TW200613256A - Photoactive compounds - Google Patents

Photoactive compounds

Info

Publication number
TW200613256A
TW200613256A TW094117283A TW94117283A TW200613256A TW 200613256 A TW200613256 A TW 200613256A TW 094117283 A TW094117283 A TW 094117283A TW 94117283 A TW94117283 A TW 94117283A TW 200613256 A TW200613256 A TW 200613256A
Authority
TW
Taiwan
Prior art keywords
photoactive compounds
photoactive
compounds
relates
present
Prior art date
Application number
TW094117283A
Other languages
English (en)
Inventor
Dalil M Rahman
Woo-Kyu Kim
Munirathna Padmanaban
Sang-Ho Lee
Original Assignee
Az Electronic Materials Japan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Az Electronic Materials Japan filed Critical Az Electronic Materials Japan
Publication of TW200613256A publication Critical patent/TW200613256A/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
    • C07C381/12—Sulfonium compounds
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03C—PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
    • G03C1/00—Photosensitive materials
    • G03C1/005—Silver halide emulsions; Preparation thereof; Physical treatment thereof; Incorporation of additives therein
    • G03C1/492—Photosoluble emulsions
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Materials For Photolithography (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Nitrogen Condensed Heterocyclic Rings (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
TW094117283A 2004-06-08 2005-05-26 Photoactive compounds TW200613256A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/863,042 US20050271974A1 (en) 2004-06-08 2004-06-08 Photoactive compounds

Publications (1)

Publication Number Publication Date
TW200613256A true TW200613256A (en) 2006-05-01

Family

ID=35044987

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094117283A TW200613256A (en) 2004-06-08 2005-05-26 Photoactive compounds

Country Status (7)

Country Link
US (1) US20050271974A1 (zh)
EP (1) EP1766474A2 (zh)
JP (1) JP2008501779A (zh)
KR (1) KR20070030200A (zh)
CN (1) CN1961260A (zh)
TW (1) TW200613256A (zh)
WO (1) WO2005121894A2 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI739855B (zh) * 2016-06-28 2021-09-21 日商東京應化工業股份有限公司 光阻組成物及光阻圖型形成方法

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050214674A1 (en) 2004-03-25 2005-09-29 Yu Sui Positive-working photoimageable bottom antireflective coating
US7255970B2 (en) * 2005-07-12 2007-08-14 Az Electronic Materials Usa Corp. Photoresist composition for imaging thick films
JP4695941B2 (ja) * 2005-08-19 2011-06-08 富士フイルム株式会社 液浸露光用ポジ型レジスト組成物及びそれを用いたパターン形成方法
US20070105040A1 (en) * 2005-11-10 2007-05-10 Toukhy Medhat A Developable undercoating composition for thick photoresist layers
US7601482B2 (en) * 2006-03-28 2009-10-13 Az Electronic Materials Usa Corp. Negative photoresist compositions
JP4881692B2 (ja) * 2006-10-23 2012-02-22 富士フイルム株式会社 感光性組成物、該感光性組成物に用いられる化合物及び該感光性組成物を用いたパターン形成方法
US20080171270A1 (en) * 2007-01-16 2008-07-17 Munirathna Padmanaban Polymers Useful in Photoresist Compositions and Compositions Thereof
JP5364256B2 (ja) * 2007-06-13 2013-12-11 東京応化工業株式会社 化合物、酸発生剤、レジスト組成物およびレジストパターン形成方法
US8227624B2 (en) * 2007-08-07 2012-07-24 Adeka Corporation Aromatic sulfonium salt compound
US8252503B2 (en) * 2007-08-24 2012-08-28 Az Electronic Materials Usa Corp. Photoresist compositions
US8088548B2 (en) * 2007-10-23 2012-01-03 Az Electronic Materials Usa Corp. Bottom antireflective coating compositions
US8455176B2 (en) 2008-11-12 2013-06-04 Az Electronic Materials Usa Corp. Coating composition
US8632948B2 (en) 2009-09-30 2014-01-21 Az Electronic Materials Usa Corp. Positive-working photoimageable bottom antireflective coating
US20110086312A1 (en) * 2009-10-09 2011-04-14 Dammel Ralph R Positive-Working Photoimageable Bottom Antireflective Coating
US9012126B2 (en) 2012-06-15 2015-04-21 Az Electronic Materials (Luxembourg) S.A.R.L. Positive photosensitive material
US8906594B2 (en) 2012-06-15 2014-12-09 Az Electronic Materials (Luxembourg) S.A.R.L. Negative-working thick film photoresist
JP5830503B2 (ja) * 2012-09-15 2015-12-09 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーＲｏｈｍ ａｎｄ Ｈａａｓ Ｅｌｅｃｔｒｏｎｉｃ Ｍａｔｅｒｉａｌｓ ＬＬＣ 酸発生剤化合物およびそれを含むフォトレジスト
EP2990425B1 (en) 2013-04-23 2018-05-30 Mitsubishi Gas Chemical Company, Inc. Novel alicyclic ester compound, and (meth)acrylic copolymer and photosensitive resin composition containing same
JP6442271B2 (ja) * 2014-12-22 2018-12-19 デクセリアルズ株式会社 化合物、熱硬化性樹脂組成物、及び熱硬化性シート
TWI731961B (zh) 2016-04-19 2021-07-01 德商馬克專利公司 正向感光材料及形成正向凸紋影像之方法
US11385543B2 (en) 2016-08-09 2022-07-12 Merck Patent Gmbh Enviromentally stable, thick film, chemically amplified resist

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US5021197A (en) * 1988-06-16 1991-06-04 Mitsubishi Gas Chemical Company, Inc. Process for production of sulfonium compounds
DE3902114A1 (de) * 1989-01-25 1990-08-02 Basf Ag Strahlungsempfindliche, ethylenisch ungesaettigte, copolymerisierbare sulfoniumsalze und verfahren zu deren herstellung
US5075476A (en) * 1989-06-07 1991-12-24 Mitsubishi Gas Chemical Company, Inc. Process for production of sulfonium compounds and novel methylthiphenol derivatives
US5252436A (en) * 1989-12-15 1993-10-12 Basf Aktiengesellschaft Process for developing a positive-working photoresist containing poly(p-hydroxystyrene) and sulfonium salt with an aqueous developer containing basic organic compounds
US5274148A (en) * 1992-08-10 1993-12-28 Isp Investments, Inc. Dialky alkoxy phenyl sulfonium salt cationic initiators
DE69519629T2 (de) * 1994-03-09 2001-04-12 Nippon Soda Co. Ltd., Tokio/Tokyo Sulfoniumsalze und Polymerisationsinitiatoren
JP2770740B2 (ja) * 1994-07-14 1998-07-02 日本電気株式会社 橋かけ環式アルキル基を有するスルホニウム塩化合物および光酸発生剤
DE846681T1 (de) * 1995-08-22 1998-11-19 Nippon Soda Co. Ltd., Tokio/Tokyo Neue sulfoniumsalzverbindungen, polymerisierungsinitiator, härtbare zusammensetzung und stärkungsverfahren
JP3587325B2 (ja) * 1996-03-08 2004-11-10 富士写真フイルム株式会社 ポジ型感光性組成物
US5693903A (en) * 1996-04-04 1997-12-02 Coda Music Technology, Inc. Apparatus and method for analyzing vocal audio data to provide accompaniment to a vocalist
JP4226803B2 (ja) * 2000-08-08 2009-02-18 富士フイルム株式会社 ポジ型感光性組成物
EP1179750B1 (en) * 2000-08-08 2012-07-25 FUJIFILM Corporation Positive photosensitive composition and method for producing a precision integrated circuit element using the same
JP4150509B2 (ja) * 2000-11-20 2008-09-17 富士フイルム株式会社 ポジ型感光性組成物
US6749987B2 (en) * 2000-10-20 2004-06-15 Fuji Photo Film Co., Ltd. Positive photosensitive composition
US6855476B2 (en) * 2001-04-05 2005-02-15 Arch Specialty Chemicals, Inc. Photoacid generators for use in photoresist compositions
JP4054978B2 (ja) * 2001-08-24 2008-03-05 信越化学工業株式会社 レジスト材料及びパターン形成方法
US7105267B2 (en) * 2001-08-24 2006-09-12 Shin-Etsu Chemical Co., Ltd. Resist compositions and patterning process
JP2003228167A (ja) * 2002-02-01 2003-08-15 Fuji Photo Film Co Ltd ネガ型レジスト組成物
JP3841399B2 (ja) * 2002-02-21 2006-11-01 富士写真フイルム株式会社 ポジ型レジスト組成物
EP1480079A3 (en) * 2002-06-07 2008-02-13 FUJIFILM Corporation Photosensitive resin composition
US20030235775A1 (en) * 2002-06-13 2003-12-25 Munirathna Padmanaban Photoresist composition for deep ultraviolet lithography comprising a mixture of photoactive compounds
US6841333B2 (en) * 2002-11-01 2005-01-11 3M Innovative Properties Company Ionic photoacid generators with segmented hydrocarbon-fluorocarbon sulfonate anions
US7358408B2 (en) * 2003-05-16 2008-04-15 Az Electronic Materials Usa Corp. Photoactive compounds

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI739855B (zh) * 2016-06-28 2021-09-21 日商東京應化工業股份有限公司 光阻組成物及光阻圖型形成方法
US11204551B2 (en) 2016-06-28 2021-12-21 Tokyo Ohka Kogyo Co., Ltd. Resist composition and method for forming resist pattern

Also Published As

Publication number Publication date
EP1766474A2 (en) 2007-03-28
KR20070030200A (ko) 2007-03-15
WO2005121894A2 (en) 2005-12-22
WO2005121894A3 (en) 2006-03-30
JP2008501779A (ja) 2008-01-24
US20050271974A1 (en) 2005-12-08
CN1961260A (zh) 2007-05-09

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