TW201344830A - Robot for transferring substrate, multi-chamber substrate processing apparatus using the same, and control method therefor - Google Patents
Robot for transferring substrate, multi-chamber substrate processing apparatus using the same, and control method therefor Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
- H01L21/67265—Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Abstract
Description
本發明係關於一種基板轉移機械裝置、使用基板轉移機械裝置之一多腔室基板處理裝置以及一種多腔室基板處理裝置之控制方法,其中該基板轉移機械裝置能高效率地轉移一基板。 The present invention relates to a substrate transfer mechanism, a multi-chamber substrate processing apparatus using a substrate transfer mechanism, and a control method of a multi-chamber substrate processing apparatus, wherein the substrate transfer mechanism can transfer a substrate efficiently.
在一半導體製程中,一薄膜沉積製程用以將一所需材料沉積在一基板上,並可分為一物理氣體沉積(physical vapor deposition,PVD)方法與一化學氣相沉積(chemical vapor deposition,CVD)方法。其中,化學氣相沉積方法係提供反應氣體至反應腔室,而在使用高熱或電漿的情況下,使反應氣體產生化學反應,如此可沉積一薄膜於基板上。另外,在有機金屬化學氣相沉積(metal-organic chemical vapor deposition,MOCVD)方法中,有機金屬化合物係作為前驅物(precursor),並被傳送至反應腔室作為載運氣體(carrier gas),以使一有機金屬化合物薄膜成長於一加熱之基板表面。 In a semiconductor process, a thin film deposition process is used to deposit a desired material on a substrate, and can be divided into a physical vapor deposition (PVD) method and a chemical vapor deposition (chemical vapor deposition). CVD) method. Among them, the chemical vapor deposition method provides a reaction gas to the reaction chamber, and in the case of using high heat or plasma, the reaction gas is chemically reacted, so that a film can be deposited on the substrate. In addition, in a metal-organic chemical vapor deposition (MOCVD) method, an organometallic compound is used as a precursor and is transported to a reaction chamber as a carrier gas so that An organometallic compound film is grown on the surface of a heated substrate.
在進行一沉積或蝕刻製程之習知基板處理裝置中,通常僅有單一基板載入至一反應腔室以進行基板處理製程。然而近來,一種半批次(semi-batch type)基板處理裝置被開發出來,其中,複數承載盤容器設置於反應腔室之一承載盤上,並且複數基板係同時被載入至個別的承載 盤容器以進行處理。此外,一多腔室基板處理裝置亦被開發出來,其具有多個反應腔室可同時進行多個製程。 In conventional substrate processing apparatus that performs a deposition or etching process, typically only a single substrate is loaded into a reaction chamber for substrate processing. Recently, however, a semi-batch type substrate processing apparatus has been developed in which a plurality of carrier disk containers are disposed on one of the reaction chambers, and a plurality of substrate systems are simultaneously loaded to individual carriers. The tray is processed for processing. In addition, a multi-chamber substrate processing apparatus has been developed which has a plurality of reaction chambers for performing multiple processes simultaneously.
然而,上述習知技術之問題在於,半批次基板處理裝置需要藉由人工方式將多個基板載入至個別承載盤容器內。舉例而言,在載入或卸載基板的過程中,需要藉助鉗子(tweezers),而鉗子會傷害基板。此外,人工方式亦使得基板不易精確地對準對應的承載盤容器。此外,載入或卸載基板的工作也更耗時。 However, the above conventional technique has a problem in that a half batch of substrate processing apparatus requires manual loading of a plurality of substrates into individual carrier tray containers. For example, in the process of loading or unloading a substrate, it is necessary to use tweezers, and the pliers can damage the substrate. In addition, the manual approach also makes it difficult to accurately align the substrate to the corresponding carrier tray container. In addition, loading or unloading the substrate is also more time consuming.
有鑒於上述問題,本發明之一目的在於提供一種基板轉移機械裝置,能自動將基板從一匣盒取出、載入基板至一基板對準器,並且將對準之基板從基板對準器載入至一承載盤。 In view of the above problems, it is an object of the present invention to provide a substrate transfer mechanism capable of automatically taking a substrate from a cassette, loading the substrate into a substrate aligner, and aligning the aligned substrate from the substrate aligner. Enter into a carrier.
本發明之另一目的在於提供一種基板處理裝置,其係使用上述之基板轉移機械裝置載入並卸載一基板,並且處理載入之基板。 Another object of the present invention is to provide a substrate processing apparatus that loads and unloads a substrate using the substrate transfer mechanism described above, and processes the loaded substrate.
