CN101101314B - Display panel test fixture and test method - Google Patents
Display panel test fixture and test method Download PDFInfo
- Publication number
- CN101101314B CN101101314B CN2007101466371A CN200710146637A CN101101314B CN 101101314 B CN101101314 B CN 101101314B CN 2007101466371 A CN2007101466371 A CN 2007101466371A CN 200710146637 A CN200710146637 A CN 200710146637A CN 101101314 B CN101101314 B CN 101101314B
- Authority
- CN
- China
- Prior art keywords
- probe
- display panel
- electrical connection
- tested
- connection module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The present invention relates to a display panel test assistant tool and a test method thereof, and the tool comprises a plate piece and probes beside the plate piece, where these probes at least include a plurality of first probes to contact signal contact points of first tested panel with first standard and transmit first test signal to them; and a plurality of second probes to contact signal contact points of second tested panel with second standard and transmit second test signal to them. The test tool also comprises a plurality of probe files arranged at one side edge of the panel, wherein the first probes and the second probes are fixed on the probe files. Therefore, the test assistant tool is optionally used to test display panels of different standards.
Description
Technical field
The present invention is about test display panel, particularly a kind of measurement jig and method of testing of testing the different size display panel.
Background technology
Display panel must utilize tester table to produce test signal after completing, and sends in the display panel, to confirm whether display panel can correct operation.Because just finish the display panel of making and also do not have signalization winding displacement or electric connector by producing line, therefore at this time tester table must see through the measurement jig that possesses probe, comes display panel feed-in test signal.Measurement jig is reached electric connection with the signal contact (Contact Pad) of probe contact display panel edge exposure, and test signal is sent on the display panel to be tested.
The size of display panels size of different size is also inequality, and signal contact number on display panel and allocation position also can be different.Be to be arranged at measurement jig on the test platform movably in the prior art, make measurement jig can change position on test platform apace, to cooperate the display panel of different size, or be arranged at plurality of probes on the measurement jig movably, and make those probes except moving along the long axis direction of measurement jig and change the position, also can stretch whether to select the activation signal contact, to cooperate the signal contact position configuration of different display panels.But when display panel except change in size, when the allocation position of signal contact also changes, adopt when measurement jig the mode on the test platform of being arranged at movably tested display panel, still need to change the different measurement jig of allocation position of probe.And when the signal contact One's name is legion of display panel, when plurality of probes being arranged at movably the tram on the measurement jig or determine will exhaust many times by the outstanding or retraction measurement jig of each probe.Adopt measurement jig to be arranged at the mode on the test platform movably or to adopt plurality of probes the mode on the measurement jig of being arranged at is movably tested display panel all can't to produce the conversion that carry out test specification on the line apace no matter be.
Summary of the invention
In view of the tester table of the display panel of prior art can't the Fast transforms test specification problem, technical matters to be solved by this invention provides a kind of measurement jig and method of testing of display panel, can at random test the display panel of different size.
In order to reach above-mentioned purpose, the present invention proposes a kind of measurement jig of display panel, and it includes a plate, a plurality of first probe, a plurality of second probe, a plurality of needle stand, one first electrical connection module and one second electrical connection module.First probe is located at a side of plate, respectively in order to contact a signal contact with first tested panel of first specification.Second probe is located at the side of plate, respectively in order to contact a signal contact with second tested panel of second specification.A plurality of needle stands are located at a side of this plate, and this first probe and this second probe stationary are on this needle stand.First electrical connection module sees through the signal contact that each first probe is sent to the first tested panel in order to receive one first test signal.Second electrical connection module in order to receive one second test signal, sees through the signal contact that each second probe is sent to the second tested panel.Thus, just can see through same set of measurement jig, the panel that possesses different size is tested.
The present invention also proposes a kind of method of testing of display panel, and it provides a plate earlier, and establishes a plurality of first probes and a plurality of second probe in the side of plate.Side in this plate is provided with a plurality of needle stands, and this first probe and this second probe stationary are on this needle stand.Then a display panel to be tested is placed on the test platform, and with the signal contact of display panel to be tested and corresponding first probe or the contact of second probe.Judge display panel to be tested and corresponding first probe or the contact of second probe, if display panel to be tested contacts with first probe, then to first probe transmission, one first test signal.If display panel to be tested contacts with second probe, then to second probe transmission, one second test signal.
