TW200622262A - Flat display panel tester - Google Patents

Flat display panel tester

Info

Publication number
TW200622262A
TW200622262A TW094104871A TW94104871A TW200622262A TW 200622262 A TW200622262 A TW 200622262A TW 094104871 A TW094104871 A TW 094104871A TW 94104871 A TW94104871 A TW 94104871A TW 200622262 A TW200622262 A TW 200622262A
Authority
TW
Taiwan
Prior art keywords
display panel
flat display
probes
loaded
stage
Prior art date
Application number
TW094104871A
Other languages
Chinese (zh)
Other versions
TWI258591B (en
Inventor
Tae-Ho Kim
Joon-Seok Kim
Original Assignee
De&T Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by De&T Co Ltd filed Critical De&T Co Ltd
Publication of TW200622262A publication Critical patent/TW200622262A/en
Application granted granted Critical
Publication of TWI258591B publication Critical patent/TWI258591B/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02—Main electrodes
    • H01J1/13—Solid thermionic cathodes
    • H01J1/20—Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)

Abstract

Disclosed is a flat display panel tester for moving bases and probes according to the size of a loaded flat display panel to rapidly and precisely set the bases and the probes. The flat display panel tester includes a stage installed in front of a worktable on which the flat display panel is loaded, a first base that is provided on the stage in the horizontal direction and on which data probes are mounted, and a second base that is provided on the stage in the vertical direction and on which gate probes are mounted. The first and second bases move according to the size of a loaded flat display panel, and the data probes and the gate probes move along the contact points on the flat display panel. Therefore, workability and precision of examination are enhanced and the waste of manpower and time caused by the exchange of an adapter and the arrangement of the probes are reduced.
TW094104871A 2004-12-17 2005-02-18 Flat display panel tester TWI258591B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040108130A KR100673795B1 (en) 2004-12-17 2004-12-17 Flat Panel Display Inspection System

Publications (2)

Publication Number Publication Date
TW200622262A true TW200622262A (en) 2006-07-01
TWI258591B TWI258591B (en) 2006-07-21

Family

ID=36788027

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094104871A TWI258591B (en) 2004-12-17 2005-02-18 Flat display panel tester

Country Status (3)

Country Link
KR (1) KR100673795B1 (en)
CN (1) CN1790033A (en)
TW (1) TWI258591B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4808135B2 (en) * 2006-11-09 2011-11-02 株式会社日本マイクロニクス Probe positioning method, movable probe unit mechanism, and inspection apparatus
KR100861467B1 (en) * 2007-07-04 2008-10-02 호서대학교 산학협력단 Probe unit for LED panel lighting test
JP5432460B2 (en) * 2008-02-25 2014-03-05 株式会社日本マイクロニクス Inspection device
KR101063774B1 (en) * 2009-08-27 2011-09-08 (주)유비프리시젼 Multi Probe Unit
KR101292261B1 (en) * 2012-06-29 2013-08-07 주식회사 디이엔티 Flat panel display tester
KR101920224B1 (en) * 2012-07-27 2018-11-20 엘지디스플레이 주식회사 test apparatus for liquid crystal panel and test method using the same
KR101616564B1 (en) * 2014-09-24 2016-04-29 주식회사 디이엔티 Probe Mobile Apparatus
CN115097660B (en) * 2022-06-07 2023-11-21 厦门特仪科技有限公司 CT lamp box

Also Published As

Publication number Publication date
TWI258591B (en) 2006-07-21
CN1790033A (en) 2006-06-21
KR100673795B1 (en) 2007-01-24
KR20060069043A (en) 2006-06-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees