TW200949256A - Probe card for testing image sensing chips - Google Patents
Probe card for testing image sensing chips Download PDFInfo
- Publication number
- TW200949256A TW200949256A TW97118427A TW97118427A TW200949256A TW 200949256 A TW200949256 A TW 200949256A TW 97118427 A TW97118427 A TW 97118427A TW 97118427 A TW97118427 A TW 97118427A TW 200949256 A TW200949256 A TW 200949256A
- Authority
- TW
- Taiwan
- Prior art keywords
- circuit board
- unit
- probe
- light
- window
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 99
- 238000012360 testing method Methods 0.000 title claims abstract description 47
- 238000005452 bending Methods 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 2
- JRRNZNSGDSFFIR-UHFFFAOYSA-M Mepenzolate bromide Chemical compound [Br-].C1[N+](C)(C)CCCC1OC(=O)C(O)(C=1C=CC=CC=1)C1=CC=CC=C1 JRRNZNSGDSFFIR-UHFFFAOYSA-M 0.000 claims 1
- 229940057889 cantil Drugs 0.000 claims 1
- 238000000605 extraction Methods 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 230000002708 enhancing effect Effects 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 235000011389 fruit/vegetable juice Nutrition 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97118427A TW200949256A (en) | 2008-05-19 | 2008-05-19 | Probe card for testing image sensing chips |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97118427A TW200949256A (en) | 2008-05-19 | 2008-05-19 | Probe card for testing image sensing chips |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200949256A true TW200949256A (en) | 2009-12-01 |
| TWI375038B TWI375038B (https=) | 2012-10-21 |
Family
ID=44870875
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW97118427A TW200949256A (en) | 2008-05-19 | 2008-05-19 | Probe card for testing image sensing chips |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200949256A (https=) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103543372A (zh) * | 2012-07-13 | 2014-01-29 | 旺矽科技股份有限公司 | 光学检测装置 |
| TWI481874B (zh) * | 2012-07-13 | 2015-04-21 | Mjc Probe Inc | 光學檢測裝置 |
| TWI702404B (zh) * | 2019-03-18 | 2020-08-21 | 中華精測科技股份有限公司 | 探針卡測試裝置 |
| CN111722093A (zh) * | 2019-03-18 | 2020-09-29 | 中华精测科技股份有限公司 | 探针卡测试装置 |
| CN112858870A (zh) * | 2019-11-26 | 2021-05-28 | 松翰股份有限公司 | 全区域影像测试方法与架构 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103543304B (zh) | 2012-07-13 | 2016-05-18 | 旺矽科技股份有限公司 | 高频探针卡 |
| CN103543298B (zh) | 2012-07-13 | 2016-03-23 | 旺矽科技股份有限公司 | 探针固持结构及其光学检测装置 |
| TWI506279B (zh) * | 2013-01-15 | 2015-11-01 | Mjc Probe Inc | 高頻探針卡 |
-
2008
- 2008-05-19 TW TW97118427A patent/TW200949256A/zh unknown
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103543372A (zh) * | 2012-07-13 | 2014-01-29 | 旺矽科技股份有限公司 | 光学检测装置 |
| TWI481874B (zh) * | 2012-07-13 | 2015-04-21 | Mjc Probe Inc | 光學檢測裝置 |
| CN103543372B (zh) * | 2012-07-13 | 2016-08-24 | 旺矽科技股份有限公司 | 光学检测装置 |
| TWI702404B (zh) * | 2019-03-18 | 2020-08-21 | 中華精測科技股份有限公司 | 探針卡測試裝置 |
| CN111722093A (zh) * | 2019-03-18 | 2020-09-29 | 中华精测科技股份有限公司 | 探针卡测试装置 |
| CN112858870A (zh) * | 2019-11-26 | 2021-05-28 | 松翰股份有限公司 | 全区域影像测试方法与架构 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI375038B (https=) | 2012-10-21 |
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