TW200622373A - Worktable for flat display panel tester - Google Patents

Worktable for flat display panel tester

Info

Publication number
TW200622373A
TW200622373A TW094104874A TW94104874A TW200622373A TW 200622373 A TW200622373 A TW 200622373A TW 094104874 A TW094104874 A TW 094104874A TW 94104874 A TW94104874 A TW 94104874A TW 200622373 A TW200622373 A TW 200622373A
Authority
TW
Taiwan
Prior art keywords
flat display
display panel
worktable
blocks
base plate
Prior art date
Application number
TW094104874A
Other languages
Chinese (zh)
Other versions
TWI275862B (en
Inventor
Tae-Ho Kim
Sung-Min Jang
Original Assignee
De&T Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by De&T Co Ltd filed Critical De&T Co Ltd
Publication of TW200622373A publication Critical patent/TW200622373A/en
Application granted granted Critical
Publication of TWI275862B publication Critical patent/TWI275862B/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)

Abstract

A worktable for a flat display panel tester capable of rapidly and easily setting various sized flat display panels. The worktable includes a base plate and a fixed member installed on the base plate and setting the position of a flat display panel. The fixed member includes a plurality of blocks, each block including a support closely contacting the lower surface of the flat display panel and the support formed with at least one vacuum hole. The blocks are movably installed on the base plate such that the blocks are arranged and fixed in accordance with the size of the flat display panel. Waste of time and manpower for exchange of components in order to examine different sized flat display panel is prevented and workability and productivity are remarkably increased.
TW094104874A 2004-12-17 2005-02-18 Worktable for flat display panel tester TWI275862B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040108178A KR100776177B1 (en) 2004-12-17 2004-12-17 Work table for flat display panel tester

Publications (2)

Publication Number Publication Date
TW200622373A true TW200622373A (en) 2006-07-01
TWI275862B TWI275862B (en) 2007-03-11

Family

ID=36788025

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094104874A TWI275862B (en) 2004-12-17 2005-02-18 Worktable for flat display panel tester

Country Status (3)

Country Link
KR (1) KR100776177B1 (en)
CN (1) CN1790031A (en)
TW (1) TWI275862B (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101258267B1 (en) * 2006-06-30 2013-04-25 엘지디스플레이 주식회사 Inspection apparatus for liquid crystal panel and setting method and changing method for work table unit using the same
KR100820049B1 (en) * 2006-08-18 2008-04-07 주식회사 파이컴 Inspecting stage of apparatus for inspecting of liquid crystal display panel
TW200939088A (en) * 2008-03-07 2009-09-16 & T Technology Co Ltd A touch-control screen system of automatically detecting sizes and its module
KR100950016B1 (en) * 2008-04-11 2010-03-31 티에스씨멤시스(주) Unit for supporting a flat panel
KR100950014B1 (en) * 2008-04-11 2010-03-29 티에스씨멤시스(주) Unit for supporting a flat panel and stage for inspecting a flat panel having the unit
KR100950018B1 (en) 2008-04-11 2010-03-29 티에스씨멤시스(주) Unit for supporting a flat panel and stage for inspecting a flat panel having the unit
KR100913188B1 (en) * 2008-05-02 2009-08-20 (주)유비프리시젼 Support for all sizes panel of worktable usingtesting device for display panel
JP5156970B2 (en) * 2008-11-10 2013-03-06 株式会社日本マイクロニクス Probe unit for electrical inspection, electrical inspection device, and lighting inspection device
KR20130005128A (en) * 2011-07-05 2013-01-15 주식회사 탑 엔지니어링 Glass panel tranferring apparatus
KR101395219B1 (en) * 2012-05-30 2014-05-15 (주)펨트론 Display glass holding module
KR101285167B1 (en) * 2013-01-04 2013-07-11 주식회사 프로이천 Work table of display panel tester
CN109360518B (en) * 2018-09-06 2023-09-29 武汉精测电子集团股份有限公司 Automatic alignment fine adjustment carrier for display panel
KR102236234B1 (en) * 2019-07-26 2021-04-05 (주)에스티아이 Window holding module and laminating apparatus including the same
CN112213876B (en) * 2020-10-29 2021-08-24 Tcl华星光电技术有限公司 Adjustable curved surface liquid crystal display panel test device and operation method thereof

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3350899B2 (en) * 1999-08-31 2002-11-25 株式会社双晶テック Probe block support frame
JP3480925B2 (en) * 2000-09-12 2003-12-22 株式会社双晶テック Display panel or probe frame support frame

Also Published As

Publication number Publication date
TWI275862B (en) 2007-03-11
KR20060069085A (en) 2006-06-21
CN1790031A (en) 2006-06-21
KR100776177B1 (en) 2007-11-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees