TW200539314A - Substrate carrying device and substrate processing device having the same - Google Patents
Substrate carrying device and substrate processing device having the same Download PDFInfo
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- TW200539314A TW200539314A TW094106004A TW94106004A TW200539314A TW 200539314 A TW200539314 A TW 200539314A TW 094106004 A TW094106004 A TW 094106004A TW 94106004 A TW94106004 A TW 94106004A TW 200539314 A TW200539314 A TW 200539314A
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- substrate
- tray
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D90/00—Component parts, details or accessories for large containers
- B65D90/02—Wall construction
- B65D90/023—Modular panels
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D88/00—Large containers
- B65D88/02—Large containers rigid
- B65D88/10—Large containers rigid parallelepipedic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D90/00—Component parts, details or accessories for large containers
- B65D90/02—Wall construction
- B65D90/08—Interconnections of wall parts; Sealing means therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D90/00—Component parts, details or accessories for large containers
- B65D90/12—Supports
- B65D90/20—Frames or nets, e.g. for flexible containers
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- E—FIXED CONSTRUCTIONS
- E03—WATER SUPPLY; SEWERAGE
- E03B—INSTALLATIONS OR METHODS FOR OBTAINING, COLLECTING, OR DISTRIBUTING WATER
- E03B11/00—Arrangements or adaptations of tanks for water supply
- E03B11/10—Arrangements or adaptations of tanks for water supply for public or like main water supply
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Structural Engineering (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Hydrology & Water Resources (AREA)
- Public Health (AREA)
- Water Supply & Treatment (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Furnace Charging Or Discharging (AREA)
Abstract
Description
20053 九、發明說明: 【發明所屬之技術領域】 本發明關於一種基板的搬運裝置及具有該搬運梦晉的 基板處理裝置。 、' 【先前技術】20053 IX. Description of the invention: [Technical field to which the invention belongs] The present invention relates to a substrate conveying device and a substrate processing device having the same. , '[Prior art]
半導體基板和玻璃基板經過多個處理製程而形成製 品。作為縮短整體製造時間的1個方法,是為了將結束^ 1個製程的基板立即投入到下一製程,而盡可能快地回收 基板。例如,在玻璃基板上形成了非結晶型矽膜的太陽電 池面板,成膜後要進行劃片(scribing),但成膜製程結束後 的面板處於高溫狀態。在習知技術中,是利用以合成樹脂 製的吸附部吸附面板之真空夾盤方式,把持面板並進行搬 運。 習知的真空夾盤方式由於利用合成樹脂製的吸附部, 所以在面板處於高溫狀態期間無法進行把持或搬運,需要 在處理結束了的托盤上使面板進行冷卻的時間。因此而使 依次進行連續處理之面板的流動停滯,無法縮短作為生產 製程整體的生產時間(tact time)。 【發明内容】 本發明提供-種基板搬運裝置,為—種㈣置於處理 托盤上並處於咼溫狀態下的基板,搬運至下一步的回收 盤上之基板搬運裝置,其特徵在於,包括:接;;處理托盤 上的基板並進彳T保持之㈣熱性材料形成的保持構件 處理托盤上的基板從處理托盤轉移到保持構件上之第I轉 5 20053 ft3sif4>c 移單元,使保持構件從處理 元;將在利用移動單元移動到时托盤的移動單 保持的基板’轉移到回收托盤上的第構件上所 在上述基板搬運裝置中,复 早兀 理托盤上所設置的貫通孔土隹^第轉移單元包括通過處 通孔從處理減二藉由通過貫 從處理托盤上浮起的基板的背面二 持構件上之構成。而==出;,基板轉移到保 行升降的第2升^t轉 括將时托盤進 托II = 可採用藉由第2升降構件將回收 般:的:板牛韓在保持構件上被保持並移動到回收托 现上的基板,轉移到回收托盤上之構成。 ^上述基板搬運褒置中,其處理托盤具有部分分離且 置ί件;第1轉移單元具有貫通處理托盤並升 it Γ升降構件’在藉由第1升降構件使載置 攸处理托盤的主體上浮起,並將載置構件的背面端部 以保持構件進行接合後,使第!升降構件下降,而將載置 構,與基板-起轉移到保持構件上之構成。而且,第2轉 移單元包括升降回收托盤的第2升降構件,藉由第2升降 構件升降回收托盤’且將在保持構件上被保持並移動到回 收托盤上的載置構件,與基板一起轉移到回收托盤上之構 成。 在上述基板搬運裝置中,也可在回收托盤上設置對從 處理托盤所搬運來的基板進行冷卻之冷卻單元。 6 20053iS3plf4c 本發明還提供一種基板處理裝置,包括收納用於載置 處於高溫狀態的基板之處理托盤的收納室、上述的基板搬 運裝置。 如利用本發明,即使為處於高溫狀態下的基板,由於 是利用耐熱性材_形成的簡構件,將處理托盤上的基 板向回收減上進行搬運,所以也能夠賴地進行基板搬 運,並能夠縮短生產製程整體的生產時間(tacttime)。 ▲為讓本發明之上述和其他目的、特徵和優點能更明顯 易懂,下文特舉較佳實施例,並配合所附圖式,作詳細說 明如下。 【實施方式】 下面’麥照圖1〜圖5對根據本發明的實施形態之基 板搬運裝置和基板處理裝置進行說明。 (第1實施形態) 、圖1所示為具有根據本發明的第1實施形態的基板搬 ,裝置之基板處理裝置的概略全體構成圖。圖2為在根據 第1實施形態的基板搬運裝置上所設置之夾盤部的斜視 圖。圖3(a)〜圖3(i)為根據第丨實施形態的基板搬運裝置之 構成的概略部分構成圖。 基板處理裝置1〇包括加載室u、處理室12、卸載室 13、回收站14。在加載室u中,面向外部設置有閘門G1 , ,加載室11和處理室12的臨界處設置有閘門G2,在處理 室12和卸載室13的臨界處設置有閘門G3,在卸載室13 中,面向回收站14設置有閘門G4。閘門G1〜G4採用可 7 20053^plf4 分別開關的構成。另 —成另外,回收站14也可不構成室而只是所 疋玄Γ曰]。 八則u、處理室12、卸載室13及回收站14中, 二:用於載置基板w的托盤15、16、17及回收托Semiconductor substrates and glass substrates are processed through multiple processes to form products. As a method for shortening the overall manufacturing time, the substrate is recovered as soon as possible in order to immediately transfer the substrate that has completed one process to the next process. For example, a solar cell panel in which an amorphous silicon film is formed on a glass substrate is subjected to scribing after film formation, but the panel after the film formation process is at a high temperature. In the conventional technique, a vacuum chuck system is used to adsorb the panel by an adsorption portion made of synthetic resin, and the panel is held and transported. The conventional vacuum chuck method uses a synthetic resin adsorption section, so it cannot be held or transported while the panel is at a high temperature, and it takes time to cool the panel on the tray after the process is completed. As a result, the flow of the panels that are sequentially processed continuously is stagnated, and the tact time of the entire production process cannot be shortened. [Summary of the Invention] The present invention provides a substrate transporting device, which is a substrate transporting device that transports a substrate placed on a processing tray and in a high temperature state to a next recovery tray, which includes: The substrate on the processing tray is processed into a holding member made of a thermal material held by the T. The substrate on the processing tray is transferred from the processing tray to the holding member. I Turn 5 20053 ft3sif4 > c Transfer the substrate held by the moving sheet of the tray when the mobile unit is moved to the above-mentioned substrate conveying device on the first member on the recovery tray, and the through-hole soil provided on the tray The unit includes a structure in which the processing hole is reduced from the second through the through hole, and the second holding member on the back surface of the substrate is lifted through the processing tray. And == 出;, the substrate is transferred to the second liter of Baoxing lifting ^ t, including the tray loading into the tray II = can be recovered by the second lifting member:: Baniuhan is held on the holding member The substrate is moved to a collection tray and transferred to a collection tray. ^ In the above-mentioned substrate conveying device, the processing tray is partially separated and placed; the first transfer unit has a through-processing tray and is lifted Γ a lifting member 'lifts the main body on which the processing tray is placed by the first lifting member After the back end of the mounting member is joined with the holding member, the first! The lifting member is lowered, and the mounting structure is transferred to the holding member together with the substrate. In addition, the second transfer unit includes a second lifting member for lifting and lowering the recovery tray, and the second lifting member for lifting and lowering the recovery tray ′ and a holding member that is held on the holding member and moved to the recovery tray is transferred to the substrate together with the substrate. Composition on the recycling tray. In the substrate transfer apparatus described above, a cooling unit may be provided on the collection tray to cool the substrate transferred from the processing tray. 6 20053iS3plf4c The present invention also provides a substrate processing apparatus including a storage chamber for storing a processing tray for placing a substrate in a high temperature state, and the above-mentioned substrate transporting device. According to the present invention, even if the substrate is in a high-temperature state, the substrate on the processing tray is transferred to the substrate for recycling, because it is a simple member formed of a heat-resistant material. Therefore, the substrate can be transferred in a convenient manner, and Reduce the overall production time (tacttime) of the production process. ▲ In order to make the above and other objects, features, and advantages of the present invention more comprehensible, the preferred embodiments are described below in detail with the accompanying drawings as follows. [Embodiment] Next, a substrate transfer apparatus and a substrate processing apparatus according to an embodiment of the present invention will be described with reference to Figs. 1 to 5. (First Embodiment) FIG. 1 is a diagram showing a schematic overall configuration of a substrate processing apparatus having a substrate transfer apparatus according to a first embodiment of the present invention. Fig. 2 is a perspective view of a chuck portion provided in the substrate transfer apparatus according to the first embodiment. Fig. 3 (a) to Fig. 3 (i) are schematic configuration diagrams of the configuration of a substrate transfer apparatus according to the first embodiment. The substrate processing apparatus 10 includes a loading chamber u, a processing chamber 12, an unloading chamber 13, and a recycling station 14. In the loading chamber u, a gate G1 is provided facing the outside. A gate G2 is provided at the boundary of the loading chamber 11 and the processing chamber 12, and a gate G3 is provided at the boundary of the processing chamber 12 and the unloading chamber 13. In the unloading chamber 13, A gate G4 is provided facing the recycling station 14. The gates G1 to G4 are configured to be individually switchable. In addition, the recycling station 14 may not constitute a chamber, but may only be used. Of the eight rules u, the processing chamber 12, the unloading chamber 13, and the recycling station 14, two: trays 15, 16, 17 and a recycling tray for placing the substrate w
、= 15、16、17為將複數片基板w排列為複數行、 I '仃載置之相同形狀的平板,但只在托盤17上,根 的排列而穿孔形成有複數個貫職17a。回收托 ^ :、、、載置1行或1列複數片基板W的的平板。基板W 2利用例如非結晶型賴的域f池面板,且在處理室12 在,板表面上形成氮化石夕膜作為防反射膜。通常情況 下,太陽電池面板利用平行平板等離子CVD (化學汽相沈 積)被加熱到300〜500Τ左右。 在卸載室13中,收納有夾盤部2〇和升降板3〇,還設 置有驅動失盤部20的水平驅動機構21和使升降板30升降 的升降機;構31。夾盤部2〇利用水平驅動機構21,在圖中 進行左右往返運動,當將托盤17上的基板W向回收托盤 以進行搬運時,通過閘門G4而進入到回收站14内。關= 夾盤部20的構造將在後面進行說明。 升降板30利用升降機構31,在圖中進行上下往返運 動。在升降板30的上面,複數根銷30a與托盤17的複數 個貝通孔17 a位置對合並插入設置。而且,在回收站1 * 中’設置有使回收托盤18升降的升降機構32,且在回收 站14内,收納有從回收托盤18接收基板W並進行收納的 盒部40。, = 15, 16, and 17 are flat plates of the same shape in which a plurality of substrates w are arranged in a plurality of rows and I ′ are placed, but only on the tray 17, a plurality of permanent posts 17 a are formed by perforation of the roots. A flat plate on which a plurality of substrates W in one row or one column are placed. The substrate W 2 uses, for example, a non-crystalline Lai F cell panel, and a nitride stone film is formed on the surface of the plate in the processing chamber 12 as an anti-reflection film. Normally, solar cell panels are heated to about 300 ~ 500T using parallel flat plate plasma CVD (chemical vapor deposition). In the unloading chamber 13, a chuck portion 20 and a lifting plate 30 are housed, and a horizontal driving mechanism 21 for driving the missing plate portion 20 and a lifter for lifting the lifting plate 30 are provided; The chuck section 20 uses the horizontal drive mechanism 21 to perform a left-right reciprocating motion in the figure. When the substrate W on the tray 17 is moved toward the recycling tray for transportation, it enters the recycling station 14 through the gate G4. Off = The structure of the chuck section 20 will be described later. The elevating plate 30 uses the elevating mechanism 31 to move up and down in the figure. On the upper plate 30, a plurality of pins 30a and a plurality of bethle holes 17a of the tray 17 are inserted in a combined position. In the recycling station 1 *, a lifting mechanism 32 for raising and lowering the recycling tray 18 is provided. In the recycling station 14, a box portion 40 that receives the substrate W from the recycling tray 18 and stores it is stored.
200539314 i 6226pif.doc 參照圖2對央盤部20的構造進行說明。夾盤部20是 斷面呈矩形且兩端開放的管狀,且其下面的中央部分是呈 被切掉的形狀。端部2〇a為與基板w的兩端抵接並進行保 持以免基板W下降的部分,以下將夾盤部2〇保持基板w 的動作稱作夾緊(chucking)。在圖示中,距離yi被設定 得較基板W的尺寸短,距離y2被設定得較基板賈的尺寸 長而且,距離yl為了通過回收托盤18,被設定得較回 收托盤18的寬度尺寸(與圖丨的紙面垂直的方向)長。夾 盤部20的長邊方向(xs向)白勺尺寸,由基板…的尺寸 和被夾緊的片數而決定。 夾盤部20由於形成圖2所示的形狀,所以在爽緊時, 不與基板W的上面接觸,不會受到損傷。而且,在夾緊時, 2形成-種覆蓋基板w上面的狀態,所以能夠防止灰塵 的=:著。夾盤部20由金屬、陶細的具有耐熱性 ,作。藉由使夾盤部20為金屬製或 =的基板也可立即夾緊進行搬運,所以㈣縮短夺 w 1根據本實施形態的基板處理裝置1G之基板 間門m行說明。未處理的基板w從外部通過 向處理室m11的滅15搬運,料通過閘⑽ 成加熱到所定溫度而進行。 杯般I 束後的基板W,通過閘門G 3被向卸載室Π沾 7搬運。在該階段,基板冒形成高溫狀態。 9 200539314 16226pif.doc 成膜處理後的基板W由夾盤部20被夾緊,從卸載室 13的托盤17被向回收站14的回收托盤18搬運。另外, 成膜處理後的基板W從回收托盤a被向盒部4〇搬運,且 收納在盒部40内。對該搬運過程,利用圖3 (a)〜圖3 (0的部分構成圖詳細地進行說明。 圖3 (a)〜圖3 (C)所示為卸載室13内的情況,圖 3(d)〜圖3(f)及圖3(g)〜圖3(i)所示為回收站 14内的情況。圖3(a)所示為載置基板w之托盤17和夾 盤部20的位置關係的平面圖,圖3 (b)為圖3 (a)的工_工 斷面圖,圖3 (c)為圖3 (a)的ιΗΙ斷面圖。圖3 (d)所 示為載置基板W之回收托盤18和夾盤部2〇的位置關係的 平面圖,圖3 (〇為圖3 (d)的πι-m斷面圖,圖3 (f) 為圖3 (d)的IV_IV斷面圖。圖3 (g)所示為載置基板% 之回收托盤18和盒部40的位置關係的平面圖,圖3 (h) 為圖3 (g)的V_V斷面圖,圖3 (i)為圖3 (g)的%_% 斷面圖。 如圖3 (a)的平面圖所示,使基板w在托盤17上以 3片為單位進行排列。在初期狀態下,預先使夾盤部加從 托盤部17的上方退開。首先,如圖3 (b)、圖3(c)所示, 使升降板上升並使銷30a的頂端通過貫通孔〗7a的頂端與 3片基板w的背面抵接,且將基板w從托盤17的表面只 隹I所疋距離。使夾盤部2〇沿基板w的表面,在圖3 (a) 的XI方向上進行滑動,而使3片基板w位於夹盤部如 的内部,並與端部2〇a靠近。藉由使升降板咒下降,而結 200539314 16226pif.doc200539314 i 6226pif.doc The structure of the central disk unit 20 will be described with reference to FIG. 2. The chuck portion 20 is a tube having a rectangular cross-section and both ends are open, and the center portion of the chuck portion 20 is cut out. The end portion 20a is a portion that comes into contact with both ends of the substrate w and is held to prevent the substrate W from descending. Hereinafter, the operation of the chuck portion 20 to hold the substrate w is referred to as chucking. In the illustration, the distance yi is set to be shorter than the size of the substrate W, the distance y2 is set to be longer than the size of the substrate, and the distance yl is set to be wider than the width of the recovery tray 18 (and Figure 丨 the paper surface is vertical). The size of the chuck portion 20 in the longitudinal direction (xs direction) is determined by the size of the substrate ... and the number of pieces to be clamped. Since the chuck portion 20 is formed in the shape shown in FIG. 2, it does not contact the upper surface of the substrate W and is not damaged when it is tight. In addition, during clamping, 2 forms are formed to cover the upper surface of the substrate w, so that dust can be prevented from being caught. The chuck portion 20 is made of metal and ceramics and has heat resistance. Since the chuck portion 20 is made of a metal or a substrate, the substrate can be immediately clamped and transported. Therefore, the length of the inter-substrate door m of the substrate processing apparatus 1G according to this embodiment will be shortened. The unprocessed substrate w is transferred from the outside to the processing chamber m11, and the material is heated to a predetermined temperature through the gate. The substrate W bundled in a cup-like shape is transferred to the unloading chamber Π 7 through the gate G 3. At this stage, the substrate rises to a high temperature state. 9 200539314 16226pif.doc The substrate W after the film formation process is clamped by the chuck section 20, and is transferred from the tray 17 of the unloading chamber 13 to the recycling tray 18 of the recycling station 14. In addition, the substrate W after the film formation process is transferred from the recovery tray a to the box portion 40 and is stored in the box portion 40. This conveyance process will be described in detail with reference to Fig. 3 (a) to Fig. 3 (0). Figs. 3 (a) to 3 (C) show the inside of the unloading chamber 13, and Fig. 3 (d) Figures 3 (f) and 3 (g) to 3 (i) show the inside of the recycling station 14. Figure 3 (a) shows the tray 17 and the chuck section 20 on which the substrate w is placed. Figure 3 (b) is a plan view of the positional relationship, and Figure 3 (b) is a cross-section view of Figure 3 (a), and Figure 3 (c) is a cross-sectional view of Figure 1 (a). Figure 3 (d) shows the load A plan view of the positional relationship between the recovery tray 18 on the substrate W and the chuck portion 20 is shown in FIG. 3 (0 is a π-m sectional view of FIG. 3 (d), and FIG. 3 (f) is IV_IV of FIG. 3 (d) Sectional view. Fig. 3 (g) is a plan view showing the positional relationship between the recovery tray 18 on which the substrate is placed and the box portion 40, and Fig. 3 (h) is a V_V cross-sectional view of Fig. 3 (g), and Fig. 3 ( i) is a sectional view of% _% in Fig. 3 (g). As shown in the plan view of Fig. 3 (a), the substrates w are arranged on the tray 17 in units of three pieces. In the initial state, the clamps are made in advance. The plate portion is retracted from above the tray portion 17. First, as shown in FIG. 3 (b) and FIG. 3 (c), the lifting plate is raised and the tip of the pin 30a passes through the top of the through hole. It is in contact with the back surfaces of the three substrates w, and the substrate w is spaced a distance from the surface of the tray 17. The chuck portion 20 is slid along the surface of the substrate w in the direction XI in FIG. 3 (a). , And the three substrates w are located inside the chuck part and close to the end part 20a. By lowering the lifting plate spell, the knot 200539314 16226pif.doc
束基板W的夾緊。 接著,如圖3 (d) 圖 (e)、圖3 (f)所示, 使夾 緊3片基板W的夾盤部20移動到回收滅18的上方^ 利用升降機構32使回收托盤18從設定位置上升時,。虽 回收 托盤18的上面通過夾盤部20下面的中央開口,鱼 板W的背面抵接,並將基板W只推起所定距離f藉月基 片基板W形成一種從爽盤部20的端部施分離並J ’ 3 狀態。在該狀態下,使夾盤部20沿圖3 (d)的χ2方^的 動,並與3片基板W脫離,返回到初始位置。利用 構32,使回收托盤18下降並返回到設定位置。藉由:機 的過程,完成從托盤17向回收托盤18之基板w的搬 在圖3 (a)中,使返回到初始位置的夾盤部2〇向上口° 偏離1列後,沿X4方向進行移動,準備下一次基板^ 搬運。 的 接著,將搬運到回收托盤18的基板w㈣到各部4〇The bundle substrate W is clamped. Next, as shown in FIG. 3 (d), FIG. 3 (e), and FIG. 3 (f), the chuck portion 20 that clamps the three substrates W is moved above the recovery unit 18. The lifting tray 32 is used to lift the recovery tray 18 from When the setting position is raised. Although the upper surface of the recovery tray 18 passes through the central opening under the chuck portion 20, the back surface of the fish plate W abuts, and the substrate W is pushed up only a predetermined distance f to form an end portion of the refreshing plate portion 20 by the moon substrate substrate W Shi separated and J'3 state. In this state, the chuck portion 20 is moved along the χ2 direction in Fig. 3 (d), separated from the three substrates W, and returned to the initial position. With the mechanism 32, the collection tray 18 is lowered and returned to the set position. In the process of the machine, the transfer of the substrate w from the tray 17 to the recovery tray 18 is completed. As shown in FIG. 3 (a), the chuck portion 20 returned to the initial position is shifted upward by 1 ° from the opening angle, and then moves along the X4 direction. Move and prepare for the next substrate ^ transfer. Next, the substrate w transferred to the collection tray 18 is transferred to each section 4.
中。如圖3(g)、圖3⑴、圖3⑴所示,使回收托盤 18向盒部40方向,即圖3 (g)的χ3方向進行移動,並在 内部,成多層之盒部40的各層中,使基板w以每層i片 的开> 恶被收納。此時,使盒部40向圖3 ( h)的z方向間 歇性移動。該閜歇性移動距離為盒部4〇的層間隔。另外, 即使使回收托盤18間歇性地向上方移動,並使盒部4〇沿 左右方向往返移動,也可將基板w收納到盒部4〇中。= 些一系列的搬運過程依次反復’使托盤17上的基 部收納到盒部40中。in. As shown in FIGS. 3 (g), 3 (i), and 3 (i), the recovery tray 18 is moved in the direction of the box portion 40, that is, in the direction of χ3 in FIG. 3 (g), and is internally formed into each layer of the box portion 40 in multiple layers. , So that the substrate w is housed in the opening > At this time, the box portion 40 is intermittently moved in the z direction in Fig. 3 (h). This restorative moving distance is the step interval of the box portion 40. In addition, even if the collection tray 18 is intermittently moved upward and the box section 40 is moved back and forth in the left-right direction, the substrate w can be stored in the box section 40. = These series of conveying processes are repeated in sequence 'so that the base portion on the tray 17 is stored in the box portion 40.
200539314 16226pif.doc 卻機構19。= 4盤1^設置有用於冷卻基板W的冷 古^ ^ ,、疋進仃了成膜和加熱處理的基板W形成 18二二了一製程。藉由設置冷卻機構19,可使回收托盤 各加、土板〜迅速冷卻,所以可在短時間内將基板冒向 二。40進仃收納。作為冷卻機構丨9,可採用冷卻水的循 裱、冷風的送風等。 本實施形態的基板搬運裝置,由於利用财熱性材料所 ^作的夹,20,將基板W進行機械性地夾緊(保持),所 以即使為高溫的基板也可立即搬運,能夠縮短生產時間。 =外,藉由在回收托盤18上設置用於冷卻基板 W的冷卻 钱構19,即使為咼溫的基板也可立即進行冷卻,所以可進 :步縮短生產時間。而且,由於在卸載室13中設置有夾盤 邛20、水平驅動機構21、升降板30、升降機構31,所以 不需要用於基板搬運裝置的新空間,不會招致基板處理裝 置10的大型化,能夠以簡潔的構成進行基板的處理和搬 運。另外,在本實施形態中,由夾盤部2〇、水平驅動機構 21、升降板30、升降機構31,32構成基板搬運裝置。 (第2實施形態) 圖4(a)〜4(i)所示為根據本發明的第2實施形態的基板 搬運裝置之構成的概略部分構成圖。具有本實施形態的基 板搬運裝置之基板處理裝置的構成,與第1實施形態所說 明的基本相同,所以只對不同點進行說明。而且,由於夾 盤部、水平驅動機構及升降機構也與根據第1實施形態之 12 200539314 &板搬運j置相同’所以對蝴的構成構件付以相同的符200539314 16226pif.doc but agency 19. = 4 trays 1 ^ is provided with a cooling substrate ^ ^ for cooling the substrate W, and the substrate W formed into a film and a heat treatment is formed into a 1821 process. By providing the cooling mechanism 19, the collection tray can be added quickly and the soil plate can be quickly cooled, so that the substrate can be moved to two in a short time. 40 into the storage. As the cooling mechanism 9, it is possible to use cooling water circulation, cold air supply, and the like. Since the substrate conveying device of this embodiment uses a clip made of a thermally-conductive material, 20, the substrate W is mechanically clamped (held), so that even a substrate having a high temperature can be immediately conveyed, and the production time can be shortened. In addition, by providing a cooling mechanism 19 for cooling the substrate W on the recovery tray 18, even a substrate having a high temperature can be immediately cooled, so that the production time can be further reduced. In addition, since the chuck 20, the horizontal drive mechanism 21, the lifting plate 30, and the lifting mechanism 31 are provided in the unloading chamber 13, no new space for the substrate conveying device is required, and the substrate processing device 10 is not increased in size. , Can handle and transport substrates with a simple structure. In this embodiment, the substrate transfer device is constituted by the chuck section 20, the horizontal drive mechanism 21, the lifting plate 30, and the lifting mechanisms 31 and 32. (Second Embodiment) Figs. 4 (a) to 4 (i) are schematic partial configuration diagrams showing the configuration of a substrate transfer apparatus according to a second embodiment of the present invention. The configuration of the substrate processing apparatus having the substrate transfer apparatus of this embodiment is basically the same as that described in the first embodiment, so only the differences will be described. In addition, since the chuck section, the horizontal driving mechanism, and the lifting mechanism are also the same as those of the plate conveying device according to the first embodiment 12 200539314 &
.,U)所示為卸載室13内的情況,圖 4^^4(^圖化)〜圖川)所示為回收站 般部9r/〆兄。圖4/a)所示為載置基板W之托盤17和失 Θ位置關係的平面圖,圖4 (b)為圖4 (a)的1J - ^ ’圖4 (C)為圖4 (a)的Π-Π斷面圖。圖4⑷所 =為載置基板W之回收托盤18和夾盤部20的位置關係的 ^面圖’圖4 (e)為圖4 (d)的ΙΙΙ-ΙΙΙ斷面圖,圖4⑴ :、、、圖4 (d)的IV-IV斷面圖。圖4 (g)所示為載置基板w =回收托盤18和盒部4〇的位置關係的平面圖,圖4⑴(, U) shows the situation in the unloading chamber 13, and Figure 4 ^^ 4 (^ Figure) ~ Figure Chuan) shows the general part 9r / 〆 brother of the recycling station. Fig. 4 / a) is a plan view showing the positional relationship between the tray 17 on which the substrate W is placed and the loss of Θ. Fig. 4 (b) is 1J-^ 'of Fig. 4 (a). Fig. 4 (C) is Fig. 4 (a) Sectional view of Π-Π. Fig. 4 (a) is a top view of the positional relationship between the recovery tray 18 and the chuck portion 20 on which the substrate W is placed. Fig. 4 (e) is a cross-sectional view of III-III in Fig. 4 (d). 4. Section IV-IV in Figure 4 (d). FIG. 4 (g) is a plan view showing the positional relationship between the mounting substrate w = recovery tray 18 and the box portion 40, and FIG. 4⑴
二圖4 (g)的V_V斷面圖,圖4 (〇為圖4 (g)的VI-VI 斷面圖。 參照圖4(a)〜4(i)對與第1實施形態所說明之構成不同 的=進行說明。首先,托盤Η?與圖3⑻〜的托盤口在 構造上有所不同。如圖4(a)、圖4(b)、圖4(c)所示, 在托盤117上形成有複數個採用2層結構的分層式孔部 U7b’且在各個分層式孔部117b上分別裝卸自如地設置有 用於載置基板W的載置構件117a。而且,升降板130也 與圖3(a)〜3(i)的升降板3〇不同。即,採用一種使升降板 的上面與載置構件117a的下面抵接,將升降板130進 行升降的結構。2 is a sectional view taken along the line V_V in FIG. 4 (g), and FIG. 4 (0 is a sectional view taken along the line VI-VI in FIG. 4 (g). Refer to FIGS. 4 (a) to 4 (i) for the description of the first embodiment. The structure is different. = First, the structure of the tray Η is different from that of the tray openings shown in FIGS. 3 to 2. As shown in FIGS. 4 (a), 4 (b), and 4 (c), the tray 117 A plurality of layered hole portions U7b 'having a two-layer structure are formed thereon, and a mounting member 117a for mounting the substrate W is detachably provided in each layered hole portion 117b. In addition, the lifting plate 130 is also 3 (a) to 3 (i). That is, a structure is adopted in which the upper surface of the lifting plate is brought into contact with the lower surface of the mounting member 117a, and the lifting plate 130 is raised and lowered.
、對採用上述那種構成的基板處理裝置之基板W的搬 運過程進行說明。如圖4 (a)的平面圖所示,使基板W 13The process of transporting the substrate W using the substrate processing apparatus configured as described above will be described. As shown in the plan view of FIG. 4 (a), the substrate W 13
2005393H 在托盤117上以3片為單位進行排列。在初期狀態下,預 先使夾盤部20從托盤部117的上方退開。首先,如圖4 (b)、圖4(c)所示,當使升降板13〇上升時,升降板 的上面與載置構件117a的下面抵接,並將載置構件u7a 只推起所定距離。此時,在載置構件U7a的上面載置有3 片基板W。如第1實施形態所說明的,使夾盤部20沿基 板W的表面,在圖4 (a)的“方向上進行滑動,並將^ 置有3片基板W的載置構件U7a由夾盤部2〇的端部2如 • 失緊。該失緊與姻第丨實施形_說明的方法是相同 的。即使基板W的夾緊結束,也不使升降板3〇下降。 接著,如圖4 (d)、圖4 (e)、圖4 (f)所示,使夾 緊了載置有3片基板W之載置構件U7a的夾盤部汕,移 動到回收托:t 18的上方。當利用升降機構32使回收托盤 18從設定位置上升時,回收托盤18的上面通過夾盤部2〇 下面的中央開口,與載置構件117a的下面抵接,並將載置 構件117a只推起所定距離。藉此,載置構件㈣形成一 • 種在載置有3片基板W的情況下從夾盤部2〇的端部術 分離並浮起的狀態。在該狀態下,使夾盤部2〇沿圖4 的x2方向進行滑動,並與載置構件U7a脫離。利用升降 機構32,使回收托盤18下降並返回到設定位置。藉由以 上的過程,完成從托盤117向回收托盤18之基板w的搬 運。3片基板W保持一種在載置構件117a上被載置的狀 態。 接著,將搬運到回收托盤18上之載置構件117a上的 14 200539314 16226pif.doc 基板W,收納到盒部40中。藉由使夾盤部20與載置構件 脫離而使3片基板W的表面露出。在使真空夾盤 裝巧吸附部5〇從3片基板w的上方下落,將3片基: :同日讀仃真空吸附後,使吸附部5G從载置構件117a脫 板w、隹圖-4 (g)、圖4⑴、圖4⑴所示,使將3片基 仃了真空吸附之吸附部5 〇向盒部4 〇,即向圖4 ( g )2005393H is arranged on the tray 117 in units of 3 pieces. In the initial state, the chuck section 20 is retracted from above the tray section 117 in advance. First, as shown in FIGS. 4 (b) and 4 (c), when the lifting plate 13 is raised, the upper surface of the lifting plate abuts on the lower surface of the mounting member 117a, and the mounting member u7a is only pushed up to a predetermined level. distance. At this time, three substrates W are placed on the upper surface of the placing member U7a. As described in the first embodiment, the chuck portion 20 is slid along the surface of the substrate W in the direction of "a" in FIG. 4 (a), and the mounting member U7a on which the three substrates W are placed is moved by the chuck. The end 2 of the portion 20 is loosened. This loosening is the same as the method described in the embodiment. Even if the clamping of the substrate W is completed, the lifting plate 30 is not lowered. Next, as shown in FIG. As shown in 4 (d), FIG. 4 (e), and FIG. 4 (f), the chuck portion holding the mounting member U7a on which the three substrates W are placed is moved to the top of the collection tray: t 18 When the recovery tray 18 is raised from the set position by the lifting mechanism 32, the upper surface of the recovery tray 18 passes through the central opening of the lower portion of the chuck portion 20 and abuts the lower surface of the mounting member 117a, and pushes the mounting member 117a only A predetermined distance is thereby formed. As a result, the mounting member ㈣ forms a state in which three substrates W are placed apart from the end of the chuck section 20 and floated. In this state, the clamp The tray portion 20 slides in the direction x2 in FIG. 4 and is separated from the mounting member U7a. The lifting tray 32 is used to lower the recovery tray 18 and return to the set position. Through the above process, the transfer of the substrate w from the tray 117 to the recovery tray 18 is completed. The three substrates W are maintained in a state of being placed on the placing member 117a. Next, the placement is carried on the recovery tray 18 The 14 200539314 16226pif.doc substrate W on the member 117a is stored in the box portion 40. The surfaces of the three substrates W are exposed by disengaging the chuck portion 20 from the mounting member. The vacuum chuck is equipped with a suction portion 50. The three substrates are dropped from above the three substrates w .: After the vacuum suction is performed on the same day, the adsorption portion 5G is released from the mounting member 117a, w-4 (g), 4 (4), and 4 (4). As shown in the figure, the adsorption portion 50 where three substrates are vacuum-adsorbed is moved to the box portion 40, that is, to FIG. 4 (g).
中以向進仃移動’且在内部形成多層之盒部4G的各層 片的形態收納基板W。此時,使盒部40向圖4 外,即向以每層間隔為單位進行間歇性地移動。另 動,並使空夾盤裝置的吸附部5〇間歇性地向上方移 盒部40中皿進左右方向往返移動,也可將基板W向 托盤17 些一系列的搬運過程依次反復,使 列的搬運^^全部被收納到盒部40中。當這些一系 上方只再次將爽盤部20在圖4⑷中向 板w::運'列後’沿χ4方向進行 盤18在的搬運動作之前,還有-個將回收托 程。即,在將裁罟福^構件η轉換到㈣117上的製 的吸附部50逸〜、U7a上的基板W以真空夾盤裝置 部滑動,ίΓί附並向盒部4G側進行移動後,使夹盤 夾盤部20返回收托盤18上的載置構件117a,並使 I 2◦返回到初始位置,將 進行轉移,且使升降板130下卩夂而/^牛117&向升降板13〇 牛而將载置構件117a轉換到 200539314 16226pif.doc Ϊ盤117/。另外,即使在本實施形態中,也可在回收托 盤18上设置用於冷卻基板w的冷卻機構19。另外,在本 部2〇、水平嗔^ 升降機構31、32構成基板搬運裝置。 的作用If本r广恶中’也可起到與第1實施形態同樣 的作用效果。另外,由於將載置構件117a與基板w 一起 夾緊’所以即使從托盤17向回收托盤18進行 w彼此間的位置關係也是不變的,不需要進行特別= 位’使例如將基板Wllu_盒部4G巾的作業變得容易。 本發明並不限定於以上所說明的實施形態, 害其特徵即可。例如,在本實施形態中,為ί說明、上的^ 是對以3片為單雜縣板”情況崎說明的2 並不蚊於3 ^既可為丨片也可為複數片。而且,样 明的基板搬運裂置並不只限於從卸載室13向回收站Μ ^ ^板搬運’也可用於例如從處理室12向卸載室13的基板 搬運。 另外,本發明的基板搬運裝置,也可用於基板w 卸載室㈣时站14或基板處理裝㈣料部被搬 的基板搬運。^本發明的基板搬絲置,也可用於 站14内的基板搬運和在基板處理裳置1〇以外之場所的美 板移載。如圖5所示’可將本發明的基板搬運裝置在= 站14内進行設置使用。如前面所說明的,在回收站μ 口 是所定空間的情況下,基板搬運震置可設置在基板處理粟、 置嫩的外部。另外,在圖5巾,對與^採用相同構成 200539314 16226pif.doc 的構件付以相同的符號,並省略說明。 雖然本發明已以較佳實施例揭露 限定本發明,任何孰羽卜妯疏I如 …、,、並非用以 .rpi^ A 热白此技藝者,在不脫離本發明之精神 【圖式簡單說明】 番夕二^了為具有關於本發明的實施形態的基板搬運裝 置之基板處理I置的概略全體構顧。 、 =為在關於本發明的第丨實施形態的基板搬運裝置 上所"又置之夾盤部的斜視圖。 圖3(a)〜3(i)為根據本發明的第丨實施形態的基板 装置之構成的概略構成圖。 圖:(:)〜4(i)為根據本發明㈣2實施形態的基板搬運 袭置之構成的概略構成圖。 圖5所示為關於本發明的實施形態之基板搬運裝 5又置於基板處理裝置的外料的概略全體構成圖。 【主要元件符號說明】 10、 ]〇A :基; 11 加載室 12 處理室 13 卸載室 14 回收站 15- ‘17 ··托盤 200539314 16226pif.doc 17a :貫通孔 18 :回收托盤 19 :冷卻機構 20 :夾盤部 20a :端部 21 :水平驅動機構 30 ··升降板 30a :銷 31、32 :升降機構 40 :盒部 50 :吸附部 117 :托盤 117a :載置構件 117b :分層式孔部 130 :升降板The substrate W is housed in a form of "moving forward" and forming a plurality of layers of the box portion 4G inside. At this time, the box portion 40 is moved intermittently outside of FIG. 4, that is, in units of intervals of each layer. Separately, the suction part 50 of the empty chuck device is intermittently moved upwards to the left and right in the box part 40, and the substrate W can also be repeatedly moved to the tray 17 in a series. All of the transports ^^ are stored in the box portion 40. When the pan section 20 is moved to the plate w :: shipping row in FIG. 4 (a), the plate 18 is transported in the direction of χ4 again in the above series, and there will be a recovery process. That is, the substrate W on the U7a is slid with the vacuum chuck device after the cutting member 50 is converted to the suction section 50, which is made on the 117, and is moved to the 4G side of the box section. The disk chuck portion 20 returns to the placing member 117a on the receiving tray 18, returns I 2 to the initial position, and transfers the lower plate 130 to the lower plate 117. The mounting member 117a is converted to 200539314 16226pif.doc disk 117 /. Further, even in this embodiment, a cooling mechanism 19 for cooling the substrate w may be provided on the recovery tray 18. The substrate 20 and the horizontal lifting mechanisms 31 and 32 constitute a substrate conveying device. The same effect as that of the first embodiment can be achieved in the present example. In addition, since the mounting member 117a is clamped together with the substrate w, even if the positional relationship between w from the tray 17 to the recovery tray 18 is constant, there is no need to perform a special = position, for example, to place the substrate Wllu_box The operation of the 4G towel becomes easy. The present invention is not limited to the embodiments described above, and it is only necessary to detract from the characteristics. For example, in the present embodiment, for the explanation, the above ^ refers to the case where 3 pieces are used as a single miscellaneous county board. The case 2 described above is not a mosquito, and 3 ^ may be 丨 pieces or plural pieces. Moreover, The substrate transfer cracking is not limited to the board transfer from the unloading chamber 13 to the recycling station M ^^, and it can also be used to transfer the substrate from the processing chamber 12 to the unloading chamber 13. In addition, the substrate transfer apparatus of the present invention can also be used. When the substrate w is unloaded in the substrate unloading chamber, the substrate 14 is transferred by the station 14 or the substrate processing and loading unit. ^ The substrate transfer device of the present invention can also be used for substrate transportation in the station 14 and other than 10 in the substrate processing rack. The board of the place is transferred. As shown in FIG. 5, the substrate conveying device of the present invention can be installed and used in the station 14. As explained above, when the μ port of the recycling station is a predetermined space, the substrate is conveyed. Vibration can be set on the outside of the substrate processing millet and tender. In addition, in Fig. 5, the components that use the same structure 200539314 16226pif.doc as ^ are given the same symbols, and description is omitted. Although the present invention has been better The examples disclosed limit the invention, any I do n’t use it as a way to… .., rpi ^ A Hot white artists, without departing from the spirit of the present invention [Schematic description] Fan Xier ^ The overall consideration of the outline of the substrate processing device of the substrate transfer device. Is a perspective view of a chuck portion provided on the substrate transfer device according to the first embodiment of the present invention. Fig. 3 (a) ~ 3 (i) is a schematic configuration diagram of the structure of a substrate device according to the first embodiment of the present invention. Figures: (:) to 4 (i) are schematic configurations of the structure of a substrate transport and placement according to the second embodiment of the present invention. Fig. 5 is a schematic diagram showing the overall structure of a substrate handling device 5 according to an embodiment of the present invention and an external material placed on a substrate processing apparatus. [Description of main component symbols] 10,] 〇A: 基; 11 Loading chamber 12 Processing chamber 13 Unloading chamber 14 Recycling station 15-'17 Pallet 200539314 16226pif.doc 17a: Through hole 18: Recycling tray 19: Cooling mechanism 20: Chuck portion 20a: End portion 21: Horizontal drive mechanism 30 Plate 30a: Pins 31, 32: Lifting mechanism 40: Box portion 50: Suction section 117: Tray 117a: Mounting member 117b: Layered hole section 130: Lifting plate
Gl、G2、G3、G4 :閘門 W :基板 yl、y2 :距離 18Gl, G2, G3, G4: Gate W: Base plate yl, y2: Distance 18
Claims (1)
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JP2004157274A JP2005340499A (en) | 2004-05-27 | 2004-05-27 | Substrate carrying equipment and substrate treatment device equipped therewith |
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TW200539314A true TW200539314A (en) | 2005-12-01 |
TWI275132B TWI275132B (en) | 2007-03-01 |
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JP (1) | JP2005340499A (en) |
KR (1) | KR100701642B1 (en) |
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JP2005340499A (en) | 2004-05-27 | 2005-12-08 | Shimadzu Corp | Substrate carrying equipment and substrate treatment device equipped therewith |
KR100765189B1 (en) * | 2006-11-30 | 2007-10-15 | 세메스 주식회사 | Method of transferring a substrate, and method and apparatus of processing a substrate |
DE102007010710A1 (en) | 2007-02-28 | 2008-09-04 | Q-Cells Ag | Carrier system for fixing multiple substrates to be processed, has is arranged with substrate in processing unit by holding device, such that force of gravity, which has force component, points away from assigned contact area |
US20110318144A1 (en) * | 2009-03-11 | 2011-12-29 | Sakae Kobayashi | Substrate transfer system and method, and component mounting apparatus and method |
JP4535408B1 (en) * | 2010-05-10 | 2010-09-01 | 智雄 松下 | Substrate transport mechanism and substrate transport method |
CN101882565B (en) * | 2010-06-03 | 2012-04-11 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Online processing equipment |
KR20120059218A (en) * | 2010-11-30 | 2012-06-08 | 주식회사 테라세미콘 | METHOD FOR LOADING A SUBSTRATE IN For Flexible Display HOLDER And SYSTEM FOR THE SAME |
CN102263047B (en) * | 2011-08-19 | 2013-05-22 | 清华大学 | Wafer thermal buffer stack and method for realizing thermal buffer |
KR101205245B1 (en) | 2012-07-25 | 2012-12-03 | 주식회사 테라세미콘 | Method for loading flexible substrate |
CN103855057B (en) * | 2012-12-04 | 2016-04-27 | 北京北方微电子基地设备工艺研究中心有限责任公司 | The cooling means of pallet lift device, pre-heating device and high temperature pallet |
CN103551743A (en) * | 2013-11-04 | 2014-02-05 | 苏州德龙激光股份有限公司 | Glass drilling device for production line |
CN104210844B (en) * | 2014-09-10 | 2016-11-02 | 深圳市华星光电技术有限公司 | Glass substrate transmission system and mechanical hand thereof |
CN107428472B (en) * | 2015-03-27 | 2020-06-02 | 艺端机电设备私人有限公司 | Modular processing table transport apparatus and method of operation |
CN114334761B (en) * | 2021-12-10 | 2022-12-27 | 昆山铭驰自动化科技有限公司 | Automatic wafer transporter |
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KR0137828B1 (en) * | 1994-10-31 | 1998-06-01 | 황인길 | Handling method for wafer and apparatus thereof |
JPH09213772A (en) | 1996-01-30 | 1997-08-15 | Dainippon Screen Mfg Co Ltd | Board holder |
JP2002324829A (en) * | 2001-07-13 | 2002-11-08 | Tokyo Electron Ltd | Treating system |
JP2003045932A (en) * | 2001-08-01 | 2003-02-14 | Fujitsu Display Technologies Corp | Cassette for storing substrate and method for storing substrate |
JP2003092335A (en) * | 2001-09-18 | 2003-03-28 | Toshiba Corp | Substrate carrying apparatus, substrate processing apparatus using the same and substrate processing method |
JP2004018215A (en) * | 2002-06-18 | 2004-01-22 | Tokyo Electron Ltd | Heat-treatment apparatus for flat panel display and heat treatment method |
JP2005340499A (en) | 2004-05-27 | 2005-12-08 | Shimadzu Corp | Substrate carrying equipment and substrate treatment device equipped therewith |
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TWI275132B (en) | 2007-03-01 |
JP2005340499A (en) | 2005-12-08 |
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