TW200741749A - Method for fabricating superconductive film meterial, superconductive machine and superconductive film material - Google Patents

Method for fabricating superconductive film meterial, superconductive machine and superconductive film material

Info

Publication number
TW200741749A
TW200741749A TW096104050A TW96104050A TW200741749A TW 200741749 A TW200741749 A TW 200741749A TW 096104050 A TW096104050 A TW 096104050A TW 96104050 A TW96104050 A TW 96104050A TW 200741749 A TW200741749 A TW 200741749A
Authority
TW
Taiwan
Prior art keywords
superconductive
layer
fabricating
type
meterial
Prior art date
Application number
TW096104050A
Other languages
English (en)
Inventor
Shuji Hahakura
Kazuya Ohmatsu
Munetsugu Ueyama
Katsuya Hasegawa
Original Assignee
Sumitomo Electric Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries filed Critical Sumitomo Electric Industries
Publication of TW200741749A publication Critical patent/TW200741749A/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/01—Manufacture or treatment
    • H10N60/0268—Manufacture or treatment of devices comprising copper oxide
    • H10N60/0296—Processes for depositing or forming copper oxide superconductor layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00—Liquid-phase epitaxial-layer growth
    • C30B19/02—Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
    • C30B23/02—Epitaxial-layer growth
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10—Inorganic compounds or compositions
    • C30B29/16—Oxides
    • C30B29/22—Complex oxides
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10—Inorganic compounds or compositions
    • C30B29/16—Oxides
    • C30B29/22—Complex oxides
    • C30B29/225—Complex oxides based on rare earth copper oxides, e.g. high T-superconductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B12/00—Superconductive or hyperconductive conductors, cables, or transmission lines
    • H01B12/02—Superconductive or hyperconductive conductors, cables, or transmission lines characterised by their form
    • H01B12/06—Films or wires on bases or cores
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F6/00—Superconducting magnets; Superconducting coils
    • H01F6/06—Coils, e.g. winding, insulating, terminating or casing arrangements therefor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/01—Manufacture or treatment
    • H10N60/0268—Manufacture or treatment of devices comprising copper oxide
    • H10N60/0296—Processes for depositing or forming copper oxide superconductor layers
    • H10N60/0324—Processes for depositing or forming copper oxide superconductor layers from a solution
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/01—Manufacture or treatment
    • H10N60/0268—Manufacture or treatment of devices comprising copper oxide
    • H10N60/0296—Processes for depositing or forming copper oxide superconductor layers
    • H10N60/0521—Processes for depositing or forming copper oxide superconductor layers by pulsed laser deposition, e.g. laser sputtering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Inorganic Compounds Of Heavy Metals (AREA)
TW096104050A 2006-02-16 2007-02-05 Method for fabricating superconductive film meterial, superconductive machine and superconductive film material TW200741749A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006039395A JP2007220467A (ja) 2006-02-16 2006-02-16 超電導薄膜材料の製造方法、超電導機器、および超電導薄膜材料

Publications (1)

Publication Number Publication Date
TW200741749A true TW200741749A (en) 2007-11-01

Family

ID=38371334

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096104050A TW200741749A (en) 2006-02-16 2007-02-05 Method for fabricating superconductive film meterial, superconductive machine and superconductive film material

Country Status (11)

Country Link
US (1) US8216979B2 (zh)
EP (1) EP1990809B1 (zh)
JP (1) JP2007220467A (zh)
KR (1) KR101289999B1 (zh)
CN (1) CN101385096A (zh)
AU (1) AU2007216115A1 (zh)
CA (1) CA2641902A1 (zh)
NO (1) NO20083913L (zh)
RU (1) RU2399106C2 (zh)
TW (1) TW200741749A (zh)
WO (1) WO2007094146A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8153281B2 (en) * 2003-06-23 2012-04-10 Superpower, Inc. Metalorganic chemical vapor deposition (MOCVD) process and apparatus to produce multi-layer high-temperature superconducting (HTS) coated tape
JP4690246B2 (ja) * 2006-05-19 2011-06-01 住友電気工業株式会社 超電導薄膜材料およびその製造方法
JP2010040962A (ja) * 2008-08-08 2010-02-18 Sumitomo Electric Ind Ltd 超電導コイル
US9362477B2 (en) 2010-02-05 2016-06-07 Sunam Co., Ltd. Method of forming ceramic wire, system of forming the same, and superconductor wire using the same
DE102010038656A1 (de) * 2010-07-29 2012-02-02 THEVA DüNNSCHICHTTECHNIK GMBH Hochtemperatur-Supraleiter-Bandleiter mit hoher kritischer Stromtragfähigkeit
JP5838596B2 (ja) 2011-05-30 2016-01-06 住友電気工業株式会社 超電導薄膜材料およびその製造方法
DE102012223366A1 (de) * 2012-12-17 2014-06-18 Siemens Aktiengesellschaft Supraleitende Spuleneinrichtung mit Spulenwicklung und Kontakten
CN103367626B (zh) * 2013-07-02 2015-08-12 西北有色金属研究院 一种涂层导体超导膜及其制备方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2032765C1 (ru) 1987-04-03 1995-04-10 Фудзицу Лимитед Способ нанесения алмазного покрытия из паровой фазы и устройство для его осуществления
JPH01100815A (ja) 1987-10-14 1989-04-19 Fujikura Ltd 高温超電導材
RU2043981C1 (ru) 1992-10-19 1995-09-20 Физико-технический институт им.А.Ф.Иоффе РАН Керамический материал
KR20000076104A (ko) 1997-03-25 2000-12-26 노르딕 슈퍼콘덕터 테크놀로지스 에이/에스 초전도체의 코팅방법
RU2133525C1 (ru) 1997-10-21 1999-07-20 Омский государственный университет Сверхпроводящий квантовый интерференционный датчик и способ его изготовления
US6743533B1 (en) * 1999-04-15 2004-06-01 Fujikura Ltd. Oxide superconductor, manufacturing method thereof, and base substrate therefor
JP2002063815A (ja) * 2000-08-15 2002-02-28 Fujikura Ltd 酸化物超電導導体とその製造方法
JP4433589B2 (ja) * 2000-08-29 2010-03-17 住友電気工業株式会社 高温超電導厚膜部材およびその製造方法
JP3407733B2 (ja) 2000-12-13 2003-05-19 住友電気工業株式会社 無機固体電解質薄膜の形成方法
JP2003324167A (ja) * 2002-02-26 2003-11-14 Kyocera Corp セラミック回路基板
JP4082080B2 (ja) 2002-05-02 2008-04-30 住友電気工業株式会社 薄膜超電導線材およびその製造方法
JP4012772B2 (ja) 2002-07-03 2007-11-21 株式会社フジクラ 酸化物超電導体テープ線材
JP4626134B2 (ja) * 2003-09-17 2011-02-02 住友電気工業株式会社 超電導体およびその製造方法
JP4690246B2 (ja) * 2006-05-19 2011-06-01 住友電気工業株式会社 超電導薄膜材料およびその製造方法

Also Published As

Publication number Publication date
US8216979B2 (en) 2012-07-10
NO20083913L (no) 2008-09-12
CA2641902A1 (en) 2007-08-23
RU2399106C2 (ru) 2010-09-10
EP1990809A1 (en) 2008-11-12
JP2007220467A (ja) 2007-08-30
CN101385096A (zh) 2009-03-11
US20090239753A1 (en) 2009-09-24
AU2007216115A1 (en) 2007-08-23
EP1990809A4 (en) 2012-08-01
KR20080103558A (ko) 2008-11-27
RU2008137076A (ru) 2010-03-27
WO2007094146A1 (ja) 2007-08-23
EP1990809B1 (en) 2013-07-17
KR101289999B1 (ko) 2013-07-30

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