Effect of the present invention is, the present invention is as long as select test signal by first electrical connection module or the second electrical connection module feed-in, the test specification of conversion measurement jig apace just, need not change measurement jig at different display panels, or the adjustment measurement jig that expends time in, make testing process can adapt to the variation of producing line products apace.
Description of drawings
Fig. 1 is the tester table of first embodiment of the invention.
Fig. 2 A and Fig. 2 B are the partial perspective view of the measurement jig of first embodiment of the invention.
Fig. 3 A and Fig. 3 B are the partial exploded view of the measurement jig of first embodiment of the invention, disclose first electrical connection module and second electrical connection module.
Fig. 4 A and Fig. 4 B are the floor map of first embodiment of the invention.
Fig. 5 A and Fig. 5 B are the floor map of second embodiment of the invention.
Fig. 6 electrically connects the assembly synoptic diagram for another of measurement jig of the present invention.
The main element symbol description
100 tester tables, 110 test platforms
120 measurement jigs, 121 plates
122 first probes, 123 second probes
124 first electrical connection module 124a first circuit boards
124b metallic circuit layer 124c first lead
125 second electrical connection module 125a second circuit boards
125b metallic circuit layer 125c second lead
126 the 3rd probe 127a needle stands
131 electric connectors, 132 winding displacements
200 display panel 200a, the first tested panel
The 200b second tested panel 201a signal contact
The 201b signal contact
Embodiment
More than about the explanation of the explanation of content of the present invention and following embodiment be in order to demonstration with explain principle of the present invention, and provide claims of the present invention further to explain.
Below in embodiment, be described in detail detailed features of the present invention and advantage, its content is enough to make any related art techniques person of haveing the knack of to understand technology contents of the present invention and implements according to this, and according to the disclosed content of this instructions, claims and graphic, any related art techniques person of haveing the knack of can understand purpose and the advantage that the present invention is correlated with easily.
For making purpose of the present invention, structure, feature and function thereof there are further understanding, now cooperate embodiment to be described in detail as follows.
Consult shown in Figure 1ly, be the disclosed a kind of tester table 100 of first embodiment of the invention, in order to test display panel 200.This tester table 100 includes the measurement jig 120 that can test different size display panel 200 in order to the test platform 110 and two of carrying display panel 200.Two measurement jigs 120 are arranged at test platform 110 both sides respectively, in order to transmit test signal to display panel 200, so that display panel 200 is tested.
Refer again to shown in Fig. 2 A and Fig. 2 B, each measurement jig 120 comprises a plate 121, a plurality of first probe 122 and a plurality of second probe 123.A plurality of first probes 122 are located at a side of plate 121, and the position configuration of first probe 122 simultaneously is the positions of signal contact 201a that have first a tested panel 200a of first specification with respect to.When the first tested panel 200a is positioned over test platform 110, and when making measurement jig 120 be positioned at the top, edge of the first tested panel 200a, the signal contact 201a of each first probe, 122 contacts, first tested panel 200a is shown in Fig. 2 A.A plurality of second probes 123 also are arranged at the side of plate 121.The position configuration of second probe 123 is the positions of signal contact 201b that have second a tested panel 200b of second specification with respect to.Make measurement jig 120 be positioned at edge when top of the second tested panel 200b when the second tested panel 200b is positioned over test platform 110, the signal contact 201b of each second probe, 123 contacts, second tested panel 200b is shown in Fig. 2 B.Because the position configuration of first probe 122 and second probe 123 is to dispose with respect to the first tested panel 200a and the second tested panel 200b respectively, therefore the position configuration of first probe 122 and second probe 123 is preferably staggered or arranged spaced.When the first tested panel 200a was positioned over test platform 110, the signal contact of the first tested panel 200a only can contact with first probe 122, and can not contact with second probe 123.Otherwise when the second tested panel 200b was positioned over test platform 110, the signal contact 201b of the second tested panel 200b only can contact with second probe 123, and can not contact with first probe 122.Shown in Fig. 3 A and Fig. 3 B, measurement jig 120 also comprises a plurality of needle stand 127a, 127b, 127c, is arranged at the edge of plate 121.These first probes 122 and these second probes 123 are fixed on each needle stand 127a, 127b, the 127c, and are arranged at the edge of plate 121.Wherein, first probe 122 and second probe 123 are fixed in earlier on needle stand 127a, 127b, the 127c, needle stand 127a, 127b, 127c are set at plate 121 edges again, so that the assembling of plate 121 is comparatively convenient, simultaneously, needle stand 127a, 127b, 127c also can prolong first probe 122 and second probe, 123 distances.Probe is arranged at the number on needle stand 127a, 127b, the 127c, can decide according to the relative position that each probe will be provided with.With the present embodiment is example, and the number of probes of each needle stand 127a, 127b, 127c (first probe 122 adds second probe 123) can be two, three or four, but number does not exceed with aforementioned.
Refer again to shown in Fig. 2 A, Fig. 2 B, Fig. 3 A and Fig. 3 B, measurement jig 120 also includes one first electrical connection module 124 and second electrical connection module 125.First electrical connection module 124 is electrically connected at first probe 122, in order to receive one first test signal.Second electrical connection module 125 electrically connects second probe 123, in order to receive one second test signal.When the test first tested panel 200a, be that the electric connector 131 with testing source (figure does not illustrate) is electrically connected at first electrical connection module 124, and connect electric connector 131 and testing sources with winding displacement 132.When the test first tested panel 200a, testing source provides one first test signal, this first test signal is by winding displacement 132 and electric connector 131, first test signal is transferred to first electrical connection module 124, and see through the signal contact 201a that each first probe 122 transfers to the first tested panel 200a.In the same manner, when the test second tested panel 200b, be that electric connector 131 with testing source (figure do not illustrate) is electrically connected at second electrical connection module 125, testing source provides one second test signal, this second test signal is by winding displacement 132 and electric connector 131, second test signal is transferred to second electrical connection module 125, and see through each second probe 123, transfer to the signal contact 201b of the second tested panel 200b.
Please refer to shown in Fig. 4 A and Fig. 4 B, first electrical connection module 124 also comprises a first circuit board 124a and a plurality of first leads 124c, and has a metallic circuit layer 124b on the first circuit board 124a, is electrically connected at the first lead 124c.The other end of each first lead 124c is electrically connected at each first probe 122 respectively, to transmit first test signal to each first probe 122.Similarly, second electrical connection module 125 also comprises a second circuit board 125a and a plurality of second leads 125c, and has a metallic circuit layer 125b on the second circuit board 125a, is electrically connected at the second lead 125c.The other end of each second lead 125c is electrically connected at each second probe 123 respectively, to transmit second test signal to each second probe 123.
Using the method for testing that above-mentioned measurement jig 110 carries out, is to provide a side to be provided with the plate 120 of a plurality of first probes 122 and a plurality of second probes 123 earlier.Then a display panel to be tested is placed on the test platform 110, and with the signal contact of display panel to be tested and corresponding first probe 122 or 123 contacts of second probe.Judge the signal contact of display panel to be tested and corresponding first probe 122 or 123 contacts of second probe then.If the signal contact of display panel to be tested contacts with first probe 122, the specification that then determines display panel to be tested is first specification, and to these first probe, 122 transmission, first test signals.If the signal contact of panel to be tested contacts with second probe 123, the specification that then determines panel to be tested is second specification, and to second probe, 123 transmission, second test signal.Thus,, just can see through same set of measurement jig 110, the panel that possesses different size is tested as long as select test signal by first electrical connection module 124 or 125 feed-ins of second electrical connection module.
Consult shown in Fig. 5 A and Fig. 5 B, be a kind of measurement jig 120 that second embodiment of the invention provided, this measurement jig 120 comprises a plate 121, a plurality of first probe 122, a plurality of second probe 123, a plurality of the 3rd probe 126, first electrical connection module 124, second electrical connection module 125.First probe 122, second probe 123 and the 3rd probe 126 are arranged at a side of plate 120.For the first tested panel 200a that possesses different size and the second tested panel 200b, among their signal contact 201a, the 201b, have part and be positioned at identical allocation position, this a part of signal contact 201a, 201b can see through the 3rd probe 126 and contact, that is to say that the 3rd probe 126 is the part signal contact 201a that selectively contact the first tested panel 200a, or the part signal contact 201b of the second tested panel 200b.In this embodiment, first probe 122 and the 3rd probe 126 common position configuration of forming are the positions with respect to the signal contact 201a of the first tested panel 200a, shown in Fig. 5 A.Similarly, identical these the 3rd probe 126 and second probe, the 123 common position configuration of forming are the positions with respect to the signal contact 201b of the second tested panel 200b, shown in Fig. 5 B.Therefore, first probe 122 and the 3rd probe 126 can be used to contact the signal contact 201a of the first tested panel 200a jointly, and second probe 123 and the 3rd probe 126 can be used to contact the signal contact 201b of the second tested panel 200b jointly.
For the transmission of first test signal and second test signal, in the first lead 124c of the first electric connection assembly 124, the first lead 124c of part is connected in the 3rd probe 126, and all the other first lead 124c are connected in first probe 122.In the second lead 125c of the second electric connection assembly 125, the second lead 125c of part is connected in the 3rd probe 126, and all the other second lead 125c are connected in second probe 123.That is to say that at least one first lead 124c and at least one second lead 125c are electrically connected at the 3rd probe 126 jointly.Therefore, when the test first tested panel 200a, when testing source provided one first test signal, this first test signal transferred to the signal contact 201a of the first tested panel 200a by first probe 122 and the 3rd probe 126.Identical, when the tested panel 200b of test second, testing source provides one second test signal, and this second test signal transfers to the signal pin point 201b of the second tested panel 200b by second probe 123 and the 3rd probe 126.
Consult shown in Figure 6, another electric connection assembly synoptic diagram for measurement jig that the present invention discloses 120, this measurement jig 120 is roughly identical with first embodiment, and its difference is that it is to be electrically connected with an electric connector 131 respectively that the first electric connection assembly 124 and second electrically connects assembly 125.Each electric connector 131 sees through winding displacement 132 respectively and connects the first electric connection assembly 124 and the second electric connection assembly 125, to be plugged in testing source apace, receives first test signal or second test signal.Certainly, the first electric connection assembly 124 and second electrically connects assembly 125 also can only comprise an electric connector 131, this electric connector 131 sees through a winding displacement 132 and optionally is connected in the first electric connection assembly 124 or the second electric connection assembly 125 (omission accompanying drawing), can reduce cost.
Though the present invention discloses as above with aforesaid embodiment, yet it is not in order to limit the present invention.Change of being done and retouching without departing from the spirit and scope of the present invention all belongs to scope of patent protection of the present invention.To be as the criterion with claims institute restricted portion about the protection domain that the present invention defined.
Claims (13)
1. the measurement jig of a display panel is characterized in that, includes:
One plate;
A plurality of first probes are located at a side of this plate, respectively in order to contact a signal contact with tested panel of first specification;
A plurality of second probes are located at this side of this plate, respectively in order to contact a signal contact with tested panel of second specification;
A plurality of needle stands are located at a side of this plate, and this first probe and this second probe stationary are on this needle stand;
One first electrical connection module electrically connects these first probes, and wherein this first electrical connection module is in order to receiving one first test signal, and sees through respectively that this first probe transmits the signal contact of this first test signal to the tested panel of this first specification; And
One second electrical connection module electrically connects these second probes, and wherein this second electrical connection module is in order to receiving one second test signal, and sees through the signal contact that this second probe respectively is sent to the tested panel of this second specification.
2. the measurement jig of display panel as claimed in claim 1 is characterized in that, also comprises an electric connector, is electrically connected at this first electrical connection module or this second electrical connection module.
3. the measurement jig of display panel as claimed in claim 2 is characterized in that, also comprises a winding displacement, in order to electrically connecting this first electrical connection module and this electric connector, or electrically connects this second electrical connection module and this electric connector.
4. the measurement jig of display panel as claimed in claim 1 is characterized in that, also comprises two electric connectors, is electrically connected at this first electrical connection module and this second electrical connection module respectively.
5. the measurement jig of display panel as claimed in claim 4 is characterized in that, also comprises two winding displacements, and this two electric connector sees through this two winding displacement respectively and connects this first electric connection assembly and the second electric connection assembly.
6. the measurement jig of display panel as claimed in claim 1 is characterized in that, this first electrical connection module has a plurality of first leads, in order to electrically connect these first probes respectively.
7. the measurement jig of display panel as claimed in claim 6 is characterized in that, this first electrical connection module has a first circuit board, has a metallic circuit layer on it, and this metallic circuit layer is electrically connected at these first leads.
8. the measurement jig of display panel as claimed in claim 1 is characterized in that, this second electrical connection module has a plurality of second leads, in order to electrically connect these second probes respectively.
9. the measurement jig of display panel as claimed in claim 8 is characterized in that, this second electrical connection module has a second circuit board, has a metallic circuit layer on it, and this metallic circuit layer is electrically connected at these second leads.
10. the measurement jig of display panel as claimed in claim 1, it is characterized in that, also comprise at least one the 3rd probe, be located at this side of this plate, the 3rd probe is arranged on a part of described needle stand, this first probe and this second probe are arranged on the described needle stand of another part, and the 3rd probe is in order to the part signal contact of the tested panel that contacts this first specification, or the part signal contact of the tested panel of this second specification.
11. the measurement jig of display panel as claimed in claim 10 is characterized in that, the 3rd probe is electrically connected at this first electrical connection module and this second electrical connection module.
12. the measurement jig of display panel as claimed in claim 1 is characterized in that, these first probes and these second probes are this sides that is arranged in this plate at interval with staggered or mode.
13. the method for testing of a display panel is characterized in that, includes following steps:
Provide a side to be provided with the plate of a plurality of first probes and a plurality of second probes;
Side in this plate is provided with a plurality of needle stands, and this first probe and this second probe stationary are on this needle stand;
One display panel to be tested is placed on the test platform, and signal contact that will this display panel to be tested and corresponding first probe or the contact of second probe; And
Judge that this display panel to be tested contacts with first probe or second probe, if this display panel to be tested contacts with first probe, then to these first probe transmission, one first test signals, if this panel to be tested contacts with second probe, then to this second probe transmission, one second test signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101466371A CN101101314B (en) | 2007-08-23 | 2007-08-23 | Display panel test fixture and test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101466371A CN101101314B (en) | 2007-08-23 | 2007-08-23 | Display panel test fixture and test method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101101314A CN101101314A (en) | 2008-01-09 |
| CN101101314B true CN101101314B (en) | 2011-07-06 |
Family
ID=39035687
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007101466371A Active CN101101314B (en) | 2007-08-23 | 2007-08-23 | Display panel test fixture and test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101101314B (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101299315B (en) * | 2008-07-04 | 2010-10-13 | 友达光电（苏州）有限公司 | Test system for display panel |
| KR101234088B1 (en) * | 2010-12-30 | 2013-02-19 | 주식회사 탑 엔지니어링 | Array test apparatus |
| US9741277B2 (en) | 2012-07-02 | 2017-08-22 | E Ink Holdings Inc. | Test structure of display panel and test structure of tested display panel |
| TWI467269B (en) * | 2012-07-02 | 2015-01-01 | E Ink Holdings Inc | Test structure of display panel and testing method thereof and tested test structure |
| CN102879926B (en) * | 2012-09-19 | 2014-12-10 | 深圳市华星光电技术有限公司 | Type setting structure for sharing jig by two display panels and method of type setting structure |
| CN107247192B (en) * | 2017-06-12 | 2020-06-23 | 深圳市信维通信股份有限公司 | Mobile terminal antenna test system and method |
| WO2019084874A1 (en) * | 2017-11-02 | 2019-05-09 | 深圳市柔宇科技有限公司 | Touch screen detection structure and fabricating method therefor, touch screen with detection structure |
| CN108627759B (en) * | 2018-05-09 | 2022-05-13 | 京东方科技集团股份有限公司 | Auxiliary device for signal detection and signal detection system |
| CN108806564B (en) * | 2018-05-22 | 2021-07-13 | 武汉华星光电半导体显示技术有限公司 | Test fixture for display panel |
| CN113075430B (en) * | 2021-03-30 | 2023-03-31 | 云谷（固安）科技有限公司 | Pin card structure and test equipment |
| CN114019354A (en) * | 2021-11-02 | 2022-02-08 | 环鸿电子（昆山）有限公司 | Circuit board testing device and circuit board testing method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW230259B (en) * | 1990-08-03 | 1994-09-11 | Hitacha Seisakusho Kk | |
| US6137300A (en) * | 1997-08-22 | 2000-10-24 | Nec Corporation | Test probe device for a display panel and test probe positioning method |
| US6759867B2 (en) * | 2000-12-30 | 2004-07-06 | L. G. Philips Lcd., Ltd. | Inspection apparatus for liquid crystal display device |
| US20040183985A1 (en) * | 2003-03-20 | 2004-09-23 | Fujitsu Display Technologies Corporation | Liquid crystal display apparatus |
| CN1721867A (en) * | 2004-07-12 | 2006-01-18 | 应用材料股份有限公司 | Configurable prober for TFT LCD array test |
-
2007
- 2007-08-23 CN CN2007101466371A patent/CN101101314B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW230259B (en) * | 1990-08-03 | 1994-09-11 | Hitacha Seisakusho Kk | |
| US6137300A (en) * | 1997-08-22 | 2000-10-24 | Nec Corporation | Test probe device for a display panel and test probe positioning method |
| US6759867B2 (en) * | 2000-12-30 | 2004-07-06 | L. G. Philips Lcd., Ltd. | Inspection apparatus for liquid crystal display device |
| US20040183985A1 (en) * | 2003-03-20 | 2004-09-23 | Fujitsu Display Technologies Corporation | Liquid crystal display apparatus |
| CN1721867A (en) * | 2004-07-12 | 2006-01-18 | 应用材料股份有限公司 | Configurable prober for TFT LCD array test |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101101314A (en) | 2008-01-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101101314B (en) | Display panel test fixture and test method | |
| CN100487468C (en) | Rear-panel testing system | |
| US5633598A (en) | Translator fixture with module for expanding test points | |
| EP2335084B1 (en) | Test adapter configuration | |
| WO2005072406A3 (en) | Test system and method for reduced index time | |
| CN1892246B (en) | Systems, methods and device for calibrating an automated circuit test system | |
| CN108803566A (en) | Automobile engine cooling fan controller general-utility test platform | |
| CN207473048U (en) | A kind of Combined circuit board test device | |
| US6741072B2 (en) | Docking system for connecting a tester to a probe station using an A-type docking configuration | |
| CN211123130U (en) | Withstand voltage testing device | |
| US20070005287A1 (en) | Automatic hi-pot test appartus and method | |
| CN110716121A (en) | Soft board and connector full-page testing method | |
| CN212207665U (en) | TR subassembly parameter test anchor clamps | |
| CN103792399A (en) | Test clamp of multi-channel input-output circuit board | |
| US20090256582A1 (en) | Test circuit board | |
| US7688093B2 (en) | Sharing conversion board for testing chips | |
| CN110907806A (en) | ICC multifunctional integrated test system | |
| CN111693849A (en) | Closed-loop automatic test system capable of realizing multi-interface index test and test bench | |
| WO1995023341A1 (en) | Translator fixture with module for expanding test points | |
| CN208367055U (en) | A kind of clamp for electrical measurement | |
| CN203894282U (en) | Signal switching structure of probe type detection device | |
| CN212626423U (en) | Adapter plate for debugging and integrated circuit module debugging system | |
| CN212586482U (en) | Integrated system architecture for wireless charging product function test | |
| CN219302608U (en) | Detection system applied to circuit board | |
| CN216051994U (en) | MCU base station and MCU automation equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |