A kind of integrated electrical test integrated test system
Technical field
The present invention relates to a kind of integrated test system, especially relate to a kind of integrated electrical test integrated test system.
Background technology
Existing electrical test testing tool device all belongs to stand alone type, and each instrument can only be finished a certain test assignment.And the electrical test project is many, and tests such as insulation, no-load voltage ratio, straight resistance, dielectric loss, unloaded load loss and capacity are just arranged as transformer, and work such as its method of testing, wiring, points for attention and calibration contrast are very complicated.
For having simplified field wiring and test operation, make electrical test work clear, convenient, efficient, for the site test personnel provide succinct equipment, test apparatus, we have invented the integrated electrical test integrated test system of a cover.
Summary of the invention
The present invention solves the existing in prior technology technical matters; A kind of multiple test function that integrates is provided, has integrated multiple test function, and structurally can realize a kind of integrated electrical test integrated test system of the built-up pattern blocking of the Fast Installation of various test modules and dismounting.
Above-mentioned technical matters of the present invention is mainly solved by following technical proposals:
A kind of integrated electrical test integrated test system, it is characterized in that, comprise cpu chip, and the computing module that is connected with cpu chip respectively, display module, hyperchannel AD data conversion module and channel selecting module, described hyperchannel AD data conversion module also is connected with described channel selecting module, also is provided with harvester on the described channel selecting module.
In above-mentioned a kind of integrated electrical test integrated test system, described harvester comprises that the while is connected with described channel selecting module:
The no-load voltage ratio module that is used for the no-load voltage ratio signals collecting;
Be used for directly hindering the straight resistance module of signals collecting;
The voltage-withstand test module that is used for withstand voltage signals collecting;
The dielectric loss test module that is used for the dielectric loss signals collecting;
Be used for the idling that idling carries signals collecting and carry test module;
And the switch dynamic characteristic test module that is used for switch dynamic characteristic signals collecting.
Integrated the integrated of circuit that comprise of the present invention, not that the abridged armilla device simply superposes, be to no-load voltage ratio, straight resistance, withstand voltage, idling carries, integrated on the dynamic perfromance circuit theory of dielectric loss and switch, acquired signal is delivered to unified signal processing module after control is switched.
Described modularization capable of being combined comprises on all-in-one Fast Installation or dismantles some or a plurality of test modules, increases or reduce some or a plurality of test functions;
In above-mentioned a kind of integrated electrical test integrated test system; described no-load voltage ratio module comprises waveform generator, shaping amplifier, engine power, transformer, holding circuit and the system controller that links to each other successively, and described system controller is connected with described shaping amplifier.
In above-mentioned a kind of integrated electrical test integrated test system, described idling carries test module and comprises battery electric quantity detecting unit, first data acquisition unit, second data acquisition unit, the 3rd data acquisition unit and the inversion unit that is connected with cpu chip by above-mentioned channel selecting module simultaneously; This idling carries test module and also includes a storage battery that is connected with the battery electric quantity detecting unit with inversion unit respectively; Also be connected with charhing unit on the described storage battery; Be connected with a voltage switch unit on described first data acquisition unit, second data acquisition unit and the 3rd data acquisition unit simultaneously.
In above-mentioned a kind of integrated electrical test integrated test system, described switch dynamic characteristic test module comprises a sensor that is connected with cpu chip by channel selecting module.
Therefore, the present invention has following advantage: integrate multiple test function, integrate multiple test function, and structurally can realize the Fast Installation of various test modules and the built-up pattern blocking of dismounting.
Description of drawings
Accompanying drawing 1 is a kind of principle of work synoptic diagram of the present invention;
Accompanying drawing 2 is structural principle synoptic diagram of no-load voltage ratio module among the present invention;
Accompanying drawing 3 is structural principle synoptic diagram of straight resistance module among the present invention;
Accompanying drawing 4 is structural principle synoptic diagram of voltage-withstand test module among the present invention;
Accompanying drawing 5 is structural principle synoptic diagram of dielectric loss test module among the present invention;
Accompanying drawing 6 is structural principle synoptic diagram of hollow load testing module of the present invention;
Accompanying drawing 7 is structural principle synoptic diagram of switch dynamic characteristic test module among the present invention.
Embodiment
Below by embodiment, and in conjunction with the accompanying drawings, technical scheme of the present invention is described in further detail.
Embodiment:
Native system mainly comprises cpu chip, and the computing module that is connected with cpu chip respectively, display module, hyperchannel AD data conversion module and channel selecting module, described hyperchannel AD data conversion module also is connected with described channel selecting module, also is provided with harvester on the described channel selecting module.
Wherein harvester comprises that the while is connected with described channel selecting module:
1. the no-load voltage ratio module that is used for the no-load voltage ratio signals collecting:
The no-load voltage ratio module comprises waveform generator, shaping amplifier, engine power, transformer, holding circuit and the system controller that links to each other successively, and described system controller is connected with described shaping amplifier.
2. be used for directly hindering the straight resistance module of signals collecting:
3. the voltage-withstand test module that is used for withstand voltage signals collecting:
4. the dielectric loss test module that is used for the dielectric loss signals collecting:
5. be used for the idling that idling carries signals collecting and carry test module:
Idling carries test module and comprises battery electric quantity detecting unit, first data acquisition unit, second data acquisition unit, the 3rd data acquisition unit and the inversion unit that is connected with cpu chip by above-mentioned channel selecting module simultaneously; This idling carries test module and also includes a storage battery that is connected with the battery electric quantity detecting unit with inversion unit respectively; Also be connected with charhing unit on the described storage battery; Be connected with a voltage switch unit on described first data acquisition unit, second data acquisition unit and the 3rd data acquisition unit simultaneously.
6. and the switch dynamic characteristic test module that is used for switch dynamic characteristic signals collecting:
Switch dynamic characteristic test module comprises a sensor that is connected with cpu chip by channel selecting module.
Should be noted in the discussion above that in the present invention: 1, multiple test function can increase successively.2, integrated module adopts dsp chip at a high speed to Signal Processing.3. the signals collecting handover module increases short-circuit protection function.4. built-up pattern blocking, not only can be on all-in-one Fast Installation or dismantle some or a plurality of test modules, increase or reduce some or a plurality of test functions, also can be combined into new function between the module.
The present invention is in practice: during on-the-spot electrical test, only need to select the test module of needs according to this less important test inventory of doing, pack in the integrated electrical test integrated test system main frame, according to the disposable wiring of explanation, test successively according to the test inventory after carefully connecting the wire, and print corresponding test findings.Succinct efficient, clear thinking.
Test function selects control loop to adopt programmable logic controller (PLC) PLC to control the precision maneuver of each device and the interlocking between each module, and man-machine interface adopts touch-screen to carry out visualized operation, and is simple to operate, the operation interface close friend.Some demonstration amounts (voltage, electric current etc.) are sent back to PC to analog-to-digital conversion module and (as overvoltage protection, overcurrent protection etc.) are judged in the protection action; realize isolation electric between each electric pressure by devices such as relay and optocouplers, control system is reliable and stable.
Specific embodiment described herein only is that the present invention's spirit is illustrated.The technician of the technical field of the invention can make various modifications or replenishes or adopt similar mode to substitute described specific embodiment, but can't depart from spirit of the present invention or surmount the defined scope of appended claims.