CN112540324A - Interface function testing system and method - Google Patents
Interface function testing system and method Download PDFInfo
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- CN112540324A CN112540324A CN201910886288.XA CN201910886288A CN112540324A CN 112540324 A CN112540324 A CN 112540324A CN 201910886288 A CN201910886288 A CN 201910886288A CN 112540324 A CN112540324 A CN 112540324A
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- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 238000000034 method Methods 0.000 title claims abstract description 20
- 238000003032 molecular docking Methods 0.000 claims description 16
- 210000001503 joint Anatomy 0.000 claims description 13
- 239000003990 capacitor Substances 0.000 claims description 10
- 238000001914 filtration Methods 0.000 claims description 4
- 230000000087 stabilizing effect Effects 0.000 claims description 4
- 230000005611 electricity Effects 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 230000013011 mating Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
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Abstract
The invention relates to a system and a method for testing interface functions, wherein the method comprises the following steps: (1) setting a PIN needle on the interface; (2) the input end of the interface is connected with a power supply and inputs a first voltage; (3) the machine port is grounded and used for reducing the first voltage to a second voltage; (4) the processing module detects whether the input end of the interface has voltage; (5) reducing the second voltage to 0V under the condition of voltage; (6) no voltage exists, and the test is finished; (7) when the second voltage is reduced to 0V, the processing module detects whether the voltage exists at the output end of the interface; (8) when the voltage is available, the machine station port is electrified and started; (9) no voltage is present, and the test is finished. By utilizing the system and the method for testing the functions of the interface, the problems that the number of PIN PINs on the plug-in interface is large and the arrangement is single are solved, the limitation that the PIN PINs cannot be completely contacted is overcome, the conducting time of the PIN PINs and the interface is shortened, and the testing efficiency is greatly improved.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the technical field of testing a docking interface, in particular to a docking interface function testing system and a docking interface function testing method.
[ background of the invention ]
At present, the workshop can dispose the interface at the in-process of producing notebook computer, most types to the interface are bayonet interface, the PIN needle number that sets up on the bayonet interface is many and arrange single, the test mode at present stage is when testing interface function, adopt to set up on notebook computer's the interface and arrange single a plurality of PIN needles and carry out the function detection, because this PIN needle number is many and arrange single, cause PIN needle and interface's electrically conductive time extension, there is the limitation that can't contact PIN needle completely to bayonet interface, and it is not convenient to test, thereby produce the problem that efficiency of software testing reduces.
In view of the above, it is actually necessary to provide a system and a method for testing interface functions to solve the problems that the number of PIN PINs on a plug-in interface generated in the current stage detection manner is large, the PIN PINs are arranged in a single manner, the PIN PINs cannot be completely contacted, the conduction time between the PIN PINs and the interface is prolonged, the test is inconvenient, and the test efficiency is reduced.
[ summary of the invention ]
The invention aims to provide a method and a system for testing functions of a butt joint port, and aims to solve the problems that the number of PIN PINs on a plug-in butt joint port generated in a current detection mode is large, the PIN PINs are arranged in a single mode and cannot be completely contacted, the conduction time of the PIN PINs and the butt joint port is prolonged, the test is inconvenient, and the test efficiency is reduced.
In order to achieve the above object, the present invention provides a system for testing interface functions, comprising:
a power supply for supplying power;
the PIN PINs are connected with the power supply, are uniformly arranged on the butt-joint ports in a rectangular surrounding mode and are used for conducting electricity;
the butt joint interface is connected with the PIN PIN and comprises an input end and an output end, and the butt joint interface is used for inputting voltage and outputting voltage;
the processing module is connected with the butt joint interface and is used for detecting the voltage conditions of the input end and the output end of the butt joint interface;
the machine port is connected with the processing module and is used for connecting the output end of the butt joint port.
Optionally, the system for testing functions of a docking interface further includes a power line, and the power line is connected in series to the power supply, the PIN, the docking interface, the processing module, and the machine port.
Optionally, a capacitor bank and a resistor bank are arranged on the power-on circuit.
Optionally, the spacing between adjacent PIN PINs ranges from 1.5 mm to 2 mm.
The invention also provides a method for testing the interface function, which comprises the following steps:
(1) setting a PIN needle on the interface;
(2) the input end of the interface is connected with a power supply and inputs a first voltage;
(3) the machine port is grounded and used for reducing the first voltage to a second voltage;
(4) the processing module detects whether the input end of the interface has voltage;
(5) reducing the second voltage to 0V under the condition of voltage;
(6) no voltage exists, and the test is finished;
(7) when the second voltage is reduced to 0V, the processing module detects whether the voltage exists at the output end of the interface;
(8) when the voltage is available, the machine station port is electrified and started;
(9) no voltage is present, and the test is finished.
Optionally, in the step (1), the PIN PINs are uniformly arranged on the mating interfaces in a rectangular surrounding manner.
Optionally, the pair of interfaces in the step (1) has functions of inputting and outputting voltage.
Optionally, the power line is connected in series to the power supply, the PIN, the docking port, the detection module, and the machine station port.
Optionally, a capacitor bank and a resistor bank are arranged on the power-on line, the capacitor bank is used for stabilizing voltage and filtering, and the resistor bank is used for limiting current.
Compared with the prior art, the interface function testing system and the method thereof firstly uniformly arrange the PIN PINs on the interface in a rectangular surrounding mode, the input end of the interface is connected with a power supply to input a first voltage, then the first voltage is reduced to a second voltage, a processing module is utilized to detect whether the voltage is available at the input end of the interface, if the voltage is available, the second voltage is reduced to 0V, if no voltage exists, the testing fails, then when the second voltage is reduced to 0V, the processing module is utilized to detect whether the voltage is available at the output end of the interface, if the voltage exists, the machine port is electrified to be started, if no voltage exists, the testing fails, by utilizing the interface function testing system and the method thereof, the problems that the number of the PIN PINs on the plug-in interface is large and the PIN PINs are singly arranged are solved, the limitation that the PIN PINs cannot be completely contacted is overcome, and the conducting time of the PIN PINs and the interface is reduced, the testing efficiency is greatly improved.
[ description of the drawings ]
FIG. 1 is a schematic diagram of a system for testing interface functionality according to the present invention.
FIG. 2 is a schematic diagram of the interface function testing method of the present invention.
FIG. 3 is a schematic diagram of a PIN of the interface functionality test system of the present invention being aligned with an interface.
[ detailed description ] embodiments
To further illustrate the technical means and effects of the present invention, the following detailed description is given with reference to a preferred embodiment of the present invention and the accompanying drawings.
Referring to fig. 1 and 2, fig. 1 is a schematic diagram of a system for testing interface functions according to the present invention, fig. 2 is a schematic diagram of a method for testing interface functions according to the present invention, and a system 100 for testing interface functions according to the present invention includes:
a power supply 110, the power supply 110 for supplying power;
the PIN PINs 120 are connected with the power supply 110, the PIN PINs 120 are uniformly arranged on the butt-joint interface 130 in a rectangular surrounding mode respectively, and the PIN PINs 120 are used for conducting electricity;
a pair of interfaces 130, wherein the pair of interfaces 130 is connected to the PIN PINs 120, the pair of interfaces 130 comprises an input end 131 and an output end 132, and the pair of interfaces 130 is used for inputting and outputting voltage;
the processing module 140, the processing module 140 is connected to the interface 130, the processing module 140 is configured to detect voltage conditions of the input end 131 and the output end 132, and the processing module 140 tests the voltage conditions of the input end 131 and the output end 132 of the interface 130 through a voltage tester;
a machine port 150, wherein the machine port 150 is connected to the processing module 140, and the machine port 150 is used for connecting to the output end 132 of the pair of interfaces 130.
The interface function testing system 100 further includes a power line, which connects the power source 110, the PIN 120, the interface 130, the processing module 140 and the machine port 150 in series.
The power supply circuit is provided with a capacitor bank and a resistor bank, the capacitor bank is used for stabilizing voltage and filtering, and the resistor bank is used for limiting current.
Wherein the spacing between the adjacent PIN PINs 120 is in the range of 1.5-2 millimeters.
The invention also provides a method for testing the interface function, which comprises the following steps:
s101: setting a PIN needle on the interface;
s102: the input end of the interface is connected with a power supply and inputs a first voltage;
s103: the machine port is grounded and used for reducing the first voltage to a second voltage;
s104: the processing module detects whether the input end of the interface has voltage;
s105: reducing the second voltage to 0V under the condition of voltage;
s106: no voltage exists, and the test is finished;
s107: when the second voltage is reduced to 0V, the processing module detects whether the voltage exists at the output end of the interface;
s108: when the voltage is available, the machine station port is electrified and started;
s109: no voltage is present, and the test is finished.
In step S101, the PIN PINs are uniformly arranged on the mating interfaces in a rectangular surrounding manner.
In step S101, the pair of interfaces has functions of inputting and outputting voltage.
Wherein the power line is connected in series with the power supply, the PIN PIN, the docking port, the detection module, and the machine station port.
The power supply circuit is provided with a capacitor bank and a resistor bank, the capacitor bank is used for stabilizing voltage and filtering, and the resistor bank is used for limiting current.
Referring to fig. 3, fig. 3 is a schematic diagram of PIN PINs of the interface function testing system according to the present invention, the PIN PINs 120 are uniformly arranged on the interface 130 in a rectangular surrounding manner, the PIN PINs 120 are located on a side surface of the interface 130, and the interface 130 is completely connected to the power supply 110 through the PIN PINs 120 arranged in the rectangular surrounding manner, so as to avoid poor contact.
Compared with the prior art, the interface function testing system 100 and the method thereof of the invention firstly uniformly arrange the PIN PINs 120 on the interface 130 in a rectangular surrounding manner, the input end 131 of the interface 130 is connected with the power supply 110, the first voltage is input, then the first voltage is reduced to the second voltage, the processing module 140 is used for detecting whether the voltage is present at the input end 131 of the interface 130, if the voltage is present, the second voltage is reduced to 0V, if no voltage is present, the testing fails, then, when the second voltage is reduced to 0V, the processing module 140 is used for detecting whether the voltage is present at the output end 132 of the interface 130, if the voltage is present, the machine station port 150 is electrified and started, if no voltage is present, the testing fails, by using the interface function testing system 100 and the method thereof of the invention, not only the problems that the PIN PINs 120 on the plug-in interface are large in number and are singly arranged are solved, the limitation that the PIN PINs 120 cannot be completely contacted is overcome, and the conduction time of the PIN 120 and the interface 130 is also reduced, and the test efficiency is greatly improved.
It should be noted that the present invention is not limited to the above embodiments, and any simple modifications of the above embodiments based on the technical solution of the present invention, equivalent changes and modifications are within the scope of the present invention.
Claims (9)
1. A system for testing the functionality of a docking interface, comprising:
a power supply for supplying power;
the PIN PINs are connected with the power supply, are uniformly arranged on the butt-joint ports in a rectangular surrounding mode and are used for conducting electricity;
the butt joint interface is connected with the PIN PIN and comprises an input end and an output end, and the butt joint interface is used for inputting voltage and outputting voltage;
the processing module is connected with the butt joint interface and is used for detecting the voltage conditions of the input end and the output end of the butt joint interface;
the machine port is connected with the processing module and is used for connecting the output end of the butt joint port.
2. A docking port functionality test system as recited in claim 1, further comprising a power-on line connecting the power supply, the PIN, the docking port, the processing module and the tool port in series.
3. A system for testing the functionality of a docking port as recited in claim 2, wherein a capacitor bank and a resistor bank are disposed on the power-on line.
4. A docking port functionality test system according to claim 1 wherein the spacing between adjacent PIN PINs is in the range of 1.5-2 mm.
5. A method for testing interface function, comprising the steps of:
(1) setting a PIN needle on the interface;
(2) the input end of the interface is connected with a power supply and inputs a first voltage;
(3) the machine port is grounded and used for reducing the first voltage to a second voltage;
(4) the processing module detects whether the input end of the interface has voltage;
(5) reducing the second voltage to 0V under the condition of voltage;
(6) no voltage exists, and the test is finished;
(7) when the second voltage is reduced to 0V, the processing module detects whether the voltage exists at the output end of the interface;
(8) when the voltage is available, the machine station port is electrified and started;
(9) no voltage is present, and the test is finished.
6. A method as claimed in claim 5, wherein the PIN PINs are uniformly arranged on the interface in a rectangular surrounding manner in step (1).
7. The method for testing the function of a docking port as claimed in claim 5, wherein the docking port has the functions of inputting voltage and outputting voltage in step (1).
8. The method for testing the functionality of a docking port of claim 5, wherein the power line connects the power source, the PIN pad, the docking port, the probe module, and the tool port in series.
9. The method as claimed in claim 8, wherein a capacitor bank and a resistor bank are disposed on the power line, the capacitor bank is used for stabilizing voltage and filtering, and the resistor bank is used for limiting current.
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| CN201910886288.XA CN112540324B (en) | 2019-09-19 | 2019-09-19 | Interface function test system and method thereof |
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| CN201910886288.XA CN112540324B (en) | 2019-09-19 | 2019-09-19 | Interface function test system and method thereof |
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