TW200622268A - Temperature aging test device for display panel - Google Patents
Temperature aging test device for display panelInfo
- Publication number
- TW200622268A TW200622268A TW093141668A TW93141668A TW200622268A TW 200622268 A TW200622268 A TW 200622268A TW 093141668 A TW093141668 A TW 093141668A TW 93141668 A TW93141668 A TW 93141668A TW 200622268 A TW200622268 A TW 200622268A
- Authority
- TW
- Taiwan
- Prior art keywords
- display panel
- temperature aging
- test device
- testing
- aging test
- Prior art date
Links
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
A temperature aging testing device for display panel is provided. The device includes a furnace member and a movable rack. The furnace member is used to supply a testing temperature, and the movable rack has a plurality of testing units set on the rack wherein the testing units respectively linked to testing panels. The movable rack has a circuit and a light.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW093141668A TW200622268A (en) | 2004-12-31 | 2004-12-31 | Temperature aging test device for display panel |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW093141668A TW200622268A (en) | 2004-12-31 | 2004-12-31 | Temperature aging test device for display panel |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200622268A true TW200622268A (en) | 2006-07-01 |
Family
ID=57808460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093141668A TW200622268A (en) | 2004-12-31 | 2004-12-31 | Temperature aging test device for display panel |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200622268A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI381181B (en) * | 2008-12-04 | 2013-01-01 | Samsung Display Co Ltd | An aging test apparatus of display module |
CN111551839A (en) * | 2020-04-23 | 2020-08-18 | 武汉精测电子集团股份有限公司 | High-low temperature aging test equipment for semiconductor memory |
-
2004
- 2004-12-31 TW TW093141668A patent/TW200622268A/en unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI381181B (en) * | 2008-12-04 | 2013-01-01 | Samsung Display Co Ltd | An aging test apparatus of display module |
CN111551839A (en) * | 2020-04-23 | 2020-08-18 | 武汉精测电子集团股份有限公司 | High-low temperature aging test equipment for semiconductor memory |
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