TW200730832A - Probe pin - Google Patents

Probe pin

Info

Publication number
TW200730832A
TW200730832A TW095149407A TW95149407A TW200730832A TW 200730832 A TW200730832 A TW 200730832A TW 095149407 A TW095149407 A TW 095149407A TW 95149407 A TW95149407 A TW 95149407A TW 200730832 A TW200730832 A TW 200730832A
Authority
TW
Taiwan
Prior art keywords
probe pin
plunger
center layer
tip
test object
Prior art date
Application number
TW095149407A
Other languages
English (en)
Chinese (zh)
Inventor
Toshio Kazama
Koji Ishikawa
Hiroyasu Sotoma
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200730832A publication Critical patent/TW200730832A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
TW095149407A 2005-12-28 2006-12-28 Probe pin TW200730832A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005380377A JP4907171B2 (ja) 2005-12-28 2005-12-28 プローブピン

Publications (1)

Publication Number Publication Date
TW200730832A true TW200730832A (en) 2007-08-16

Family

ID=38217984

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095149407A TW200730832A (en) 2005-12-28 2006-12-28 Probe pin

Country Status (3)

Country Link
JP (1) JP4907171B2 (ja)
TW (1) TW200730832A (ja)
WO (1) WO2007074764A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI426274B (zh) * 2010-06-30 2014-02-11 Leeno Ind Inc 探針
CN104755943A (zh) * 2012-12-04 2015-07-01 日本电子材料株式会社 电接触构件

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4900843B2 (ja) 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
KR101064852B1 (ko) 2010-05-24 2011-09-14 김재길 프로브 카드용 니들
KR101439342B1 (ko) 2013-04-18 2014-09-16 주식회사 아이에스시 포고핀용 탐침부재
TWI555987B (zh) 2014-01-28 2016-11-01 Spring sleeve type probe and its manufacturing method
KR101492242B1 (ko) * 2014-07-17 2015-02-13 주식회사 아이에스시 검사용 접촉장치 및 전기적 검사소켓
JP6084591B2 (ja) * 2014-08-05 2017-02-22 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． ポゴピン用プローブ部材

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3979478B2 (ja) * 1998-05-01 2007-09-19 株式会社エンプラス コンタクトピン及びこのコンタクトピンを用いた電気部品用ソケット
JP3768183B2 (ja) * 2002-10-28 2006-04-19 山一電機株式会社 狭ピッチｉｃパッケージ用ｉｃソケット
KR100573089B1 (ko) * 2003-03-17 2006-04-24 주식회사 파이컴 프로브 및 그 제조방법
JP4101773B2 (ja) * 2004-02-09 2008-06-18 山一電機株式会社 Ｉｃソケット

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI426274B (zh) * 2010-06-30 2014-02-11 Leeno Ind Inc 探針
US9128120B2 (en) 2010-06-30 2015-09-08 Leeno Industrial Inc. Probe
CN104755943A (zh) * 2012-12-04 2015-07-01 日本电子材料株式会社 电接触构件
CN104755943B (zh) * 2012-12-04 2018-04-27 日本电子材料株式会社 电接触构件
CN108333394A (zh) * 2012-12-04 2018-07-27 日本电子材料株式会社 接触探针
CN108333394B (zh) * 2012-12-04 2020-06-09 日本电子材料株式会社 接触探针

Also Published As

Publication number Publication date
JP2007178403A (ja) 2007-07-12
WO2007074764A1 (ja) 2007-07-05
JP4907171B2 (ja) 2012-03-28

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