200903001 九、發明說明： 【發明所屬之技術領域】 本發明側於測觸示面板，特狀_種可測試不同規格顯 示面板之測試治具及測試方法。 【先前技術】 顯示面板在製作完成之後，必須利用測試機台產生剛試信 號，送人顯涵射’叫簡和板是何以正辅動。由於 剛由產線完成製作_和板還沒有設置訊號排線或是電連接 器，因此這時候測試機台必須透過具備探針的測試治具，來對顯 不面板饋人測試職。測試治具細探針·_面板邊緣外露 的訊號接點伽aet Pad)來軸紐輕，_嫩鏡傳送 至待測試之顯示面板上。 針可 不同規格之顯示面板尺寸大小並不相同，在顯示面板上的訊 號接點數目及配置位置也會Μ。f知技術中係制試治具可移 動地設置於測試平台上，使測試治具可以快速地改變於_平t 上的位置，藉以配合不同尺寸的顯示面板，或是將複數個探台 200903001 移動地設置於測試治具上’並使該些探針除了可以沿著剛試治具 之長軸方向移動而改變位置外，也可以進行伸縮以選擇是否接觸 訊號接點，藉以配合不同顯示面板的訊號接點位置配置。但當顯 下面板除了尺寸變化之外，訊號接點的配置位置也有變化時，採 用將測試治具可移動地設置於測試平台上之方式測試顯示面板 時，仍需要更換探針之配置位置不同的測試治具。而當顯示面板 的訊唬接點數量眾多時，為了將複數個探針可移動地設置於測試 治具上之正確位置時或決定每一探針突出或縮入測試治具，將耗 許夕吩間。不論是採用將測試治具可移動地設置於測試平台上 式或是採用將複數個探針可移動地設置於測試治具上之方式 Ί、、員示面板^法快速地在產線上進行測試規格的變換。 【發明内容】 自繁於習知技術之顯示面板之測試機台無法快速變換測試規格 、、B、本1月提供-種可測試不同規格顯示面板之測試治具及 K方法，可任意地測試不同規格之顯示面板。 200903001 為了達成上述目的，本發明提出—種可測試不簡格顯示面 板之測試治具，其包括有一板件、複數個第一探針、複數個第二 探針、-第-電連接組件及—第二電連接組件。第—探針設於板 件之-侧邊’分以翻—具有第—規格之第―％觸板的訊 號接點。第二探針設於板件之侧邊，分卿以接觸—具有第二規 格之第二受測面板的訊號接點。第—電連接組相以接收一第一 測試訊號，透過各[探針傳送至第—受測面板的戦接點。第 二電連接組件’用以接收一第二測試訊號，透過各第二探針傳送 至第二受咖板的訊號接點。如此—來，就可崎過同—套測試 治具，對具備不同規格之面板進行測試。 本發明更提出一種顯示面板之測試方法，其係先提供一板 件’並於板件之側邊設複數個第-探針及·個第二探針。接著 將相摘爾胁—撕台上，並物觸示 峨接點與朗u針衫二辦麵。判 板係與對㈣—探物高_，她咖d面 -探針接觸，刪-探峨_㈣物。若細= 200903001 面板與第二探針接觸，則對第二探針傳輸一第二測試訊號。 本發明之功效在於，本發明只要選擇測試訊號由第一電連接 組件或第二電連接組件饋入，就可以快速地變換測試治具之測試 規格，不需要針對不同的顯示面板更換測試治具，或耗費時間調 整測試’冶具，使測試流料以快速地因應產線產品的變化。 以下在貫施方式中詳細敘述本發明之詳細特徵以及優點，其 内容足以使任何熟習相關技藝者了解本發明之技術内容並據以實 把且根據本况明書所揭露之内容、申請專利範圍及圖式，任何 目的及優點。 熟習相關技藝者可輕^地理解本發明相關之 之說明及以下之實施方式之說明係用 ，並且提供本發明之專利申請範圍更 以上之關於本發明内容$ 以示範與解釋本發明之原理， 進一步之解釋。 【實施方式】 為使對本發明的目的、構造、特徵、 解，兹配合實施例詳細說明如下。 翏閱「第1圖」所示’係i 及其功能有進一步的瞭 係為本發料-實施例所 揭露之一種 200903001 測賴w⑻，用以測試顯示面板施。該測試機台⑽包含有用 以承載顯示面板之測試平台11〇及二可測試不同規格顯示面 板200之測试治具12〇。二測試治具⑽分別設置於測試平台削 兩側用Μ傳达測試訊號至顯示面板2〇〇，以對顯示面板進 行測試。 ^〜第2Α圖」及「第2Β圖」所示，各測試治具包 括一板件121、複數個第一探針122及複數㈣二探針123。複數 ^菜十122 °又於板件121之一側邊，同時第一探針122之位 置配置係相對於—具有第-規格H測面板200a的訊號接 占201a的位置。當第_受測面板職放置於測試平台η。，且使 測試治具120位於第—受泰板㈣&的邊緣上树，各第一探針 122係接觸第一受測面板2〇〇a之訊號接點20la，如「第2A圖」 所不複數個第—探針⑵亦設置於板件⑵之側邊。第二探針 123之位置配置，係相對於—具有第二規格之第二受測面板200b 的訊號接點201b的位置。當第二受測面板·b放置於測試平台 110使測試治具120位於第二受測面板200b的邊緣上方時，各第 10 200903001 一抹針123係接觸第二受測面板200b之訊號接點201b，如「第 2B圖」所示。由於第—探針122及第二探針123之位置配置，係 7刀別相對於第一受測面板2〇〇a及第二受測面板2〇〇b配置，是故 第彳木針122及第二探針123之位置配置較佳係交錯或是間隔配 置。當第一受測面板2〇〇a放置於測試平台n〇時，第一受測面板 2〇〇a之訊號接點只會與第一探針122接觸，而不會與第二探針 接觸。反之，當第二受測面板200b放置於測試平台no時，第二 文測面板200b之訊號接點2〇lb只會與第二探針123接觸，而不 會與弟-探針122接觸。參照「第3A圖」及「第3B圖」所示， 測試治具120更包含複數鑛座127a、㈣、127£，設置於板件 121之邊緣。該等第一探針m及該等第二探針係'固定於各 ’十座127a 127b、127c上，而設置於板件121之邊緣。其中，第 一探針122及第二探針123係先固定於針座127a、127b、127c上， 針座127&、12713、127。在被設置於板件121邊緣，藉以使板件121 的組裝較為· ’同時，針座127a、咖、也可以延長第一 朱十122及第十123距離。探針設置於針座m、 11 200903001 置來決定。以本實施 目（第一探針122加 但數目並不以前述為 上的數目，可依據各探針所要設置的相對位 例為例’各針座127a、127b、127c的探針數 上第二探針123)可為二個、三個或四個， 限。 再參照「第2A圖」、「第2B圖」、「第3A m 「 」昂3A圖」及「第3B圖」 所示，測試治具120更包含有一第一雷诖& 3有$冑連接組件124及第二電連 接組件125。第—電連接組件124係電性連接於第一探㈣，用 以接收一第—卿臟。於測試第—受測祕施時，係以測試 訊號源（ffi树示）之電連舖131紐連接於第1連接組件 124，並以鱗132連接電連_⑶及顧職源。當測試第一 測試訊號，該第一測試 受測面板200a時，測試訊號源提供一第— 訊號通過排線132及電遠挺哭1 q] ^ 电建接态131，將苐一測試訊號傳輸至第一 電連接組件124,並透過各第一据料3 ” / ί木針122傳輸至第一受測面板200a 的訊號接點201a。_地，#職第二_面板鳩時，測試 訊號源提供-第二順賴，該第二測試訊號通過麟132及電 第二電連接組件125，並透過 連接器131，將第二測試訊號傳輸至 12 200903001 各第二探針123 ’傳輸至第二她板烏的爾點鳥。 口月…$ 4A圖」及「弟4B圖」所示，第—電連接組件以 更包含-第-電路板124a及條第一導線撕，且第一電路板 咖之上具有-金屬、線路層跡係電性連接於第一導線咖。 各第-導線咖之另一端係分別電性連接於各第一探針⑵，以 傳送第-賴職至各第，122。_ , _連接組件 125更包含—第二電路板⑽及複數條第—導線敗，且第二電 路板咖之上具有一金屬線路層伽，係電性連接於第二導線 ❿。各第二導線既之另一端係分別電性連接於各第二探針 123 ’以傳送第二測觀號至各第二探針123。 應用上述測試治具110進行之測試方法，係先提供-侧邊設 有複數個第-探針122及複數個第二探針123之板件⑽。接著 將一待測試顯示面板置於測試平台11〇上，並將待測試顯示面板 之訊號接點與對應之第-探針122或第二探針123接觸。然後判 斷待測試顯示面板之訊號接點係與對應之第—探針⑵或第二探 針123接觸。若待測試顯示面板之訊號接點與第—探針122接觸， 13 200903001 則决疋相摘不面板之規格為第—規格，並觸等第—探針⑺ 傳輪第測4喊。若待測試面板之訊號接點與第二探針⑵接 觸’則決定但測試面板之規格為第二規格，並對第二探針⑵傳 輸弟-測試訊號。如此—來，只要選擇測試訊號由苐—電連接組 件以或第二電連接組件125饋入，就可以透過同—套測試治具 110 ’對具備不同規格之面板進行測試。 參閱「第5A圖」及「第5β圖」所示，為本發明第二實施例 所提供之-_試治具12Q，_試治具m包含—板件⑵、複 第才衣針122、複數個第二探針123、複數個第三探針⑶、 第-電連接組件124、第二電連接組件125。第一探針122、第二 探針⑵及第三探針126係設置於板件⑽之一側邊。對於具備 不同規格之第-受測面板施及第二受測面板鳩而言，盆等 之訊號接點黯、聽中，會有部分位於相同的配置位置，這一 2的訊號接謂a、鳩可透過第三探針辑接觸，也就是 說第三探針則可選擇地接_ —❹辆板勘 點咖，榻二恤請衡_鳩。^ 14 200903001 施例中，第一探針122及第三探針126共同紐成之位置配置，係 相對於第—受測面板施的訊號接點2〇u的位置，如「第5A圖」 所不。同樣地，相同的這些第三探針126與第二探針⑵共同組 成之位置配置，係相對於第二受測面板聽的訊號接點鳥的 位置’如「第5B圖」所示。是以，第一探針122與第三探針⑶ 可共同用於接觸第一受測面板2·之訊號接點咖，而第二探針 123與第三探針126可共關於錢第二受測面板為之訊號接 點 201b 。 對於第-測試訊號及第二測試訊號的傳遞而言，於第一電性 連触件m之第一導線收中，部分之第—導線mc係:接 於第三探針126，其餘第—導線⑽係連接於第—探針122。於 第二電性連接組件125之第二導釋e中，部分之第二導線版 連接於第三探針126，細二導線❿係鱗接於第二探針 123。也就是說’ i少-第—導線收及至少—第二導線既係 共同電性連接於第三探針126。因此，當測試第-受測面板200a 日才’測趣號源提供—第—測試訊號時，該第-測試訊號通過第 15 200903001 一探針122及第三探針126傳輸至第一受測面板2〇〇a之訊號接點 201a。相同地’當測試第二受測面板時，測試訊號源提供一 第二測試訊號，該第二測試訊號係通過第二探針123及第三探針 U6傳輸至第二受測面板200b之訊號接腳點2〇ib。 麥閱「第6圖」所示，係為本發明所揭露測試治具12〇之電 生連接組件示意圖，_試治具⑽大致與第—實施例相同，其 差異在於第—f性連接組件124及第二紐連接組件125係分別 電性連接於電連接器131。電連接器131係透過排線132連接第 一電性連接組件124或是第二電性連接組件125，以快速地插接 於測試訊號源，接收第—測試訊號或是第二測試訊號。 雖然本發日⑽前述之實施例揭露如上1其並咖以限定本 發明。在獨離本發明之精神域_，所為之更動與滴飾，均 屬本發明之專娜護麵。關於本翻所界定之保職園請參考 所附之申請專利範圍。 【圖式簡單說明】 第1圖為本發明第—實施例之測試機台； 16 200903001 第2A圖、及第2B圖為本發明第一實施例之測試治具之局部 立體圖； 第3A圖及第3B圖為本發明第—實施例之測試治具之局部分 解圖，揭示第一電連接組件及第二電連接組件； 第4A圖及第4B圖為本發明第 第5A圖及第5B圖為本發明第 一實施例之平面示意圖 二實施例之平面示意圖 及 第6圖為树_試治具之之她連接组件示意圖 【主要元件符號說明】 100 測試機台 120 測試治具 122 第一探針 124 第一電連接組件 124b 金屬線路層 125 第二電連接組件 125b 金屬線路層 126 弟二麵針 110 測試平台 121 板件 123 第二探針 124a 第一電路板 124c 第一導線 125a 第一電路板 125c 第二導線 127a 針座 200903001 127b 針座 127c 針座 131 電連接器 132 排線 200 顯示面板 200a 第一受測面板 200b 第二受測面板 201a 訊3虎接點 201b 訊5虎接點 18200903001 IX. INSTRUCTIONS: [Technical Fields of the Invention] The present invention is directed to a test panel, and can be used to test test fixtures and test methods of display panels of different specifications. [Prior Art] After the display panel is completed, it is necessary to use the test machine to generate a test signal, and send the person to display the singer and the board. Since the production line has just been completed _ and the board has not been equipped with a signal cable or an electrical connector, the test machine must pass the test fixture with the probe to test the panel. Test fixture thin probe · _ panel edge exposed signal contact gamma aet Pad) to the shaft light, _ tender mirror is transmitted to the display panel to be tested. The size of the display panel of different specifications is not the same, and the number of signal contacts and the configuration position on the display panel will also be paralyzed. In the technology, the test fixture is movably placed on the test platform, so that the test fixture can be quickly changed to the position on the _ flat t, so as to match the display panel of different sizes, or multiple probes 200003001 It is movably disposed on the test fixture and allows the probes to change position in addition to being movable along the long axis of the test fixture. It can also be telescoped to select whether to contact the signal contacts to match different display panels. Signal contact location configuration. However, when the display panel of the display panel changes in addition to the size change, when the test fixture is movably disposed on the test platform, the configuration position of the probe still needs to be changed. Test fixture. When there are a large number of signal contacts on the display panel, in order to movably set a plurality of probes in the correct position on the test fixture or to determine whether each probe protrudes or retracts into the test fixture, it will take a long time. Between the actor. Whether it is to movably set the test fixture on the test platform or to vacate the plurality of probes on the test fixture, the panel is quickly tested on the production line. The transformation of the specifications. [Explanation] The test machine from the display panel of the conventional technology cannot quickly change the test specifications, and B, which is provided in January, can test the test fixture and the K method of the display panel of different specifications, and can be arbitrarily tested. Display panels of different specifications. 200903001 In order to achieve the above object, the present invention provides a test fixture capable of testing a non-simple display panel, comprising a plate member, a plurality of first probes, a plurality of second probes, a -first electrical connection component, and - a second electrical connection assembly. The first probe is placed on the side of the panel to turn over the signal contacts of the first -% contact pads of the first specification. The second probe is disposed on a side of the panel to contact the signal contact of the second panel to be tested having the second specification. The first-electrical connection group receives a first test signal and transmits the probes to the contact points of the first-test panel through the respective probes. The second electrical connection component is configured to receive a second test signal and transmit the signal to the signal interface of the second coffee plate through each of the second probes. In this way, you can use the same test kit to test panels with different specifications. The present invention further provides a test method for a display panel, which first provides a panel and provides a plurality of first probes and a second probe on the side of the panel. Then we will pick up the threat and tear the table, and touch the 峨 contact point and the lang u needle shirt. Judging the board and the pair (four) - the object is high _, her coffee d face - probe contact, delete - probe _ (four) objects. If the thin = 200903001 panel is in contact with the second probe, a second test signal is transmitted to the second probe. The invention has the effect that the invention can quickly change the test specifications of the test fixture by simply feeding the test signal by the first electrical connection component or the second electrical connection component, and does not need to replace the test fixture for different display panels. , or it takes time to adjust the test 'smelting tool to make the test flow to quickly respond to changes in the product line. The detailed features and advantages of the present invention are described in detail in the following detailed description of the embodiments of the present invention. Any purpose and advantage. The description of the present invention and the following description of the embodiments of the present invention will be understood by those skilled in the art, and the scope of the present invention is further described. Further explanation. [Embodiment] The objects, structures, features, and solutions of the present invention will be described in detail below with reference to the embodiments. Referring to the "Fig. 1", the system i and its functions are further described in the present invention - a type disclosed in the example 200903001 Measure w (8) for testing the display panel. The test machine (10) includes test benches 11 for carrying display panels and test fixtures 12 for testing different sizes of display panels 200. The two test fixtures (10) are respectively disposed on the test platform to cut the test signals to the display panel 2 to test the display panel. Each of the test fixtures includes a plate member 121, a plurality of first probes 122, and a plurality of (four) two probes 123, as shown in Fig. 2 and Fig. 2, respectively. The plurality of dishes 110 122 are further on one side of the plate member 121, and the position of the first probe 122 is disposed relative to the position of the signal receiving 201a having the first-size H-measuring panel 200a. When the _test panel is placed on the test platform η. And the test fixture 120 is located on the edge of the first board (4) & the first probe 122 is in contact with the signal contact 20la of the first panel 2a, such as "2A" A plurality of first probes (2) are also disposed on the sides of the plate member (2). The position of the second probe 123 is relative to the position of the signal contact 201b of the second panel 200b of the second specification. When the second panel to be tested is placed on the test platform 110 such that the test fixture 120 is positioned above the edge of the second panel 200b to be tested, each of the 10th 200903001 wiper pins 123 contacts the signal contact 201b of the second panel under test 200b. , as shown in Figure 2B. Since the position of the first probe 122 and the second probe 123 is arranged, the system 7 is disposed relative to the first panel 2a and the second panel 2b, which is the first tow 122. The positional arrangement of the second probes 123 is preferably staggered or spaced. When the first tested panel 2〇〇a is placed on the test platform n〇, the signal contact of the first tested panel 2〇〇a will only contact the first probe 122 without contacting the second probe. . On the other hand, when the second panel 200b to be tested is placed on the test platform no, the signal contacts 2〇1b of the second panel 200b are only in contact with the second probe 123, and are not in contact with the dipole-probe 122. Referring to "3A" and "3B", the test fixture 120 further includes a plurality of ore blocks 127a, (4), and 127, which are disposed at the edge of the plate member 121. The first probes m and the second probes are fixed to the respective ten seats 127a 127b and 127c and are disposed at the edges of the plate member 121. The first probe 122 and the second probe 123 are first fixed to the needle holders 127a, 127b, and 127c, and the needle holders 127 & 12713 and 127. It is provided at the edge of the plate member 121 so that the assembly of the plate member 121 is relatively large. At the same time, the needle holder 127a and the coffee holder can extend the distance between the first frame 112 and the tenth. The probe is set to the needle holder m, 11 200903001. In the present embodiment (the number of the first probes 122 is not the number mentioned above, the number of probes of each of the hubs 127a, 127b, and 127c may be exemplified by the relative position of the probes to be set. The two probes 123) can be two, three or four, limited. Referring to "2A", "2B", "3A m" "Aung 3A" and "3B", the test fixture 120 further includes a first radar & 3 with $胄The connection component 124 and the second electrical connection component 125. The first electrical connection component 124 is electrically connected to the first probe (4) for receiving a first dirty. In the test-tested secret application, the electrical connection shop 131 of the test signal source (ffi tree) is connected to the first connection component 124, and the electrical connection _(3) and the service source are connected by the scale 132. When testing the first test signal, the first test panel 200a is tested, the test signal source provides a first signal through the cable 132 and the power is far crying 1 q] ^ electrical connection state 131, the first test signal transmission The first electrical connection component 124 is transmitted to the signal contact 201a of the first device under test 200a through each of the first data 3" / ί wood pins 122. _ ground, #职第二_面板鸠, test signal The source provides a second pass, the second test signal passes through the lining 132 and the second electrical connection component 125, and transmits the second test signal to the 12 200903001 second probe 123' through the connector 131. Second, her singer's bird. The moon is ... $4A" and "different 4B", the first electrical connection assembly is further included - the first - board 124a and the first wire is torn, and the first circuit On the board, there is a metal, the circuit layer trace is electrically connected to the first wire coffee. The other end of each of the first-wire coffees is electrically connected to each of the first probes (2) to transmit the first-to-first position to the respective ones, 122. The _, _ connection component 125 further includes a second circuit board (10) and a plurality of first-wires, and the second circuit board has a metal circuit layer on the second circuit board, and is electrically connected to the second wire ❿. The other ends of the second wires are electrically connected to the respective second probes 123' to transmit the second observation number to each of the second probes 123. The test method performed by the above test jig 110 is first provided with a plate member (10) having a plurality of first probes 122 and a plurality of second probes 123 on the side. Next, a test display panel to be tested is placed on the test platform 11A, and the signal contacts of the display panel to be tested are brought into contact with the corresponding first probe 122 or second probe 123. Then, it is judged that the signal contact of the display panel to be tested is in contact with the corresponding first probe (2) or second probe 123. If the signal contact of the display panel to be tested is in contact with the first probe 122, 13 200903001 is determined that the specification of the non-panel is the first specification, and the first probe (7) passes the fourth test. If the signal contact of the panel to be tested is in contact with the second probe (2), the specification of the test panel is determined to be the second specification, and the second probe (2) transmits the diast-test signal. In this way, as long as the test signal is selected by the 苐-electric connection assembly or the second electrical connection assembly 125, the panel with different specifications can be tested through the same test fixture 110 ’. Referring to FIG. 5A and FIG. 5β, the test fixture 12Q is provided for the second embodiment of the present invention, and the test fixture m includes a plate member (2) and a complex needle 122. A plurality of second probes 123, a plurality of third probes (3), a first electrical connection assembly 124, and a second electrical connection assembly 125. The first probe 122, the second probe (2) and the third probe 126 are disposed on one side of the plate member (10). For the first-measured panel with different specifications and the second panel to be tested, the signal contacts of the basin, etc., will be partially in the same configuration position, and the two signals are connected to a.鸠 can be contacted through the third probe, that is to say, the third probe can be selectively connected to the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ ^ 14 200903001 In the example, the position where the first probe 122 and the third probe 126 are co-positioned is the position of the signal contact 2〇u relative to the first panel to be tested, such as "5A". No. Similarly, the same position configuration of the third probe 126 and the second probe (2) is the position of the signal contact bird relative to the second panel to be tested, as shown in Fig. 5B. Therefore, the first probe 122 and the third probe (3) can be used together to contact the signal contact point of the first panel 2, and the second probe 123 and the third probe 126 can be used for money second. The panel under test is the signal contact 201b. For the transmission of the first test signal and the second test signal, in the first wire of the first electrical contact piece m, a part of the first wire mc is connected to the third probe 126, and the remaining first The wire (10) is connected to the first probe 122. In the second guide e of the second electrical connection component 125, a portion of the second wire is connected to the third probe 126, and the second wire is squashed to the second probe 123. That is, the 'n-first-wires are at least—the second wires are electrically connected to the third probe 126 in common. Therefore, when the first-test panel 200a is tested, the first test signal is transmitted to the first test through the 15th 200903001 probe 122 and the third probe 126. The signal contact 201a of the panel 2〇〇a. Similarly, when the second panel is tested, the test signal source provides a second test signal, and the second test signal is transmitted to the second panel 200b via the second probe 123 and the third probe U6. Pin point 2〇ib. The "FIG. 6" of the present invention is a schematic diagram of the electrical connection component of the test fixture disclosed in the present invention. The test fixture (10) is substantially the same as the first embodiment, and the difference lies in the first-f-connection assembly. The 124 and the second button connecting component 125 are electrically connected to the electrical connector 131, respectively. The electrical connector 131 is connected to the first electrical connection component 124 or the second electrical connection component 125 via the cable 132 for quickly plugging in the test signal source and receiving the first test signal or the second test signal. Although the foregoing embodiment of the present invention (10) discloses the above, it is intended to limit the present invention. In the spirit of the invention, the change and the drip decoration are all the special protective faces of the present invention. Please refer to the attached patent application scope for the insurance park defined by this book. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a test machine of a first embodiment of the present invention; 16 200903001 FIG. 2A and FIG. 2B are partial perspective views of a test fixture according to a first embodiment of the present invention; FIG. FIG. 3B is a partial exploded view of the test fixture of the first embodiment of the present invention, showing the first electrical connection component and the second electrical connection component; FIGS. 4A and 4B are diagrams 5A and 5B of the present invention; The schematic diagram of the second schematic embodiment of the first embodiment of the present invention and the sixth diagram is a schematic diagram of the connection component of the tree _ test fixture [main component symbol description] 100 test machine 120 test fixture 122 first probe Needle 124 first electrical connection assembly 124b metal circuit layer 125 second electrical connection assembly 125b metal circuit layer 126 dice pin 110 test platform 121 plate 123 second probe 124a first circuit board 124c first wire 125a first circuit Plate 125c second wire 127a pin holder 200003001 127b pin holder 127c pin holder 131 electrical connector 132 cable 200 display panel 200a first panel under test 200b second panel under test 201a 3 hubs 20 1b News 5 Tiger Contact 18