本發明之另一目的在於提供一種基板處理裝置之控制方法以處理一基板。 Another object of the present invention is to provide a method of controlling a substrate processing apparatus to process a substrate.
為達上述目的,本發明係提供一種基板轉移機械裝置,其包含一基板支持件、複數機械手臂以及一載入固定單元。機械手臂驅動基板支持件使其進行一三維移動。載入固定單元設置於該等機械手臂之任一,並從一基板之上方吸住或支持該基板。 To achieve the above object, the present invention provides a substrate transfer mechanism comprising a substrate support member, a plurality of robot arms, and a loading and fixing unit. The robotic arm drives the substrate support to perform a three-dimensional movement. The loading and fixing unit is disposed on any of the robot arms and sucks or supports the substrate from above the substrate.
在一實施例中,該等機械手臂包含:一機械手臂,具有該基板支持件;以及另一機械手臂,連接於具有該基板支持件之該機械手臂,並且載入固定單元設置於該另一機械手臂之一底部。 In one embodiment, the mechanical arms include: a robot arm having the substrate support; and another robot arm coupled to the robot arm having the substrate support member, and the loading and fixing unit is disposed on the other The bottom of one of the robot arms.
在一實施例中,載入固定單元係為一非接觸吸力夾持單元。此外,一攝像器設置於載入固定單元之一側。 In one embodiment, the loading fixture unit is a non-contact suction grip unit. In addition, a camera is disposed on one side of the loading fixed unit.
為達上述目的,本發明亦提供一種基板處理裝置,其包含一匣盒、一基板對準器、一反應腔室以及一基板轉移機械裝置。複數基板係疊設於匣盒內。基板對準器係依據一預定方向對準各基板。反應腔室包含一承載盤,承載盤具有複數承載盤容器。基板轉移機械裝置係在匣盒、基板對準器與該等承載盤容器之間轉移各基板,並包含一基板支持件、一載入固定單元以及複數機械手臂。基板支持件係將各基板從匣盒轉移至基板對準器。載入固定單元係從由基板對準器所對準之基板之上方吸住或支持該基板,並且將基板轉移至一對應的承載盤容器。機械手臂驅動基板支持件與載入固定單元進行一三維移動。 To achieve the above object, the present invention also provides a substrate processing apparatus comprising a cassette, a substrate aligner, a reaction chamber, and a substrate transfer mechanism. A plurality of substrates are stacked in a cassette. The substrate aligner aligns the substrates in accordance with a predetermined direction. The reaction chamber contains a carrier tray having a plurality of carrier tray containers. The substrate transfer mechanism transfers the substrates between the cassette, the substrate aligner and the carrier trays, and includes a substrate holder, a loading and fixing unit, and a plurality of robot arms. The substrate support transfers the substrates from the cassette to the substrate aligner. Loading the fixed unit holds or supports the substrate from above the substrate aligned by the substrate aligner and transfers the substrate to a corresponding carrier tray container. The robotic arm drive substrate support member and the loading and fixing unit perform a three-dimensional movement.
在一實施例中,反應腔室之數量為至少二,並且基板轉移機械裝置為該等反應腔室進行一基板載入作業以及一基板卸載作業。 In one embodiment, the number of reaction chambers is at least two, and the substrate transfer mechanism performs a substrate loading operation and a substrate unloading operation for the reaction chambers.
在一實施例中,該等機械手臂包含:一機械手臂,具有該基板支持件;以及另一機械手臂,連接於具有基板支持件之該機械手臂,並且載入固定單元設置於該另一機械手臂之一底部。載入固定單元可為一非接觸吸力夾持單 元。 In one embodiment, the mechanical arms include: a robot arm having the substrate support; and another robot arm coupled to the robot arm having a substrate support member, and the loading and fixing unit is disposed on the other mechanical mechanism The bottom of one of the arms. The loading fixture unit can be a non-contact suction clamping sheet yuan.
為達上述目的,本發明亦提供一種控制方法,其係控制一基板處理裝置,基板處理裝置包含一匣盒、一基板對準器、至少二反應腔室以及一基板轉移機械裝置,複數基板疊設於匣盒內,基板對準器係依據一預定方向對準各基板,各反應腔室具有一承載盤,承載盤具有複數承載盤容器,基板轉移機械裝置係在匣盒、基板對準器與該等承載盤容器之間轉移各基板。控制方法包含:使用基板轉移機械裝置之一基板支持件將各基板從匣盒轉移至基板對準器;使用基板轉移機械裝置之一載入固定單元從由基板對準器所對準之基板之上方吸住或支持該基板;將載入固定單元移動至一對應的承載盤容器上方並將該基板載入至承載盤容器內;以及使用基板轉移機械裝置為該等反應腔室重覆上述步驟。 To achieve the above object, the present invention also provides a control method for controlling a substrate processing apparatus, the substrate processing apparatus comprising a cassette, a substrate aligner, at least two reaction chambers, and a substrate transfer mechanism, the plurality of substrate stacks The substrate aligner is arranged in a predetermined direction according to a predetermined direction, each reaction chamber has a carrier disk, the carrier disk has a plurality of carrier disk containers, and the substrate transfer mechanism is disposed in the cassette and the substrate aligner. Each substrate is transferred between the carrier tray containers. The control method comprises: transferring each substrate from the cassette to the substrate aligner using one of the substrate transfer mechanisms; loading the fixed unit from the substrate aligned by the substrate aligner using one of the substrate transfer mechanisms Suctioning or supporting the substrate; moving the loading and fixing unit over a corresponding carrier tray container and loading the substrate into the carrier tray container; and repeating the above steps for the reaction chambers using a substrate transfer mechanism .
在一實施例中,控制方法更包含:在一對應之反應腔室內進行完一製程之後,使用載入固定單元將該基板從該承載盤容器卸載。 In one embodiment, the controlling method further comprises: unloading the substrate from the carrier tray container using a loading and fixing unit after performing a process in a corresponding reaction chamber.
以下將參照相關圖式,說明依據本發明較佳實施例之一種基板轉移機械裝置、基板處理裝置及其控制方法,其中相同的元件將以相同的參照符號加以說明。 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a substrate transfer mechanism, a substrate processing apparatus, and a control method thereof according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings, wherein the same elements will be described with the same reference numerals.
圖1為本發明較佳實施例之一種基板轉移機械裝置的示意圖。 1 is a schematic view of a substrate transfer mechanism of a preferred embodiment of the present invention.
本發明較佳實施例之基板轉移機械裝置1包含一基台10、複數機械手臂12、14、16、18、一基板支持件20以及一載入固定單元30。機械手臂12、14、16、18係設置於基台10上。基板支持件20係設置於該等機械手臂之一遠端機械手臂上(於此以機械手臂18為例)。 The substrate transfer mechanism 1 of the preferred embodiment of the present invention includes a base 10, a plurality of robot arms 12, 14, 16, 18, a substrate support member 20, and a loading and fixing unit 30. The robot arms 12, 14, 16, 18 are disposed on the base 10. The substrate support member 20 is disposed on a distal robot arm of one of the mechanical arms (here, the robot arm 18 is taken as an example).
機械手臂12、14、16、18係形成一鉸接式的機械裝置。如圖1所示,機械手臂12、14、16、18包含一第一機械手臂12、一第二機械手臂14、一第三機械手臂16以及一第四機械手臂18。第一機械手臂12係設置於基台10之一頂部上,第二機械手臂14係連接於第一機械手臂12,第三機械手臂16連接於第二機械手臂14,第四機械手臂18連接於第三機械手臂16。需注意者,本發明之機械機臂在數量以及結構上可有其他變化態樣,於此僅為舉例說明。較佳者,該等機械手臂係構成並可讓基板支持件20以及載入固定單元30進行三維運動。 The robot arms 12, 14, 16, 18 form an articulated mechanical device. As shown in FIG. 1, the robot arms 12, 14, 16, 18 include a first robot arm 12, a second robot arm 14, a third robot arm 16, and a fourth robot arm 18. The first robot arm 12 is disposed on the top of one of the bases 10, the second robot arm 14 is coupled to the first robot arm 12, the third robot arm 16 is coupled to the second robot arm 14, and the fourth robot arm 18 is coupled to Third robot arm 16. It should be noted that the mechanical arm of the present invention may have other variations in number and structure, which are merely illustrative. Preferably, the robotic arms are constructed and allow the substrate support member 20 and the loading and fixing unit 30 to perform three-dimensional movement.
為驅動機械手臂12、14、16、18,一第一驅動馬達22、一第二驅動馬達24、一第三驅動馬達26以及一第四驅動馬達28係分別設置於該等機械手臂12、14、16、18的連接處。其中,第一驅動馬達22係可轉動地驅動第一機械手臂12,第二驅動馬達24係可轉動地驅動第二機械手臂14,第三驅動馬達26係可轉動地驅動第三機械手臂16,第四驅動馬達28係可轉動地驅動第四機械手臂18。此外,一垂直移動單元23可設置於基台10內並驅動第一機械手臂12在垂直方向上移動。 To drive the robot arms 12, 14, 16, 18, a first drive motor 22, a second drive motor 24, a third drive motor 26, and a fourth drive motor 28 are respectively disposed on the mechanical arms 12, 14 , 16, 18 connections. Wherein, the first driving motor 22 rotatably drives the first robot arm 12, the second driving motor 24 rotatably drives the second robot arm 14, and the third driving motor 26 rotatably drives the third robot arm 16, The fourth drive motor 28 rotatably drives the fourth robot arm 18. Further, a vertical moving unit 23 may be disposed in the base 10 and drive the first robot arm 12 to move in the vertical direction.
上述用以可轉動地驅動機械手臂12、14、16、18之驅動馬達22、24、26、28僅為舉例說明,本發明可有其他態樣用以驅動機械手臂之結構。此外,垂直移動單元23可使用如齒棒(rack)、齒輪傳動(pinion gear)元件、滾珠螺桿(ball screw)、線性馬達等等之驅動單元。 The drive motors 22, 24, 26, 28 for rotatably driving the robot arms 12, 14, 16, 18 are merely illustrative, and the present invention may have other aspects for driving the structure of the robot arm. Further, the vertical moving unit 23 may use a driving unit such as a rack, a pinion gear element, a ball screw, a linear motor, or the like.
基板支持件20設置於第四機械手臂18之一端部。在一實施例中,基板支持件20可例如支撐一基板之一底部。此外,在另一實施例中,一真空器可用於基板支持件20以避免基板掉落。 The substrate holder 20 is disposed at one end of the fourth robot arm 18. In an embodiment, the substrate holder 20 can support, for example, one of the bottoms of a substrate. Further, in another embodiment, a vacuum can be used for the substrate holder 20 to prevent the substrate from falling.
載入固定單元30設置於第三機械手臂16之下方,並可為使用伯努利定律(Bernoulli’s principle)之一非接觸式夾持(chuck)單元或一靜電式夾持單元。載入固定單元30之一底部吸住或支持基板。此外,一攝像器32可設置於第三機械手臂16下方,並可藉由取得之影像決定基板之一位置或得知一承載盤之一承載盤容器(susceptor pocket)之一位置。載入固定單元30與攝像器32可經由一耦接元件29固設於第三機械手臂16之一底部。若必要,用以作動並控制載入固定單元30與攝像器32之元件係可裝設於耦接元件29內。 The loading and fixing unit 30 is disposed below the third robot arm 16 and may be a non-contact chuck unit or an electrostatic clamping unit using Bernoulli's principle. The substrate is loaded or supported at the bottom of one of the loading units 30. In addition, a camera 32 can be disposed under the third robot arm 16 and can determine the position of one of the substrates by the acquired image or know that one of the carrier trays carries one of the positions of the susceptor pocket. The loading and fixing unit 30 and the camera 32 can be fixed to the bottom of one of the third robot arms 16 via a coupling element 29 . If necessary, an element for actuating and controlling the loading of the fixed unit 30 and the camera 32 can be mounted in the coupling element 29.
圖2為本發明較佳實施例之基板轉移機械裝置、一基板接收匣盒以及一基板對準器的示意圖。 2 is a schematic diagram of a substrate transfer mechanism, a substrate receiving cassette, and a substrate aligner in accordance with a preferred embodiment of the present invention.
複數基板36設置於匣盒34內,並以相同的間距彼此疊設。 The plurality of substrates 36 are disposed in the cassette 34 and are stacked one on another at the same pitch.
基板對準器38用以使各基板36依據一方向對準。一 平整區域或一凹痕係形成於基板36,並且基板對準器38係對準基板36,而使基板之該平整區域或該凹痕面對一預設方向。當基板36被載入至承載盤之承載盤容器時,基板36係受控制而沿一對準方向載入。在一實施例中,基板36可載入至承載盤容器,並且基板36之平整區域或凹痕面對以承載盤為中心之徑向之外側。 The substrate aligner 38 is used to align the substrates 36 in a direction. One A flattened area or a dimple is formed on the substrate 36, and the substrate aligner 38 is aligned with the substrate 36 such that the flattened area or the indentation of the substrate faces a predetermined direction. When the substrate 36 is loaded into the carrier tray of the carrier, the substrate 36 is controlled to be loaded in an alignment direction. In an embodiment, the substrate 36 can be loaded into the carrier tray container and the flat regions or indentations of the substrate 36 face the radially outer side centered on the carrier disk.
在基板36被基板對準器38對準且被轉移至承載盤並由載入固定單元30吸住與支持之後,基板36係座落於承載盤容器內。 After the substrate 36 is aligned by the substrate aligner 38 and transferred to the carrier tray and is held and supported by the loading and fixing unit 30, the substrate 36 is seated within the carrier tray container.
圖3為本發明一較佳實施例之具有基板轉移機械裝置之一基板處理裝置的示意圖,圖4為基板處理裝置之一前視示意圖。 3 is a schematic view of a substrate processing apparatus having a substrate transfer mechanism according to a preferred embodiment of the present invention, and FIG. 4 is a front view of a substrate processing apparatus.
基板處理裝置包含基板轉移機械裝置1以及至少二反應腔室40、50。圖3及圖4顯示基板處理裝置具有第一反應腔室40與第二反應腔室50。 The substrate processing apparatus includes a substrate transfer mechanism 1 and at least two reaction chambers 40, 50. 3 and 4 show that the substrate processing apparatus has a first reaction chamber 40 and a second reaction chamber 50.
一第一承載盤42設置於第一反應腔室40內,並具有複數第一承載盤容器44位於第一承載盤42內。一第二承載盤52設置於第二反應腔室50內,並具有複數第二承載盤容器54位於第二承載盤52內。另外,雖然圖未顯示,但各反應腔室40、50可被一腔室罩體覆蓋,腔室罩體可打開或關閉反應腔室40、50。 A first carrier tray 42 is disposed in the first reaction chamber 40 and has a plurality of first carrier trays 44 located within the first carrier tray 42. A second carrier 52 is disposed in the second reaction chamber 50 and has a plurality of second carrier trays 54 located within the second carrier 52. Additionally, although not shown, each of the reaction chambers 40, 50 can be covered by a chamber cover that can open or close the reaction chambers 40, 50.
基板轉移機械裝置1可設置於反應腔室40、50之間、或位於基板處理裝置之一接近中間位置,以將基板載入至各反應腔室40、50、並從各反應腔室40、50卸載基板36。 基板處理裝置亦包含匣盒34與基板對準器38,匣盒34可儲存基板36,基板對準器38可對準基板36。匣盒34與基板對準器38可由反應腔室40、50共同分享使用。 The substrate transfer mechanism 1 may be disposed between the reaction chambers 40, 50 or at an intermediate position of one of the substrate processing devices to load the substrate into each of the reaction chambers 40, 50 and from each of the reaction chambers 40, 50 unloads the substrate 36. The substrate processing apparatus also includes a cassette 34 and a substrate aligner 38, the cassette 34 can store the substrate 36, and the substrate aligner 38 can be aligned with the substrate 36. The cassette 34 and the substrate aligner 38 can be shared by the reaction chambers 40, 50.
圖5為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中基板係從匣盒被取出;圖6為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中基板被載入至基板對準器;圖7為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中已對準之基板係從基板對準器被卸載。 5 is a schematic view of a substrate processing apparatus having a substrate transfer mechanism according to a preferred embodiment of the present invention, wherein the substrate is taken out from the cassette; FIG. 6 is a substrate processing of the substrate transfer mechanism according to a preferred embodiment of the present invention; A schematic diagram of a device in which a substrate is loaded into a substrate aligner; FIG. 7 is a schematic view of a substrate processing apparatus having a substrate transfer mechanism in accordance with a preferred embodiment of the present invention, wherein the aligned substrates are aligned from the substrate The device is uninstalled.
請參照圖5所示,設置於第四機械手臂18之基板支持件20係朝向匣盒34移動,匣盒34內有多個基板36疊設。在基板支持件20置入一對應基板36的下方之後,基板支持件20係往上移動,使得基板36被置放於基板支持件20上。 Referring to FIG. 5, the substrate holder 20 disposed on the fourth robot arm 18 moves toward the cassette 34, and a plurality of substrates 36 are stacked in the cassette 34. After the substrate holder 20 is placed under a corresponding substrate 36, the substrate holder 20 is moved upward so that the substrate 36 is placed on the substrate holder 20.
請參照圖6所示,已支持基板36之基板支持件20係移動至基板對準器38之上方之一位置,然後向下移動,使得基板36被載入至基板對準器38內。之後,基板支持件20係離開。 Referring to FIG. 6, the substrate support 20 of the supported substrate 36 is moved to a position above the substrate aligner 38 and then moved downward so that the substrate 36 is loaded into the substrate aligner 38. Thereafter, the substrate holder 20 is separated.
請參照圖7所示,在基板對準器38對準基板36之後,載入固定單元30係從基板對準器38上方之一位置而朝向基板36向下移動。接著,基板36係被載入固定單元30之底部吸住並支持。另外,如圖7所示,具有基板支持件20之第四機械手臂18係折疊以幫助載入固定單元30之移 動。 Referring to FIG. 7, after the substrate aligner 38 is aligned with the substrate 36, the loading and fixing unit 30 is moved downward from the position above the substrate aligner 38 toward the substrate 36. Next, the substrate 36 is sucked and supported by the bottom of the loading unit 30. In addition, as shown in FIG. 7, the fourth robot arm 18 having the substrate holder 20 is folded to assist in loading the fixed unit 30. move.
圖8為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中基板係被載入至承載盤之承載盤容器內。 8 is a schematic diagram of a substrate processing apparatus having a substrate transfer mechanism in which a substrate is loaded into a carrier tray of a carrier tray in accordance with a preferred embodiment of the present invention.
載入固定單元30吸住或支持基板36,並移動至承載盤40上方之一位置,並且將基板36載入至承載盤容器44內。攝像器32係對基板36所要載入之承載盤容器44擷取一影像,藉此精確控制基板36之載入位置。 The loading fixture unit 30 holds or supports the substrate 36 and moves to a position above the carrier tray 40 and loads the substrate 36 into the carrier tray container 44. The camera 32 captures an image of the carrier tray 44 to which the substrate 36 is to be loaded, thereby precisely controlling the loading position of the substrate 36.
圖9為本發明較佳實施例之基板轉移機械裝置之載入固定單元之一實施態樣的示意圖。 FIG. 9 is a schematic view showing an embodiment of a loading and fixing unit of a substrate transfer mechanism according to a preferred embodiment of the present invention.
如上所述,載入固定單元30可基於伯努利定律而使用非接觸的吸力。請參照圖9所示,載入固定單元30係與一壓縮氣體供應器60及一通道形成元件62配合使用,其中,通道形成元件62設置於載入固定單元30之一吸力面。經由壓縮氣體供應器60所供應的壓縮氣體係藉由通道形成元件62而沿著載入固定單元30之吸力面徑向的流出。在此態樣中,負壓係產生於載入固定單元30之吸力面。基於這樣的理論,基板36可以非接式的方式被吸到載入固定單元30之吸力面。 As described above, the loading and fixing unit 30 can use a non-contact suction based on Bernoulli's law. Referring to FIG. 9, the loading and fixing unit 30 is used in combination with a compressed gas supply 60 and a channel forming member 62, wherein the channel forming member 62 is disposed on one suction surface of the loading and fixing unit 30. The compressed gas system supplied via the compressed gas supply 60 flows out along the suction side of the loading fixing unit 30 by the passage forming member 62. In this aspect, the negative pressure system is generated from the suction side of the loading unit 30. Based on such a theory, the substrate 36 can be sucked into the suction side of the loading and fixing unit 30 in a non-contact manner.
當然,基板36亦可藉由一真空方法或一靜電夾持方法而被吸住,於此,真空方法係將一真空施加於載入固定單元30,靜電夾持方法係使用靜電力。當載入固定單元30使用上述之非接觸吸力方法,可避免基板36之一上表面被載入固定單元30損壞。 Of course, the substrate 36 can also be sucked by a vacuum method or an electrostatic clamping method. Here, the vacuum method applies a vacuum to the loading and fixing unit 30, and the electrostatic clamping method uses an electrostatic force. When the loading and fixing unit 30 uses the non-contact suction method described above, it is possible to prevent the upper surface of one of the substrates 36 from being damaged by the loading and fixing unit 30.
圖10為本發明較佳實施例之使用基板轉移機械裝置載入與卸載基板之方法的流程圖。 10 is a flow chart of a method of loading and unloading a substrate using a substrate transfer mechanism in accordance with a preferred embodiment of the present invention.
在步驟S100中,基板轉移機械裝置1將基板支持件20移動至匣盒34,以將基板36從匣盒34中取出。 In step S100, the substrate transfer mechanism 1 moves the substrate holder 20 to the cassette 34 to take the substrate 36 out of the cassette 34.
在步驟S102中,基板支持件20係朝向基板對準器38移動,然後向下移動以將基板36載入至基板對準器38。基板對準器38轉動並對準基板36,使得形成於基板36之平整區域或凹痕面對一特定方向。 In step S102, the substrate holder 20 is moved toward the substrate aligner 38 and then moved downward to load the substrate 36 to the substrate aligner 38. The substrate aligner 38 rotates and aligns the substrate 36 such that the flat regions or indentations formed on the substrate 36 face a particular direction.
在步驟S104中,在基板36對準之後,基板轉移機械裝置1係作動以使載入固定單元30位於基板36上方,然後載入固定單元30吸住或支持基板36,並且從基板對準器38移開。 In step S104, after the substrate 36 is aligned, the substrate transfer mechanism 1 is actuated to place the loading and fixing unit 30 above the substrate 36, and then the loading and fixing unit 30 sucks or supports the substrate 36, and the substrate aligner 38 removed.
在步驟S106中,載入固定單元30移動至承載盤42或52,並將基板36載入至承載盤42或52之承載盤容器44或54。這些步驟係重覆進行直到一預設數量的基板36被載入至多個承載盤容器44或54內。 In step S106, the loading and fixing unit 30 is moved to the carrier tray 42 or 52, and the substrate 36 is loaded to the carrier tray 44 or 54 of the carrier tray 42 or 52. These steps are repeated until a predetermined number of substrates 36 are loaded into the plurality of carrier trays 44 or 54.
另外,步驟S100至步驟S106可執行在各反應腔室40、50中。 In addition, steps S100 to S106 may be performed in each of the reaction chambers 40, 50.
假使基板36已被載入至承載盤42或52,則可在反應腔室40或50內進行一預設的基板處理製程。在步驟S108中,當基板處理製程進行完畢時,基板36係藉由載入固定單元30從承載盤容器44或54卸載下來。 If the substrate 36 has been loaded onto the carrier disk 42 or 52, a predetermined substrate processing process can be performed in the reaction chamber 40 or 50. In step S108, when the substrate processing process is completed, the substrate 36 is unloaded from the carrier tray 44 or 54 by the loading and fixing unit 30.
如上所述,本發明可有效地將一基板從一匣盒轉移至一基板對準器以及一反應腔室之一承載盤,以及卸載一處 理完成之基板。此外,在基板之載入或卸載過程中,基板之表面可避免被損壞,藉此使基板處理製程的效能最大化。 As described above, the present invention can effectively transfer a substrate from a cassette to a substrate aligner and a carrier tray of one reaction chamber, and unload one place. The finished substrate. In addition, the surface of the substrate can be prevented from being damaged during loading or unloading of the substrate, thereby maximizing the effectiveness of the substrate processing process.
此外,依據本發明,藉由單一基板轉移機械裝置即可將多個基板載入至多個反應腔室內、或從多個反應腔室卸載多個基板,藉此提升裝置之管理效能。 In addition, according to the present invention, a plurality of substrates can be loaded into a plurality of reaction chambers or a plurality of substrates can be unloaded from a plurality of reaction chambers by a single substrate transfer mechanism, thereby improving the management efficiency of the device.
此外,相較於習知使用人工方式,本發明可節省作業時間。 In addition, the present invention can save work time compared to the conventional use of manual methods.
以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。 The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.
1‧‧‧基板轉移機械裝置 1‧‧‧Substrate transfer mechanism
10‧‧‧基台 10‧‧‧Abutment
12、14、16、18‧‧‧機械手臂 12, 14, 16, 18‧‧ mechanical arm
20‧‧‧基板支持件 20‧‧‧Substrate support
22‧‧‧第一驅動馬達 22‧‧‧First drive motor
23‧‧‧垂直移動單元 23‧‧‧Vertical mobile unit
24‧‧‧第二驅動馬達 24‧‧‧Second drive motor
26‧‧‧第三驅動馬達 26‧‧‧ Third drive motor
28‧‧‧第四驅動馬達 28‧‧‧fourth drive motor
29‧‧‧耦接元件 29‧‧‧Coupling components
30‧‧‧載入固定單元 30‧‧‧Loading fixed units
32‧‧‧攝像器 32‧‧‧ camera
34‧‧‧匣盒 34‧‧‧匣 box
36‧‧‧基板 36‧‧‧Substrate
38‧‧‧基板對準器 38‧‧‧Substrate aligner
40、50‧‧‧反應腔室 40, 50‧‧‧ reaction chamber
42‧‧‧第一承載盤 42‧‧‧First carrier
44‧‧‧第一承載盤容器 44‧‧‧First carrier tray container
52‧‧‧第二承載盤 52‧‧‧Second carrier
54‧‧‧第二承載盤容器 54‧‧‧Second carrier tray container
60‧‧‧壓縮氣體供應器 60‧‧‧Compressed gas supply
62‧‧‧通道形成元件 62‧‧‧Channel forming elements
圖1為本發明較佳實施例之一種基板轉移機械裝置的示意圖;圖2為本發明較佳實施例之基板轉移機械裝置、一基板接收匣盒以及一基板對準器的示意圖;圖3為本發明一較佳實施例之具有基板轉移機械裝置之一基板處理裝置的示意圖;圖4為本發明一較佳實施例之具有基板轉移機械裝置之一基板處理裝置之一前視示意圖;圖5為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中基板係從匣盒被取出; 圖6為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中基板被載入至基板對準器;圖7為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中已對準之基板係從基板對準器被卸載;圖8為本發明較佳實施例之具有基板轉移機械裝置之基板處理裝置之一示意圖,其中基板被載入至承載盤之承載盤容器內;圖9為本發明較佳實施例之基板轉移機械裝置之載入固定單元之一實施態樣的示意圖;以及圖10為本發明較佳實施例之使用基板轉移機械裝置載入與卸載基板之方法的流程圖。 1 is a schematic view of a substrate transfer mechanism according to a preferred embodiment of the present invention; FIG. 2 is a schematic view of a substrate transfer mechanism, a substrate receiving cassette, and a substrate aligner according to a preferred embodiment of the present invention; A schematic diagram of a substrate processing apparatus having a substrate transfer mechanism according to a preferred embodiment of the present invention; FIG. 4 is a front view of a substrate processing apparatus having a substrate transfer mechanism according to a preferred embodiment of the present invention; A schematic diagram of a substrate processing apparatus having a substrate transfer mechanism according to a preferred embodiment of the present invention, wherein the substrate is taken out from the cassette; 6 is a schematic diagram of a substrate processing apparatus having a substrate transfer mechanism in which a substrate is loaded to a substrate aligner according to a preferred embodiment of the present invention; FIG. 7 is a substrate transfer mechanism according to a preferred embodiment of the present invention; A schematic diagram of a substrate processing apparatus in which an aligned substrate is unloaded from a substrate aligner; FIG. 8 is a schematic diagram of a substrate processing apparatus having a substrate transfer mechanism according to a preferred embodiment of the present invention, wherein the substrate is loaded FIG. 9 is a schematic view showing an embodiment of a loading and fixing unit of a substrate transfer mechanism according to a preferred embodiment of the present invention; and FIG. 10 is a substrate transfer using a preferred embodiment of the present invention. A flow chart of a method of loading and unloading a substrate by a mechanical device.
1‧‧‧基板轉移機械裝置 1‧‧‧Substrate transfer mechanism
10‧‧‧基台 10‧‧‧Abutment
12、14、16、18‧‧‧機械手臂 12, 14, 16, 18‧‧ mechanical arm
20‧‧‧基板支持件 20‧‧‧Substrate support
22‧‧‧第一驅動馬達 22‧‧‧First drive motor
23‧‧‧垂直移動單元 23‧‧‧Vertical mobile unit
24‧‧‧第二驅動馬達 24‧‧‧Second drive motor
26‧‧‧第三驅動馬達 26‧‧‧ Third drive motor
28‧‧‧第四驅動馬達 28‧‧‧fourth drive motor
29‧‧‧耦接元件 29‧‧‧Coupling components
30‧‧‧載入固定單元 30‧‧‧Loading fixed units
32‧‧‧攝像器 32‧‧‧ camera
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- 2012-04-26 KR KR1020120044064A patent/KR101409752B1/en active IP Right Grant
- 2012-07-31 CN CN201210270395.8A patent/CN103377973B/en not_active Expired - Fee Related
- 2012-08-15 TW TW101129524A patent/TWI560797B/en active
Also Published As
Publication number | Publication date |
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TWI560797B (en) | 2016-12-01 |
KR20130120857A (en) | 2013-11-05 |
CN103377973B (en) | 2017-11-28 |
CN103377973A (en) | 2013-10-30 |
KR101409752B1 (en) | 2014-07-08 |
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