TW200802383A - Reduction of leakage current and program disturbs in flash memory devices - Google Patents

Reduction of leakage current and program disturbs in flash memory devices

Info

Publication number
TW200802383A
TW200802383A TW096111975A TW96111975A TW200802383A TW 200802383 A TW200802383 A TW 200802383A TW 096111975 A TW096111975 A TW 096111975A TW 96111975 A TW96111975 A TW 96111975A TW 200802383 A TW200802383 A TW 200802383A
Authority
TW
Taiwan
Prior art keywords
leakage current
bias voltage
flash memory
target
substrate bias
Prior art date
Application number
TW096111975A
Other languages
English (en)
Other versions
TWI355662B (en
Inventor
Kuo-Tung Chang
Timothy Thurgate
Original Assignee
Spansion Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Spansion Llc filed Critical Spansion Llc
Publication of TW200802383A publication Critical patent/TW200802383A/zh
Application granted granted Critical
Publication of TWI355662B publication Critical patent/TWI355662B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
    • G11C16/0475—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS] comprising two or more independent storage sites which store independent data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3404—Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
    • G11C16/3409—Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427—Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
    • G11C16/3445—Circuits or methods to verify correct erasure of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/021—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in voltage or current generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • G11C5/146—Substrate bias generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0491—Virtual ground arrays

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Read Only Memory (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
TW096111975A 2006-04-05 2007-04-04 Reduction of leakage current and program disturbs TWI355662B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/398,414 US7489560B2 (en) 2006-04-05 2006-04-05 Reduction of leakage current and program disturbs in flash memory devices

Publications (2)

Publication Number Publication Date
TW200802383A true TW200802383A (en) 2008-01-01
TWI355662B TWI355662B (en) 2012-01-01

Family

ID=38581643

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111975A TWI355662B (en) 2006-04-05 2007-04-04 Reduction of leakage current and program disturbs

Country Status (6)

Country Link
US (1) US7489560B2 (zh)
JP (1) JP2009532820A (zh)
KR (1) KR101345318B1 (zh)
CN (2) CN101432822B (zh)
TW (1) TWI355662B (zh)
WO (1) WO2007117598A2 (zh)

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Publication number Priority date Publication date Assignee Title
JP2007172718A (ja) * 2005-12-20 2007-07-05 Samsung Electronics Co Ltd 不揮発性半導体記憶装置
US7468920B2 (en) 2006-12-30 2008-12-23 Sandisk Corporation Applying adaptive body bias to non-volatile storage
KR100818717B1 (ko) * 2007-01-18 2008-04-02 삼성전자주식회사 비휘발성 반도체 메모리 장치 및 상기 비휘발성 반도체메모리 장치의 프로그램 방법
US7916551B2 (en) * 2007-11-06 2011-03-29 Macronix International Co., Ltd. Method of programming cell in memory and memory apparatus utilizing the method
US7944747B2 (en) * 2008-03-17 2011-05-17 Samsung Electronics Co., Ltd. Flash memory device and method for programming flash memory device having leakage bit lines
KR101360138B1 (ko) 2008-03-17 2014-02-07 삼성전자주식회사 메모리 시스템 및 그것의 동작 방법
JP5143655B2 (ja) * 2008-07-22 2013-02-13 スパンション エルエルシー 半導体装置へのデータ書き込み方法、半導体装置
US8482987B2 (en) 2010-09-02 2013-07-09 Macronix International Co., Ltd. Method and apparatus for the erase suspend operation
CN103345934B (zh) * 2013-06-03 2016-12-28 上海华虹宏力半导体制造有限公司 控制栅极电压译码电路
US10825529B2 (en) 2014-08-08 2020-11-03 Macronix International Co., Ltd. Low latency memory erase suspend operation
FR3031832B1 (fr) * 2015-01-15 2017-02-03 Commissariat Energie Atomique Systeme de caracterisation d'une cellule memoire flash

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5487033A (en) * 1994-06-28 1996-01-23 Intel Corporation Structure and method for low current programming of flash EEPROMS
JPH113595A (ja) * 1997-06-13 1999-01-06 Sharp Corp 不揮発性半導体記憶装置
US5912845A (en) 1997-09-10 1999-06-15 Macronix International Co., Ltd. Method and circuit for substrate current induced hot e- injection (SCIHE) approach for VT convergence at low VCC voltage
US6009017A (en) * 1998-03-13 1999-12-28 Macronix International Co., Ltd. Floating gate memory with substrate band-to-band tunneling induced hot electron injection
US6147907A (en) 1999-10-29 2000-11-14 Advanced Micro Devices, Inc. Biasing scheme to reduce stress on non-selected cells during read
US6456533B1 (en) 2001-02-28 2002-09-24 Advanced Micro Devices, Inc. Higher program VT and faster programming rates based on improved erase methods
US6493266B1 (en) 2001-04-09 2002-12-10 Advanced Micro Devices, Inc. Soft program and soft program verify of the core cells in flash memory array
US6510085B1 (en) 2001-05-18 2003-01-21 Advanced Micro Devices, Inc. Method of channel hot electron programming for short channel NOR flash arrays
JP2003132683A (ja) 2001-10-23 2003-05-09 Hitachi Ltd 半導体装置
US7113430B2 (en) * 2002-05-31 2006-09-26 Freescale Semiconductor, Inc. Device for reducing sub-threshold leakage current within a high voltage driver
US6956768B2 (en) 2003-04-15 2005-10-18 Advanced Micro Devices, Inc. Method of programming dual cell memory device to store multiple data states per cell
US6868014B1 (en) 2003-05-06 2005-03-15 Advanced Micro Devices, Inc. Memory device with reduced operating voltage having dielectric stack
US6862221B1 (en) 2003-06-11 2005-03-01 Advanced Micro Devices, Inc. Memory device having a thin top dielectric and method of erasing same
JP2006040495A (ja) 2004-07-30 2006-02-09 Renesas Technology Corp 半導体集積回路装置

Also Published As

Publication number Publication date
CN101432822B (zh) 2013-10-16
WO2007117598A3 (en) 2008-01-10
US20070247907A1 (en) 2007-10-25
CN103474091A (zh) 2013-12-25
CN101432822A (zh) 2009-05-13
US7489560B2 (en) 2009-02-10
WO2007117598A2 (en) 2007-10-18
KR20090007400A (ko) 2009-01-16
KR101345318B1 (ko) 2013-12-27
CN103474091B (zh) 2016-05-04
TWI355662B (en) 2012-01-01
JP2009532820A (ja) 2009-09-10

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