CN203688600U - Test clamp for multipath input/output circuit board - Google Patents
Test clamp for multipath input/output circuit board Download PDFInfo
- Publication number
- CN203688600U CN203688600U CN201420024769.2U CN201420024769U CN203688600U CN 203688600 U CN203688600 U CN 203688600U CN 201420024769 U CN201420024769 U CN 201420024769U CN 203688600 U CN203688600 U CN 203688600U
- Authority
- CN
- China
- Prior art keywords
- circuit board
- interface
- test
- test fixture
- coiling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims abstract description 25
- 238000005476 soldering Methods 0.000 claims description 3
- 230000007812 deficiency Effects 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model discloses a test clamp for a multipath input/output circuit board. The test clamp comprises an interface, coiling wires, P-pins and contact probes, wherein the contact probes are multiple in number and are respectively connected with the P-pins through the coiling wires in one-to-one correspondence, the P-pins are further connected with the interface through the coiling wire, the contact probes are used for being in contact connection with a circuit board having multiple tested points, and the interface is provided with multiple terminals and is used for connecting external equipment which provides external signal sources for the circuit board and is used for acquiring signals of the circuit board. During use of the test clamp, through connection of the circuit board and the contact probes, electric signals sent by the external equipment are inputted to the circuit board through the clamp; electric signals of the tested points on the circuit board are simultaneously transmitted to the external equipment through the clamp, so multipath input/output tests on the circuit board are realized simultaneously, a problem that a clamp in the prior art can not provide multipath input signals or carry out simultaneous multi-test-point acquisition is solved, the test clamp provided in the utility model has stronger functions and can satisfy higher test demands.
Description
Technical field
The utility model relates to a kind of circuit board test clamp, especially a kind of test fixture of multichannel imput output circuit plate.
Background technology
At present, when application Agilent on-line testing board and matched clamp thereof are tested circuit board, two input signals be can only provide simultaneously, S-bus and A-bus are respectively, helpless for the circuit board testing of three of needs and above input signal.And, application Agilent on-line testing board and matched clamp thereof are in the time of the signal of each test point of collecting circuit board, dot sequency collection one by one, can not carry out test point collection simultaneously, therefore, need to be for the test of the function of the circuit board of collection signal simultaneously of each test point for some, existing Agilent circuit board test clamp cannot be satisfied the demand.
Utility model content
For the problems referred to above, the utility model provides a kind of test fixture of multichannel imput output circuit plate, described circuit board test clamp can apply multiple signals and multiple measured points on testing circuit board simultaneously, compared with available circuit board test fixture, it has overcome existing test fixture can not provide the deficiency of multichannel input signal, and existing system can not carry out the restriction of multiple test point collections simultaneously, there is stronger function, can meet higher test needs.
The technical scheme that the utility model provides is:
A kind of test fixture of multichannel imput output circuit plate, the structure of this test fixture as shown in Figure 1, comprise interface 2, coiling 8, P-Pin9 and contact probe 10, wherein said contact probe 10 is multiple, 8 connect one to one with multiple P-Pin9 by winding the line respectively, P-Pin9 is again by coiling 8 connecting interfaces 2, and described contact probe 10 is for being connected with circuit board 7 contacts with multiple measured points; It is characterized in that, interface 2 is provided with multiple terminals, outside source is provided and is used for the external unit of Acquisition Circuit partitioned signal for connecting to circuit board.
In multiple terminals of the interface 2 of above-mentioned test fixture, a part of terminal is connected with the external unit of outside source is provided to circuit board by many wires; Another part terminal is connected with the external unit of Acquisition Circuit partitioned signal by many wires.
In an example of the present utility model, the test fixture of described multichannel imput output circuit plate also comprises backboard 1, jig frame 3, needle plate 4, back up pad 5 and vacuum air cushion 6, as shown in Figure 2, P-Pin9 and contact probe 10 all have multiple, all be fixed on needle plate 4, needle plate 4 is fixed in jig frame 3, backboard 1 is screwed the bottom that is arranged on jig frame 3, interface 2 is arranged on a side of jig frame 3, above needle plate 4, be fixed with back up pad 5, for support circuit plate 7, porose in back up pad 5, contact probe 10 penetrates in the hole of back up pad 5, between back up pad 5 and circuit board 7, vacuum air cushion 6 is installed, one end of coiling 8 is together with the terminal soldering of interface 2, the other end is connected with P-Pin9.
In the test fixture of above-mentioned multichannel imput output circuit plate, the size of interface 2 of test fixture and the way of circuit can arrange according to the actual conditions of circuit board 7.In a specific embodiment of the present utility model, circuit board 7 You Wu road signal demands apply test simultaneously, have the collection of ten measuring point signal demands; The interface Wei Shi five road interfaces of described test fixture.When above-mentioned test fixture carries out test job to circuit board 7, first outside multi-channel electric signal sends to the interface 2 on test fixture by the external unit that outside source is provided to circuit board, then multi-channel electric signal is along the coiling 8 on test fixture, be delivered to circuit board 7 by P-Pin9 and contact probe 10, realize thus and provide multichannel input signal to circuit board 7; Meanwhile, first the electric signal of the multiple measured points on circuit board 7 is delivered to P-Pin9 along the contact probe 10 on test fixture, be delivered to again the interface 2 of test fixture by the coiling 8 on test fixture, this electric signal is obtained by the external unit collection of Acquisition Circuit partitioned signal, thus circuit board 7 is carried out to multiple signals and gathers simultaneously.
Compare existing Agilent circuit board test clamp, the beneficial effects of the utility model are,
The test fixture of the multichannel imput output circuit plate that the utility model provides, can apply simultaneously multiple signals and simultaneously the multiple measured points on collecting circuit board test, compared with available circuit board test fixture, it has overcome existing test macro can not provide the deficiency of multiple input electrical signals, and existing system can not carry out the restriction of multiple test point collections simultaneously, there is stronger function, can meet higher test needs, realize the functional test of circuit board complexity.
Accompanying drawing explanation
Fig. 1 is composition structural representation of the present utility model.
Fig. 2 is inner structure schematic diagram of the present utility model.
In Fig. 1～Fig. 2,
1-backboard; 2-interface; 3-jig frame; 4-needle plate; 5-back up pad; 6-vacuum air cushion; 7-circuit board; 8-coiling; 9-P-Pin; 10-contact probe.
Embodiment
Below in conjunction with accompanying drawing, further describe the utility model by embodiment, but limit never in any form scope of the present utility model.
The test fixture of the multichannel imput output circuit plate that the present embodiment provides, the inner structure of this test fixture as shown in Figure 2, comprise interface 2, coiling 8, P-Pin9 and contact probe 10, wherein said contact probe 10 is multiple, 8 connect one to one with multiple P-Pin9 by winding the line respectively, P-Pin9 is again by coiling 8 connecting interfaces 2, and described contact probe 10 is for being connected with circuit board 7 contacts with multiple measured points; It is characterized in that, interface 2 is provided with multiple terminals, outside source is provided and is used for the external unit of Acquisition Circuit partitioned signal for connecting to circuit board.
In the present embodiment, as shown in Figure 1, this test fixture also comprises backboard 1, jig frame 3, needle plate 4, back up pad 5 and vacuum air cushion 6 to the composition structure of above-mentioned test fixture.Wherein, as shown in Figure 2, P-Pin9 and contact probe 10 are all fixed on needle plate 4, needle plate 4 is fixed in jig frame 3, backboard 1 is screwed the bottom that is arranged on jig frame 3, interface 2 is arranged on a side of jig frame 3, above needle plate 4, be fixed with back up pad 5, for support circuit plate 7, porose in back up pad 5, contact probe 10 penetrates in the hole of back up pad 5, between back up pad 5 and circuit board 7, vacuum air cushion 6 is installed, one end of coiling 8 is together with terminal soldering, and the other end is connected with P-Pin9, and P-Pin9 is connected by coiling 8 with contact probe 10.
While utilizing above-mentioned test fixture to carry out the test of multichannel input and output to circuit board 7, the size of interface 2 of test fixture and the way of circuit can arrange according to the actual conditions of circuit board 7.In the present embodiment, circuit board 7 You Wu road signal demands apply test simultaneously, have the collection of ten measuring point signal demands; The interface Wei Shi five road interfaces of described test fixture.When above-mentioned test fixture carries out test job to circuit board 7, first outside multi-channel electric signal sends to the interface 2 on test fixture by the external unit that outside source is provided to circuit board, then multi-channel electric signal is along the coiling 8 on test fixture, be delivered to circuit board 7 by P-Pin9 and contact probe 10, realize thus and provide five road input signals to circuit board 7; Meanwhile, first the electric signal of the multiple measured points on circuit board 7 is delivered to P-Pin9 along the contact probe 10 on test fixture, be delivered to again the interface 2 of test fixture by the coiling 8 on test fixture, this electric signal is obtained by the external unit collection of Acquisition Circuit partitioned signal, realizes thus circuit board 7 is gathered to ten road signals simultaneously.
Claims (3)
1. the test fixture of a multichannel imput output circuit plate, comprise interface (2), coiling (8), P-Pin(9) and contact probe (10), wherein said contact probe (10) is multiple, respectively by coiling (8) and multiple P-Pin(9) connect one to one, P-Pin(9) again by coiling (8) connecting interface (2), and described contact probe (10) is for being connected with circuit board (7) contact with multiple measured points; It is characterized in that, interface (2) is provided with multiple terminals, outside source is provided and is used for the external unit of Acquisition Circuit partitioned signal for connecting to circuit board.
2. the test fixture of multichannel imput output circuit plate as claimed in claim 1, it is characterized in that, described test fixture also comprises backboard (1), jig frame (3), needle plate (4), back up pad (5) and vacuum air cushion (6), described needle plate (4) is fixed in jig frame (3), described P-Pin(9) and contact probe (10) be fixed on needle plate (4), backboard (1) is screwed the bottom that is arranged on jig frame (3), interface (2) is arranged on the side of jig frame (3), the fixed support plate (5) above of needle plate (4), for support circuit plate (7), back up pad (5) is provided with hole, contact probe (10) penetrates in the hole of back up pad (5), between back up pad (5) and circuit board (7), vacuum air cushion (6) is installed, together with the coiling one end of (8) and the terminal soldering of interface (2), the other end and P-Pin(9) be connected.
3. the test fixture of multichannel imput output circuit plate as claimed in claim 1, is characterized in that, a part of terminal in multiple terminals of the interface (2) of described test fixture is connected with the external unit of outside source is provided to circuit board by many wires; Another part terminal is connected with the external unit of Acquisition Circuit partitioned signal by many wires.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420024769.2U CN203688600U (en) | 2014-01-15 | 2014-01-15 | Test clamp for multipath input/output circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420024769.2U CN203688600U (en) | 2014-01-15 | 2014-01-15 | Test clamp for multipath input/output circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203688600U true CN203688600U (en) | 2014-07-02 |
Family
ID=51010485
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420024769.2U Expired - Lifetime CN203688600U (en) | 2014-01-15 | 2014-01-15 | Test clamp for multipath input/output circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203688600U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792399A (en) * | 2014-01-15 | 2014-05-14 | 中科华核电技术研究院有限公司北京分公司 | Test clamp of multi-channel input-output circuit board |
-
2014
- 2014-01-15 CN CN201420024769.2U patent/CN203688600U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792399A (en) * | 2014-01-15 | 2014-05-14 | 中科华核电技术研究院有限公司北京分公司 | Test clamp of multi-channel input-output circuit board |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN202903935U (en) | A multifunctional portable line detector | |
| CN204291015U (en) | A kind of test macro of communication products | |
| CN103760388A (en) | Four-wire test fixture and test method thereof | |
| CN202994875U (en) | A multi-channel calibrating device | |
| CN203688599U (en) | Four-wire test fixture | |
| CN203688600U (en) | Test clamp for multipath input/output circuit board | |
| CN103792399A (en) | Test clamp of multi-channel input-output circuit board | |
| CN206609901U (en) | A kind of PCIE channel loss test tool | |
| US20120217977A1 (en) | Test apparatus for pci-e signals | |
| CN203275535U (en) | Testing device for dynamic characteristics of IGBT two-unit power device module | |
| CN105445598A (en) | Portable device for testing conduction or insulation of cable, and method | |
| CN205003212U (en) | 10kV handcart switch return circuit resistance test fastener | |
| CN203708319U (en) | Universal audio distribution frame test cord | |
| CN205643569U (en) | Device of test cell -phone card signal | |
| CN104764909A (en) | Convenient and fast chip testing base capable of being used for extremely-low temperature measuring | |
| CN211669544U (en) | Test system | |
| CN212255393U (en) | CNI test adaptation subassembly | |
| CN204576255U (en) | A kind of high frequency electric source controller test fixture | |
| CN207833264U (en) | A kind of adapter of universal airplane test equipment | |
| CN202975220U (en) | Universal wire and cable connector clip tester | |
| CN203037746U (en) | Test device used for double-unit 73mm power device module capacitor | |
| CN105652184A (en) | Hardware testing equipment of battery management system | |
| CN203595727U (en) | Test clamp of low voltage electric appliance switch | |
| CN206181379U (en) | Power amplifier AP testing arrangement and system | |
| CN208125876U (en) | A kind of triode Kelvin test suite |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140702 |
|
| CX01 | Expiry of patent term |