200902986 九、發明說明： 【發明所屬之技術領域】 本發明侧於-觀針裝置，且更特定言之， 十板裝Γ若伟針於—單獨之殼體中、同時使該等二 '取小且目此取大程度地湘空間之探針裝置。 【先前技術】200902986 IX. Description of the Invention: [Technical Field of the Invention] The present invention is directed to a needle-observing device, and more specifically, a ten-plate mounting device is used in a separate housing while making the two The probe device that is small and has a large degree of space. [Prior Art]
-般而言’諸如_電晶體液晶顯示器（TFT_LCD)、電 不杰（PDP)或有機發光二_顯示器（〇L D f複數個單元，每—單元_少—電極。為確 ==) 置，藉由-電連接測試4^；包括複數個探針之電聯接裝 ，針典朗於電連接裝置巾，其分類為： 一¥電性絲好之金麟藉她 #中 一彈笠雜别甘仔列目铽之母一電極圖形相對應； 中每—探針A ’、："目‘之各個電極相對應;及插片型，其 母心針4M。無針雜針及該_ =針在於，其能適應，小=: H =#/使㈣，龍物難置揭= 早四寻利弟2525於號與第314586號中。 如此一探針裝置具有一内部結構與— :括—提供-圖像信號之圖像信號電極。為測試一成：=結3 :::衷置實施-_程。在酬試二;= 平頭電極之 =個平頭電極接觸’用以提供一電信號至該等 頭紐基於该電信號作用之結果，可續定該FPD正常與否。 200902986 口此田η亥FPD品質低劣時，則廢棄。 所述裝!實施如此—FPD測試，其包括如上 情形’ 一_咖*—峨裝置之賴針裝置中，如—般 ^彈性動1c之_電信賴㈣由利用一彈 接觸 =接—r--特定值(舉:隔 ‘下；珣、σ構之凌配應在5亥槽間隔、即該槽距保持不變之條 然而’該裝配製程中可能產生誤差。為此，可= 差精度相關之_ ’使得可能在精韻訊方面存在 -壁成該等槽之製程期間可能存在相鄰槽 探針該探針距非常鱗’存在之問題於在—殼體中固定所有 【發明内容】 中裝:二月之一目標係提供一種能使用針板在-單-殼體 H、〜情置’同時驗該等探針之間崎低至最小程 度，且因此最大程度地利用空間。 根據本發明’此目標藉由提供—探針裝置實現，該探針裝置 2 ·稷數個探針；一接收該等探針之及第一與第二針板， :針板具有複數個用於接收並固持該等探針中相關探針之槽， /、中》玄第針板之槽與該第二針板之槽彼此不對準。 【實施方式】 見 > 亥荨附圖洋細描述本發明之較佳具體實施例。 參照圖2a圖示說明根據本發明之一探針裝置10。該探針裝置 200902986 ίο包括複數個探針110、第一與第二針板120、13〇及一殼體14〇。 每一探針110包括一體1U、一自該體lu之一端垂直延伸之 垂直構件112及一自該體11丨之另一端水平延伸之水平構件U4。 接點113與115分別形成於該垂直構件112與該水平構件114之 大鈿。該接點113與一待測目標接觸，而該接點115與一探針卡 接觸。一對孔116貫穿該體ill形成。提供於該殼體140處之針 (未顯示）延伸穿過該等孔116,以耦合該探針110至該殼體14〇。 在每一探針110中，該垂直構件112在其一側表面開槽，用 以形成一槽117 ’該槽117在該垂直構件112之側表面具有一開口 端，如圖4所示。該接點113接觸該待測目標時，該槽117允許 該接點113水平移動，且因此防止該接點113在該目標上產生一 滑痕。該j曹117同樣增強該接點113之接觸力。較佳地，該槽117 之内知為形。根據此形狀，該槽117允許該接點113在該槽117 之寬度範圍内水平移動。 如圖2或圖3所示，每一第一針板12〇包括複數個形成於該 第一針板120前表面之槽122，使得其垂直延伸，同時在縱向上彼 此均勻間隔。如隨後所述，為耦合該等第二針板13〇之一相關針 板，該第一針板120同樣包括一形成於該第一針板12〇後表面之 耦合用凹槽124，使得其縱向延伸。 每一第二針板13〇包括複數個形成於該第二針板13〇下表面 之槽132 ’使得其水平延伸，同時彼此在縱向上均勻間隔。該第二 針板130同樣包括一形成於該第二針針13〇前表面之耦合用凸出 134，使得其縱向延伸。該耦合用凸出134與該耦合用凹槽124耦 合時’該等第一與第二針板120、130可搞合。 該殼體140包括分別形成於該支撐體143相對端之一支撐體 200902986 H3與若干垂直壁141。上部空間142財部空間i44分別於該支 撐體143之相對垂直側處界定於該殼體14〇内。一组 對準狀態接收於每-該等上、下部空間142巾。穿過該等垂直壁 H1形成若干針孔146。該殼體14〇之針（未顯示）能延伸穿過該 等針孔146。 下文將描述該等針U0之裝配。首先，該等第一與第二針板 120、130 _合’用以製備兩針板對，每—針板對包括一第一針 板120—與-第一針板130。該等針板對然後分別被佈置於該殼體 140之前下端與後上端。兩組探針11〇被佈置於該殼體刚之上、 了部空間142與144中，使得其彼此對稱。在此情況下，佈置於 该上部空間M2内之該探針組中之每一探針ιι〇之該垂直構件⑴ 铃水平t冓件114分職合至該下針板對之第—針板12(3與該上針 板對^二針板13〇。同樣’佈置於該下部空間144内之該探針組 ^之每-探針110之該垂直構件112與水平構件114分別揭合至 该上針板對之第—針板12G與該下針板對之第二針板⑽。因此， 精'屈地佈置探針於—單—殼體内是可能的。之後，利用該等針（未 顯不）’該等探針110完全耦合至該殼體140。 較佳地’佈置於該殼體140之上部空間142内之該等探針110 與佈置於該殼體14〇之下部空間144内之該等探針11〇不對準。 此可藉由該等第一與第二針板12〇 、130實現。 山舉例έ之’當假定在每一針板裝置中該第一針板12〇内一側 端至:亥第—槽122之距離為L，該第-針板120内該第-槽122 至該第—槽122’之距離（即該第一針板12〇之槽距）為a，該第 —針，130内一側端至第一槽132之距離為L，該第二針板130 内该第—槽132至該第二槽132,之距離（即該第二針板130之槽 200902986 距）為A’則藉由確定該第二針板13〇之距離L，等於—值（其藉 由自距離L與距離A之和中減去距離a之1/2而得到），從而使該 第一針板120之槽122與該第二針板13〇之槽132以不對準狀態 佈置成為可能’同時使該等第一與第二針板120、130之槽距相等^ 如“A”所指示。在此情況下，彼此相鄰佈置之該等第—與第二針板 120、130之槽之間的間隔等於該槽距之1/2。因此，獲得一更為精 細之探針間距成為可能。在此情況下，應瞭解該第 與該第二針板之一端彼此對準。 儘管已結合該具體實施·述了本剌，其中使用兩組第一 ，、第二針板將探針佈置於該殼體之上、下部空間内， 探針間距使其與該待測目標之每—接觸位置—致，亦可利用」 與第二針板其中之一使探針僅佈置於該上、下部空間其中之一 :上目標之接觸間距大時’可僅藉由利用佈置於該殼體 或下σ卩工間内之探針達到該測試製程。 例，月之目的已揭示本發明之該等較佳具體實施 所揭Γ精神與範圍情況下，可進行各種更改、添加與替^ 針於，根據本發明，使用針板裝配若干探 程度，且同時可使該等探針之_降至最小 且口此取大程度地利用空間。 距 干探：ί本發明’同樣可使用對稱佈置之第-與第二針板佈置若 之接 200902986 且增加該接點之接觸力。 【圖式簡單說明】 結合該等附圖閱讀以上之詳細描述後，本發明之上述目標、 其他特徵及優點將更為顯而易見，其中： 圖1為圖示說明根據本發明之一探針裝置之一戴面圖； 圖2為與圖1中之A部分對應之放大截面圖； 圖3為圖不說明圖2中所示之探針與針板之放大透視圖； 圖4為圖示說明圖3中所示之一探針之一部分之放大側視 圖；及 ® 5為-包括第-與第二針板之—針板襄置之仰視圖；圖示 說明形成於該等第一與第二針板處之槽之佈置。 【主要元件符號說明】 10 探針裝置 110 探針 111 體 112 垂直構件 113 接點 114 水平構件 115 接點 116 孔 117 槽 120 第一針板 122 第一槽 122’ 第二槽 124 耦合用凹槽 200902986 130 第二針板 132 第一槽 132’ 第二槽 134 耦合用凸出 140 殼體 141 垂直壁 142 上部空間 143 支撐體 144 下部空間- Generally speaking, 'such as _transistor liquid crystal display (TFT_LCD), electric non-excellent (PDP) or organic light-emitting two-display (〇 LD f multiple units, each - unit _ less - electrode. = = =), By electric connection test 4^; including a plurality of probes of the electrical connection, the needle is written in the electrical connection device towel, which is classified as: a ¥ electric wire is good, Jin Lin borrows her #中一弹笠别别The mother electrode of the Ganzi column is corresponding to the electrode pattern; each electrode of the probe A ', :" mesh' corresponds; and the insert type, the mother pin 4M. Needle-free needles and the _ = needles, it can adapt, small =: H = # / make (four), dragons difficult to expose = early four find Lidi 2525 in the number and No. 314586. Such a probe device has an internal structure and an image signal electrode that includes - provides - an image signal. For the test of one: = knot 3 ::: sincere implementation - _ process. In the second test; = flat electrode = flat electrode contact 'to provide an electrical signal to the head based on the effect of the electrical signal, the FPD can be continued. 200902986 When the quality of this field ηhai FPD is inferior, it is discarded. The installation implements such an FPD test, which includes the above-mentioned situation of a 'a coffee*' device, such as - a flexible movement 1c _ electrical trust (four) by the use of a bomb contact = connected - r- - a specific value (lifting: under the 'under; 珣, σ 之 之 配 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 Related _ 'make it possible to exist in the fine rhyme - during the process of forming the slots, there may be problems with the adjacent slot probes, the probes are very scaly, and all of them are fixed in the housing." Medium: One of the targets in February provides a way to use the needle plate in the - single-shell H, ~ situational 'simultaneously, to detect the minimum between the probes, and thus maximize the use of space. Invention 'This object is achieved by providing a probe device 2, a plurality of probes; and receiving the probes and the first and second needle plates: the needle plate has a plurality of pins for receiving And holding the groove of the relevant probe in the probes, /, the groove of the middle needle plate and the second needle The slots are not aligned with each other. [Embodiment] See the detailed description of the preferred embodiment of the present invention. Referring to Figure 2a, a probe device 10 according to the present invention is illustrated. The probe device 200902986 The ίο includes a plurality of probes 110, first and second needle plates 120, 13A and a casing 14A. Each probe 110 includes an integral 1U, a vertical member 112 extending perpendicularly from one end of the body lu, and a a horizontal member U4 extending horizontally from the other end of the body 11. The contacts 113 and 115 are respectively formed on the vertical member 112 and the horizontal member 114. The contact 113 is in contact with a target to be tested, and the connection is A point 115 is in contact with a probe card. A pair of holes 116 are formed through the body ill. A needle (not shown) provided at the housing 140 extends through the holes 116 to couple the probe 110 to the housing. In each of the probes 110, the vertical member 112 is grooved on one side surface thereof to form a groove 117. The groove 117 has an open end on the side surface of the vertical member 112, as shown in FIG. The slot 117 allows the contact 113 to move horizontally when the contact 113 contacts the target to be tested. And thus preventing the contact 113 from creating a slip on the target. The j 117 also enhances the contact force of the contact 113. Preferably, the groove 117 is shaped as a shape. According to the shape, the groove 117 allows the contact 113 to move horizontally within the width of the slot 117. As shown in Figure 2 or Figure 3, each of the first needle plates 12A includes a plurality of slots 122 formed in the front surface of the first needle plate 120. , such that they extend vertically while being evenly spaced from each other in the longitudinal direction. As will be described later, in order to couple the associated needle plate of one of the second needle plates 13 , the first needle plate 120 also includes a first needle formed thereon. The coupling groove 124 of the rear surface of the plate 12 is such that it extends longitudinally. Each of the second needle plates 13A includes a plurality of grooves 132' formed on the lower surface of the second needle plate 13 such that they extend horizontally while being evenly spaced from each other in the longitudinal direction. The second needle plate 130 also includes a coupling projection 134 formed on the front surface of the second needle 13 so as to extend longitudinally. When the coupling projection 134 is coupled to the coupling recess 124, the first and second needle plates 120, 130 can be engaged. The housing 140 includes a support body 200902986 H3 and a plurality of vertical walls 141 formed at opposite ends of the support body 143, respectively. The upper space 142, the fiscal space i44, is defined in the casing 14〇 at the opposite vertical sides of the support body 143, respectively. A set of alignment states is received in each of the upper and lower spaces 142. A plurality of pinholes 146 are formed through the vertical walls H1. The housing 14 has a pin (not shown) extending through the pin holes 146. The assembly of the pins U0 will be described below. First, the first and second needle plates 120, 130 are combined to form a pair of needle plates, each of which includes a first needle plate 120 - and a first needle plate 130. The pair of needle plates are then respectively disposed at the lower end and the rear upper end of the housing 140. Two sets of probes 11 are disposed just above the housing, in the spaces 142 and 144, such that they are symmetrical to each other. In this case, the vertical member (1) of the probe member disposed in the upper space M2 is equal to the first needle plate of the lower needle plate pair. 12 (3) and the upper needle plate pair 2 pin plate 13A. Similarly, the vertical member 112 and the horizontal member 114 of each probe 110 of the probe set disposed in the lower space 144 are respectively exposed to The upper needle plate pair of the first needle plate 12G and the lower needle plate pair of the second needle plate (10). Therefore, it is possible to arrange the probes in the single-shell. After that, the needles are used. (not shown) 'The probes 110 are fully coupled to the housing 140. Preferably, the probes 110 disposed in the upper space 142 of the housing 140 are disposed below the housing 14 The probes 11 in the space 144 are misaligned. This can be achieved by the first and second needle plates 12, 130. The example of the mountain is assumed to be the first needle in each needle plate device. The inner end of the plate 12 is at a distance L from the first hole 122, and the distance from the first groove 122 to the first groove 122' in the first needle plate 120 (ie, the first needle plate 12) Slot distance a, the distance from the one end of the first needle 130 to the first groove 132 is L, and the distance between the first groove 132 and the second groove 132 in the second needle plate 130 (ie, the second needle) The slot 130902986 of the plate 130 is A', and the distance L of the second needle plate 13〇 is determined to be equal to the value (which is obtained by subtracting 1/2 of the distance a from the sum of the distance L and the distance A). Obtaining, so that the groove 122 of the first needle plate 120 and the groove 132 of the second needle plate 13 are arranged in a misaligned state, while making the groove distance of the first and second needle plates 120, 130 Equivalent ^ as indicated by "A". In this case, the interval between the first and second slots 120, 130 arranged adjacent to each other is equal to 1/2 of the slot pitch. A finer probe pitch is possible. In this case, it should be understood that the first end of the second needle plate is aligned with each other. Although the present invention has been described in connection with the specific implementation, in which two sets of first are used, The second needle plate arranges the probe on the upper and lower spaces of the casing, and the probe spacing is made to be in contact with the target to be tested, and may also be utilized. And one of the second needle plates allows the probe to be disposed only in one of the upper and lower spaces: when the contact distance of the upper target is large, 'only by using the housing or the lower σ 卩 之The probe has reached the test process. For example, the purpose of the present invention is to disclose various modifications, additions and substitutions in accordance with the spirit and scope of the preferred embodiments of the present invention. The board is assembled with a certain degree of probing, and at the same time, the _ of the probes can be minimized and the space can be utilized to a large extent. Detecting: ί The invention can also use the symmetrical arrangement of the first and second needle plates Arrange the connection to 200902986 and increase the contact force of the contact. BRIEF DESCRIPTION OF THE DRAWINGS The above-described objects, other features and advantages of the present invention will become more apparent from the aspects of the appended claims. Figure 2 is an enlarged cross-sectional view corresponding to the portion A of Figure 1; Figure 3 is an enlarged perspective view of the probe and the needle plate shown in Figure 2; Figure 4 is an explanatory view An enlarged side view of a portion of one of the probes shown in FIG. 3; and a 5 is - a bottom view of the needle plate including the first and second needle plates; the illustration is formed in the first and second The arrangement of the slots at the needle plate. [Main component symbol description] 10 Probe device 110 Probe 111 Body 112 Vertical member 113 Contact 114 Horizontal member 115 Contact 116 Hole 117 Slot 120 First needle plate 122 First groove 122' Second groove 124 Coupling groove 200902986 130 Second needle plate 132 First groove 132' Second groove 134 Coupling projection 140 Housing 141 Vertical wall 142 Upper space 143 Support body 144 Lower space