TW200637009A - Thin film transistor array panel - Google Patents
Thin film transistor array panelInfo
- Publication number
- TW200637009A TW200637009A TW094142308A TW94142308A TW200637009A TW 200637009 A TW200637009 A TW 200637009A TW 094142308 A TW094142308 A TW 094142308A TW 94142308 A TW94142308 A TW 94142308A TW 200637009 A TW200637009 A TW 200637009A
- Authority
- TW
- Taiwan
- Prior art keywords
- thin film
- film transistor
- transistor array
- array panel
- regions
- Prior art date
Links
- 239000010409 thin film Substances 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 5
- 239000000758 substrate Substances 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/22—Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of auxiliary dielectric or reflective layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/127—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement
- H01L27/1274—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement using crystallisation of amorphous semiconductor or recrystallisation of crystalline semiconductor
- H01L27/1285—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement using crystallisation of amorphous semiconductor or recrystallisation of crystalline semiconductor using control of the annealing or irradiation parameters, e.g. using different scanning direction or intensity for different transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1296—Multistep manufacturing methods adapted to increase the uniformity of device parameters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
- H01L29/78621—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure with LDD structure or an extension or an offset region or characterised by the doping profile
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78645—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with multiple gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Geometry (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
- Recrystallisation Techniques (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040109052A KR20060070345A (ko) | 2004-12-20 | 2004-12-20 | 박막 트랜지스터 표시판 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200637009A true TW200637009A (en) | 2006-10-16 |
Family
ID=36594544
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094142308A TW200637009A (en) | 2004-12-20 | 2005-12-01 | Thin film transistor array panel |
Country Status (5)
Country | Link |
---|---|
US (1) | US8106409B2 (zh) |
JP (1) | JP2006178449A (zh) |
KR (1) | KR20060070345A (zh) |
CN (1) | CN100474085C (zh) |
TW (1) | TW200637009A (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060157711A1 (en) * | 2005-01-19 | 2006-07-20 | Samsung Electronics Co., Ltd. | Thin film transistor array panel |
KR20070031620A (ko) | 2005-09-15 | 2007-03-20 | 삼성전자주식회사 | 액정 표시 장치 |
KR101358827B1 (ko) * | 2006-07-24 | 2014-02-06 | 삼성디스플레이 주식회사 | 액정 표시 장치 |
KR101094285B1 (ko) * | 2009-12-04 | 2011-12-19 | 삼성모바일디스플레이주식회사 | 박막트랜지스터 및 이를 포함하는 표시장치 |
KR101100959B1 (ko) * | 2010-03-10 | 2011-12-29 | 삼성모바일디스플레이주식회사 | 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를 구비하는 표시 장치 |
KR101666661B1 (ko) * | 2010-08-26 | 2016-10-17 | 삼성디스플레이 주식회사 | 박막 트랜지스터 기판 및 평판 표시 장치 |
US9224759B2 (en) | 2010-12-20 | 2015-12-29 | Japan Display Inc. | Pixel array substrate structure, method of manufacturing pixel array substrate structure, display device, and electronic apparatus |
KR101984309B1 (ko) * | 2010-12-20 | 2019-05-30 | 가부시키가이샤 재팬 디스프레이 | 화소 구조, 표시 장치, 및 전자 기기 |
US8830436B2 (en) * | 2010-12-24 | 2014-09-09 | Japan Display West Inc. | Pixel structure, display device, and electronic apparatus |
JP5725337B2 (ja) * | 2011-03-24 | 2015-05-27 | ソニー株式会社 | 表示装置、表示装置の製造方法および電子機器 |
KR102048941B1 (ko) | 2013-04-12 | 2020-01-09 | 삼성디스플레이 주식회사 | 가요성 기판 및 그 제조 방법, 유기 발광 표시 장치 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08201846A (ja) * | 1995-01-25 | 1996-08-09 | Matsushita Electric Ind Co Ltd | レーザーアニール法及び液晶表示装置 |
JP3317482B2 (ja) | 1996-11-26 | 2002-08-26 | シャープ株式会社 | 半導体装置及びその製造方法 |
US5981974A (en) | 1996-09-30 | 1999-11-09 | Sharp Kabushiki Kaisha | Semiconductor device and method for fabricating the same |
KR100296109B1 (ko) * | 1998-06-09 | 2001-10-26 | 구본준, 론 위라하디락사 | 박막트랜지스터제조방법 |
KR100319206B1 (ko) * | 1998-10-20 | 2002-01-10 | 윤종용 | 박막트랜지스터 제조방법과 이에 의해 제조된 기판 및 박막트랜지스터 |
JP4398015B2 (ja) | 1999-08-09 | 2010-01-13 | シャープ株式会社 | 液晶表示装置及びその製造方法 |
JP4127466B2 (ja) | 2000-07-31 | 2008-07-30 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US6613620B2 (en) | 2000-07-31 | 2003-09-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the same |
WO2003018882A1 (en) | 2001-08-27 | 2003-03-06 | The Trustees Of Columbia University In The City Of New York | Improved polycrystalline tft uniformity through microstructure mis-alignment |
KR100796794B1 (ko) | 2001-10-17 | 2008-01-22 | 삼성전자주식회사 | 다결정 규소 박막 트랜지스터 기판 및 그 제조 방법 |
JP4003471B2 (ja) * | 2002-02-12 | 2007-11-07 | セイコーエプソン株式会社 | 電気光学装置、電子機器、および電気光学装置の製造方法 |
JP4583004B2 (ja) | 2003-05-21 | 2010-11-17 | 株式会社 日立ディスプレイズ | アクティブ・マトリクス基板の製造方法 |
US7358165B2 (en) * | 2003-07-31 | 2008-04-15 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device and method for manufacturing semiconductor device |
US20050062052A1 (en) * | 2003-09-23 | 2005-03-24 | Fu-Hsiang Yang | Panel of organic electroluminescent display |
KR100997971B1 (ko) * | 2003-11-19 | 2010-12-02 | 삼성전자주식회사 | 결정화용 마스크, 이를 이용한 결정화 방법 및 이를포함하는 박막 트랜지스터 표시판의 제조 방법 |
KR100984359B1 (ko) * | 2003-11-20 | 2010-09-30 | 삼성전자주식회사 | 박막 트랜지스터 표시판 |
KR100737535B1 (ko) * | 2003-12-29 | 2007-07-10 | 비오이 하이디스 테크놀로지 주식회사 | 다결정실리콘막 형성방법 |
KR101230299B1 (ko) * | 2005-01-07 | 2013-02-07 | 삼성디스플레이 주식회사 | 박막 트랜지스터 표시판 |
US20060157711A1 (en) * | 2005-01-19 | 2006-07-20 | Samsung Electronics Co., Ltd. | Thin film transistor array panel |
-
2004
- 2004-12-20 KR KR1020040109052A patent/KR20060070345A/ko not_active Application Discontinuation
-
2005
- 2005-11-23 US US11/285,935 patent/US8106409B2/en not_active Expired - Fee Related
- 2005-12-01 TW TW094142308A patent/TW200637009A/zh unknown
- 2005-12-08 JP JP2005355423A patent/JP2006178449A/ja active Pending
- 2005-12-16 CN CNB200510132007XA patent/CN100474085C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20060131585A1 (en) | 2006-06-22 |
KR20060070345A (ko) | 2006-06-23 |
CN100474085C (zh) | 2009-04-01 |
JP2006178449A (ja) | 2006-07-06 |
US8106409B2 (en) | 2012-01-31 |
CN1794069A (zh) | 2006-06-28 |
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