TW200742504A - Surface processing apparatus - Google Patents
Surface processing apparatusInfo
- Publication number
- TW200742504A TW200742504A TW096110567A TW96110567A TW200742504A TW 200742504 A TW200742504 A TW 200742504A TW 096110567 A TW096110567 A TW 096110567A TW 96110567 A TW96110567 A TW 96110567A TW 200742504 A TW200742504 A TW 200742504A
- Authority
- TW
- Taiwan
- Prior art keywords
- units
- processing apparatus
- surface processing
- subject
- processed
- Prior art date
Links
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4404—Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
- H01J37/32825—Working under atmospheric pressure or higher
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32752—Means for moving the material to be treated for moving the material across the discharge
- H01J37/32761—Continuous moving
- H01J37/3277—Continuous moving of continuous material
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Plasma Technology (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
Abstract
[PROBLEMS] To process a surface by a simple constitution even when a subject to be processed is large. [MEANS FOR SOLVING PROBLEMS] A processing head (10) of a surface processing apparatus (1) is composed of a first unit (11L) and a second unit (11R). On these units (11), a hole row (34) for jetting out a processing gas is extended in a first direction. The first direction orthogonally intersects with a second direction wherein the subject to be processed is moved. The two units (11) are arranged by being shifted in the first direction and the second direction. The hole rows (34) of the two units (11) are overlapped when viewed from the second direction.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006087989 | 2006-03-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200742504A true TW200742504A (en) | 2007-11-01 |
TWI380742B TWI380742B (en) | 2012-12-21 |
Family
ID=38541168
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096110567A TW200742504A (en) | 2006-03-28 | 2007-03-27 | Surface processing apparatus |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5162448B2 (en) |
KR (1) | KR101078506B1 (en) |
CN (1) | CN101405845B (en) |
TW (1) | TW200742504A (en) |
WO (1) | WO2007111251A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102437002B (en) * | 2011-11-29 | 2015-12-09 | 中国科学院微电子研究所 | A kind of even gas dish for air intake structure |
JP6414784B2 (en) * | 2016-06-02 | 2018-10-31 | 香川県 | Electrode for atmospheric pressure plasma generation, atmospheric pressure plasma generator, method for producing surface modified substrate, and method for producing reusable electrode |
JP7215305B2 (en) * | 2019-04-04 | 2023-01-31 | 日本電産株式会社 | JIG FOR PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING SYSTEM |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004283773A (en) * | 2003-03-24 | 2004-10-14 | Seiko Epson Corp | Surface treatment apparatus and surface treatment method |
JP4427974B2 (en) * | 2003-06-12 | 2010-03-10 | コニカミノルタホールディングス株式会社 | Thin film forming method, thin film forming apparatus, and highly functional thin film |
JP4331117B2 (en) * | 2003-07-23 | 2009-09-16 | 積水化学工業株式会社 | Electrode structure of plasma processing equipment |
-
2007
- 2007-03-23 KR KR1020087022104A patent/KR101078506B1/en active IP Right Grant
- 2007-03-23 WO PCT/JP2007/056018 patent/WO2007111251A1/en active Application Filing
- 2007-03-23 CN CN2007800103453A patent/CN101405845B/en active Active
- 2007-03-23 JP JP2008507465A patent/JP5162448B2/en active Active
- 2007-03-27 TW TW096110567A patent/TW200742504A/en unknown
Also Published As
Publication number | Publication date |
---|---|
JP5162448B2 (en) | 2013-03-13 |
CN101405845A (en) | 2009-04-08 |
WO2007111251A1 (en) | 2007-10-04 |
JPWO2007111251A1 (en) | 2009-08-13 |
CN101405845B (en) | 2010-11-03 |
KR20080094817A (en) | 2008-10-24 |
TWI380742B (en) | 2012-12-21 |
KR101078506B1 (en) | 2011-10-31 |
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