the above manner, there are roughly two methods, that is, a method of removing a metal portion not covered by a photoresist layer by etching and plating with plating The method of metal. In particular, the use of the former is more often taken from the simplicity of the steps. 136982.doc 200949433 Method. In the method of removing a metal portion by etching, a through-hole (through hole) of a substrate or a via hole for interlayer connection is covered with a hardened photoresist film, thereby avoiding the inside of the hole The metal is etched. This method is called the cover hole method. In the silver engraving step, for example, a vaporized copper, a gasified iron, or a copper ammonia complex solution is used. With the miniaturization of the wiring wiring intervals in the printed wiring board in recent years, the pattern of the narrow pitch is preferably produced at a good yield, and the dry film photoresist is required to have high resolution and the same capping property. As a method of improving the resolution, the resolution can be easily improved by thinning the dry film photoresist, but the following problems occur: the film has a weak resistance to physical external force due to the ejection of the development step and the etching step, thereby The through hole and the via hole cannot be protected in the developing step and the etching step (the cap hole property is not good). Patent Document 1 discloses that the photoresist is excellent in the amount of difunctional monomers in the unsaturated resin in the photosensitive resin composition. However, only the ratio of the trifunctional monomer in the unsound compound is described, and there is a problem that the capping property is poor in a certain range. Patent Document 1 will be described later in the comparative example. Patent Document 2 discloses that the photoresist is excellent in that the unsaturated compound is a tetrafunctional monomer in the photosensitive resin composition. However, in direct drawing exposure using such photoresists, there is a problem that the capping property is poor. Patent Document 3 discloses a photoresist which is excellent in trifunctional monomers in an unsaturated resin composition in a photosensitive resin composition. However, in the direct edge exposure of the film of the 5th photoresist, there is a problem that the hole porosity is not good 136982.doc 200949433. However, when a large amount of these polyfunctional monomers are contained in the photosensitive resin composition, there is also a problem that oily aggregates are generated during development. Therefore, the industry has demanded that even if the capping property is good in direct drawing exposure and the coagulation is not oily when developing, the powdery agglomerates are also less. [Patent Document 1] Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. 2000-347400 (Patent Document 3). DISCLOSURE OF THE INVENTION PROBLEMS TO BE SOLVED BY THE INVENTION An object of the present invention is to provide a photosensitive resin laminate which is exposed even when the thickness of the photosensitive resin layer is as thin as 3 to 15 and even by direct drawing exposure. At the same time, the capping property was also good and oily aggregates were not generated during development, and powdery aggregates were also less. [Technical means for solving the problem] The above problems can be attained by the following constitution of the present invention. That is, the present invention is as follows. 1 . A photosensitive resin laminate comprising a support layer and a photosensitive resin layer, wherein the layer: the layer contains a photosensitive resin composition, and the photosensitive resin composition The composition comprises: at least (a) a solvent-soluble resin in an amount of 25 to 64% by mass; (b) a compound having a photopolymerizable unsaturated double bond; 136982.doc 200949433 (c) a photopolymerization initiator 0.1 to 20% by mass; Further, the following (i), (Π), and (m) are satisfied: (1) The compound having the photopolymerizable unsaturated double bond as the above 00, and the total amount of the photosensitive resin composition is from 3 to 55 The mass% is at least one selected from the group consisting of a compound represented by the following formula (I) and a compound represented by the following formula (1): [Chemical Formula 1]
(1) (式中,R,、R2、及R3分別獨立為时现;及以 分別獨立為0~4之整數,亦(1) (where R, R2, and R3 are independent of each other; and are independently independent integers from 0 to 4,
一 〜尤双 π可冋時為〇 ; w為以 表示之基); [化2]One ~ especially double π can be 〇; w is the base of representation); [Chemical 2]
CH2—C*-CH2CH2—C*-CH2
136982.doc (II) 200949433 (式中’ R5、R6、厌7及厌8分別獨立為; mi、m2、m3 及叫分別獨立為〇〜4之整數,亦可同時為〇); (11)上述(a)鹼溶性樹脂之重量平均分子量為 70,000〜220,0〇〇,酸當量為 1〇〇〜6〇〇 ; (n〇感光性樹脂層之厚度a3〜15pm。 2.如上述1所記載之感光性樹脂積層體,其中作為上述 (b)具有光可聚合之不飽和雙鍵之化合物包含相對於感光 性樹脂組合物之總量為35〜55質量%的選自以上述通式⑴ 所表示之化合物及以上述通式(π)所表示之化合物所組成 之群中的至少一種者。 3·如上述1或2所記載之感光性樹脂積層體,其中光聚 合起始劑為9-苯基吖啶。 4·如上述1至3中任一項所記載之感光性樹脂積層體,其 中當相對於感光性樹脂組合物總量而將上述⑷驗溶性樹脂 之比例設為A質量%、將上述(b)具有光可聚合之不飽和雙 鍵之化合物之比例設為B質量%時,A/B為κι〜丨3。 5. -種光阻圖案之形成方法,其包括:於基板上層慶如 上述1至4中任—項所記載之感光性樹脂積層體之感光性樹 脂層的層塵步驟、利用紫外線進行曝光之曝光步驟、以及 去除未曝光部之顯影步驟。 6.如上述5所記載之光阻圖案之形成方法,其中於上述 曝光步驟中,利用直接繪圖進行曝光。 7· -種導線之製造方法,其包括如下步驟:使用銅笛積 層板作為基板,對藉由如上述5或6所記載之方法而形成有 136982.doc •10· 200949433 光阻圖案之基板進行蝕刻或鍍敷。 8. —種印刷布線板之製造方法,其特徵在於:使用金屬 包覆絕緣板作為基板’對藉由如上述4至7中任一項所記載 之方法而形成有光阻圖案之基板進行蝕刻或鍍敷,並剝離 光阻圖案。 • 9· 一種導線架之製造方法,其特徵在於:使用金屬板作 為基板,對藉由如上述4至8中任一項所記載之方法而形成 有光阻圖案之基板進行银刻,並剝離光阻圖案。 © 1〇. 一種半導體封裝之製造方法’其特徵在於:使用已形 成有作為LSI之電路的晶圓作為基板,對藉由如上述4至= 中任一項所記載之方法而形成有光阻圖案之基板進行鍍 敷’並剝離光阻圖案。 11. 一種具有凹凸圖案之基材之製造方法,其特徵在於: 使用玻璃肋作為基板,利用噴砂法對藉由如上述4至10中 任一項所記載之方法而形成有光阻圖案之基板進行加工, 並剝離光阻圖案。 [發明之效果] 本發明之感光性樹脂積層體具有如下之效果:雖然感光 性樹脂層之厚度薄至3〜15㈣’但即便於利用直接繪圖曝 光進行曝光時,蓋孔性亦良好,而且顯影時不產生油狀凝 聚物,且粉狀之凝聚物亦較少。 【實施方式】 以下,對本發明進行具體說明。 <感光性樹脂積層體> 136982.doc 200949433 本發明之感光性樹脂積層體係積層有至少支持層及感光 性樹脂層而成者,並且該感光性樹脂層係包含感光性樹脂 組合物, 該感光性樹脂組合物包含:至少 (a) 鹼溶性樹脂25〜64質量%; (b) 具有光可聚合之不飽和雙鍵之化合物; (c) 光聚合起始劑 進而滿足以下之⑴、(ii)及(iii): (0 作為上述(b)具有光可聚合之不飽和雙鍵之化合❹ 物,包含相對於感光性樹脂組合物之總量為3〇〜55質量% 的選自以下述通式⑴所表示之化合物及以下述通式(I〗)所 表示之化合物所組成之群中的至少一種者: [化3]136982.doc (II) 200949433 (In the formula, 'R5, R6, 厌7, and 厌8 are independent; mi, m2, m3, and singly are independent integers of 〇~4, and can also be 〇); (11) The (a) alkali-soluble resin has a weight average molecular weight of 70,000 to 220,0 Å, and an acid equivalent of 1 〇〇 to 6 〇〇; (n 〇 the thickness of the photosensitive resin layer is a 3 to 15 pm. In the photosensitive resin laminate according to the above (b), the compound having a photopolymerizable unsaturated double bond is contained in an amount of 35 to 55 mass% based on the total amount of the photosensitive resin composition, and is selected from the above formula (1). The photosensitive resin laminate according to the above 1 or 2, wherein the photopolymerization initiator is 9 or more, wherein the compound represented by the above formula (π) is at least one of the group consisting of the compound represented by the above formula (π). The photosensitive resin laminate according to any one of the above-mentioned items 1 to 3, wherein the ratio of the (4) test resin is set to A mass with respect to the total amount of the photosensitive resin composition. %, the ratio of the above (b) compound having a photopolymerizable unsaturated double bond is set to B% by mass And A/B is κι to 丨3. 5. A method for forming a photoresist pattern comprising: a photosensitive resin layer of the photosensitive resin laminate according to any one of the above 1 to 4 The dusting step, the exposure step of exposing with ultraviolet rays, and the developing step of removing the unexposed portion. 6. The method for forming a photoresist pattern according to the above 5, wherein in the exposing step, exposure is performed by direct drawing. A method of manufacturing a wire comprising the steps of: forming a substrate having a photoresist pattern of 136982.doc • 10·200949433 by a method as described in the above 5 or 6 using a copper flute laminate as a substrate. 8. A method of manufacturing a printed wiring board, characterized in that a metal-clad insulating board is used as a substrate, and light is formed by the method according to any one of the above 4 to 7. The substrate of the resist pattern is etched or plated, and the photoresist pattern is stripped. • A method of manufacturing a lead frame, characterized in that a metal plate is used as the substrate, as recorded by any one of the above 4 to 8 In the method of forming a substrate having a photoresist pattern, silver etching is performed, and the photoresist pattern is removed. [1] A method of manufacturing a semiconductor package is characterized in that a wafer on which a circuit as an LSI is formed is used as a substrate, The substrate on which the photoresist pattern is formed by the method described in any one of the above 4 to = plating is performed and the photoresist pattern is peeled off. 11. A method of manufacturing a substrate having a concave-convex pattern, characterized in that: The substrate on which the photoresist pattern was formed by the method described in any one of the above 4 to 10 was processed by a sand blasting method using a glass rib as a substrate, and the photoresist pattern was peeled off. [Effect of the Invention] The photosensitive resin laminate of the present invention has an effect that although the thickness of the photosensitive resin layer is as thin as 3 to 15 (four)', even when exposed by direct drawing exposure, the capping property is good, and development is performed. Oily aggregates are not produced, and powdery aggregates are also less. [Embodiment] Hereinafter, the present invention will be specifically described. <Photosensitive Resin Laminate> 136982.doc 200949433 The photosensitive resin laminate system of the present invention comprises at least a support layer and a photosensitive resin layer, and the photosensitive resin layer contains a photosensitive resin composition. The photosensitive resin composition contains at least (a) an alkali-soluble resin in an amount of 25 to 64% by mass; (b) a compound having a photopolymerizable unsaturated double bond; (c) a photopolymerization initiator further satisfying the following (1), Ii) and (iii): (0) The compound (b) having a photopolymerizable unsaturated double bond, which is selected from the group consisting of 3 to 55% by mass based on the total amount of the photosensitive resin composition At least one of the compound represented by the general formula (1) and the compound represented by the following general formula (I): [Chemical 3]
及化分別獨立為H或 CH3 ; 4之整數, 亦可同時為0 ; W為以CH3或 (式中,R!、r2、 及Π4分別獨立為〇 OH所表示之基); 136982.doc -12· 200949433 [化4]And the independent is H or CH3; 4 integers, can also be 0; W is CH3 or (where R!, r2, and Π4 are respectively independent of 〇OH); 136982.doc - 12· 200949433 [Chemical 4]
(式中’ R5、R6、R7、及以分別獨立為时叫;叫、^、 1η3、及nu分別獨立為〇〜4之整數,亦可同時為〇); (Π)上述(a)鹼溶性樹脂之重量平均分子量為7〇 〇〇〇〜 220,000,酸當量為1〇〇〜6〇〇 ; (iii)感光性樹脂層之厚度為3〜15μιη。 對感光性樹脂組合物中之各成分之調配量進行記載時, 各成分之調配量係以將感光性樹脂組合物中之固形物整發 作為基準時之質量%來進行記載。(wherein R5, R6, R7, and each are independently called; called, ^, 1η3, and nu are each independently an integer of 〇~4, which may also be 〇); (Π) the above (a) alkali The weight average molecular weight of the soluble resin is 7 Å to 220,000, and the acid equivalent is 1 〇〇 to 6 〇〇; (iii) The thickness of the photosensitive resin layer is 3 to 15 μm. In the case where the amount of each component in the photosensitive resin composition is described, the amount of each component is described in terms of the mass % of the solid content in the photosensitive resin composition as a standard.
(a) 驗溶性樹脂 所謂驗溶性樹脂係指含有m基之乙烯㈣脂,例 基)丙烯酸、(甲基)丙稀酸_、(甲基)丙稀腈、(甲基 醯胺等之共聚物。 馬 ⑷驗溶性樹脂較好的是含有致基、且酸當 100〜600。所謂酸當量传 ’"、 合物之質量。酸當量更=中具有h之缓基的線性聚 影性提昇、解U 疋25G以上、彻以下。就耐顯 又及密著性提昇之觀點而言較好的是1〇〇 136982.doc *13· 200949433 以上,就顯影性及剝離性提昇之觀點而言較好的是600以 下。酸當量之測定係使用平沼產業(股)製造之平沼自動滴 定裝置(COM-555),利用0.1 mol/L之氫氧化鈉藉由電位滴 定法來進行。 本發明中所使用之(a)鹼溶性樹脂之重量平均分子量較好 的是70,000以上220,000以下。就顯影性提昇之觀點而言, 較好的是220,000以下。就蓋孔性、凝聚物之性狀之觀點 而言,重量平均分子量較好的是70,000以上。進而好的是 70,000以上200,000以下。更好的是70,000以上、120,000以 下。重量平均分子量係利用日本分光(股)製造之凝膠滲透 層析儀(GPC ’ Gel Permeation Chromatography) (泵:Gulliver,PU-15 80型,管柱:昭和電工(股)製造之 Shodex(註冊商標)(KF-807、KF-806M、KF-806M、KF-802.5)4根串聯,移動層溶劑:四氫呋喃,並使用聚苯乙烯 標準樣品(昭和電工(股)製造之Shodex STANDARD SM-105)之校準曲線)並進行聚苯乙烯換算來求出。 鹼溶性樹脂較好的是包含後述之第一單體之至少一種以 上與後述之第二單體之至少一種以上的共聚物。 第一單體係分子中具有一個聚合性不飽和基之羧酸或酸 酐。例如可列舉:(甲基)丙烯酸、反丁烯二酸、肉桂酸、 丁烯酸、衣康酸、順丁烯二酸酐及順丁稀二酸半酯。其 中,特別好的是(曱基)丙烯酸。 此處,所謂(甲基)丙烯酸表示丙烯酸及/或甲基丙烯酸。 以下相同。 136982.doc -14- 200949433 第-單體係非酸性、且分子中具有至少〆個聚合性不飽 和基之單體。例如可列舉:(甲基)丙稀酸甲醋、(甲基)丙 烯酸乙酯、(曱基)丙烯酸正丙酯、(曱基)丙烯酸異丙酯、 (曱基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸 第二丁 s曰、(曱基)丙烯酸2_羥乙酯、(甲基)丙烯酸2_羥丙 酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸苄酯、乙烯 醇之醋類例如乙酸乙稀醋、(甲基)丙婦猜、#乙稀及苯乙 烯行生物其中,較好的是(甲基)丙烯酸甲酯、(甲基)丙 參 賴正丁醋、苯乙稀、(曱基)丙烯酸节醋。 就蓋孔性、凝聚物之性狀之觀點而言,鹼溶性樹脂含 有羧基、酸當量為100〜6〇〇、且重量平均分子量為 70’000〜220,000,係本發明之較佳實施形態。 U)鹼溶性樹脂相對於感光性樹脂組合物之總和之比例 為25〜64質量%之範圍,較好的是4〇〜6〇質量%。就利用曝 光、顯影所形成之光阻圖案具有作為光阻之特性,例如於 & 蓋孔、蝕刻及各種鍍敷步驟中具有充分之耐性之觀點而 言’較好的是25質量❶/❶以上64質量%以下。 (b)光可聚合之不飽和化合物 所謂光可聚合之不飽和化合物,係指分子内具有至少一 個乙稀性不飽和鍵之化合物。 於本發明之感光性樹脂組合物中,作為(b)具有光可聚 合之不飽和雙鍵之化合物,包含相對於感光性樹脂組合物 之總量為30〜55質量%的選自以下述通式⑴所表示之化人 物及以下述通式(Π)所表示之化合物所組成之群中的至^ 136982.doc 15 200949433 一種光可聚合之不飽和化合物: [化5](a) Detective resin The so-called solvent-soluble resin means an ethylene (tetra) ester containing an m group, an acrylic acid, a (meth) acrylic acid _, a (meth) acrylonitrile, or a copolymer of methyl amide. The horse (4) test soluble resin preferably contains a radical and the acid is 100 to 600. The so-called acid equivalent of '", the mass of the compound. The acid equivalent is more than the linear polymorphism of the slow base of h It is better to raise and solve U 疋25G or more, and it is better than 1 136982.doc *13· 200949433 or more in terms of resistance and reproducibility. It is preferable that it is 600 or less. The measurement of the acid equivalent is carried out by the potentiometric titration method using the Sampron automatic titrator (COM-555) manufactured by Hiranuma Industry Co., Ltd. using 0.1 mol/L of sodium hydroxide. The weight average molecular weight of the (a) alkali-soluble resin to be used is preferably 70,000 or more and 220,000 or less. From the viewpoint of improving the developability, it is preferably 220,000 or less. From the viewpoint of the porosity of the pores and the properties of the aggregates In terms of weight average molecular weight, it is preferably 70,000 or more. Further preferably, it is 70,000 or more and 200,000 or less, more preferably 70,000 or more and 120,000 or less. The weight average molecular weight is a GPC 'Gelph Permeation Chromatography (MPC) manufactured by Japan Spectrophotometer (pump: Gulliver, PU) -15 80 type, pipe column: Shodex (registered trademark) (KF-807, KF-806M, KF-806M, KF-802.5) manufactured by Showa Denko Electric Co., Ltd. 4 in series, moving layer solvent: tetrahydrofuran, and using poly The styrene standard sample (calibration curve of Shodex STANDARD SM-105 manufactured by Showa Denko Co., Ltd.) is obtained by polystyrene conversion. The alkali-soluble resin preferably contains at least one or more of the first monomers described later. a copolymer of at least one or more of a second monomer to be described later. A carboxylic acid or an acid anhydride having a polymerizable unsaturated group in the first single-system molecule, and examples thereof include (meth)acrylic acid and fumaric acid. , cinnamic acid, crotonic acid, itaconic acid, maleic anhydride, and cis-butyl diacid half-ester. Among them, (mercapto)acrylic acid is particularly preferred. Here, (meth)acrylic acid means acrylic acid. / methacrylic acid. The same as the following. 136982.doc -14- 200949433 The mono-system is a non-acidic monomer having at least one polymerizable unsaturated group in the molecule. For example, (meth) propylene Acid methyl vinegar, ethyl (meth) acrylate, n-propyl (meth) acrylate, isopropyl (meth) acrylate, n-butyl (meth) acrylate, isobutyl (meth) acrylate, (A Acrylic acid dibutyl sulfonate, 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, benzyl (meth) acrylate The vinegar of vinyl alcohol such as ethyl acetate acetonate, (meth) propyl guar, #ethylene and styrene. Among them, methyl (meth) acrylate, (methyl) propylene ginseng butyl vinegar is preferred. , styrene, (mercapto) acrylic vinegar. The alkali-soluble resin contains a carboxyl group, an acid equivalent of 100 to 6 Å, and a weight average molecular weight of 70'000 to 220,000 from the viewpoint of the property of the capping property and the property of the agglomerate, and is a preferred embodiment of the present invention. U) The ratio of the alkali-soluble resin to the total of the photosensitive resin composition is in the range of 25 to 64% by mass, preferably 4 to 6 % by mass. The photoresist pattern formed by exposure and development has characteristics as a photoresist, for example, from the viewpoint of & capping, etching, and various plating steps, it is preferable that it is 25 mass ❶/❶. The above is 64% by mass or less. (b) Photopolymerizable unsaturated compound The term "photopolymerizable unsaturated compound" means a compound having at least one ethylenically unsaturated bond in the molecule. In the photosensitive resin composition of the present invention, the compound (b) having a photopolymerizable unsaturated double bond is contained in an amount of from 30 to 55% by mass based on the total amount of the photosensitive resin composition. a group of the compound represented by the formula (1) and a compound represented by the following formula (Π) to 136982.doc 15 200949433 A photopolymerizable unsaturated compound: [Chemical 5]
CH2-^〇C3H6j—CH2-^〇C3H6j—
〇 (式中,R!、R2及R3分別獨立為Η或CH3 ; ηι、n2、n3及…分 別獨立為0〜4之整數,亦可同時為〇; w為以CHyi〇H所表 不之基), [化6]〇 (where R!, R2, and R3 are independently Η or CH3; ηι, n2, n3, and ... are each independently an integer of 0 to 4, and may be 〇 at the same time; w is represented by CHyi〇H Base), [Chem. 6]
(式中 ’ R5、R6、R7AR8分別獨立為 j^CH3 ;叫、m2、m3 及nu分別獨立為〇〜4之整數,亦可同時為〇)。 作為選自以上述通式⑴所表示之化合物及以上述通式 136982.doc -16- 200949433 (II)所表不之化合物所組成之群中的至少一種光可聚合之 不飽和化合物的具體例,例如可列舉:於上述通式⑴中, R!、R2及R3為Η,ηι、n2及n3為整數i,n4為整數〇,且w為 CH3之化合物(新中村化學工業(股)公司製造之Νκ ester A-TMPT-3PO);同樣可列舉:於上述通式⑴中,R丨、化及 R3為Η,ηι、〜及〜為整數3,n4為整數〇,且霄為^^之化 合物(新中村化學工業(股)公司製造之NK ESTER A-TMPT-9PO)等。又可列舉:於上述通式(π)中,&、&、尺7及心 為Η,、m2、瓜3及m4為整數〇的化合物(新中村化學工業 (股)公司製造NK ESTER A-TMMT);同樣可列舉:於上述 通式(II)中’ R5、r6、尺7及尺8為Η,m丨、m2、叫及m4為整 數1的化合物(Sartomer Japan(股)公司製造之sr_494)。 就蓋孔性之觀點而言’選自以上述通式⑴所表示之化合 物及以上述通式(II)所表示之化合物所組成之群中的至少 一種光可聚合之不飽和化合物的含量為35〜55質量%,更 好的是40〜55質量%。另外,對於(b)光可聚合之不飽和化 合物’除以上述通式(I)、上述通式(Π)所表示之化合物以 外’可使用下述所示之光可聚合之不飽和化合物。例如可 列舉:1,6-己二醇二(甲基)丙烯酸酯、M_環己二醇二(甲 基)丙烯酸酯、聚乙二醇二(曱基)丙烯酸酯、2_二(對經苯 基)丙烧一(甲基)丙婦酸醋、甘油三(甲基)丙稀酸醋、三經 甲基丙烷三(甲基)丙烯酸酯、聚氧丙基三羥甲基丙烷三(甲 基)丙烯酸酯、聚氧乙基三羥曱基丙烷三丙烯酸酯、季戊 四醇四(甲基)丙烯酸酯、二季戊四醇五(甲基)丙烯酸醋、 136982.doc -17- 200949433 一笔甲基丙烧二縮水甘油喊三(甲基)丙烯酸醋、雙盼a二 縮水甘油醚二(曱基)丙烯酸酯、p_羥丙基_p,_(丙烯醯氧基) 丙基鄰苯二曱酸酯、苯氧基聚乙二醇(甲基)丙烯酸酯、壬 基苯氧基聚乙二醇(甲基)丙烯酸酯、壬基苯氧基聚烷二醇 (甲基)丙烯酸酯、聚丙二醇單(曱基)丙烯酸酯。 又,亦可列舉胺基甲酸酯化合物,作為胺基甲酸酯化合 物,例如可列舉:六亞曱基二異氰酸酯、甲苯二異氰酸酯 或二異氰酸酯化合物例如2,2,4-三甲基六亞曱基二異氰酸 西曰與一分子中具有羥基與(甲基)丙稀基之化合物例如丙 烯酸-2-羥基丙酯、低聚丙二醇單甲基丙烯酸酯的胺基甲酸 酯化合物。具體而言,有六亞甲基二異氰酸酯與低聚丙二 醇單曱基丙烯酸酯(日本油脂(股)製造,Blemmer ρρι〇〇〇) 之反應物。該等胺基甲酸酯化合物可單獨使用,亦可併用 2種以上。 相對於感光性樹脂組合物之總量,包含選自以上述通式 (I)所表示之化合物及以上述通式(„)所表示之化合物所組 成之群中的至少一種光可聚合之不飽和化合物的(b)具有光 可聚合之不飽和雙鍵之化合物的總含量為3〇〜55質量%, 較好的是35質量%〜55質量。/。。更好的是40〜55質量%。 又’當相對於感光性樹脂組合物總量而將上述(a)鹼溶性 樹脂之比例設為A質量%、將上述(b)具有光可聚合之不飽 和雙鍵之化合物之比例設為8質量%時,a/B為1.1M.3係本 發明之較佳實施形態。就蓋孔性之觀點而言,較好的是 A/B為1·1以上,且較好的是a/B為1·3以下。 136982.doc *18» 200949433 (C)光聚合起始劑 於感光性樹脂組合物中,作為(e)光聚合起始劑,可使用 眾所周知者。感光性樹脂組合物中所含有之(c)光聚合起始 劑之量為0.1〜20質量%之範圍,更好的範圍為05〜10質量 %。就獲得充分之靈敏度之觀點而言,較好的是〇丨質量0/〇 以上’又,就使光充分地透射至光阻底面、獲得良好之高 解析性之觀點而言,較好的是2〇質量%以下。 作為此種光聚合起始劑’可列舉:2_乙基蒽醌、八乙基 ^ 蒽醌、丨,2_苯并蒽醌、2,3-笨并蒽醌、2_苯基蒽醌、2,3_二 苯基蒽醌、1-氣蒽醌、2-氣蒽醌、2-甲基蒽醌、ι,4-萘 醌、9,10-菲醌、2-甲基-1,4-萘醌、91〇_菲醌、2_甲基_14_ 萘醌、2,3-二甲基蒽醌、3_氣_2_甲基蒽醌等醌類;芳香族 酮類,例如二苯甲酮、米其勒嗣[4,4,_雙(二甲胺基)二笨甲 酮]、4,4-雙(二乙胺基)二苯甲酮;安息香或安息香醚類, 例如安息香、安息香乙醚、安息香苯醚、甲基安息香、乙 φ 基安息香;二烷基縮酮類,例如苄基二曱基縮酮、苄基二 乙基縮綱;9-氧硫咄蠖類,例如二乙基_9_氧硫咄嗟、氣_ 9-氧硫咄嗤;二烷基胺基安息香酸酯類,例如二甲基胺基 •安息香酸乙酯;肟酯類,例如丨_苯基_丨,2_丙二酮_2七-笨甲 醯基肟、1-苯基_1,2_丙二酮_2-(〇-乙氧羰基)肟;咯吩二聚 物,例如2-(鄰氣苯基)_4,5_二苯基咪唑基二聚物、2_(鄰氣 苯基)-4,5_雙_(間甲氧基苯基)咪唑基二聚物、2_(對曱氧基 苯基)-4,5_二苯基咪唑基二聚物;吖啶化合物,例如 基吖啶。該等化合物可單獨使用,亦可併用2種以上 工0就 136982.doc -19· 200949433 蓋孔性提昇、且可抑制油狀凝聚物之產生之觀點而言,較 好的是°丫咬化合物’特別好的是9_苯基吖啶。此處所謂油 狀凝聚物係表示黏性較高之凝聚物,一般認為其以具有不 飽和雙鍵之化合物為主成分。另一方面,一般認為粉狀之 凝聚物係以抑制劑·起始劑為主成分,係與油狀凝聚物不 同者。 (d)其他成分 為提高本發明中之感光性樹脂組合物之操作性,亦可添 加無色染料或熒烷染料、或者著色物質。 ❹ 作為無色染料,可列舉:參(4_二甲胺基苯基)甲烷[無色 結晶紫]、雙(4-二曱胺基笨基)苯基曱烷[無色孔雀綠]。其 中,於使用無色結晶紫之情形時,對比度良好而較好。於 感光性樹脂組合物中含有無色染料之情形時,其含量較好 的是〇·1〜10質量%。就對比度之表現的觀點而言較好的是 〇. 1質量/〇以上,又,就維持保存穩定性之觀點而言較好的 是10質量%以下。 於感光性樹脂組合物中,就密著性及對比度之觀點而❹ a ’組合使用無色染料與下述鹵素化合物係本發明之較佳 實施形態。 作為著色物質,例如可列舉:品紅、耿菁綠、金黃胺鹽 基、對品紅、結晶紫、曱基橙、尼祿藍2B、維多利亞藍、 孔雀綠(保土谷化學(股)製S Aizen(註冊商標)Malac_ GREEN)、鹼性藍2〇、鑽石綠(保土谷化學(股)製造 Alzen(註冊商標)DIam〇Nd green gh)。於感光性樹脂組 136982.doc •20- 200949433 合物中含有著色物質之情形時, 〇顧〜1質量%。0·001質量%以…县h較好的疋 上之含量有操作性提昇之效 果,1質量%以下之含量有維持保存穩定性之效果。 ▲於本發明之感光性樹脂組合物中,就靈敏度之觀點而 :’亦可含有N-芳基·α,基酸化合物。作為N_芳基胺 ^酸化合物’較好的是Ν•笨甘胺酸。於含修芳基_α•胺 酸化。物之情形時,其含量較好的是〇 〇1質量。,。以上 質量%以下。(where R', R6, and R7AR8 are each independently j^CH3; called, m2, m3, and nu are each independently an integer of 〇~4, which can also be 〇). Specific examples of at least one photopolymerizable unsaturated compound selected from the group consisting of the compound represented by the above formula (1) and the compound represented by the above formula 136982.doc -16-200949433 (II) For example, in the above formula (1), R!, R2 and R3 are Η, ηι, n2 and n3 are integers i, n4 is an integer 〇, and w is a compound of CH3 (Xinzhongcun Chemical Industry Co., Ltd.) Ν ester ester ester A-TMPT-3PO) manufactured by the company; also exemplified: in the above formula (1), R 丨, 化 and R3 are Η, ηι, 〜 and 〜 are integers 3, n4 is an integer 〇, and 霄 is Compound of ^^ (NK ESTER A-TMPT-9PO manufactured by Shin-Nakamura Chemical Industry Co., Ltd.). In addition, in the above formula (π), &, &, ruler 7 and heart are Η, m2, melon 3 and m4 are integer 〇 compounds (Xin Nakamura Chemical Industry Co., Ltd. manufactures NK) ESTER A-TMMT); also in the above formula (II), 'R5, r6, 尺7 and 尺8 are Η, m丨, m2, and m4 is an integer 1 compound (Sartomer Japan) The company's sr_494). The content of at least one photopolymerizable unsaturated compound selected from the group consisting of the compound represented by the above formula (1) and the compound represented by the above formula (II) is from the viewpoint of the capping property. 35 to 55 mass%, more preferably 40 to 55 mass%. Further, the photopolymerizable unsaturated compound shown below can be used in addition to (b) the photopolymerizable unsaturated compound 'except the compound represented by the above formula (I) or the above formula (?). For example, 1,6-hexanediol di(meth)acrylate, M_cyclohexanediol di(meth)acrylate, polyethyleneglycol bis(indenyl)acrylate, 2_two (pair Phenyl)-propanone-(methyl)-propyl acetoacetate, tris(meth)acrylic acid vinegar, trimethylpropane tris(meth)acrylate, polyoxypropyltrimethylolpropane (Meth) acrylate, polyoxyethyl trihydroxy decyl propane triacrylate, pentaerythritol tetra (meth) acrylate, dipentaerythritol penta (meth) acrylate vine, 136982.doc -17- 200949433 Propylene diglycidyl glycerol tris(meth)acrylic acid vinegar, dioxin a diglycidyl ether di(indenyl) acrylate, p_hydroxypropyl _p, _(propylene decyloxy) propyl phthalate Acid ester, phenoxy polyethylene glycol (meth) acrylate, nonyl phenoxy polyethylene glycol (meth) acrylate, nonyl phenoxy polyalkylene glycol (meth) acrylate, poly Propylene glycol mono(indenyl) acrylate. Further, a urethane compound may be mentioned, and examples of the urethane compound include hexamethylene diisocyanate, toluene diisocyanate or a diisocyanate compound such as 2,2,4-trimethylhexa. A carbazate compound of decyl diisocyanate and a compound having a hydroxyl group and a (meth) propyl group in one molecule such as 2-hydroxypropyl acrylate or oligomeric propylene glycol monomethacrylate. Specifically, there is a reactant of hexamethylene diisocyanate and oligo-propylene glycol monodecyl acrylate (manufactured by Nippon Oil & Fats Co., Ltd., Blemmer ρρι〇〇〇). These urethane compounds may be used singly or in combination of two or more. At least one photopolymerizable group selected from the group consisting of the compound represented by the above formula (I) and the compound represented by the above formula („) is not contained in the total amount of the photosensitive resin composition. The total content of the (b) compound having a photopolymerizable unsaturated double bond of the saturated compound is from 3 to 55 mass%, preferably from 35 to 55 mass%, more preferably from 40 to 55 mass. And the ratio of the (a) alkali-soluble resin to A mass% and the ratio of the (b) photopolymerizable unsaturated double bond to the total amount of the photosensitive resin composition When it is 8% by mass, a/B is 1.1 M. 3 is a preferred embodiment of the present invention. From the viewpoint of capping property, it is preferred that A/B is 1.1 or more, and preferably a/B is 1-3 or less. 136982.doc *18» 200949433 (C) Photopolymerization initiator In the photosensitive resin composition, as the (e) photopolymerization initiator, a known resin can be used. The amount of the (c) photopolymerization initiator contained in the composition is in the range of 0.1 to 20% by mass, more preferably in the range of 05 to 10%. The amount of %. From the viewpoint of obtaining sufficient sensitivity, it is preferable that the mass is 0/〇 or more, and the light is sufficiently transmitted to the bottom surface of the photoresist to obtain a good high resolution. It is preferably 2% by mass or less. As such a photopolymerization initiator, 2' ethyl hydrazine, octaethyl hydrazine, hydrazine, 2 benzopyrene, 2, 3-stall蒽醌, 2_phenyl hydrazine, 2,3_diphenyl fluorene, 1- gas hydrazine, 2- gas hydrazine, 2-methyl hydrazine, iota, 4-naphthoquinone, 9,10- Phenanthrene, 2-methyl-1,4-naphthoquinone, 91〇_phenanthrenequinone, 2_methyl_14_naphthoquinone, 2,3-dimethylhydrazine, 3_gas_2_methylhydrazine Isoindoles; aromatic ketones such as benzophenone, Michelin [4,4,_bis(dimethylamino) dioxin], 4,4-bis(diethylamino) Benzophenone; benzoin or benzoin ethers, such as benzoin, benzoin ethyl ether, benzoin phenyl ether, methyl benzoin, ethyl benzoyl benzoin; dialkyl ketals, such as benzyl didecyl ketal, benzyl diethyl a sulphide; 9-oxopurines, such as diethyl _9 oxa sulfonium, gas -9 oxa sulfonium; dialkyl Kean acid esters, such as dimethylamino benzoic acid ethyl ester; oxime esters, such as 丨 phenyl phenyl hydrazine, 2 propylene glycol ketone -7 acetylene sulfhydryl hydrazine, 1-phenyl _ 1,2-propylenedione 2 - (hydrazine-ethoxycarbonyl) hydrazine; octomer dimer, such as 2-(o-phenyl)-4,5-diphenylimidazolyl dimer, 2_(o Phenyl)-4,5-bis-(m-methoxyphenyl)imidazolyl dimer, 2-(p-methoxyphenyl)-4,5-diphenylimidazolyl dimer; acridine a compound such as a pyridinium. These compounds may be used singly or in combination with two or more types of workers, 136,982.doc -19·200949433, which has improved capping property and inhibits the formation of oily aggregates. Preferably, the "biting compound" is particularly preferred as 9-phenyl acridine. Here, the oily agglomerate is a cohesive substance having a high viscosity, and is generally considered to have a compound having an unsaturated double bond as a main component. On the other hand, it is considered that the powdery agglomerates are mainly composed of an inhibitor and a starter, and are different from oily aggregates. (d) Other components In order to improve the handleability of the photosensitive resin composition of the present invention, a leuco dye or a fluoran dye or a coloring matter may be added. ❹ As the leuco dye, ginseng (4-dimethylaminophenyl)methane [colorless crystal violet], bis(4-diamidophenyl) decane [colorless malachite green] can be mentioned. Among them, in the case of using colorless crystal violet, the contrast is good and good. In the case where the photosensitive resin composition contains a leuco dye, the content thereof is preferably from 1 to 10% by mass. From the viewpoint of the performance of the contrast, it is preferably 1 mass/〇 or more, and more preferably 10% by mass or less from the viewpoint of maintaining storage stability. In the photosensitive resin composition, a combination of a leuco dye and a halogen compound described below is a preferred embodiment of the present invention in terms of adhesion and contrast. Examples of the coloring matter include magenta, phthalocyanine green, golden amine base, p-magenta, crystal violet, fluorenyl orange, Nero blue 2B, Victoria blue, and malachite green (Batu Valley Chemical Co., Ltd.) Aizen (registered trademark) Malac_ GREEN), alkaline blue 2〇, diamond green (Alzen (registered trademark) DIam〇Nd green gh manufactured by Hodogaya Chemical Co., Ltd.). In the case where the photosensitive resin group 136982.doc • 20- 200949433 contains a coloring matter, it is considered to be ~1% by mass. The content of 0·001% by mass is better in the content of 县, which is better in the county. The content of 1% by mass or less has the effect of maintaining storage stability. ▲ In the photosensitive resin composition of the present invention, from the viewpoint of sensitivity: 'N-aryl·α, a carboxylic acid compound may be contained. As the N-arylamine acid compound, it is preferred that Ν• streptoglutamic acid. Acidified with aryl-α-amine. In the case of matter, the content of 〇 〇 1 is better. ,. Above mass% or less.
於本發明之感光性樹脂組合物中,亦可含有齒素化合 物。作為齒素化合物’例如可列舉:溴戊烧、漠異戍烧、 漠化異丁烯、漠化乙稀、二笨f基漠、节基漠、二漠甲 三漠甲苯基硬、四漠化碳、參(2,3-二漠丙基)構酸 s曰、二氯乙醯胺、碘戊烷、碘異丁烷、u山三氣_2,2_雙 (十氯苯基)乙烧、氣化二p井化合物,其中可特別好地使用 三溴甲苯基颯。於感光性樹脂組合物中含有_素化合物之 情形時,其含量為0.01〜3質量%。 進而,為提高本發明之感光性樹脂組合物之熱穩定性、 保存穩定性,亦可於感光性樹脂組合物中添加選自以自由 基聚合抑制劑、苯并三唑類及羧基苯并三唑類所組成之群 中的至少一種以上之化合物。 作為此種自由基聚合抑制劑,例如可列舉:對甲氧基苯 酚、對苯二酚、鄰苯三酚、萘胺、第三丁基兒茶酚、氯化 亞鋼、2,6-二-第三丁基-對甲酚、2,2'-亞曱基雙(4_甲基_6_ 第一丁基笨酚)、2,2'-亞曱基雙(4-乙基_6_第三丁基苯盼)、 136982.doc • 21- 200949433 亞硕基苯基㈣㈣及二笨基亞硝基胺。 又’作為苯并三σ坐翻,/χί . 類例如可列舉·· 1,2,3-苯并三唑、 1-氯_1,2,3-苯并三 β坐、簪 7 1 g , 雙(义2_乙基己基)胺基亞甲基-123- 苯弁二唾、雙(Ν·2·己其p «、 , 土己基)胺基亞曱基^,2,3-甲苯三唑 及雙(N-2_經基乙基)胺基亞甲基],2,3_苯并三嗤。 又,作為幾基苯并:r咕1 开—生類,例如可列舉:4-竣基 一、5_羧基_1,2,3-苯并三唑、Ν-(Ν,Ν-二-2-乙義己 基)胺基亞甲基羧基苯并二 土己 ❹ 美亞甲某錄其—Ν·(Ν,Ν-二-2-羥基乙基)胺 土亞甲基羧基本开二唑及Ν _ 基m基苯并三心 ,―2-乙基己基)胺基伸乙 自::聚合抑制劑、苯并三唾類及㈣笨并三唾類之總 添加量較好的是〇.01〜3質量%,更好的是0.05M質量%。就 樹脂組。合物賦予保存穩定性之觀點而言,該量較 更好二01質量%以上,又,就維持靈敏度之觀點而言, 更好的是3質量%以下。 ° ❹ 於本發明之感光性樹频合物巾,視需要亦可 劑。作為此種添加劑,例如可列舉:聚乙二:化 醇、聚氧丙稀聚氧乙_、聚氧乙稀單甲謎、聚氧丙= 甲醚、聚氧乙烯聚氧㈣單甲⑽ -r- .3« „ 6婦單乙喊、聚氫 丙浠早乙越、聚氧乙歸聚氧丙埽 '氧 贫戌# ¥酸知類’鄰甲苯績酿胺、對甲 三乙醋、乙酿基檸檬酸:正_酸二乙^曰、乙酿基棒樣酸 醋。 暇—正^、乙酿基擰檬酸三正丁 136982.doc -22· 200949433 於感光性樹脂組合物中,作為塑化劑之含量,較好的是 含有5〜50質量’更好的是5〜30質量%。就抑制顯影時間 之延遲、對硬化膜賦予柔軟性之觀點而言較好的是5質量 0/〇以上,又,就抑制硬化不足或冷流之觀點而言較好的是 5 0質量%以下。 本發明之感光性樹脂積層體包含由感光性樹脂組合物所 形成之感光性樹脂層與支持層。視需要亦可於感光性樹脂 層之與支持層側相反側之表面上具有保護層。作為此處^ 使用之支持層,較理想的是使自曝光光源所放射之光透過The photosensitive resin composition of the present invention may further contain a dentate compound. Examples of the dentate compound include bromopentane, desert smoldering, desertified isobutylene, desertified ethylene, diphthyl, sulphate, sulphate, and sulphate. , ginseng (2,3-di-dipropyl) acid s曰, dichloroacetamide, iodopentane, iodine isobutane, u mountain three gas_2, 2_bis (decachlorophenyl) ethylene And gasifying the di-p well compound, wherein tribromotolylhydrazine can be used particularly well. When the photosensitive resin composition contains a _-based compound, the content thereof is 0.01 to 3% by mass. Further, in order to improve the thermal stability and storage stability of the photosensitive resin composition of the present invention, a photosensitive resin composition may be added with a radical polymerization inhibitor, a benzotriazole, and a carboxybenzotriene. At least one or more compounds of the group consisting of azoles. Examples of such a radical polymerization inhibitor include p-methoxyphenol, hydroquinone, pyrogallol, naphthylamine, t-butylcatechol, chlorite, and 2,6-di. - tert-butyl-p-cresol, 2,2'-fluorenylene bis (4-methyl-6-first butyl phenol), 2,2'--fluorenylene bis (4-ethyl _6) _T-butyl phenyl porphyrin), 136982.doc • 21- 200949433 Acetophenyl (tetra) (tetra) and diphenyl nitrosamine. Also, as a benzotriazole, /χί. Examples include, for example, 1,2,3-benzotriazole, 1-chloro-1,2,3-benzotriazine, 簪7 1 g , bis(yi 2_ethylhexyl)aminomethylene-123- benzoquinone di-salt, bis(Ν·2·hexyl p «, , hexyl) aminyl fluorenyl, 2,3-toluene Triazole and bis(N-2-transethylethyl)aminomethylene], 2,3-benzotriazine. Further, examples of the benzyl group:r咕1 open-type include 4-mercapto-, 5-carboxyl-1,2,3-benzotriazole, Ν-(Ν, Ν-二-2 -Ethylhexyl)aminomethylenecarboxybenzobenzodiazepine Membrane _ base m-based benzotriene, "2-ethylhexyl" amine-based extension from:: polymerization inhibitors, benzotris-sodium and (four) stupid and three-salt total addition is better 〇.01~ 3 mass%, more preferably 0.05 mass%. On the resin group. In view of the storage stability, the amount is more preferably 0.001% by mass or more, and more preferably 3% by mass or less from the viewpoint of maintaining sensitivity. ° The photosensitive tree-frequency composite towel of the present invention may be used as needed. As such an additive, for example, polyethylene glycol: polyoxypropylene polyoxyethylene, polyoxyethylene monomethyl mystery, polyoxypropylene = methyl ether, polyoxyethylene polyoxy (tetra) monomethyl (10) - R- .3« „ 6 women single-single shout, polyhydrogen hydrazine 浠 乙 、 、, polyoxyethylene ethoxylated polyoxypropylene 氧 'oxygen 戌 ¥ ¥ ¥ ¥ ¥ 邻 邻 邻 邻 邻 邻 邻 邻 邻 邻 邻 邻 邻 邻Ethyl citric acid: n-acid diethyl hydrazine, b-branched bar-like acid vinegar. 暇 正 正 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 The content of the plasticizer is preferably from 5 to 50% by mass, more preferably from 5 to 30% by mass. From the viewpoint of suppressing the delay of the development time and imparting flexibility to the cured film, it is preferred that 5 The photosensitive resin laminate of the present invention contains a photosensitive resin formed of a photosensitive resin composition, and is preferably 50% by mass or less, from the viewpoint of suppressing insufficient hardening or cold flow. a layer and a support layer. If necessary, a protective layer may be provided on the surface of the photosensitive resin layer opposite to the support layer side. Holding the layer, it is desirable to pass the light emitted from the exposure source
之透明性者。作為此種支持層,例如可列舉:聚對苯二甲 酸乙二醋膜、聚乙烯醇膜、聚氣乙烯膜、氣乙烯共;物 膜、聚偏二氣乙烯膜、偏二氣乙烯共聚合膜、聚甲基丙烯 酸甲醋共聚物膜、聚苯乙稀膜、聚丙稀腈膜、苯乙婦共聚 物膜、聚醯胺膜、纖維素衍生物膜。該等 要 制經延伸者。隸較好的是W下1於狀厚 薄時於圖像形成性及經濟性方面有利,但由於必須維持強 度’因此較好的是使用10〜30 μιη者。 又,感光性樹脂積層體中所使用之保護層之重要特性 為··相較於支持層與感光性樹脂層之密著力,保護層與感 光性樹脂層之密著力充分小,可容易地剝離。例如可較好 地使用聚乙烯膜、聚丙烯膜作為保護層。又,可使用日本 專利特開昭59_2()2457號公報中所示之剝離性優異之膜。 保護層之膜厚較好的是10〜⑽μιη,更好的是ι〇〜5〇吨。 感光性樹脂積層體中之感光性樹脂層之厚度係根據用途而 136982.doc -23- 200949433 不同’較好的是5〜100 μιη,更好的是7〜60 μιη,且越薄則 解析度越提昇’又,越厚則膜強度越提昇。 依序積層支持層、感光性樹脂層及視需要之保護層而製 作本發明之感光性樹脂積層體之方法,可採用先前眾所周 知之方法。例如’將感光性樹脂層所用之感光性樹脂組合 物與溶解該等組合物之溶劑混合而製成均一之溶液,首先 使用棒式塗布機或輥式塗布機將該溶液塗布於支持層上並 加以乾燥’於支持體上積層由感光性樹脂組合物所形成之 感光性樹脂層。其次,視需要可於感光性樹脂層上層壓保❹ 護層,藉此製作感光性樹脂積層體。 作為上述溶劑,可列舉以甲基乙基酮(ΜΕΚ)為代表之酮 類,以及以甲醇、乙醇及異丙醇為代表之酵類。較好的 是,以使塗布於支持層上之感光性樹脂組合物之溶液的黏 度於25°C下達到500〜4000 mPa之方式將上述溶劑添加於感 光性樹脂組合物中。 <光阻圖案形成方法> 使用本發明之感光性樹脂積層體之光阻圖案可藉由包含❹ 層壓步驟、曝光步驟及顯影步驟之步驟而形成。以下表示 具體方法之一例。 作為被加工基材,於以製造印刷布線板為目的之情形時 可列舉銅箔積層板,又,於以製造凹凸基材為目的之情形 時可列舉玻璃基材’例如電浆顯示器面板用基材或表面電 解顯示器基材、有機EL密封蓋用或形成有貫通孔之矽晶圓 及陶究基材。所謂電黎顯示器·用基材,係指於玻璃上形成 136982.doc •24· 200949433 電極後塗布介電體層,繼而塗布隔離壁用玻璃漿,並對隔 離壁用玻璃漿部分實施喷砂加工而形成有隔離壁之基材。 就該等被加工基材而言,經過喷砂步驟者成為凹凸基材。 首先,使用貼合機進行層壓步驟。於感光性樹脂積層體 具有保護層之情形時,將保護層剝離後,用貼合機將感光 性樹脂層加熱壓接於被加工基材表面上而加以積層。於此 情形時’感光性樹脂層可僅積層於基板表面之單面上,亦 可積層於兩面上。此時之加熱溫度通常為4〇〜16〇。(:。又, 藉由進行二次以上之該加熱壓接,密著性及耐化學性提 昇。此時’可使用具備二連輥之二段式貼合機進行壓接, 亦可反覆幾次通過輥而進行壓接。 接著,使用曝光機進行曝光步驟。若有必要則將支持體 剝離,通過光罩利用活性光而進行曝光。曝光量係根據光 源照度及曝光時間而決定。亦可使用光量計進行測定。 又’於曝光步驟中亦可使用直接繪圖曝光方法。直接繪 圖曝光係不使用光罩而於基板上直接繪圖進行曝光之方 式。作為光源’例如可使用波長為35〇〜4丨〇 nm之半導體雷 射或超高壓水銀燈❶描繪圖案係由電腦所控制,此時之曝 光量係根據光源照度及基板之移動速度而決定。 繼而,使用顯影裝置進行顯影步驟。曝光後,於感光性 樹脂層上具有支持體之情形時,視需要將其除去,繼而使 用驗!·生水浴液之顯影液將未曝光部顯影去除,從而獲得光 阻圖像。作為鹼性水溶液,係使用Na2C03或K2C03之水溶 液°亥等水/谷液係根據感光性樹脂層之特性來選擇,通常 136982.doc 25- 200949433 使用0·2〜2質量%之濃度、2〇〜4〇〇c之Na2c〇3水溶液。該鹼 性水溶液中,亦可混入表面活性劑、消泡劑、用以促進顯 影之少量的有機溶劑。 利用上述步驟可獲得光阻圖案,視情況亦可進而實行 100〜300°C之加熱步驟。藉由實施該加熱步驟,可進一步 提高财化學性。加熱時使用熱風、紅外線或遠紅外線之方 式的加熱爐。 <導線之製造方法.印刷布線板之製造方法> 本發明之印刷布線板之製造方法係繼使用銅络積層板或 可撓性基板作為基板之上述光阻圖案形成方法之後,經由 以下之步驟而進行。 首先’使用姓刻法或鍍敷法等已知之方法於藉由顯影而 露出之基板之銅面上形成導線。 其後,使用具有較顯影液更強之鹼性的水溶液將光阻圖 案自基板上剝離,從而獲得所需之印刷布線板。關於剝離 用之鹼性水溶液(以下亦稱為「剝離液」)並無特別限制, 通常使用違度為2〜5質量%、溫度為4〇〜7〇cc之NaOI1、 KOH之水溶液。剝離液中亦可添加少量之水溶性溶劑。 <導線架之製造方法> 本發明之導線架之製造方法係繼使用金屬板例如銅、鋼 合金、鐵系合金作為基板之上述光阻圖案的形成方法之 後,經由以下之步驟而進行。 首先,對藉由顯影而露出之基板進行蝕刻而形成導線。 其後,以與上述印刷布線板之製&方法相同t方法將光限 I36982.doc -26· 200949433 圖案剝離’從而獲得所需之導線架。 <半導體封裝之製造方法> 本發明之半導體封裝之製造方法係繼使用已形成有作為 LSI之電路之晶圓作為基板的上述光阻圖案之形成方法之 後’經由以下之步驟而進行。 首先,於藉由顯影而露出之開口部實施銅或焊錫之柱狀 .鍍敷,從而形成導線。其後,以與上述印刷布線板之製造 方法相同之方法將光阻圖案剝離,進而藉由蝕刻將柱狀鍍 © 冑以外之#》之薄金屬層去除’由此獲得所需之半導體封 裝。 [實施例] 根據實施例對本發明加以說明。 以下表示實施例及比較例之評價用樣品之製作方法以及 對所獲得之樣品的評價方法及評價結果。 U評價用樣品之製作 實施例及比較例中之感光性樹脂積層體係按以下之方式 來製作。 <感光性樹脂積層體之製作> 對表1所示之組合物之溶液進行調整,以使固形物量達 到50質量%,充分攪拌、混合,並使用刮刀塗布機將表i 所示之感光性樹脂組合物均一地塗布於作為支持膜之16 μπι厚之聚對苯二甲酸乙二酯膜(三菱化學公司製造之们 G16)上,於95 c下乾燥i分鐘。乾燥後之感光性樹脂層之 、厚為10 μχη。繼而,將作為保護層之pm厚之聚乙烯膜 136982.doc -27· 200949433 (Tamapoly公司製造之GF-858)貼合於感光性樹脂層上之表 面上,從而獲得感光性樹脂積層體。 <基板> 使用於絕緣樹脂上積層有35 μηι銅箔之0.4 mm厚之銅箔 積層板進行評價。再者,以下使用其他基板之情形時記載 其主旨。 <層壓> 一面剝離本發明之感光性樹脂積層體之保護層,一面利 用熱棍貼合機(Asahi-Kasei Engineering(股)公司製造,AL-700)於輥溫度105°C下進行層壓。將氣壓設定為0.35 MPa、層壓速度設定為1.5 m/min。 <曝光> 使用直接繪圖曝光機(Orbotech公司製造,Paragon9000) 於8 W下以12 mJ/cm2之曝光量對感光性樹脂層進行曝光。 <顯影> 以特定時間喷射30°C之1.0質量% Na2C03水溶液,來溶 解去除感光性樹脂層之未曝光部分。以24秒之實際顯影時 間進行顯影,其後以36秒之水洗時間進行水洗。 2) 評價方法 除上述評價樣品之製作中所說明之方法以外,利用以下 之方法對各種性能進行評價。 <蓋孔性> 利用上述方法於製作有2500個直徑為0.3 mm之通孔穴的 5 00 mm X 5 00 mm之0.2 mm厚的銅辖積層板上進行雙面層壓 136982.doc -28- 200949433 而形成基板’利用上述曝光方法對該基板進行 曝光而獲得硬化膜’並利用上述顯影方 全面地直描 去進行顯影。顯影 後清點硬化膜之破裂個數,並以如下方式進、 ◎ 破裂個數為25個以下 〇:破裂個數超過25個、小於75個 X :破裂個數超過75個。 <油狀之凝聚物之產生> 僅收集感光性樹脂積層體之感光性樹脂層2 4瓜2,將其 浸潰於200 ml之顯影液中,於30<t下攪拌2小時使其溶 解。其後靜置,根據72小時後之溶液之狀態以如下方式進 行分級。 〇:未產生油狀之凝聚物、粉狀凝聚物。 △:油狀之凝聚物、粉狀凝聚物較少。 X ··油狀之凝聚物、粉狀凝聚物較多。 <支持層(PET)之剝離強度>Transparency. Examples of such a support layer include polyethylene terephthalate film, polyvinyl alcohol film, polystyrene film, and gas-ethylene copolymer film, polyvinylidene gas film, and ethylene dioxide copolymerization. Membrane, polymethyl methacrylate copolymer film, polystyrene film, polyacrylonitrile film, styrene copolymer film, polyamine film, cellulose derivative film. These are the extensions. It is preferable that W 1 is advantageous in image formability and economy when it is thin, but since it is necessary to maintain strength, it is preferable to use 10 to 30 μm. In addition, the important property of the protective layer used in the photosensitive resin laminate is that the adhesion between the protective layer and the photosensitive resin layer is sufficiently small compared to the adhesion between the support layer and the photosensitive resin layer, and the adhesive layer can be easily peeled off. . For example, a polyethylene film or a polypropylene film can be preferably used as the protective layer. Further, a film excellent in peelability as shown in Japanese Laid-Open Patent Publication No. SHO 59-2() No. 2457 can be used. The film thickness of the protective layer is preferably 10 to 10 μm, more preferably 10 to 5 ton. The thickness of the photosensitive resin layer in the photosensitive resin laminate is 136982.doc -23- 200949433 depending on the application. Preferably, it is preferably 5 to 100 μm, more preferably 7 to 60 μm, and the thinner the resolution is. The more the increase, the thicker the film strength is. The method of producing the photosensitive resin laminate of the present invention by sequentially laminating the support layer, the photosensitive resin layer and, if necessary, the protective layer, may be carried out by a conventionally known method. For example, 'a photosensitive resin composition for a photosensitive resin layer is mixed with a solvent for dissolving the compositions to prepare a uniform solution, and the solution is first applied onto a support layer using a bar coater or a roll coater. It is dried to laminate a photosensitive resin layer formed of a photosensitive resin composition on a support. Then, a protective resin layer can be laminated on the photosensitive resin layer as needed to prepare a photosensitive resin laminate. Examples of the solvent include ketones represented by methyl ethyl ketone (oxime), and yeasts represented by methanol, ethanol, and isopropyl alcohol. The solvent is preferably added to the photosensitive resin composition such that the viscosity of the solution of the photosensitive resin composition applied to the support layer is 500 to 4000 mPa at 25 °C. <Photoresist Pattern Forming Method> The photoresist pattern using the photosensitive resin laminate of the present invention can be formed by a step including a ruthenium lamination step, an exposure step, and a development step. An example of a specific method is shown below. A copper foil laminated board is used for the purpose of producing a printed wiring board, and a glass base material such as a plasma display panel is used for the purpose of producing a textured base material. A substrate or a surface electrolytic display substrate, an organic EL sealing cover or a tantalum wafer and a ceramic substrate having through holes formed therein. The substrate for electric display is a 136982.doc •24·200949433 electrode which is coated with a dielectric layer, and then a glass paste for the partition wall is applied, and the glass paste portion of the partition wall is subjected to sandblasting. A substrate having a partition wall formed. For these substrates to be processed, the blasting step becomes an uneven substrate. First, a lamination step is performed using a laminator. In the case where the photosensitive resin laminate has a protective layer, the protective layer is peeled off, and then the photosensitive resin layer is heat-pressure-bonded to the surface of the substrate to be processed by a bonding machine to be laminated. In this case, the photosensitive resin layer may be laminated only on one surface of the substrate surface, or may be laminated on both surfaces. The heating temperature at this time is usually 4 〇 to 16 〇. (: In addition, by performing the thermo-bonding for more than two times, the adhesion and chemical resistance are improved. At this time, the two-stage laminating machine with two rollers can be used for crimping, and it is also possible to repeat Next, the pressure is applied by a roll. Next, the exposure step is performed using an exposure machine. If necessary, the support is peeled off, and exposure is performed by the photoreceptor using the active light. The exposure amount is determined according to the illuminance of the light source and the exposure time. The measurement is performed using a light meter. In addition, a direct drawing exposure method can also be used in the exposure step. Direct drawing exposure is a method of directly drawing on a substrate without using a mask. As a light source, for example, a wavelength of 35 〇 can be used. The semiconductor laser or ultra-high pressure mercury lamp ❶ pattern of 4 丨〇 nm is controlled by a computer, and the exposure amount at this time is determined according to the illuminance of the light source and the moving speed of the substrate. Then, the developing step is performed using a developing device. When there is a support on the photosensitive resin layer, it is removed as needed, and then the test is used. The developer of the raw water bath develops the unexposed portion. In addition, a photoresist image is obtained. As an alkaline aqueous solution, an aqueous solution of Na2C03 or K2C03 is used, and water/valley is selected according to the characteristics of the photosensitive resin layer, usually 136982.doc 25-200949433 uses 0·2 An aqueous solution of 2% by mass and 2Na~4〇〇c of Na2c〇3. In the alkaline aqueous solution, a surfactant, an antifoaming agent, and a small amount of an organic solvent for promoting development may be mixed. A photoresist pattern can be obtained, and a heating step of 100 to 300 ° C can be carried out as occasion demands. By performing this heating step, the chemical property can be further improved. A heating furnace of hot air, infrared rays or far infrared rays is used for heating. <Manufacturing Method of Conducting Wire. Method of Manufacturing Printed Wiring Board> The method of manufacturing a printed wiring board according to the present invention is followed by the method of forming a resist pattern using a copper clad laminate or a flexible substrate as a substrate, The following steps are carried out. First, a wire is formed on the copper surface of the substrate exposed by development by a known method such as a surname method or a plating method. The alkaline aqueous solution having a stronger liquid-shaping liquid is peeled off from the substrate to obtain a desired printed wiring board. The alkaline aqueous solution for peeling (hereinafter also referred to as "peeling liquid") is not particularly limited. Usually, an aqueous solution of NaOI1 and KOH having a degree of deviation of 2 to 5% by mass and a temperature of 4 to 7 cc is used. A small amount of a water-soluble solvent may be added to the stripping solution. <Method for Producing Lead Frame> The present invention The method of manufacturing the lead frame is followed by a method of forming the resist pattern using a metal plate such as copper, a steel alloy, or an iron-based alloy as a substrate, and then performing the following steps. First, etching the substrate exposed by development Then, a wire is formed. Thereafter, the light limit I36982.doc -26·200949433 is peeled off in the same manner as the above-described method of the printed wiring board, and the desired lead frame is obtained. <Manufacturing Method of Semiconductor Package> The method of manufacturing a semiconductor package of the present invention is carried out by the following steps after the method of forming the photoresist pattern in which a wafer as a circuit of an LSI is formed as a substrate. First, a copper or solder column is formed on the opening exposed by development, and plating is performed to form a wire. Thereafter, the photoresist pattern is peeled off in the same manner as in the above-described method of manufacturing a printed wiring board, and the thin metal layer other than the pillar-shaped plating layer is removed by etching, thereby obtaining a desired semiconductor package. . [Examples] The present invention will be described based on examples. The production methods of the samples for evaluation of the examples and the comparative examples and the evaluation methods and evaluation results of the obtained samples are shown below. Preparation of Sample for U Evaluation The photosensitive resin layered systems of the examples and the comparative examples were produced in the following manner. <Production of Photosensitive Resin Laminate> The solution of the composition shown in Table 1 was adjusted so that the amount of the solid matter reached 50% by mass, sufficiently stirred and mixed, and the photosensitive light shown in Table i was obtained using a knife coater. The resin composition was uniformly applied to a 16 μm thick polyethylene terephthalate film (G16 manufactured by Mitsubishi Chemical Corporation) as a support film, and dried at 95 c for 1 minute. The photosensitive resin layer after drying was 10 μχ thick. Then, a pm thick polyethylene film 136982.doc -27· 200949433 (GF-858 manufactured by Tamapoly Co., Ltd.) as a protective layer was bonded to the surface of the photosensitive resin layer to obtain a photosensitive resin laminate. <Substrate> A 0.4 mm thick copper foil laminate having a 35 μηι copper foil laminated on an insulating resin was used for evaluation. In addition, the following will be described when other substrates are used. <Lamination> The protective layer of the photosensitive resin laminate of the present invention was peeled off at a roll temperature of 105 ° C by a hot stick laminator (manufactured by Asahi-Kasei Engineering Co., Ltd., AL-700). laminated. The air pressure was set to 0.35 MPa and the lamination speed was set to 1.5 m/min. <Exposure> The photosensitive resin layer was exposed at an exposure amount of 12 mJ/cm 2 at 8 W using a direct drawing exposure machine (Orragon Co., Paragon 9000). <Development> An aqueous solution of 1.0% by mass of Na 2 CO 3 at 30 ° C was sprayed at a specific time to dissolve and remove the unexposed portion of the photosensitive resin layer. The development was carried out at an actual development time of 24 seconds, and then washed with a washing time of 36 seconds. 2) Evaluation method Various properties were evaluated by the following methods in addition to the methods described in the production of the above evaluation samples. <Coverability> Double-sided lamination was carried out by using the above method to fabricate a 500 mm X 5 00 mm 0.2 mm thick copper delamination plate having 2500 diameter holes of 0.3 mm. 136982.doc -28 - 200949433, a substrate is formed by exposing the substrate by the above-described exposure method to obtain a cured film, and the development is performed by using the above-described development method. After development, the number of cracks in the cured film was counted, and the number of cracks was 25 or less as follows: 〇: the number of cracks exceeded 25, less than 75 X: the number of cracks exceeded 75. <Production of oily aggregates> Only the photosensitive resin layer of the photosensitive resin laminate was collected, and the mixture was immersed in 200 ml of the developing solution, and stirred at 30 ° t for 2 hours. Dissolved. Thereafter, it was allowed to stand, and classification was carried out in the following manner in accordance with the state of the solution after 72 hours. 〇: No oily aggregates or powdery aggregates were produced. △: Oily aggregates and powdery aggregates are less. X ·· Oily aggregates and powdery aggregates are numerous. < peel strength of support layer (PET)>
準備利用上述方法於單面上層壓有感光性樹脂積層體之 感光性樹脂層的基板,將其於23。(:、50%之相對濕度下放 置24小時後,對1吋寬之支持層(此處為PET)進行丨8〇。剝 離,並使用Tensilon RTM-500(東洋精機製造)測定其強 度’以如下方式分級。 〇:剝離強度之最大平均值為3 gf以上。 △.剝離強度之最大平均值未達3 gf。 3)評價結果 將實施例及比較例之評價結果示於表1。表1中之丨 136982.doc -29- 200949433 4之質量份為固形物之質量份,且不含溶劑。製備感光性 樹脂組合物時,預先製作B-卜B-4之固形物濃度為50質量 %的甲基乙基酮溶液,並以達成表1之固形物之方式調配 各B-1〜B-4之溶液。 136982.doc •30- 200949433 【11 S.S6 66 2 ειΌ 〇 d— X ?ΓΤ "IF ΗA substrate on which a photosensitive resin layer of a photosensitive resin laminate is laminated on one surface by the above method is prepared, and this is carried out at 23. (:, after standing at 50% relative humidity for 24 hours, 吋8〇 was applied to the support layer of 1 吋 wide (here PET), peeled off, and the strength was measured using Tensilon RTM-500 (manufactured by Toyo Seiki) The classification was as follows: 〇: The maximum average value of the peel strength was 3 gf or more. Δ. The maximum average value of the peel strength was less than 3 gf. 3) Evaluation results The evaluation results of the examples and comparative examples are shown in Table 1. In Table 1, 136982.doc -29- 200949433 4 parts by mass are solid parts by mass and do not contain a solvent. In the preparation of the photosensitive resin composition, a methyl ethyl ketone solution having a solid content of B-Bu B-4 of 50% by mass was prepared in advance, and each B-1 to B- was prepared in such a manner as to achieve the solid matter of Table 1. 4 solution. 136982.doc •30- 200949433 [11 S.S6 66 2 ειΌ 〇 d- X ?ΓΤ "IF Η
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S 2 ίι-審®θ<ε-Η-ώ) $ *丨^叫$4>軚>噠刼茫矣<0-> ^^^-ϋ^ιϊ^τνίΓ^^φ- (q) (e/s •"¥w#龄雜荽·«.< -31 - 200949433 ’ ^ <符號說明> B-l :曱基丙烯酸25質量%、甲基丙烯酸曱酯65質量%、丙 烯酸丁酯10質量%之三元共聚物(重量平均分子量為 100,000,酸當量為344) B-2 :甲基丙烯酸25質量% '甲基丙烯酸甲酯65質量%、丙 烯酸丁酯10質量%之三元共聚物(重量平均分子量為 ’ 200,000,酸當量為370) B-3 :曱基丙烯酸25質量%、曱基丙烯酸甲酯50質量%、苯 乙烯25質量%之三元共聚物(重量平均分子量為50,000,酸 © 當量為344) B-4 :甲基丙烯酸25質量%、甲基丙烯酸曱酯5〇質量%、丙 烯酸丁酯25質量%之三元共聚物(重量平均分子量為 70,000,酸當量為344) B-5:曱基丙烯酸苄酯80質量%、甲基丙烯酸2〇質量0/〇之二 元共聚物(重量平均分子量為1〇〇,〇〇〇,酸當量為43〇) M-1 :於季戊四醇之4個末端分別加成有1莫耳之環氧乙烷 所形成之四丙烯酸酯(Sartomer Japan(股)公司製造SR-494) ❹ M-2 ·將季戊四醇之4個末端加以丙烯酸酯化所形成之四丙 稀酸酉旨 M-3.於二羥甲基丙烷上加成有平均3莫耳之環氧乙烷所形 成之三丙烯酸酯(新中村化學製造A-TMPT-3EO) M4.於一羥甲基丙烷上加成有平均3莫耳之環氧丙烷所形 成之三丙烯酸酯 M-5 :於雙盼A之兩端分a丨夂 碼77別各加成有平均2莫耳之環氧乙烷 I36982.doc •32· 200949433 所形成之聚乙二醇之二甲基丙烯酸脂 M-6 :聚丙二醇二丙稀酸酯 I-1 : 9-苯基。丫咬 1-2 : N-苯甘胺酸 1-3 · 2-(鄰氯苯基)_4,5-—苯基味β坐基二聚物 ' 1-4: 1-苯基-3_(4_第三丁基-苯乙烯基)5(4第三丁基苯 基)-β比唾琳 1-5 . 2-(鄰氯苯基)_4,5-雙-(間甲氧基苯基)咪唑基二聚物 © D-1 :鑽石綠 D-2 :無色結晶紫 F-1 :甲基乙基酮 於比較例1中,若使用平均分子量未達7萬之聚合物作為 驗溶性樹脂,則顯影時產生油狀凝聚物而引起不良狀況。 於比較例2中’感光性樹脂組合物中之以上述通式(11)所 表示之化合物之比例少於30質量%,結果蓋孔性惡化。 • 於比較例3中,感光性樹脂組合物中之以上述通式(jj)所 表示之化合物之比例多於55質量%,又,當相對於感光性 樹脂組合物總量而將上述(a)鹼溶性樹脂之比例設為Α質量 %、將上述(b)具有光可聚合之不飽和雙鍵之化合物之比例 設為B質量時,A/B少於1.1,結果蓋孔性惡化。比較例4係 特開平11-119422之追加試驗。於比較例4中,由於未使用 不對應於以上述通式(I)所表示之化合物及以上述通式(π) 所表示之化合物的多官能之光可聚合之不飽和化合物,結 果蓋孔性惡化’且產生油狀凝聚物。 136982.doc •33- 9 200949433 [產業上之可利用性] 、對於本發明之感光性樹脂積層體而言,#由在層壓有該 感光性樹脂積層體之基板上進行曝光’而保護通孔不受驗 性顯影液、#刻液之景> 響’藉此可使後續步驟簡化’且由 於顯影液中之油狀之凝聚物較少,因此不僅裝置之清洗變 少,而且於利用鹼性顯影之印刷布線板之製造中軾為有 用。 136982.doc -34·S 2 ίι-审®θ<ε-Η-ώ) $ *丨^叫$4>軚>哒刼茫矣<0-> ^^^-ϋ^ιϊ^τνίΓ^^φ- (q (e/s •"¥w#年杂荽·«.< -31 - 200949433 ' ^ <symbol description> Bl : 25% by mass of mercaptoacrylic acid, 65 mass% of methacrylate, acrylic 10% by mass of ternary copolymer of butyl ester (weight average molecular weight is 100,000, acid equivalent is 344) B-2: 25 mass% of methacrylic acid '65% by mass of methyl methacrylate and 10% by mass of butyl acrylate Copolymer (weight average molecular weight is '200,000, acid equivalent is 370) B-3: 25% by weight of mercaptoacrylic acid, 50% by mass of methyl methacrylate, and 25% by mass of styrene (weight average molecular weight) 50,000, acid equivalent: 344) B-4: 25% by mass of methacrylic acid, 5% by mass of methacrylate, and 25% by mass of butyl acrylate (weight average molecular weight: 70,000, acid equivalent) 344) B-5: dimethyl methacrylate 80% by mass, methacrylic acid 2 〇 mass 0 / 〇 binary copolymer (weight average molecular weight is 1 〇〇, hydrazine, acid Equivalent to 43〇) M-1: Tetraacrylate formed by adding 1 mole of ethylene oxide to four ends of pentaerythritol (SR-494, manufactured by Sartomer Japan Co., Ltd.) ❹ M-2 The tetrapropyl acid formed by acrylation of the four ends of pentaerythritol is M-3. The triacrylate formed by adding an average of 3 moles of ethylene oxide to dimethylolpropane (new Nakamura Chemical Manufacturing A-TMPT-3EO) M4. Addition of trimethacrylate M-5 with an average of 3 moles of propylene oxide on monomethylolpropane: at both ends of the double-prepared A Code 77 is added separately with an average of 2 moles of ethylene oxide I36982.doc • 32· 200949433 formed polyethylene glycol dimethacrylate M-6: polypropylene glycol diacrylate I-1 : 9-phenyl. Bite 1-2 : N-phenylglycine 1-3 · 2-(o-chlorophenyl)_4,5-phenyl-based β-sitting dimer' 1-4: 1 -Phenyl-3_(4_t-butyl-styryl)5(4-tert-butylphenyl)-β than salicin 1-5. 2-(o-chlorophenyl)_4,5-bis- (m-methoxyphenyl)imidazolyl dimer © D-1 : diamond green D-2 : colorless crystal violet F-1 : methyl ethyl ketone ratio In Example 1, when a polymer having an average molecular weight of less than 70,000 was used as the test-soluble resin, oily aggregates were generated during development to cause a problem. In Comparative Example 2, the above-mentioned formula was used in the photosensitive resin composition. The proportion of the compound represented by (11) is less than 30% by mass, and as a result, the capping property is deteriorated. In Comparative Example 3, the ratio of the compound represented by the above formula (jj) in the photosensitive resin composition is more than 55% by mass, and the above (a) is added to the total amount of the photosensitive resin composition. When the ratio of the alkali-soluble resin is Α% by mass and the ratio of the compound (b) having a photopolymerizable unsaturated double bond is B mass, A/B is less than 1.1, and the capping property is deteriorated. Comparative Example 4 is an additional test of JP-A-11-119422. In Comparative Example 4, since a polyfunctional photopolymerizable unsaturated compound which does not correspond to the compound represented by the above formula (I) and the compound represented by the above formula (π) is not used, the result is a cap hole. Sexual deterioration 'and produces oily aggregates. 136982.doc •33- 9 200949433 [Industrial Applicability] The photosensitive resin laminate of the present invention is protected by exposure on a substrate on which the photosensitive resin laminate is laminated. The hole is not affected by the developer, the etch of the liquid, and the sound is simplified, and since the oil-like agglomerates in the developer are less, not only the cleaning of the device is reduced, but also the utilization is utilized. It is useful in the manufacture of an alkaline developed printed wiring board. 136982.doc -34·
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TWI424269B (en) * | 2011-01-25 | 2014-01-21 | Chunghwa Picture Tubes Ltd | Hydrophilic monomer, hydrophilic photoresist composition containing the same, and resist pattern formation method |
JP5990366B2 (en) * | 2011-03-31 | 2016-09-14 | 旭化成株式会社 | Laminated body and roll using the same |
JP2012215787A (en) * | 2011-04-01 | 2012-11-08 | Hitachi Chem Co Ltd | Photosensitive resin composition, photosensitive element, method for manufacturing resist pattern, and printed wiring board and method for manufacturing the same |
CN103064253B (en) * | 2012-12-05 | 2015-04-08 | 北京化工大学常州先进材料研究院 | Photosensitive composition containing acridine oxide |
CN111694218B (en) * | 2014-05-21 | 2023-09-08 | 旭化成株式会社 | Photosensitive resin composition and method for forming circuit pattern |
KR101662706B1 (en) | 2014-10-10 | 2016-10-05 | 율촌화학 주식회사 | Cushioned released composite films and method of matufacturing the same |
CN114437251B (en) * | 2015-04-08 | 2024-02-20 | 旭化成株式会社 | Photosensitive resin composition |
JP6869263B2 (en) * | 2016-12-05 | 2021-05-12 | 旭化成株式会社 | Photosensitive resin composition, photosensitive resin laminate, resin pattern manufacturing method and cured film pattern manufacturing method |
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JPS6425147A (en) * | 1987-07-22 | 1989-01-27 | Hitachi Chemical Co Ltd | Photosensitive resin composition |
JPH06214400A (en) * | 1993-01-18 | 1994-08-05 | Sekisui Chem Co Ltd | Production of image display board |
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JP2004037518A (en) * | 2002-06-28 | 2004-02-05 | Hitachi Chem Co Ltd | Surface irregularities forming method, optical film obtained thereby and diffuse reflector plate and manufacture method for diffuse reflector plate |
JP2004198993A (en) * | 2002-12-20 | 2004-07-15 | Hitachi Chem Co Ltd | Energy-sensitive negative resin composition and photosensitive element used for organic layer having roughened surface for liquid crystal display device |
TWI377440B (en) * | 2004-10-14 | 2012-11-21 | Sumitomo Chemical Co | Radiation sensitive resin composition |
TW200622486A (en) * | 2004-10-14 | 2006-07-01 | Sumitomo Chemical Co | Radiation sensitive resin composition |
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JP4761909B2 (en) * | 2005-10-05 | 2011-08-31 | 旭化成イーマテリアルズ株式会社 | Photosensitive resin composition and laminate |
JP4697031B2 (en) * | 2006-04-21 | 2011-06-08 | Jsr株式会社 | Inorganic particle-containing photosensitive resin composition, photosensitive film, and inorganic pattern forming method |
-
2008
- 2008-12-23 TW TW097150274A patent/TWI536094B/en active
- 2008-12-24 JP JP2009547105A patent/JP5107367B2/en active Active
- 2008-12-24 WO PCT/JP2008/073391 patent/WO2009081925A1/en active Application Filing
- 2008-12-24 KR KR1020107010522A patent/KR101207242B1/en active IP Right Grant
- 2008-12-24 CN CN200880122943.4A patent/CN101910943B/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI803009B (en) * | 2020-10-23 | 2023-05-21 | 日商旭化成股份有限公司 | Photosensitive resin laminate |
Also Published As
Publication number | Publication date |
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JPWO2009081925A1 (en) | 2011-05-06 |
TWI536094B (en) | 2016-06-01 |
KR101207242B1 (en) | 2012-12-03 |
KR20100082852A (en) | 2010-07-20 |
CN101910943A (en) | 2010-12-08 |
CN101910943B (en) | 2015-03-25 |
WO2009081925A1 (en) | 2009-07-02 |
JP5107367B2 (en) | 2012-12-26 |
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