TWI730595B - Lateral detection device and detection method of panel to be tested - Google Patents

Abstract

A lateral detection device and a detection method for a panel to be tested. The lateral detection device includes a jig and a detection unit. The jig is provided with a panel to be tested. The panel to be tested includes a front surface, a back surface, and a side surface , The side surface has a conductive contact with an exposed end surface, and the detection unit is arranged on the fixture; the detection method includes preparing the panel to be tested, setting the panel to be tested on the fixture, and then outputting through the detection unit The test signal is given to the end surface of the conductive contact to perform a test operation; the present invention can perform a lateral detection for the panel to be tested with the end surface of the exposed conductive contact on the side.

Description

Lateral detection device and detection method of panel to be tested

The invention relates to a detection device and a detection method, in particular to a lateral detection device and a detection method of a panel to be tested.

Liquid crystal display (LCD) includes assembled backlight module, liquid crystal display panel and frame...etc. Among them, before assembling, in order to ensure the normal operation of the liquid crystal display panel, the liquid crystal display panel will be accepted in a testing device Detection is used to screen out defective products to avoid the inconvenience of subsequent manufacturing processes and increased operating costs after the defective products are assembled.

The liquid crystal display panel is assembled from several components. The technology of the liquid crystal display panel has been developed for decades and is a mature and well-known display technology. Therefore, the detailed structure and working principle of the liquid crystal display panel cannot be described in detail. For the convenience of description, please refer to FIG. 9 briefly. The conventional liquid crystal display panel 30 includes a thin film transistor (TFT) substrate 31, a liquid crystal 32 sealed by a sealant, and a color filter 33. The thin film transistor substrate 31 It has a top surface 310, and the liquid crystal 32 is located between the top surface 310 of the thin film transistor substrate 31 and the color filter 33. For example, the top surface 310 of the thin-film transistor substrate 31 may be an XY plane, and the top surface 310 is provided with a plurality of transistors (not shown) for driving the liquid crystal molecules to turn in the corresponding liquid crystal 32 distribution area. The transistors are electrically connected to a plurality of signal lines 34, and the signal lines 34 include scan lines and data lines. As shown in FIG. 9, the size of the distribution area of the liquid crystal 32 and the color filter 33 is smaller than the size of the thin film transistor substrate 31, so the periphery of the top surface 310 of the thin film transistor substrate 31 is partially exposed in the X and Y axes. The circuit 34 extends to the exposed part of the thin film transistor substrate 31 and forms a conductive contact 35 at the end.

Based on market trends and advances in process technology, please refer to the narrow-frame LCD panel 40 shown in FIG. 10 to compare the size of the thin-film transistor substrate 41 and the color filter 43. The thin-film transistor The length of the body substrate 41 is relatively long, and the top surface 410 of the thin film transistor substrate 41 is partially exposed in the Y-axis direction. Similarly, the signal line 45 extends to the exposed part of the top surface 410 of the thin film transistor substrate 41 and forms a conductive end at the end.接点44. It should be noted that the dimensions, sizes, thickness, and relative positions of the components shown in Figs. 9 to 11 are only for reference and ease of understanding.

The liquid crystal display panels 30 and 40 shown in FIG. 9 and FIG. 10 have a common point, that is, their conductive contacts 35 and 44 are all disposed on the exposed places of the top surfaces 310 and 410 of the thin film transistor substrates 31 and 41, and the conductive contacts The top surface (XY plane) of 35 and 44 is the surface that receives the test signal. Take the liquid crystal display panel 30 shown in FIG. 9 as an example. When testing, please refer to FIG. 11. The liquid crystal display panel 30 is placed on the fixture 50 of the detection device, wherein the fixture 50 can be placed and absorbed. The liquid crystal display panel 30 is arranged in a, clamped or other manner. The detection device includes a probe holder 51 that can be connected to a driving mechanism (not shown in the figure), the probe holder 51 is provided with a plurality of probes 510, and the driving mechanism is connected to the probe holder 51 for moving The position of the probe holder 51; the drive mechanism moves the probe holder 51 to align the end position of the probe 510 above the top surface of the conductive contact 35 on the thin film transistor substrate 31, because the conductive contact 35 is The top surface is exposed, so a downward force in the Z-axis is applied to make the end of the probe 510 directly contact the top surface (XY plane) of the conductive contact 35 to form an electrical connection. In this way, the probe 510 can output a test signal S to be provided to the transistor of the liquid crystal display panel 30 through the conductive contact 35 and the signal line 34 to perform a test operation, wherein the transmission direction of the test signal S is directly toward the conductive contact 35 The top surface (XY plane).

The aforementioned detection device is a contact probe 510 as an example. Another existing detection device includes a non-contact probe. When testing, the position of the probe is aligned above the conductive contact on the thin film transistor substrate. Without touching the conductive contact, the probe can output the test signal (electromagnetic field) propagating downward in the Z-axis for the conductive contact to induce the electromagnetic field for detection. The transmission direction of the test signal is directly toward the top surface of the conductive contact (XY plane) ).

As mentioned above, the structure of the LCD panel will change with the market trend and the progress of the process technology. If the LCD panel is made extremely narrow, take Figure 10 as an example, the structure must be further reduced. The exposed part of the top surface 410 of the thin film transistor substrate 41 may cause almost no exposed area of the conductive contact 44 in the X-Y plane.

In this way, because the Z axis is perpendicular to the XY plane, when the conductive contact has almost no exposed area in the XY plane, for the conventional detection device, the force is applied in the Z axis (either up or down The probe of) cannot form an effective physical contact with the conductive contact in the XY plane, and the test signal (electromagnetic field) output by the Z-axis cannot be effectively and directly induced by the conductive contact, which may cause the test result to be inaccurate or impossible to test. Therefore, the applicant has designed the lateral detection device and detection method of the present invention through careful evaluation and multiple considerations, and with the professional experience accumulated in this industry, through continuous sample trial production and improvement.

In view of this, the main purpose of the present invention is to provide a lateral detection device and a detection method for the panel to be tested, in order to overcome the shortcoming that the detection mechanism of the prior art cannot detect the conductive contacts that are barely exposed on the top surface.

The lateral detection device of the panel to be tested of the present invention includes: a jig for setting a panel to be tested, wherein the panel to be tested includes a front surface, a back surface, and a side surface, and the side surface has conductive contacts with exposed ends; and A detection unit is arranged on the jig, and the detection unit outputs a test signal to the end surface of the conductive contact.

The lateral detection method of the panel to be tested of the present invention includes: preparing a panel to be tested. The panel to be tested includes a front surface, a back surface, and a side surface, and the side surface has conductive contacts with exposed ends; and disposing the panel to be tested on a A fixture; and output a test signal to the end face of the conductive contact through a detection unit to perform a test operation.

The technical means of the present invention is different from the detection mechanism of the conventional technology. For the present invention, as long as the side surface of the panel to be tested has exposed conductive contact end faces, the present invention outputs a test signal to the panel to be tested through the detection unit The end face of the conductive contact on the side of the side surface can effectively detect the panel to be tested in a "lateral way".

10: Panel to be tested

11: Thin film transistor substrate

12: LCD

13: Color filter

14: Conductive contact

140: end face

141: end face

15: signal line

20: Detection unit

21: Probe holder

22: Probe

23: Fixture

21': seat body

24: Probe

30: LCD panel

31: Thin film transistor substrate

310: top surface

32: LCD

33: Color filter

34: signal line

35: Conductive contact

40: LCD panel

41: Thin film transistor substrate

410: top surface

42: LCD

43: color filter

44: Conductive contact

45: signal line

50: Fixture

51: Probe holder

510: Probe

S: Test signal

Fig. 1: A schematic diagram of the three-dimensional appearance of the panel to be tested to be tested by the lateral detection device of the present invention.

Figure 2: Schematic diagram of the use state of the detection method of the present invention (1).

Figure 3: Schematic diagram of the use state of the detection method of the present invention (2).

Fig. 4: A schematic diagram of a three-dimensional appearance of another panel to be tested to be tested by the lateral detection device of the present invention.

Figure 5: Schematic diagram of the use state of the detection method of the present invention (3).

Figure 6: Schematic diagram of the use state of the detection method of the present invention (4).

Figure 7: Schematic diagram of the use state of the detection method of the present invention (5).

Figure 8: A schematic flow chart of the detection method of the present invention.

Figure 9: A schematic diagram of the three-dimensional appearance of the conventional panel to be tested.

Fig. 10: A schematic diagram of the three-dimensional appearance of another conventional panel to be tested.

Figure 11: Schematic diagram of the conventional detection method.

The embodiment of the lateral detection device of the panel to be tested of the present invention includes a fixture and a detection unit arranged on the fixture. For example, the detection unit can be connected to a driving mechanism, and the fixture can be placed, A panel to be tested is arranged by suction, clamping or other methods. The driving mechanism can be used to move the position of the detection unit. The detection unit can be a contact detection unit or a non-contact detection unit. The detection unit is used to output a test signal to The panel to be tested is used for testing operations, as described later.

The panel to be tested includes a front surface, a back surface, and a side surface. The transmission direction of the test signal is toward the side surface of the panel to be tested. For example, the front surface and the back surface of the panel to be tested can be XY planes, respectively. The side surface is a surface related to the Z axis, such as a vertical surface (XZ plane and YZ plane) or an inclined surface. The panel to be tested can be a display panel, a touch panel or other panels. The display panel can be, for example, a liquid crystal display panel (LCD), an organic light emitting diode display panel (OLED) or a micro light emitting diode display panel (Micro LED)... etc. The touch panel can be, for example, a capacitive touch panel, but it is not limited to this. It should be noted that the display panel and the touch panel are common knowledge, and the detailed structure and working principle are included Not detailed, and the front surface of the panel to be tested is the corresponding display surface or touch operation surface. The dimensions, sizes, thickness, and relative positions of the components shown in Figures 1 to 7 are only for reference and ease of understanding.

Please refer to the panel under test 10 shown in FIG. 1 to take a liquid crystal display panel as an example. For the convenience of description, FIG. 1 only schematically exposes part of the components in the liquid crystal display panel, which includes a thin film transistor (TFT) substrate 11, The liquid crystal 12 sealed with sealant and a color filter 13, the liquid crystal 12 is located between the thin film transistor substrate 11 and the color filter 13, the thin film transistor substrate 11 is provided with a plurality of circuits for driving the turning of the liquid crystal molecules Crystals (not shown in the figure). These transistors are electrically connected to a plurality of signal lines 15 (as shown in Figures 2 and 3). The signal lines 15 include scan lines and data lines, Each signal line 15 extends to the edge of the thin film transistor substrate 11 and forms a conductive contact 14, and the end surface 140 of the conductive contact 14 is a surface related to the Z axis (for example, a vertical surface (XZ plane and YZ plane) or an inclined surface ) And are exposed, and the end surface 140 of the conductive contact 14 is flush with the side surfaces of the thin film transistor substrate 11, the liquid crystal 12 and the color filter 13, that is, the end surface 140 of the conductive contact 14 and the thin film transistor substrate 11 , The side surfaces of the liquid crystal 12 and the color filter 13 are aligned neatly in the XY plane direction, that is, the side surface of the panel 10 to be tested has an end surface 140 with exposed conductive contacts 14, as shown in FIG. 1, these conductive The exposed end surface 140 of the contact 14 is the XZ plane.

Regarding the lateral detection device of the present invention, please refer to FIG. 2. The detection unit 20 is a contact detection unit. The detection unit 20 includes a probe holder 21 and a plurality of probes 22 arranged in the probe holder 21. The probe 22 may be, for example, a spring probe, a blade probe, a soft conductive material probe, or other types of probes. During testing, taking FIG. 2 as an example, the panel 10 to be tested can be placed on the platform of the fixture 23, and the driving mechanism first moves the probe holder 21 to the outside of the side surface of the panel 10 to be tested. Align the end position of each probe 22 with the exposed end surface 140 of each conductive contact 14, and then apply a lateral force (along the Y axis as shown in FIG. 2) to substantially contact the probe 22 with the conductive contact 14 The end surface 140 is used to form an electrical connection. In this way, the test signal S (voltage or current) is transmitted from the probe 22 to the end surface 140 of the conductive contact 14 and the transistor is driven via the signal line 15. The transmission direction of the test signal S is toward the surface related to the Z axis, For example, toward the vertical plane (XZ plane and YZ plane) or inclined plane, as shown in FIG. 2, the transmission direction of the test signal S is toward the side surface (XZ plane) of the panel 10 to be tested. In other words, the panel to be tested 10 and the detection unit 20 are arranged on the XY plane, and the test signal of the detection unit 20 is horizontally output to the end surface 140 of the conductive contact 14 from the XY plane toward the side of the panel to be tested.

Please refer to FIG. 3, another detection unit 20 is a non-contact detection unit. The detection unit 20 includes a base 21 ′ and a probe 24 disposed in the base 21 ′. During detection, the driving mechanism first moves the seat 21' to the outside of the side surface of the panel 10 to be tested, so that the position of the probe 24 is aligned with the outside of the exposed end surface 140 of each conductive contact 14, and then A high voltage is applied to the probe 24 to make the probe 24 output a test signal S (electromagnetic field). The transmission direction of the test signal S is lateral (the Y axis in FIG. 3), that is, toward the side of the panel 10 to be tested (XZ plane) and given to the end surface 140 of the conductive contact 14. In this way, the conductive contact 14 can be tested for electromagnetic induction.

Please refer to another panel under test 10 shown in FIG. 4. Compared with FIG. 1, the conductive contacts 14 in FIG. 4 can be further extended outward. For example, the exposed end surfaces 141 of the conductive contacts 14 can be Extend upward and/or downward in the Z-axis, and the end surface 141 of each conductive contact 14 protrudes outside the side surface of the thin film transistor substrate 11, the liquid crystal 12 and/or the color filter 13 in the XY plane direction, that is, The end surface 141 of the conductive contact 14 and the side surfaces of the thin film transistor substrate 11, the liquid crystal 12 and the color filter 13 are not neatly attached in the XY plane direction. The pattern shown in Figure 4 extends upward to the panel to be tested The top edge of 10 and extends downward To the bottom edge of the panel 10 to be tested. As a result, the area of the end surface 141 of each conductive contact 14 shown in FIG. 4 is larger than the area of the end surface 140 of each conductive contact 14 shown in FIGS. 2 and 3, so that the detection unit 20 can contact the end surface 141 more easily. Detection. As shown in Figures 5 and 6, as long as the probe 22 is substantially in contact with any position on the end surface 141 of the conductive contact 14, the probe 22 can be electrically connected to the conductive contact 14; please also refer to the probe of Figure 7 24. As long as the probe 24 is positioned outside the end surface 141 of the conductive contact 14, the conductive contact 14 can sense the test signal S generated by the probe 24.

To summarize the above, please refer to FIG. 8. The inspection method of the present invention includes the following steps: Step S01: Prepare a panel to be tested 10, the panel to be tested 10 includes a front, a back and a side surface, and the side surface has end surfaces 140, 141 Exposed conductive contact 14; step S02: set the panel 10 to be tested on a fixture 23; and step S03: output a test signal S to the end faces 140, 141 of the conductive contact 14 through a detection unit 20 In order to perform a test operation, a driving mechanism can be used to move the detection unit 20 to the outside of the side of the panel 10 to be tested to output a test signal S, and the transmission direction of the test signal S is toward the side of the panel 10 to be tested The end faces 140 and 141 of the conductive contact 14 are given.

With the lateral detection device and detection method of the present invention, for the panel 10 to be tested with the conductive contacts 14 of the exposed end faces 140 and 141 on the side, the present invention can effectively combine the contact type and the non-contact type with the "lateral method". The panel 10 to be tested is tested.

10: Panel to be tested

11: Thin film transistor substrate

12: LCD

13: Color filter

14: Conductive contact

140: end face

15: signal line

20: Detection unit

21: Probe holder

22: Probe

23: Fixture

S: Test signal

Claims (8)

A lateral detection device for a panel to be tested includes: a jig for setting a panel to be tested, wherein the panel to be tested includes a front surface, a back surface, and a side surface. The side surface has conductive contacts with exposed end surfaces. The front surface and the back surface of the panel to be tested are XY planes, and the side surface of the panel to be tested and the end surface of the conductive contact are surfaces related to the Z axis; and a detection unit arranged on the jig, the The detection unit outputs a test signal to the end surface of the conductive contact; wherein the panel to be tested and the detection unit are arranged on the XY plane, and the test signal of the detection unit moves from the XY plane toward the end face of the panel to be tested. One direction of the side surface is horizontally output to the end surface of the conductive contact. According to the lateral detection device of the panel to be tested according to claim 1, the end surface of the conductive contact extends upward and/or downward in the Z-axis. According to the lateral detection device of the panel to be tested in claim 2, the end surface of the conductive contact extends upward to the top edge of the panel to be tested and extends downward to the bottom edge of the panel to be tested. For the lateral detection device of the panel to be tested according to any one of claims 1 to 3, the detection unit is connected to a driving mechanism to move the position of the detection unit to the outside of the side surface of the panel to be tested. For the lateral detection device of the panel to be tested according to any one of claims 1 to 3, the detection unit is a contact detection unit, which includes a probe holder and a plurality of probes arranged on the probe holder. The probe outputs a test signal to the end surface of the conductive contact. For the lateral detection device of the panel to be tested according to any one of claims 1 to 3, the detection unit is a non-contact detection unit, which includes a probe holder and a probe set in the probe holder, The probe outputs a test signal to the end surface of the conductive contact. A lateral detection method of the panel to be tested, including: Prepare a panel to be tested. The panel to be tested includes a front, a back and a side surface. The side has conductive contacts with exposed ends. The front and back of the panel to be tested are XY planes. The side surface and the end surface of the conductive contact are surfaces related to the Z axis; the panel to be tested is set on a jig; corresponding to a position of the panel to be tested on the XY plane, set on the XY plane A detection unit; and through the detection unit, from the XY plane toward one direction of the side surface of the panel to be tested, horizontally output a test signal to the end surface of the conductive contact to perform a test operation. According to claim 7 of the lateral detection method of the panel to be tested, in the step of setting the panel to be tested on the fixture, the position of the detection unit is moved to the outside of the side surface of the panel to be tested through a driving member .

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