TW200730832A - Probe pin - Google Patents

Probe pin

Info

Publication number
TW200730832A
TW200730832A TW095149407A TW95149407A TW200730832A TW 200730832 A TW200730832 A TW 200730832A TW 095149407 A TW095149407 A TW 095149407A TW 95149407 A TW95149407 A TW 95149407A TW 200730832 A TW200730832 A TW 200730832A
Authority
TW
Taiwan
Prior art keywords
probe pin
plunger
center layer
tip
test object
Prior art date
Application number
TW095149407A
Other languages
Chinese (zh)
Inventor
Toshio Kazama
Koji Ishikawa
Hiroyasu Sotoma
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200730832A publication Critical patent/TW200730832A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The purpose of the present invention is to suppress the increase of resistance in a probe pin and to promote the life of a probe pin even in the case that the tip of a probe pin has been worn due to the repeated contact with the test object. In order to accomplish the purpose, the probe pin consists of a plunger 1 of multi-layered flat sheet, a plunger 2 and a coil spring 3, the plunger 1 has a flat center layer 11 being in generally band shape of which the tip of the side for contacting the test object is formed a wedge, and a support layer 12 formed by a generally band shape plate to at least one side of the center layer 11 so as to reinforce the center layer 11.
TW095149407A 2005-12-28 2006-12-28 Probe pin TW200730832A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005380377A JP4907171B2 (en) 2005-12-28 2005-12-28 Probe pin

Publications (1)

Publication Number Publication Date
TW200730832A true TW200730832A (en) 2007-08-16

Family

ID=38217984

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095149407A TW200730832A (en) 2005-12-28 2006-12-28 Probe pin

Country Status (3)

Country Link
JP (1) JP4907171B2 (en)
TW (1) TW200730832A (en)
WO (1) WO2007074764A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI426274B (en) * 2010-06-30 2014-02-11 Leeno Ind Inc Probe
CN104755943A (en) * 2012-12-04 2015-07-01 日本电子材料株式会社 Electrical contact

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4900843B2 (en) 2008-12-26 2012-03-21 山一電機株式会社 Electrical connection device for semiconductor device and contact used therefor
KR101064852B1 (en) 2010-05-24 2011-09-14 김재길 Needle for probe card
KR101439342B1 (en) 2013-04-18 2014-09-16 주식회사 아이에스시 Probe member for pogo pin
TWI555987B (en) * 2014-01-28 2016-11-01 Spring sleeve type probe and its manufacturing method
KR101492242B1 (en) * 2014-07-17 2015-02-13 주식회사 아이에스시 Contact device for test and test socket
JP6084591B2 (en) * 2014-08-05 2017-02-22 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． Probe member for pogo pins

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3979478B2 (en) * 1998-05-01 2007-09-19 株式会社エンプラス Contact pin and socket for electrical parts using the contact pin
JP3768183B2 (en) * 2002-10-28 2006-04-19 山一電機株式会社 IC socket for narrow pitch IC package
KR100573089B1 (en) * 2003-03-17 2006-04-24 주식회사 파이컴 Probe and manufacturing method thereof
JP4101773B2 (en) * 2004-02-09 2008-06-18 山一電機株式会社 IC socket

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI426274B (en) * 2010-06-30 2014-02-11 Leeno Ind Inc Probe
US9128120B2 (en) 2010-06-30 2015-09-08 Leeno Industrial Inc. Probe
CN104755943A (en) * 2012-12-04 2015-07-01 日本电子材料株式会社 Electrical contact
CN104755943B (en) * 2012-12-04 2018-04-27 日本电子材料株式会社 Electrical contact member
CN108333394A (en) * 2012-12-04 2018-07-27 日本电子材料株式会社 Contact probe
CN108333394B (en) * 2012-12-04 2020-06-09 日本电子材料株式会社 Contact probe

Also Published As

Publication number Publication date
JP2007178403A (en) 2007-07-12
WO2007074764A1 (en) 2007-07-05
JP4907171B2 (en) 2012-03-28

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