CN103792399A - Test clamp of multi-channel input-output circuit board - Google Patents
Test clamp of multi-channel input-output circuit board Download PDFInfo
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- CN103792399A CN103792399A CN201410017377.8A CN201410017377A CN103792399A CN 103792399 A CN103792399 A CN 103792399A CN 201410017377 A CN201410017377 A CN 201410017377A CN 103792399 A CN103792399 A CN 103792399A
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- circuit board
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Abstract
The invention discloses a test clamp of a multi-channel input-output circuit board. The test clamp comprises an interface, winding wires, a plurality of P-Pins and a plurality of contact probes. The contact probes are connected with the P-Pins through the winding wires in a one-to-one corresponding mode. The P-Pins are connected with the interface through the winding wires. The contact probes are used for being in contact connection with the circuit board with a plurality of tested points. The interface is provided with a plurality of terminals which are used for being connected with peripheral equipment which provides an external signal source for the circuit board and is used for collecting circuit board signals. When the clamp works, the circuit board is connected with the contact probes, so that electric signals sent by the peripheral equipment are input to the circuit board through the clamp, meanwhile, electric signals on the tested points on the circuit board are transmitted to the peripheral equipment through the clamp, accordingly, testing of multi-channel input and multi-channel output at the same time on the circuit board is achieved, the problem that an existing test clamp cannot provide multi-channel input signals and cannot carry out collecting at a plurality of tested points at the same time is solved, strong functions are achieved, and high test requirements can be met.
Description
Technical field
The present invention relates to a kind of circuit board test clamp, especially a kind of test fixture of multichannel imput output circuit plate.
Background technology
At present, when application Agilent on-line testing board and matched clamp thereof are tested circuit board, two input signals be can only provide simultaneously, S-bus and A-bus are respectively, helpless for the circuit board testing of three of needs and above input signal.And, application Agilent on-line testing board and matched clamp thereof are in the time of the signal of each test point of collecting circuit board, dot sequency collection one by one, can not carry out test point collection simultaneously, therefore, need to be for the test of the function of the circuit board of collection signal simultaneously of each test point for some, existing Agilent circuit board test clamp cannot be satisfied the demand.
Summary of the invention
For the problems referred to above, the invention provides a kind of test fixture of multichannel imput output circuit plate, described circuit board test clamp can apply multiple signals and multiple measured points on testing circuit board simultaneously, compared with available circuit board test fixture, it has overcome existing test fixture can not provide the deficiency of multichannel input signal, and existing system can not carry out the restriction of multiple test point collections simultaneously, there is stronger function, can meet higher test needs.
Technical scheme provided by the invention is:
A kind of test fixture of multichannel imput output circuit plate, the structure of this test fixture as shown in Figure 1, comprise interface 2, coiling 8, P-Pin9 and contact probe 10, wherein said contact probe 10 is multiple, 8 connect one to one with multiple P-Pin9 by winding the line respectively, P-Pin9 is again by coiling 8 connecting interfaces 2, and described contact probe 10 is for being connected with circuit board 7 contacts with multiple measured points; It is characterized in that, interface 2 is provided with multiple terminals, outside source is provided and is used for the external unit of Acquisition Circuit partitioned signal for connecting to circuit board.
In multiple terminals of the interface 2 of above-mentioned test fixture, part terminal is connected with the external unit of outside source is provided to circuit board by many wires, the multi-channel electric signal that external unit is sent the after tested interface 2 of fixture is input to circuit board 7, provides multichannel input signal thereby realize to circuit board 7; Simultaneously, another part terminal is connected with the external unit of Acquisition Circuit partitioned signal by many wires, the electric signal of the multiple measured points on circuit board 7 is delivered to the interface 2 of test fixture by the contact probe 10 of described test fixture, obtained by external unit collection, circuit board 7 is carried out to multiple signals gather simultaneously thereby realize.
In an example of the present invention, the test fixture of described multichannel imput output circuit plate also comprises backboard 1, jig frame 3, needle plate 4, back up pad 5 and vacuum air cushion 6, as shown in Figure 2, P-Pin9 and contact probe 10 all have multiple, all be fixed on needle plate 4, needle plate 4 is fixed in jig frame 3, backboard 1 is screwed the bottom that is arranged on jig frame 3, interface 2 is arranged on a side of jig frame 3, above needle plate 4, be fixed with back up pad 5, for support circuit plate 7, porose in back up pad 5, contact probe 10 penetrates in the hole of back up pad 5, between back up pad 5 and circuit board 7, vacuum air cushion 6 is installed, one end of coiling 8 is together with the terminal soldering of interface 2, the other end is connected with P-Pin9.
In the test fixture of above-mentioned multichannel imput output circuit plate, the size of interface 2 of test fixture and the way of circuit can arrange according to the actual conditions of circuit board 7.In a specific embodiment of the present invention, circuit board 7 You Wu road signal demands apply test simultaneously, have the collection of ten measuring point signal demands; The interface Wei Shi five road interfaces of described test fixture.When above-mentioned test fixture carries out test job to circuit board 7, first outside multi-channel electric signal sends to the interface 2 on test fixture by the external unit that outside source is provided to circuit board, then multi-channel electric signal is along the coiling 8 on test fixture, be delivered to circuit board 7 by P-Pin9 and contact probe 10, realize thus the input of multi-channel electric signal; Meanwhile, first the electric signal of the multiple measured points on circuit board 7 is delivered to P-Pin9 along the contact probe 10 on test fixture, be delivered to again the interface 2 of test fixture by the coiling 8 on test fixture, this electric signal is obtained by the external unit collection of Acquisition Circuit partitioned signal, realizes thus the output of multi-channel electric signal.
Compare existing Agilent circuit board test clamp, the invention has the beneficial effects as follows,
The test fixture of multichannel imput output circuit plate provided by the invention, can apply simultaneously multiple signals and simultaneously the multiple measured points on collecting circuit board test, compared with available circuit board test fixture, it has overcome existing test macro can not provide the deficiency of multiple input electrical signals, and existing system can not carry out the restriction of multiple test point collections simultaneously, there is stronger function, can meet higher test needs, realize the functional test of circuit board complexity.
Accompanying drawing explanation
Fig. 1 is composition structural representation of the present invention.
Fig. 2 is inner structure schematic diagram of the present invention.
In Fig. 1～Fig. 2,
1-backboard; 2-interface; 3-jig frame; 4-needle plate; 5-back up pad; 6-vacuum air cushion; 7-circuit board; 8-coiling; 9-P-Pin; 10-contact probe.
Embodiment
Below in conjunction with accompanying drawing, further describe the present invention by embodiment, but the scope not limiting the present invention in any way.
The test fixture of the multichannel imput output circuit plate that the present embodiment provides, the inner structure of this test fixture as shown in Figure 2, comprise interface 2, coiling 8, P-Pin9 and contact probe 10, wherein said contact probe 10 is multiple, 8 connect one to one with multiple P-Pin9 by winding the line respectively, P-Pin9 is again by coiling 8 connecting interfaces 2, and described contact probe 10 is for being connected with circuit board 7 contacts with multiple measured points; It is characterized in that, interface 2 is provided with multiple terminals, outside source is provided and is used for the external unit of Acquisition Circuit partitioned signal for connecting to circuit board.
In multiple terminals of the interface 2 of above-mentioned test fixture, part terminal is connected with the external unit of outside source is provided to circuit board by many wires, the multi-channel electric signal that external unit is sent the after tested interface 2 of fixture is input to circuit board 7, provides multichannel input signal thereby realize to circuit board 7; Simultaneously, another part terminal is connected with the external unit of Acquisition Circuit partitioned signal by many wires, the electric signal of the multiple measured points on circuit board 7 is delivered to the interface 2 of test fixture by the contact probe 10 of described test fixture, obtained by external unit collection, circuit board 7 is carried out to multiple signals gather simultaneously thereby realize.
In the present embodiment, as shown in Figure 1, this test fixture also comprises backboard 1, jig frame 3, needle plate 4, back up pad 5 and vacuum air cushion 6 to the composition structure of above-mentioned test fixture.Wherein, as shown in Figure 2, P-Pin9 and contact probe 10 are all fixed on needle plate 4, needle plate 4 is fixed in jig frame 3, backboard 1 is screwed the bottom that is arranged on jig frame 3, interface 2 is arranged on a side of jig frame 3, above needle plate 4, be fixed with back up pad 5, for support circuit plate 7, porose in back up pad 5, contact probe 10 penetrates in the hole of back up pad 5, between back up pad 5 and circuit board 7, vacuum air cushion 6 is installed, one end of coiling 8 is together with terminal soldering, and the other end is connected with P-Pin9, and P-Pin9 is connected by coiling 8 with contact probe 10.
While utilizing above-mentioned test fixture to carry out the test of multichannel input and output to circuit board 7, the size of interface 2 of test fixture and the way of circuit can arrange according to the actual conditions of circuit board 7.In the present embodiment, circuit board 7 You Wu road signal demands apply test simultaneously, have the collection of ten measuring point signal demands; The interface Wei Shi five road interfaces of described test fixture.When above-mentioned test fixture carries out test job to circuit board 7, first outside multi-channel electric signal sends to the interface 2 on test fixture by the external unit that outside source is provided to circuit board, then multi-channel electric signal is along the coiling 8 on test fixture, be delivered to circuit board 7 by P-Pin9 and contact probe 10, realize thus and provide five road input signals to circuit board 7; Meanwhile, first the electric signal of the multiple measured points on circuit board 7 is delivered to P-Pin9 along the contact probe 10 on test fixture, be delivered to again the interface 2 of test fixture by the coiling 8 on test fixture, this electric signal is obtained by the external unit collection of Acquisition Circuit partitioned signal, realizes thus circuit board 7 is gathered to ten road signals simultaneously.
Claims (3)
1. the test fixture of a multichannel imput output circuit plate, comprise interface (2), coiling (8), P-Pin(9) and contact probe (10), wherein said contact probe (10) is multiple, respectively by coiling (8) and multiple P-Pin(9) connect one to one, P-Pin(9) again by coiling (8) connecting interface (2), and described contact probe (10) is for being connected with circuit board (7) contact with multiple measured points; It is characterized in that, interface (2) is provided with multiple terminals, outside source is provided and is used for the external unit of Acquisition Circuit partitioned signal for connecting to circuit board.
2. the test fixture of multichannel imput output circuit plate as claimed in claim 1, it is characterized in that, described test fixture also comprises backboard (1), jig frame (3), needle plate (4), back up pad (5) and vacuum air cushion (6), described needle plate (4) is fixed in jig frame (3), described P-Pin(9) and contact probe (10) be fixed on needle plate (4), backboard (1) is screwed the bottom that is arranged on jig frame (3), interface (2) is arranged on the side of jig frame (3), the fixed support plate (5) above of needle plate (4), for support circuit plate (7), back up pad (5) is provided with hole, contact probe (10) penetrates in the hole of back up pad (5), between back up pad (5) and circuit board (7), vacuum air cushion (6) is installed, together with the coiling one end of (8) and the terminal soldering of interface (2), the other end and P-Pin(9) be connected.
3. the test fixture of multichannel imput output circuit plate as claimed in claim 1, it is characterized in that, a part of terminal in multiple terminals of the interface (2) of described test fixture is connected with the external unit of outside source is provided to circuit board by many wires, the multi-channel electric signal that external unit is sent the after tested interface of fixture (2) is input to circuit board (7), provides multichannel input signal thereby realize to circuit board (7); Simultaneously, another part terminal is connected with the external unit of Acquisition Circuit partitioned signal by many wires, the electric signal of the multiple measured points on circuit board (7) is delivered to the interface (2) of test fixture by the contact probe (10) of described test fixture, obtained by external unit collection, circuit board (7) is carried out to multiple signals gather simultaneously thereby realize.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410017377.8A CN103792399A (en) | 2014-01-15 | 2014-01-15 | Test clamp of multi-channel input-output circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410017377.8A CN103792399A (en) | 2014-01-15 | 2014-01-15 | Test clamp of multi-channel input-output circuit board |
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| Publication Number | Publication Date |
|---|---|
| CN103792399A true CN103792399A (en) | 2014-05-14 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410017377.8A Pending CN103792399A (en) | 2014-01-15 | 2014-01-15 | Test clamp of multi-channel input-output circuit board |
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| CN (1) | CN103792399A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109031088A (en) * | 2018-06-11 | 2018-12-18 | 成都京蓉伟业电子有限公司 | A kind of circuit board multichannel current test method and its system |
| CN112285523A (en) * | 2019-07-24 | 2021-01-29 | 北京振兴计量测试研究所 | Hybrid integrated circuit detection system and method |
| CN112540324A (en) * | 2019-09-19 | 2021-03-23 | 神讯电脑(昆山)有限公司 | Interface function testing system and method |
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| CN203191515U (en) * | 2013-04-03 | 2013-09-11 | 深圳市森力普电子有限公司 | Testing tool |
| CN203688600U (en) * | 2014-01-15 | 2014-07-02 | 中科华核电技术研究院有限公司北京分公司 | Test clamp for multipath input/output circuit board |
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2014
- 2014-01-15 CN CN201410017377.8A patent/CN103792399A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4232928A (en) * | 1979-06-27 | 1980-11-11 | Dit-Mco International Corporation | Apparatus employing flexible diaphragm for effecting substantially uniform force, individual couplings with multiple electrical contacts or the like |
| EP0840131A2 (en) * | 1996-10-29 | 1998-05-06 | Hewlett-Packard Company | Loaded-board guided-probe test fixture |
| US6362635B2 (en) * | 1999-04-08 | 2002-03-26 | Agilent Technologies, Inc. | Split resistor probe and method |
| US20060033513A1 (en) * | 2004-08-13 | 2006-02-16 | Lameres Brock J | Apparatus, method, and kit for probing a pattern of points on a printed circuit board |
| CN101065681A (en) * | 2004-10-15 | 2007-10-31 | 泰拉丁公司 | Interface apparatus for semiconductor device tester |
| CN101315411A (en) * | 2007-05-31 | 2008-12-03 | 安捷伦科技有限公司 | System, method and apparatus for testing circuit combination |
| CN201075114Y (en) * | 2007-07-13 | 2008-06-18 | 苏州光韵达光电科技有限公司 | IC testing control tool |
| CN101387656A (en) * | 2007-09-13 | 2009-03-18 | 加比尔电路公司 | Flexible test fixture |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109031088A (en) * | 2018-06-11 | 2018-12-18 | 成都京蓉伟业电子有限公司 | A kind of circuit board multichannel current test method and its system |
| CN112285523A (en) * | 2019-07-24 | 2021-01-29 | 北京振兴计量测试研究所 | Hybrid integrated circuit detection system and method |
| CN112540324A (en) * | 2019-09-19 | 2021-03-23 | 神讯电脑(昆山)有限公司 | Interface function testing system and method |
| CN112540324B (en) * | 2019-09-19 | 2024-05-14 | 神讯电脑(昆山)有限公司 | Interface function test system and method thereof |
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Application publication date: 20140514 |