TW200622262A - Flat display panel tester - Google Patents

Flat display panel tester

Info

Publication number
TW200622262A
TW200622262A TW094104871A TW94104871A TW200622262A TW 200622262 A TW200622262 A TW 200622262A TW 094104871 A TW094104871 A TW 094104871A TW 94104871 A TW94104871 A TW 94104871A TW 200622262 A TW200622262 A TW 200622262A
Authority
TW
Taiwan
Prior art keywords
display panel
flat display
probes
stage
loaded
Prior art date
Application number
TW094104871A
Other languages
Chinese (zh)
Other versions
TWI258591B (en
Inventor
Tae-Ho Kim
Joon-Seok Kim
Original Assignee
De&T Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to KR1020040108130A priority Critical patent/KR100673795B1/en
Application filed by De&T Co Ltd filed Critical De&T Co Ltd
Publication of TW200622262A publication Critical patent/TW200622262A/en
Application granted granted Critical
Publication of TWI258591B publication Critical patent/TWI258591B/en

Links

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42Measurement or testing during manufacture
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02Main electrodes
    • H01J1/13Solid thermionic cathodes
    • H01J1/20Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136254Checking; Testing

Abstract

Disclosed is a flat display panel tester for moving bases and probes according to the size of a loaded flat display panel to rapidly and precisely set the bases and the probes. The flat display panel tester includes a stage installed in front of a worktable on which the flat display panel is loaded, a first base that is provided on the stage in the horizontal direction and on which data probes are mounted, and a second base that is provided on the stage in the vertical direction and on which gate probes are mounted. The first and second bases move according to the size of a loaded flat display panel, and the data probes and the gate probes move along the contact points on the flat display panel. Therefore, workability and precision of examination are enhanced and the waste of manpower and time caused by the exchange of an adapter and the arrangement of the probes are reduced.
TW094104871A 2004-12-17 2005-02-18 Flat display panel tester TWI258591B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020040108130A KR100673795B1 (en) 2004-12-17 2004-12-17 Flat panel display tester

Publications (2)

Publication Number Publication Date
TW200622262A true TW200622262A (en) 2006-07-01
TWI258591B TWI258591B (en) 2006-07-21

Family

ID=36788027

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094104871A TWI258591B (en) 2004-12-17 2005-02-18 Flat display panel tester

Country Status (3)

Country Link
KR (1) KR100673795B1 (en)
CN (1) CN1790033A (en)
TW (1) TWI258591B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4808135B2 (en) * 2006-11-09 2011-11-02 株式会社日本マイクロニクス Probe positioning method, movable probe unit mechanism, and inspection apparatus
KR100861467B1 (en) * 2007-07-04 2008-10-02 호서대학교 산학협력단 Probe unit for inspecting lcd panel
JP5432460B2 (en) * 2008-02-25 2014-03-05 株式会社日本マイクロニクス Inspection device
KR101063774B1 (en) * 2009-08-27 2011-09-08 (주)유비프리시젼 Multi Probe Unit
KR101292261B1 (en) * 2012-06-29 2013-08-07 주식회사 디이엔티 Flat panel display tester
KR101920224B1 (en) * 2012-07-27 2018-11-20 엘지디스플레이 주식회사 test apparatus for liquid crystal panel and test method using the same
KR101616564B1 (en) * 2014-09-24 2016-04-29 주식회사 디이엔티 Probe Mobile Apparatus

Also Published As

Publication number Publication date
CN1790033A (en) 2006-06-21
KR20060069043A (en) 2006-06-21
TWI258591B (en) 2006-07-21
KR100673795B1 (en) 2007-01-24

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees