TW200949256A - Probe card for testing image sensing chips - Google Patents
Probe card for testing image sensing chips Download PDFInfo
- Publication number
- TW200949256A TW200949256A TW97118427A TW97118427A TW200949256A TW 200949256 A TW200949256 A TW 200949256A TW 97118427 A TW97118427 A TW 97118427A TW 97118427 A TW97118427 A TW 97118427A TW 200949256 A TW200949256 A TW 200949256A
- Authority
- TW
- Taiwan
- Prior art keywords
- circuit board
- unit
- probe
- light
- window
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 99
- 238000012360 testing method Methods 0.000 title claims abstract description 47
- 238000005452 bending Methods 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 2
- JRRNZNSGDSFFIR-UHFFFAOYSA-M Mepenzolate bromide Chemical compound [Br-].C1[N+](C)(C)CCCC1OC(=O)C(O)(C=1C=CC=CC=1)C1=CC=CC=C1 JRRNZNSGDSFFIR-UHFFFAOYSA-M 0.000 claims 1
- 229940057889 cantil Drugs 0.000 claims 1
- 238000000605 extraction Methods 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 230000002708 enhancing effect Effects 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 235000011389 fruit/vegetable juice Nutrition 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97118427A TW200949256A (en) | 2008-05-19 | 2008-05-19 | Probe card for testing image sensing chips |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97118427A TW200949256A (en) | 2008-05-19 | 2008-05-19 | Probe card for testing image sensing chips |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200949256A true TW200949256A (en) | 2009-12-01 |
| TWI375038B TWI375038B (https=) | 2012-10-21 |
Family
ID=44870875
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW97118427A TW200949256A (en) | 2008-05-19 | 2008-05-19 | Probe card for testing image sensing chips |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200949256A (https=) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103543372A (zh) * | 2012-07-13 | 2014-01-29 | 旺矽科技股份有限公司 | 光学检测装置 |
| TWI481874B (zh) * | 2012-07-13 | 2015-04-21 | Mjc Probe Inc | 光學檢測裝置 |
| TWI702404B (zh) * | 2019-03-18 | 2020-08-21 | 中華精測科技股份有限公司 | 探針卡測試裝置 |
| CN111722093A (zh) * | 2019-03-18 | 2020-09-29 | 中华精测科技股份有限公司 | 探针卡测试装置 |
| CN112858870A (zh) * | 2019-11-26 | 2021-05-28 | 松翰股份有限公司 | 全区域影像测试方法与架构 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103543304B (zh) | 2012-07-13 | 2016-05-18 | 旺矽科技股份有限公司 | 高频探针卡 |
| CN103543298B (zh) | 2012-07-13 | 2016-03-23 | 旺矽科技股份有限公司 | 探针固持结构及其光学检测装置 |
| TWI506279B (zh) * | 2013-01-15 | 2015-11-01 | Mjc Probe Inc | 高頻探針卡 |
-
2008
- 2008-05-19 TW TW97118427A patent/TW200949256A/zh unknown
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103543372A (zh) * | 2012-07-13 | 2014-01-29 | 旺矽科技股份有限公司 | 光学检测装置 |
| TWI481874B (zh) * | 2012-07-13 | 2015-04-21 | Mjc Probe Inc | 光學檢測裝置 |
| CN103543372B (zh) * | 2012-07-13 | 2016-08-24 | 旺矽科技股份有限公司 | 光学检测装置 |
| TWI702404B (zh) * | 2019-03-18 | 2020-08-21 | 中華精測科技股份有限公司 | 探針卡測試裝置 |
| CN111722093A (zh) * | 2019-03-18 | 2020-09-29 | 中华精测科技股份有限公司 | 探针卡测试装置 |
| CN112858870A (zh) * | 2019-11-26 | 2021-05-28 | 松翰股份有限公司 | 全区域影像测试方法与架构 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI375038B (https=) | 2012-10-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW200949256A (en) | Probe card for testing image sensing chips | |
| CN101923105A (zh) | 用于测试图像感测芯片的探针卡 | |
| TWI708302B (zh) | 測試系統 | |
| TW544896B (en) | Method and apparatus for calibrating marking position in chip scale marker | |
| TWI437233B (zh) | Cis電路測試探針卡 | |
| TW201914517A (zh) | 內窺鏡及製造內窺鏡的方法 | |
| TW200829926A (en) | Optical device inspecting apparatus | |
| TW201022992A (en) | A COB module for optical mouse and the optical mouse | |
| TWM356906U (en) | Probe testing device for testing image-sensing chip | |
| US20040103353A1 (en) | Failure analysis method | |
| TW201039192A (en) | Mouse pen and optical receiving module | |
| CN101923103A (zh) | 运用于影像感测芯片的高频测试的悬臂式探针卡 | |
| JPH0243511A (ja) | イメージセンサ対の光学系との位置合わせ方法 | |
| CN208013653U (zh) | 结构光投影装置、深度相机和电子设备 | |
| TW200941000A (en) | Vertical probe card used for testing image sensing chip | |
| US20020106154A1 (en) | Apparatus for and method of jointing probes | |
| TW201040536A (en) | Cantilever probe card for high frequency test applicable in image sensor chip | |
| JP2015211760A (ja) | 光ファイバ走査装置、および光走査型内視鏡 | |
| JP2006004010A (ja) | 画像入出力装置 | |
| JP2011044125A (ja) | 光学装置 | |
| CN115869125A (zh) | 一种光源发生装置 | |
| CN116794482A (zh) | 芯片测试装置 | |
| US6842260B2 (en) | Imaging system and method for positioning a measuring tip onto a contact region of a microchip | |
| TW200407561A (en) | Manufacturing method of lens module and product thereof | |
| KR100923657B1 (ko) | 칩엘이디를 이용한 피부측정장치 |