TW200849437A - High-speed testing device - Google Patents

High-speed testing device Download PDF

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Publication number
TW200849437A
TW200849437A TW96120184A TW96120184A TW200849437A TW 200849437 A TW200849437 A TW 200849437A TW 96120184 A TW96120184 A TW 96120184A TW 96120184 A TW96120184 A TW 96120184A TW 200849437 A TW200849437 A TW 200849437A
Authority
TW
Taiwan
Prior art keywords
probe
test
support frame
item
support
Prior art date
Application number
TW96120184A
Other languages
English (en)
Chinese (zh)
Other versions
TWI353031B (enExample
Inventor
wei-zheng Gu
zhi-hao He
he-hui Lin
de-cheng Feng
Jun-Liang Lai
jia-qi He
Original Assignee
Microelectonics Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microelectonics Technology Inc filed Critical Microelectonics Technology Inc
Priority to TW96120184A priority Critical patent/TW200849437A/zh
Priority to US12/133,249 priority patent/US7782070B2/en
Priority to KR1020080052519A priority patent/KR100965923B1/ko
Publication of TW200849437A publication Critical patent/TW200849437A/zh
Application granted granted Critical
Publication of TWI353031B publication Critical patent/TWI353031B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW96120184A 2007-06-05 2007-06-05 High-speed testing device TW200849437A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW96120184A TW200849437A (en) 2007-06-05 2007-06-05 High-speed testing device
US12/133,249 US7782070B2 (en) 2007-06-05 2008-06-04 Probing device
KR1020080052519A KR100965923B1 (ko) 2007-06-05 2008-06-04 프로브 테스트 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96120184A TW200849437A (en) 2007-06-05 2007-06-05 High-speed testing device

Publications (2)

Publication Number Publication Date
TW200849437A true TW200849437A (en) 2008-12-16
TWI353031B TWI353031B (enExample) 2011-11-21

Family

ID=44824156

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96120184A TW200849437A (en) 2007-06-05 2007-06-05 High-speed testing device

Country Status (1)

Country Link
TW (1) TW200849437A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI415204B (zh) * 2010-04-28 2013-11-11 Wen Chyimr Chen 測試板

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI415204B (zh) * 2010-04-28 2013-11-11 Wen Chyimr Chen 測試板

Also Published As

Publication number Publication date
TWI353031B (enExample) 2011-11-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees