TW200636841A - Cleaning device and cleaning method - Google Patents

Cleaning device and cleaning method

Info

Publication number
TW200636841A
TW200636841A TW095110619A TW95110619A TW200636841A TW 200636841 A TW200636841 A TW 200636841A TW 095110619 A TW095110619 A TW 095110619A TW 95110619 A TW95110619 A TW 95110619A TW 200636841 A TW200636841 A TW 200636841A
Authority
TW
Taiwan
Prior art keywords
cleaning
target object
opening
side wall
wafer
Prior art date
Application number
TW095110619A
Other languages
English (en)
Inventor
Akira Sawaki
Michihisa Kouno
Original Assignee
Kaijo Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kaijo Kk filed Critical Kaijo Kk
Publication of TW200636841A publication Critical patent/TW200636841A/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67057Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
TW095110619A 2005-03-31 2006-03-28 Cleaning device and cleaning method TW200636841A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005104614 2005-03-31
JP2005216217 2005-07-26

Publications (1)

Publication Number Publication Date
TW200636841A true TW200636841A (en) 2006-10-16

Family

ID=36190753

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095110619A TW200636841A (en) 2005-03-31 2006-03-28 Cleaning device and cleaning method

Country Status (5)

Country Link
US (1) US20060219257A1 (zh)
EP (1) EP1708249A2 (zh)
KR (1) KR100710505B1 (zh)
SG (1) SG126125A1 (zh)
TW (1) TW200636841A (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105478391A (zh) * 2015-12-31 2016-04-13 上海新阳半导体材料股份有限公司 晶圆清洁设备
PT3309279T (pt) * 2016-10-14 2020-09-08 Atotech Deutschland Gmbh Método, aparelho de processamento de substrato do tipo bolacha e sua utilização
JP6818607B2 (ja) * 2017-03-27 2021-01-20 株式会社Screenホールディングス 基板処理方法および基板処理装置
JP6974087B2 (ja) * 2017-09-14 2021-12-01 株式会社ディスコ 切削装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5158616A (en) * 1988-07-22 1992-10-27 Tokyo Electron Limited Apparatus for cleaning a substrate
KR100254653B1 (ko) * 1991-10-04 2000-05-01 월터 알란 이. 대상물을 처리하는 방법
KR0129712Y1 (ko) * 1995-10-06 1999-02-01 문정환 반도체 제조 장치의 회전 도포 장치
JPH10135171A (ja) * 1996-10-29 1998-05-22 Dainippon Screen Mfg Co Ltd 基板処理装置
DE69835988T2 (de) * 1997-08-18 2007-06-21 Tokyo Electron Ltd. Doppelseitenreinigungsmaschine für ein Substrat
US20010013355A1 (en) * 1998-10-14 2001-08-16 Busnaina Ahmed A. Fast single-article megasonic cleaning process for single-sided or dual-sided cleaning
JP3739225B2 (ja) * 1998-12-22 2006-01-25 大日本スクリーン製造株式会社 基板処理装置
US6799583B2 (en) * 1999-05-13 2004-10-05 Suraj Puri Methods for cleaning microelectronic substrates using ultradilute cleaning liquids
JP2002093765A (ja) * 2000-09-20 2002-03-29 Kaijo Corp 基板洗浄方法および基板洗浄装置
JP2002353181A (ja) * 2001-05-30 2002-12-06 Ses Co Ltd 枚葉式基板洗浄方法および枚葉式基板洗浄装置
US6726848B2 (en) * 2001-12-07 2004-04-27 Scp Global Technologies, Inc. Apparatus and method for single substrate processing

Also Published As

Publication number Publication date
KR100710505B1 (ko) 2007-04-23
SG126125A1 (en) 2006-10-30
US20060219257A1 (en) 2006-10-05
KR20060105540A (ko) 2006-10-11
EP1708249A2 (en) 2006-10-04

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