TW200627457A - Integrated circuit with phase-change memory cells and method for addressing phase-change memory cells - Google Patents

Integrated circuit with phase-change memory cells and method for addressing phase-change memory cells

Info

Publication number
TW200627457A
TW200627457A TW094136426A TW94136426A TW200627457A TW 200627457 A TW200627457 A TW 200627457A TW 094136426 A TW094136426 A TW 094136426A TW 94136426 A TW94136426 A TW 94136426A TW 200627457 A TW200627457 A TW 200627457A
Authority
TW
Taiwan
Prior art keywords
phase
memory cells
change memory
lines
integrated circuit
Prior art date
Application number
TW094136426A
Other languages
English (en)
Inventor
Martijn Henri Richard Lankhorst
Hendrik Gezienus Albert Huizing
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of TW200627457A publication Critical patent/TW200627457A/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/02Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using elements whose operation depends upon chemical change
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0004Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Dram (AREA)
TW094136426A 2004-10-21 2005-10-18 Integrated circuit with phase-change memory cells and method for addressing phase-change memory cells TW200627457A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04105212 2004-10-21

Publications (1)

Publication Number Publication Date
TW200627457A true TW200627457A (en) 2006-08-01

Family

ID=35636940

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094136426A TW200627457A (en) 2004-10-21 2005-10-18 Integrated circuit with phase-change memory cells and method for addressing phase-change memory cells

Country Status (9)

Country Link
US (1) US7911822B2 (zh)
EP (1) EP1807840B1 (zh)
JP (1) JP2008518373A (zh)
KR (1) KR20070067150A (zh)
CN (1) CN101044577B (zh)
AT (1) ATE469419T1 (zh)
DE (1) DE602005021527D1 (zh)
TW (1) TW200627457A (zh)
WO (1) WO2006043230A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7839672B1 (en) * 2006-12-18 2010-11-23 Marvell International Ltd. Phase change memory array circuits and methods of manufacture
ATE527702T1 (de) 2008-01-16 2011-10-15 Nxp Bv Mehrschichtige struktur mit einer phasenwechselmaterialschicht und verfahren zu ihrer herstellung
US20140159770A1 (en) * 2012-12-12 2014-06-12 Alexander Mikhailovich Shukh Nonvolatile Logic Circuit

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4202017A (en) * 1978-05-08 1980-05-06 Sperry Rand Corporation Magnetic recording signal equalization apparatus
AU3769900A (en) 1999-03-25 2000-10-09 Energy Conversion Devices Inc. Electrically programmable memory element with improved contacts
DE10297786B4 (de) 2002-09-11 2012-11-08 Ovonyx Inc. Programmierung eines Phasenübergangsmaterialspeichers
US6912146B2 (en) * 2002-12-13 2005-06-28 Ovonyx, Inc. Using an MOS select gate for a phase change memory
WO2004057618A2 (en) 2002-12-19 2004-07-08 Koninklijke Philips Electronics N.V. Electric device comprising a layer of phase change material and method of manufacturing the same
KR100546322B1 (ko) * 2003-03-27 2006-01-26 삼성전자주식회사 비휘발성 메모리와 휘발성 메모리로 선택적으로 동작할 수있는 상 변화 메모리 장치 및 상 변화 메모리 장치의 동작방법
DE102004016408B4 (de) * 2003-03-27 2008-08-07 Samsung Electronics Co., Ltd., Suwon Phasenwechselspeicherbaustein und zugehöriges Programmierverfahren
KR100498493B1 (ko) * 2003-04-04 2005-07-01 삼성전자주식회사 저전류 고속 상변화 메모리 및 그 구동 방식
KR100564567B1 (ko) * 2003-06-03 2006-03-29 삼성전자주식회사 상 변화 메모리의 기입 드라이버 회로
US7085154B2 (en) * 2003-06-03 2006-08-01 Samsung Electronics Co., Ltd. Device and method for pulse width control in a phase change memory device
EP1634296A4 (en) * 2003-06-09 2007-02-14 Nantero Inc NON-VOLATILE ELECTROMECHANICAL FIELD EFFECT BLOCKS AND CIRCUITS THEREFOR AND METHOD FOR THEIR PRODUCTION
US7308067B2 (en) * 2003-08-04 2007-12-11 Intel Corporation Read bias scheme for phase change memories
KR100520228B1 (ko) * 2004-02-04 2005-10-11 삼성전자주식회사 상변화 메모리 장치 및 그에 따른 데이터 라이팅 방법
KR100647218B1 (ko) * 2004-06-04 2006-11-23 비욘드마이크로 주식회사 고집적 상변화 메모리 셀 어레이 및 이를 포함하는 상변화메모리 소자
KR100587702B1 (ko) * 2004-07-09 2006-06-08 삼성전자주식회사 피크 전류의 감소 특성을 갖는 상변화 메모리 장치 및그에 따른 데이터 라이팅 방법
US7289351B1 (en) * 2005-06-24 2007-10-30 Spansion Llc Method of programming a resistive memory device

Also Published As

Publication number Publication date
EP1807840B1 (en) 2010-05-26
WO2006043230A1 (en) 2006-04-27
CN101044577A (zh) 2007-09-26
KR20070067150A (ko) 2007-06-27
JP2008518373A (ja) 2008-05-29
EP1807840A1 (en) 2007-07-18
US20090067226A1 (en) 2009-03-12
CN101044577B (zh) 2011-06-15
DE602005021527D1 (de) 2010-07-08
US7911822B2 (en) 2011-03-22
ATE469419T1 (de) 2010-06-15

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