TWI339731B - Probe assembly - Google Patents

Probe assembly

Info

Publication number
TWI339731B
TWI339731B TW096135245A TW96135245A TWI339731B TW I339731 B TWI339731 B TW I339731B TW 096135245 A TW096135245 A TW 096135245A TW 96135245 A TW96135245 A TW 96135245A TW I339731 B TWI339731 B TW I339731B
Authority
TW
Taiwan
Prior art keywords
probe assembly
probe
assembly
Prior art date
Application number
TW096135245A
Other languages
Chinese (zh)
Other versions
TW200902986A (en
Inventor
Ju-Young Park
Original Assignee
Kodi S Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kodi S Co Ltd filed Critical Kodi S Co Ltd
Publication of TW200902986A publication Critical patent/TW200902986A/en
Application granted granted Critical
Publication of TWI339731B publication Critical patent/TWI339731B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
TW096135245A 2007-07-11 2007-09-21 Probe assembly TWI339731B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020070069757A KR100897494B1 (en) 2007-07-11 2007-07-11 Probe Pin Assembly of Probe Unit

Publications (2)

Publication Number Publication Date
TW200902986A TW200902986A (en) 2009-01-16
TWI339731B true TWI339731B (en) 2011-04-01

Family

ID=40487643

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096135245A TWI339731B (en) 2007-07-11 2007-09-21 Probe assembly

Country Status (2)

Country Link
KR (1) KR100897494B1 (en)
TW (1) TWI339731B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101158763B1 (en) * 2010-10-19 2012-06-22 주식회사 코디에스 Blade type probe block

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100610889B1 (en) * 2005-10-10 2006-08-08 (주)엠씨티코리아 Probe unit for a flat display panel having fine pitch-pattern

Also Published As

Publication number Publication date
KR100897494B1 (en) 2009-05-15
KR20090006427A (en) 2009-01-15
TW200902986A (en) 2009-01-16

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