TWI275132B - Substrate carrying device and substrate processing device having the same - Google Patents

Substrate carrying device and substrate processing device having the same Download PDF

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Publication number
TWI275132B
TWI275132B TW094106004A TW94106004A TWI275132B TW I275132 B TWI275132 B TW I275132B TW 094106004 A TW094106004 A TW 094106004A TW 94106004 A TW94106004 A TW 94106004A TW I275132 B TWI275132 B TW I275132B
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TW
Taiwan
Prior art keywords
substrate
tray
lifting
processing tray
recovery
Prior art date
Application number
TW094106004A
Other languages
Chinese (zh)
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TW200539314A (en
Inventor
Dai Kitahara
Original Assignee
Shimadzu Corp
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Publication date
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Publication of TW200539314A publication Critical patent/TW200539314A/en
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Publication of TWI275132B publication Critical patent/TWI275132B/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65DCONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D90/00Component parts, details or accessories for large containers
    • B65D90/02Wall construction
    • B65D90/023Modular panels
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65DCONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D88/00Large containers
    • B65D88/02Large containers rigid
    • B65D88/10Large containers rigid parallelepipedic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65DCONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D90/00Component parts, details or accessories for large containers
    • B65D90/02Wall construction
    • B65D90/08Interconnections of wall parts; Sealing means therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65DCONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D90/00Component parts, details or accessories for large containers
    • B65D90/12Supports
    • B65D90/20Frames or nets, e.g. for flexible containers
    • EFIXED CONSTRUCTIONS
    • E03WATER SUPPLY; SEWERAGE
    • E03BINSTALLATIONS OR METHODS FOR OBTAINING, COLLECTING, OR DISTRIBUTING WATER
    • E03B11/00Arrangements or adaptations of tanks for water supply
    • E03B11/10Arrangements or adaptations of tanks for water supply for public or like main water supply

Abstract

A substrate carrying device is provided for carrying a substrate even in a high-temperature state such that the entire tact time can be decreased. A chuck 20 and a horizontal driving mechanism 21 are installed in an unloading chamber 13 of a substrate processing device 10. The chuck 20 chucks a substrate W loaded on a tray 17 and carries it towards a recycle tray 18. The horizontal driving mechanism 21 drives the chuck 20. A plate 30 and an elevator 31 that drives the plate 30 are disposed in the unloading chamber 13. In a case when the chuck 20 is going to chuck the substrate W, the plate 30 vertically moves the substrate W on the tray 17 to chuck the W.

Description

'6pif.doc 九、發明說明: 【發明所屬之技術領域】 本發明關於一種基板的搬運夺晉 基板處理裝置。 、夏及具有該搬運裝置的 【先前技術】<6pif.doc IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to a substrate handling apparatus for handling substrates. , summer and with the handling device [prior art]

半導體基板和玻璃基板經過多 品。作為縮短整體製造時間的丨個方处^製程而形成製 1個製程的基板立即投入到下—製程',,疋為了將結束了 基板。例如,在玻璃基板上形成了沾,I可旎快地回收 池面板,成膜後要進行劃片(scribi、、'曰曰型石夕膜的太陽電 的面板處於高溫狀態。在習知技術中=成膜製程結束後 製的吸附部吸附面板之真空夾盤方疋利用以合成樹脂 運。 把持面板並進行搬 習知的真空夾盤方式由於利用人 所以在面板處於高溫狀態期間無法 衣的吸附部’ 在處理結束了的托盤上使面板進或搬運,需要The semiconductor substrate and the glass substrate are versatile. As a method of shortening the overall manufacturing time, the substrate formed into one process is immediately put into the lower-process, and the substrate is finished. For example, a glass plate is formed on the glass substrate, and the cell panel can be recovered quickly, and the film is diced after the film formation (scribi, the solar panel of the 曰曰 type shi shi shi is at a high temperature state. In the middle of the film-forming process, the vacuum chuck of the adsorption section of the adsorption section is used as a synthetic resin. The vacuum chuck method of holding the panel and moving it is not possible because the panel is in a high temperature state. The adsorption unit' requires the panel to be moved in or carried out on the tray that has been processed.

依次進行連續處理之面板的流動停滞,111此’使 製程整體的生產時間(tact time)。 …&quot;、、、佰紐作為生產 【發明内容】 ^發明錢—種基板搬運裝置,為—種將載置 =盤上亚處於高溫狀態下的基板,搬運至下—步 盤上之基板搬運裝置,其特徵在於, 收托 ^的基板並進行保持之由耐熱性材料形成的保持 處理托盤上的基板從處理托盤轉移到保持構件上之第】轉 pif.doc 127513226, 移早H轉構件題縣 元;將在利用移動單元移動到回收托盤的移動單 保持的基板’轉移到回收托盤上的第Γ轉=持構件上所 在上述基板搬運展置中,轉移早疋。 理托盤上所設置的貫通孔進行;元包括通過處 通孔從處理托盤表面突出 二之升F牛銷’藉由通過貫 從處理托盤上浮起的基板的北二,頂端支持基板,並將 後’使升降銷從處理托盤的;、甬與保持構件進行接合 持構件上之構成。而且Ί ί出:將基板轉移到保 行升降的第2升降構件,可採===將回收托盤進 托盤進行升降’且將在保持件將回收 盤上的基板,轉移到_#_^=持亚私動到回收托 可升置中’其處理托盤具有部分分離且 降構件’在藉由第1升降構件使載置 域上浮,並將載置構件的背面端部 構件鱼美/ Γ接合後’使第1升降構件下降,而將載置 =與基板一起轉移到保持構件上之構成。而且,第2轉 元包括升降回收托盤的第2升降構件,藉由第2升降 升I1牛回收托盤,且將在保持構件上被保持並移動到回 收耗盤上的載置構件’與基板一起轉移到回收托盤上之構 成。 在上述基板搬運裝置中,也可在回收托盤上設置對從 處理托盤所搬運來的基板進行冷卻之冷卻單元。 1275 lS&amp;if.doc 提供一種基板處理装置,包括收納用於載置 $裝的基板之處理托盤的收納室、上述的基板搬 如利用本發明’即使為處於高溫狀態下的基板,由於 ^用对熱n材料所形成的轉構件,將處理托盤上的基 運°回!進仃搬運’所以也能夠順利地進行基板搬 ’亚月:夠縮短生產製程整體的生產時間(taettime)。 為讓本*明之±述和其他目的、特徵和優點能更明顯 明如下下文特麵佳實施例,並配合賴圖式,作詳細說 【實施方式】 叔▲下面,麥知圖1〜圖5對根據本發明的實施形態之基 反搬運裝置和基板處理裝置進行說明。 (第1實施形態) 圖1所示為具有根據本發明的第丨實施形態的基板搬 /置^基,理I置的概略全體構成圖。圖2為在_ 1實施形態的基板搬運裝置上所設置之爽盤部的斜視 二。圖3⑻〜圖3(i)為根據第1實施形態的基板搬運裝置之 構成的概略部分構成圖。 基板處理1置10包括加載室U、處理室12、卸載室 回收站14。在加載室Η中,面向外部設置有閘門〇卜 〜如載室11和處理室12的臨界處設置有閘門g2,在處理 =12和卸載室13白勺臨界處設置有閘門G3,在卸載室13 ,面向回收站14設置有閘門〇4。閘門&lt;31〜G4採用可 ►pif.doc 另外,回收站14也可不構成室而只是所 分別收衲5至U、處理室12、卸載室13及回收站14中, 板w的托盤15、16、17及_ 複數列數片基板μ列為複數行、The flow of the panel which is successively processed in succession is stagnant, and this is the production time (tact time) of the entire process. ...&quot;,, 佰, 生产 作为 生产 ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ The device is characterized in that the substrate on which the substrate is held and held, and the substrate on the holding processing tray formed of the heat-resistant material is transferred from the processing tray to the holding member, pif.doc 127513226, moving the H-turn member The prefecture element is transferred to the substrate transfer display in which the substrate held by the mobile unit moved to the recovery tray by the moving unit is transferred to the transfer tray of the recovery tray. The through hole provided on the tray is carried out; the element includes a protrusion through the through hole from the surface of the processing tray, and the bottom of the substrate is supported by the north side of the substrate floating through the processing tray. 'The lifting pin is formed from the processing tray; the crucible and the holding member are configured to engage the holding member. And Ί 出 : : : : : : : : : : : : : : : : : : : : : : : 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将 将Holding the sub-private move to the recovery tray, the processing tray has a partial separation and descending member, and the mounting region is floated by the first lifting member, and the rear end member of the mounting member is joined. After that, the first elevating member is lowered, and the mounting = is transferred to the holding member together with the substrate. Further, the second transfer unit includes a second elevating member that lifts and lowers the recovery tray, and the second elevating and lowering I1 bovine recovery tray, and the mounting member 'held on the holding member and moved to the recovery consumer tray' together with the substrate Transfer to the composition on the recycling tray. In the above substrate transfer device, a cooling unit that cools the substrate transported from the processing tray may be provided on the recovery tray. 1275 lS&amp;if.doc provides a substrate processing apparatus including a storage chamber for storing a processing tray for mounting a mounted substrate, and the above-described substrate transfer using the present invention, even if the substrate is in a high temperature state, For the transfer member formed by the hot n material, the base transport on the processing tray is returned to the bottom of the processing tray. Therefore, the substrate can be smoothly transferred. The sub-month is sufficient to shorten the production time (taettime) of the entire production process. In order to make this statement and other purposes, features and advantages more obvious, the following is a good example, and with the Lai diagram, the details are described [Embodiment] Uncle ▲ below, Mai Zhi Figure 1 ~ Figure 5 A base back conveying apparatus and a substrate processing apparatus according to embodiments of the present invention will be described. (First Embodiment) Fig. 1 is a view showing a schematic overall configuration of a substrate carrying/mounting substrate according to a third embodiment of the present invention. Fig. 2 is a perspective view of the swash plate portion provided in the substrate transfer device of the 1-1 embodiment. 3 (8) to 3 (i) are schematic partial configuration diagrams showing a configuration of a substrate transfer device according to the first embodiment. The substrate processing 1 includes 10 a loading chamber U, a processing chamber 12, and an unloading chamber recycling station 14. In the loading chamber ,, a gate is provided facing the outside, and a gate g2 is provided at a critical point such as the carrier chamber 11 and the processing chamber 12, and a gate G3 is provided at a critical point of the processing=12 and the unloading chamber 13 in the unloading chamber. 13. A gate 〇4 is provided for the recycling station 14. The gates &lt;31~G4 can be used as ►pif.doc. In addition, the recycle bin 14 may not constitute a chamber but only the respective trays 5 to U, the processing chamber 12, the unloading chamber 13 and the recycling station 14, the tray 15 of the board w, 16, 17 and _ plural columns of several substrates, the μ column is a plurality of rows,

據基板W的排列而4开=的平板,但只在托盤17上,根 盤18為载置成有複數個貫通孔17a。回收托 A= 或列複數片基板W的的平板。基板w f 結晶__太陽電池面板,結處理室12 ,=板表面上形成氮化頻作為防反射膜。通常情況 %電池面板利用平行平板等離子CVD (化學汽相沈 積)被加熱到3〇〇〜5〇〇°c左右。According to the arrangement of the substrates W, the flat plate is opened by 4, but only the plurality of through holes 17a are placed on the tray 17 on the tray 17. The tray of the substrate A is counted or replaced with a plurality of substrates W. The substrate w f crystal __ solar cell panel, junction processing chamber 12, = nitriding frequency is formed on the surface of the board as an anti-reflection film. Normally, the battery panel is heated to about 3 〇〇 5 〇〇 ° c by parallel plate plasma CVD (chemical vapor deposition).

分別開關的構成 定空間。 在卸載室13中,收納有夾盤部20和升降板30,還設 置有驅動夾盤部20的水平驅動機構21和使升降板3〇升降 的=降機構3卜夾盤部2G利用水平驅動機構2卜在圖中 進行左右往返運動,當將托盤17上的基板w向回收托盤 18進行搬運時,通過閘門G4而進入到回收站14内。關於 夾盤部20的構造將在後面進行說明。 升降板30利用升降機構31,在圖中進行上下往返運 動。在升降板30的上面,複數根銷3〇a與托盤17的複數 個貫通孔17a位置對合並插入設置。而且,在回收站14 中,設置有使回收托盤18升降的升降機構32,且在回收 站14内,收納有從回收托盤18接收基板w並進行收納的 盒部40。 8 I275132p,d〇c f照圖2對夾盤部2〇的構造進行說明。夾盤部2〇是 斷面主矩形且兩端開放的管狀,且其下面的中央部分是呈 被切掉的形狀。端部2〇a為與基板W #兩端抵接並進行保 持以免基板W下降的部分,以下將失盤部2〇保持基板w 的動作稱作夾緊(chucking)。在圖示中,距離被設定 付較基板w的尺相,距離y2被設定得較絲w的尺寸 長而且,距離yl為了通過回收托盤18,被設定得較回 收托盤18的寬度尺寸(與目1的紙面垂直的方向)長。夾 盤部2。的長邊方向(x方向)的尺寸,的長尺ί 和被夾緊的片數而決定。 夹盤部20由於形成圖2所示的形狀,所以在夹緊時, 不與基板W的上面接觸,不會受到損傷。而且,在夾緊時, 成-種覆蓋基板w上面的狀態,所以能夠防止灰塵 ==著:夾盤部20由金屬、陶究這樣的具有耐熱性 作。猎由使夾盤部20為金屬製或喊製,即使為 ^皿的基板也可立即夾緊進行搬運,所以能夠縮短生產時 r w 珂很像本貫鉍形態的基板處理裝置10之基板 間門f/r運進行綱。未處理的騎w從外部通過 向ίΓΛ 室11的托盤15搬運,另外通過閘門G2 上述那托盤16搬運。在處理室12内的處理為例如 =樣的成膜處理’將基板w加熱到所定溫度而進行。 托盤^搬结運束後Λ基’通過閘門G 3被向卸載室13的 運在邊階段,基板w形成高溫狀態。 I2751?626p,doc 成膜處理後的基板W由夾盤部20被夾緊,從卸載室 13的托盤17被向回收站14的回收托盤18搬運。另外, 成膜處理後的基板W從回收托盤18被向盒部40搬運,且 收納在盒部40内。對該搬運過程,利用圖3 (a)〜圖3 (i)的部分構成圖詳細地進行說明。The respective switches form a fixed space. In the unloading chamber 13, a chuck portion 20 and a lifting plate 30 are housed, and a horizontal driving mechanism 21 for driving the chuck portion 20 and a lowering mechanism 3 for raising and lowering the lifting plate 3 are mounted by the horizontal portion. The mechanism 2 performs a right and left reciprocating motion in the drawing, and when the substrate w on the tray 17 is transported to the recovery tray 18, it enters the collection station 14 through the gate G4. The configuration of the chuck portion 20 will be described later. The elevating plate 30 is moved up and down in the figure by the elevating mechanism 31. On the upper surface of the elevating plate 30, a plurality of pins 3a and a plurality of through holes 17a of the tray 17 are inserted and inserted. Further, in the collection station 14, an elevating mechanism 32 for elevating and lowering the recovery tray 18 is provided, and in the collection station 14, a cassette portion 40 for receiving and storing the substrate w from the recovery tray 18 is housed. 8 I275132p, d〇c f The structure of the chuck portion 2A will be described with reference to Fig. 2 . The chuck portion 2 is a tubular shape having a main cross section and an open end, and the central portion of the lower portion is cut away. The end portion 2a is a portion that abuts on both ends of the substrate W# and is held to prevent the substrate W from falling. Hereinafter, the operation of holding the substrate w by the lost portion 2 is referred to as chucking. In the illustration, the distance is set to the scale of the substrate w, the distance y2 is set to be longer than the size of the wire w, and the distance yl is set to be larger than the width of the recovery tray 18 in order to pass through the recovery tray 18. 1 paper is perpendicular to the direction). The chuck portion 2. The length of the long side direction (x direction), the length ί and the number of pieces clamped. Since the chuck portion 20 has the shape shown in Fig. 2, it does not come into contact with the upper surface of the substrate W during clamping, and is not damaged. Further, at the time of clamping, the state of the substrate w is covered, so that dust can be prevented. == The chuck portion 20 is made of heat resistance such as metal or ceramics. Since the chuck portion 20 is made of metal or shouted, even if the substrate of the tray is immediately clamped and transported, it is possible to shorten the inter-substrate door of the substrate processing apparatus 10 in which the rw 珂 is very similar in production. f / r transport to the program. The unprocessed ride w is transported from the outside to the tray 15 of the 室 chamber 11, and is transported by the above-described tray 16 through the gate G2. The processing in the processing chamber 12 is performed, for example, by a film forming process of the sample-heating of the substrate w to a predetermined temperature. After the pallet 2 is transported, the raft base is transported to the unloading chamber 13 through the gate G 3, and the substrate w is formed in a high temperature state. I2751?626p, doc The substrate W after the film formation process is clamped by the chuck portion 20, and is transported from the tray 17 of the unloading chamber 13 to the recovery tray 18 of the recovery station 14. Further, the substrate W after the film formation process is transported from the recovery tray 18 to the cassette unit 40, and is housed in the cassette unit 40. This conveyance process will be described in detail using a partial configuration diagram of FIGS. 3(a) to 3(i).

圖3 (a)〜圖3 (c)所示為卸載室13内的情況,圖 3 (d)〜圖3 (f)及圖3 (g)〜圖3 (〇所示為回收站 14内的情況。圖3 (a)所示為載置基板W之托盤π和夾 盤部20的位置關係的平面圖,圖3 (b)為圖3 (a)的u 斷面圖,圖3 (c)為圖3 (a)的II-II斷面圖。圖3 (d)所 示為載置基板W之回收托盤18和夾盤部20的位置關係的 平面圖,圖3(e)為圖3(d)的III-III斷面圖,圖3 (f) 為圖3 (d)的IV-IV斷面圖。圖3 (g)所示為載置基板w 之回收托盤18和盒部40的位置關係的平面圖,圖3 (匕) ,圖3 (g)的v-v斷面圖,圖3 (〇為圖3 (g)的%々^ 斷面圖。 如圖3 (a)的平面圖所示,使基板貿在托盤17上以 =1為單位進行排列。在初期狀態下,預先使爽盤部 ^部17的上方退開。首先,如圖3 (b)、圖3 (c)所示= =板上升並使銷30a的頂端通過貫通孔na的邀 片基板W的背面抵接,且將基板w從 表: ^所定距離。使夾盤❹沿基板W的表面,在圖=、、 二i方向上進行滑動,而使3片基板W位於失盤部2Γ 、。卩’並與端部20a靠近。藉由使升降板3〇下降,而結 1275132 16226pif.doc 束基板W的夾緊。 接著,如圖3 (d)、圖3 (e)、圖3 (f)所示,使夾 緊3片基板W的夾盤部20移動到回收托盤18的上方。當 利用升降機構32使回收托盤18從設定位置上升時,回收 托盤18的上面通過夾盤部20下面的中央開口,與3片基 板W的背面抵接,並將基板W只推起所定距離。藉此,3 片基板W形成一種從夾盤部20的端部2〇a分離並浮起的3(a) to 3(c) show the inside of the unloading chamber 13, and Fig. 3(d) to Fig. 3(f) and Fig. 3(g) to Fig. 3(〇 show the inside of the recovery station 14 Fig. 3(a) is a plan view showing the positional relationship between the tray π on which the substrate W is placed and the chuck portion 20, and Fig. 3(b) is a sectional view taken along line u of Fig. 3(a), Fig. 3 (c) 3(a) is a cross-sectional view taken along line II-II. Fig. 3(d) is a plan view showing the positional relationship between the recovery tray 18 on which the substrate W is placed and the chuck portion 20, and Fig. 3(e) is Fig. 3 (d) is a sectional view of III-III, and Fig. 3 (f) is a sectional view taken along line IV-IV of Fig. 3 (d). Fig. 3 (g) shows a recovery tray 18 and a box portion 40 on which the substrate w is placed. The plan view of the positional relationship, Fig. 3 (匕), Fig. 3 (g), vv sectional view, Fig. 3 (〇 is the %々^ sectional view of Fig. 3 (g). As shown in Fig. 3 (a) It is shown that the substrate trade is arranged on the tray 17 in units of =1. In the initial state, the upper portion of the swash plate portion 17 is previously retracted. First, as shown in Fig. 3 (b) and Fig. 3 (c) == The plate rises and the tip end of the pin 30a abuts against the back surface of the substrate W through the through hole na, and the substrate w is placed at a distance of: ^. The chuck is placed along the surface of the substrate W, in Fig. , Sliding in the i-direction, the three substrates W are located at the loss-receiving portion 2Γ, 卩' and close to the end portion 20a. By lowering the lifting plate 3〇, the clamping of the junction 1275132 16226pif.doc bundle substrate W Next, as shown in Fig. 3 (d), Fig. 3 (e), and Fig. 3 (f), the chuck portion 20 that clamps the three substrates W is moved above the recovery tray 18. When the lifting mechanism 32 is used When the recovery tray 18 is raised from the set position, the upper surface of the recovery tray 18 passes through the central opening on the lower surface of the chuck portion 20, and abuts against the back surface of the three substrates W, and the substrate W is pushed up only by a predetermined distance. W forms a kind which is separated and floated from the end 2〇a of the chuck portion 20.

狀態。在該狀態下,使夾盤部20沿圖3 (d)的χ2方向滑 動,並與3片基板W脫離,返回到初始位置。利用升降機 構32,使回收托盤18下降並返回到設定位置。藉由以上 的過程,完成從托盤17向回收托盤18之基板w的搬運。 在圖3 (a)中,使返回到初始位置的夾盤部2〇向上方只 偏離1列後,沿x4方向進行移動,準備下一次基板w的 搬運。 接著,將搬運到回收托盤18的基板w收納到各部4〇 二二二(I)、圖3⑴、圖3⑴所示,使‘托盤 向;。M0方向’即圖3 (g)的χ3方向進行移動,並在 内部形成多層之盒部4G的各層中,使基板w以每層i片 的形恶被收納。此時,使盒部40向圖3⑴的z方向間 歇性移動。該間歇性移動距離為盒部40的層間p。另^曰 ==18間歇性地向上方移動,並使:部4。沿 系二以尸=咖收納到盒部4°中。這 部收納到盒部4G中反復,使托盤17上的基板^ 1275132 16226pif.doc 另外,在时托盤18中設置㈣於冷卻基板w的冷 :機構19。_是進行了成膜和加祕理的基板w 面溫,而為了脑縣整體的生鱗間,重要的是盡 ^也投)下-製程。藉^設置冷卻機構19,可使“ =上的基板W迅速冷卻,所以可在短時間㈣基板 ”40進行收納。作為冷卻機構19,可採用冷卻水^ %、冷風的送風等。status. In this state, the chuck portion 20 is slid in the direction of χ2 of Fig. 3(d), and is separated from the three substrates W to return to the initial position. With the elevator mechanism 32, the recovery tray 18 is lowered and returned to the set position. By the above process, the conveyance of the substrate w from the tray 17 to the recovery tray 18 is completed. In Fig. 3 (a), the chuck portion 2, which has returned to the initial position, is shifted upward by only one row, and then moved in the x4 direction to prepare the next substrate w to be transported. Next, the substrate w transported to the recovery tray 18 is stored in each of the sections 4, 22 (I), 3 (1), and 3 (1), and the tray is placed. The M0 direction is moved in the χ3 direction of Fig. 3 (g), and in each layer of the multi-layered box portion 4G, the substrate w is housed in the shape of each layer of i. At this time, the box portion 40 is intermittently moved in the z direction of Fig. 3 (1). This intermittent moving distance is the interlayer p of the box portion 40. Another ^曰 ==18 intermittently moves upwards and makes: part 4. The second corpse = coffee is stored in the box portion 4 °. This portion is repeatedly stored in the cassette portion 4G, and the substrate 127515132226226fif.doc on the tray 17 is additionally provided with (4) a cooling mechanism 19 for cooling the substrate w. _ is the substrate w surface temperature for film formation and addition of the secret, and for the whole scale of the brain county, it is important to do the same process. By providing the cooling mechanism 19, the substrate W on the "= can be rapidly cooled, so that it can be stored in the short-term (four) substrate "40". As the cooling mechanism 19, cooling water, cold air, or the like can be used.

本貫㈣_基板搬運裝置,由於彻耐熱性材料所 版作的夾,20’將基板W進行機械性地爽緊(保持),所 以即使為高溫的基板也可立即搬運,能夠縮短生產時間。 2 ’藉由在时鋪18上設置用於冷卻基板W的冷卻 故構19,即使為高溫的基板也可立即進行冷卻,所以 -步縮短生產時間。而且,由於在卸載室13中設置有失盤 部20、水平驅動機構2卜升降板3〇、升降機構31,所: =需要用於基板搬運裝置的新空間,不會招致基板處理裝 =1〇的大型化’㈣以簡潔的構成進行基板的處理和搬 運。另外’在本實施形態中,由失盤部2〇、水平驅動機構 、升降板30、升降機構31 ’ 32構成基板搬運裝置。 (弟2實施形態) 圖4⑻〜4(〇所示為根據本發明的第2實施形態的基板 搬運裝置之構成的概略部分構賴。具有本實施形態的基 板搬運裝置之基板處理裝置的構成,與 明的基本姻,_只對不_進行說明。:且, 盤部、水平驅動機構及升降機構也與根據第】實施形態之 12 I275132p,d〇c 基板搬運裝置相同,所以對相同的構成構件付以相同的符 號。 圖4 (a)〜圖4 (c)所示為卸載室13内的情況,圖 4(d)〜圖4(f)及圖4(g)〜圖4(i)所示為回收站 14内的情況。圖4 (a)所示為載置基板w之托盤17和夾 盤部20的位置關係的平面圖,圖4(b)為圖4(a)的μι 所面圖’圖4(c)為圖4(a)的ΙΙ-Π斷面圖。圖4 (d)所 示為載置基板W之回收托盤18和夾盤部2〇的位置關係的 平面圖,圖4(e)為圖4(d)的ΙΙΙ-ΙΠ斷面圖,圖4 (f) 為圖4 (d)的IV-IV斷面圖。圖4 (g)所示為載置基板w 之回收托盤18和盒部40的位置關係的平面圖,圖4 (h) 為圖4 (g)的V-V斷面圖,圖4(i)為圖4(g)的vi_VI 斷面圖。 參照圖4(a)〜4(i)對與第i實施形態所說明之構成不同 的點進行說明。首先,托盤117與圖3⑻〜3(i)的托盤丨了在 構造上有所不同。如圖4(a)、圖4(b)、圖4(c)所示, 在托盤117上形成有複數個採用2層結構的分層式孔部 117b且在各個分層式孔部η几上分別裝卸自如地設置有 用於載置基板w的載置構件117a。而且,升降板13〇也 人圖3(a)〜3(i)的升降板3〇不同。即,採用一種使升降板 |3〇的上面與載置構件u7a的下面抵接,將升降板13〇進 行升降的結構。In the present invention, the substrate (W) is mechanically fastened (held) by the heat-resistant material, so that the substrate W can be immediately transported, and the production time can be shortened. 2' By providing a cooling structure 19 for cooling the substrate W on the time store 18, even if the substrate is heated at a high temperature, it can be immediately cooled, so that the production time is shortened. Further, since the unloading portion 20, the horizontal driving mechanism 2, the lifting plate 3, and the lifting mechanism 31 are provided in the unloading chamber 13, a new space for the substrate conveying device is required, and the substrate processing apparatus is not ingested. The enlargement of the crucible '(4) handles and transports the substrate in a compact configuration. Further, in the present embodiment, the substrate transfer device is constituted by the lost disk portion 2, the horizontal drive mechanism, the lift plate 30, and the elevating mechanism 31'32. (Embodiment 2) The configuration of the substrate processing apparatus according to the second embodiment of the present invention is shown in Fig. 4 (8) to (4). The basic affair with Ming, _ only for _ will be explained.: The disk, the horizontal drive mechanism and the lifting mechanism are also the same as the 12 I275132p, d〇c substrate transport device according to the first embodiment, so the same configuration The components are given the same symbols. Fig. 4 (a) to Fig. 4 (c) show the inside of the unloading chamber 13, Fig. 4 (d) to Fig. 4 (f) and Fig. 4 (g) to Fig. 4 (i The case shown in the recovery station 14. Fig. 4(a) is a plan view showing the positional relationship between the tray 17 on which the substrate w is placed and the chuck portion 20, and Fig. 4(b) is the μ of Fig. 4(a). Fig. 4(c) is a cross-sectional view taken along line ΙΙ-Π of Fig. 4(a), and Fig. 4(d) is a plan view showing the positional relationship between the recovery tray 18 on which the substrate W is placed and the chuck portion 2〇. 4(e) is a ΙΙΙ-ΙΠ cross-sectional view of FIG. 4(d), FIG. 4(f) is a IV-IV cross-sectional view of FIG. 4(d), and FIG. 4(g) shows a mounting substrate. Plan view of the positional relationship between the recovery tray 18 and the box portion 40 Figure 4 (h) is a VV cross-sectional view of Figure 4 (g), and Figure 4 (i) is a vi_VI cross-sectional view of Figure 4 (g). Referring to Figures 4 (a) ~ 4 (i) and the i-th implementation The configuration in which the configuration is different will be described. First, the tray 117 differs from the trays of Figs. 3(8) to 3(i) in structure, as shown in Fig. 4(a), Fig. 4(b), and Fig. 4 ( c), a plurality of layered hole portions 117b having a two-layer structure are formed on the tray 117, and mounting members for mounting the substrate w are detachably provided on each of the layered hole portions η. 117a. Further, the lifting plate 13A is different from the lifting plate 3 of Figures 3(a) to 3(i). That is, the upper surface of the lifting plate|3〇 is brought into contact with the lower surface of the placing member u7a, and The structure in which the lifting plate 13 is lifted and lowered.

對採用上述那種構成的基板處理裝置之基板w的搬 運過程進行說明。如圖4 (a)的平面圖所示,使基板W 13 1275132 16226pif.doc 在托盤117上以3片為單位進行排列。在初期狀態下,預 先使夾盤部20從托盤部117的上方退開。首先,如圖4 (b)、圖4(C)所示,當使升降板130上升時,升降板130 的上面與載置構件117a的下面抵接,並將載置構件117a 只推起所定距離。此時,在載置構件117a的上面載置有3 片基板W。如第1實施形態所說明的,使夾盤部2〇沿基 板W的表面,在圖4 (a)的xl方向上進行滑動,並將載 _ 置有3片基板W的載置構件117a由夾盤部20的端部20a 爽緊。該夾緊與利用第1實施形態所說明的方法是相同 的。即使基板W的夾緊結束,也不使升降板3〇下降。 接著,如圖4 (d)、圖4 (e)、圖4 (f)所示,使夾 緊了載置有3片基板W之載置構件117a的夾盤部2〇,移 動到回收托盤18的上方。當利用升降機構32使回收托盤 以從設定位置上升時,回收托盤18的上面通過夾盤部2〇 下面的中央開口,與載置構件117a的下面抵接,並將載置 構件117&amp;只推起所定距離。藉此,載置構件117a形成一 馨種在載置有3片基板W的情況下從夾盤部20的端部20a 分離並洋起的狀態。在該狀態下,使夾盤部20沿圖4 的χ2方向進行滑動,並與載置構件117a脫離。利用升降 機構32 ’使回收托盤18下降並返回到設定位置。藉由以 上的過程’完成從托盤117向回收托盤18之基板w的搬 ,。3片基板W保持一種在載置構件上被載置的狀 態。 接著,將搬運到回收托盤18上之載置構件U7a上的 14 1275132 16226pif.doc 基板W,收納到盒部40中。藉由使夾盤部20與載置構件 117a脫離,而使3片基板W的表面露出。在使直 裝置的吸附部5G從3片基板w的上方下^,將3片= =同時進行真空吸附後,使吸附部5()從載置構件收脫 戈口園4 ( g ) '… ^ ) 吗叶、U尸叮不,使將3片其 板W進行了真空吸附之吸附部5G向盒部4G,即向土The transport process of the substrate w of the substrate processing apparatus constructed as described above will be described. As shown in the plan view of Fig. 4 (a), the substrates W 13 1275132 16226 pif.doc are arranged on the tray 117 in units of three sheets. In the initial state, the chuck portion 20 is previously retracted from above the tray portion 117. First, as shown in FIGS. 4(b) and 4(C), when the lift plate 130 is raised, the upper surface of the lift plate 130 abuts against the lower surface of the mounting member 117a, and the mounting member 117a is only pushed up. distance. At this time, three substrates W are placed on the upper surface of the mounting member 117a. As described in the first embodiment, the chuck portion 2 is slid along the surface of the substrate W in the x1 direction of FIG. 4(a), and the mounting member 117a on which the three substrates W are placed is placed. The end 20a of the chuck portion 20 is tight. This clamping is the same as the method described in the first embodiment. Even if the clamping of the substrate W is completed, the lifting plate 3 is not lowered. Then, as shown in FIG. 4 (d), FIG. 4 (e), and FIG. 4 (f), the chuck portion 2 of the mounting member 117a on which the three substrates W are placed is moved to the recovery tray. Above the 18th. When the recovery tray 32 is raised from the set position by the elevating mechanism 32, the upper surface of the recovery tray 18 passes through the central opening of the lower surface of the chuck portion 2, and abuts against the lower surface of the mounting member 117a, and pushes the mounting member 117&amp; The set distance. Thereby, the placing member 117a is formed in a state in which the singularity is separated from the end portion 20a of the chuck portion 20 when the three substrates W are placed. In this state, the chuck portion 20 is slid in the χ2 direction of FIG. 4 and is detached from the placing member 117a. The recovery tray 18 is lowered by the elevating mechanism 32' and returned to the set position. The transfer from the tray 117 to the substrate w of the recovery tray 18 is completed by the above process. The three substrates W are held in a state of being placed on the mounting member. Next, the 14 1275132 16226 pif.doc substrate W carried on the placing member U7a on the recovery tray 18 is stored in the casing 40. The surface of the three substrates W is exposed by separating the chuck portion 20 from the mounting member 117a. After the adsorption unit 5G of the straight device is moved from above the three substrates w, and three sheets == simultaneously vacuum suction, the adsorption unit 5 () is removed from the mounting member (G) '... ^ ) The leaves and the U corpse are not, so that the three adsorption plates 5G whose plates are vacuum-adsorbed are directed to the box portion 4G, that is, to the soil.

的X3方向進行移動,且在内部形成多層之盒部仙的各 =每層1片的形態收納基板w。此時,使盒部4〇向圖^ 的z方向以每層間隔為單位進行間歇性地移動 外’即使使真空夾盤裝置的吸附部5G間歇性地向上方二 H使盒部40沿左右方向往返移動,也可將基板w向夕 =40中進行收納。這些一系列的搬運過程依次反復 托盤17上的基板W全部被收納到盒部4〇中。當這些一 列的搬運過程結束時,再次將夾盤部2()在圖7^中向 上方只偏離1列後’沿x4方向進行移動,進行下—次. 板W的搬運。 土 在進行該第2次的搬運動作之前,還有一個將回收托 盤18上所留下的餘猶U7a轉 程。即,在將載置構件117a上的基❹二空夾。2 的吸附部5G進行吸附並向盒部4G側進行移動後,使炎盤 部20滑動’只夾緊回收托盤18上的載置構件im,並使 夾盤部20返回到初始位置,將載置元件心向升降板13〇 進行轉移,且使升降板13〇下降㈣载置構件im轉換到 1275132 16226pif.doc 托盤117上。另外,即使在本實施形態中,也可在回收托 盤18上設置用於冷卻基板w的冷卻機構19。另外,在本 貝施形悲中,由夾盤部20、水平驅動機構21、升降板13〇、 升降機構31、32構成基板搬運裝置。The X3 direction is moved, and each of the plurality of box parts is formed inside. At this time, the cassette portion 4 is intermittently moved in the z direction of the drawing in the interval of each layer. Even if the adsorption portion 5G of the vacuum chuck device is intermittently moved upward, the cassette portion 40 is left and right. The direction w is moved back and forth, and the substrate w can be stored in the evening = 40. These series of conveyance processes are sequentially repeated. The substrates W on the tray 17 are all stored in the cassette portion 4A. When the conveyance process of these columns is completed, the chuck portion 2 () is again shifted from the upper side in Fig. 7^ and then moved in the x4 direction to carry out the next-time. Soil Before the second handling operation, there is another U7a conversion that will be left on the recovery tray 18. That is, the base 上 on the mounting member 117a is sandwiched. When the adsorption unit 5G of 2 adsorbs and moves to the side of the cartridge portion 4G, the squeegee portion 20 is slid to 'clamp only the placing member im on the recovery tray 18, and the chuck portion 20 is returned to the initial position, and the chuck portion 20 is loaded. The component core is transferred to the lift plate 13A, and the lift plate 13 is lowered (4) the mounting member im is switched to the 1275132 16226pif.doc tray 117. Further, even in the present embodiment, the cooling mechanism 19 for cooling the substrate w can be provided on the recovery tray 18. Further, in the present invention, the chuck portion 20, the horizontal drive mechanism 21, the lift plate 13A, and the elevating mechanisms 31, 32 constitute a substrate transfer device.

即使在本實施形態中,也可起到與第丨實施形態同樣 的作用效果。另外,由於將載置構件U7a與基板w 一起 夾緊所以即使彳文托盤17向回收托盤18進行搬運,基板 W彼此間的位置關係也是不變的,不需要進行特別的定 位,使例如將基板W收納到盒部4〇中的作業變得容易。 —本發明並不限定於以上所說明的實施形態,只要不損 害其,徵即可。例如,在本實施_中,為了說明上的便 利’疋對以3片為單位搬運基板w的情況進行說明的,但 亚不限定於3 #,既可為丨片也可為複數片。而且,本發 =的基板搬運裝置並不只限於從卸載室13向回收站Μ的 ^板搬運,也可用於例如從處_12向卸載室13的基板 另外,本發明的基板搬運裝置,也可用於基板%從 =室13、向回㈣14或基板處理裝置㈣外部被搬出後 处二反般運。即’本發明的基板搬運裝置,也可用於回收 内的基板搬運和在基板處理裝置10以外之場所的美 =載。、如圖5所示,可將本發㈣基板搬運裝置在回二 曰〃内進行設置使用。如前面所說明的,在回收站14只 空間的情況下,基板搬縣置可設置在基板處理Ϊ 的外部。另外,在圖5中,對與圖i採用相同構成 1275132 16226pif.doc 的構件付以相同的符號,並省略說明。 雖然本發明已以較佳實施例揭露如上,然其 限定本發明,任何熟習此技⑽,林脫 ::範圍内’當可作些許之更動與潤飾,因此本發= 範圍當視後附之申請專利範圍所界定者為準。 ’、 【圖式簡單說明】Even in the present embodiment, the same operational effects as those of the third embodiment can be obtained. Further, since the placing member U7a is clamped together with the substrate w, even if the paper tray 17 is transported to the collecting tray 18, the positional relationship between the substrates W is constant, and no special positioning is required, for example, the substrate is The work of storing W in the cassette portion 4 is easy. - The present invention is not limited to the embodiments described above, and may be levied as long as it is not damaged. For example, in the present embodiment, the case where the substrate w is transported in units of three sheets has been described for convenience. However, the present invention is not limited to 3 #, and may be a cymbal sheet or a plurality of sheets. Further, the substrate transfer device of the present invention is not limited to the transfer from the unloading chamber 13 to the recovery station, but may be used, for example, from the substrate 12 to the unloading chamber 13, and the substrate transfer device of the present invention may be used. After the substrate % is removed from the chamber 13 , the back (four) 14 or the substrate processing device (4), it is transported. That is, the substrate transfer device of the present invention can be used for the substrate transfer in the collection and the position of the substrate other than the substrate processing apparatus 10. As shown in Fig. 5, the (4) substrate transfer device can be set and used in the second pass. As explained above, in the case of the space of the recovery station 14, the substrate can be disposed outside the substrate processing chamber. Incidentally, in FIG. 5, members having the same configuration as that of FIG. i 1275132 16226pif.doc are denoted by the same reference numerals, and description thereof will be omitted. Although the present invention has been disclosed in the above preferred embodiments, it is intended to limit the present invention, and any of the techniques (10), Lin De:: can be used to make some changes and retouching, so the scope of the present invention is attached. The scope defined in the scope of application for patent application shall prevail. ', [Simple description of the map]

圖1所不為具有關於本發明的實施形態的基板搬運裝 置之基板處理裝置的概略全體構成圖。 圖2為在關於本發明的第1實施形態的基板搬運裝置 上所設置之夾盤部的斜視圖。 圖3(a)〜3(1)為根據本發明的第1實施形態的基板搬運 裝置之構成的概略構成圖。 圖4(a)〜4(1)為根據本發明的第2實施形態的基板搬運 裝置之構成的概略構成圖。 圖5所不為關於本發明的實施形態之基板搬運裝置被 設置於基板處理裝置的外部時的概略全體構成圖。 【主要元件符號說明】 10、10A :基板處理裝置 11 :加載室 12 :處理室 13 :卸載室 14 :回收站 15〜17 :托盤 17 I275132pif,oc 17a :貫通孔 18 :回收托盤 19 :冷卻機構 20 :夾盤部 20a :端部 21 :水平驅動機構 30 ··升降板 30a :銷 31、32 :升降機構 40 :盒部 50 :吸附部 117 :托盤 117a :載置構件 117b :分層式孔部 130 :升降板Fig. 1 is a schematic overall configuration diagram of a substrate processing apparatus having a substrate transfer device according to an embodiment of the present invention. Fig. 2 is a perspective view showing a chuck portion provided in the substrate transfer device according to the first embodiment of the present invention. 3(a) to 3(1) are schematic configuration diagrams showing a configuration of a substrate transfer device according to the first embodiment of the present invention. 4(a) to 4(1) are schematic configuration diagrams showing a configuration of a substrate transfer device according to a second embodiment of the present invention. Fig. 5 is a schematic overall configuration diagram when the substrate transfer device according to the embodiment of the present invention is provided outside the substrate processing apparatus. [Description of main component symbols] 10, 10A: substrate processing apparatus 11: loading chamber 12: processing chamber 13: unloading chamber 14: recycling stations 15 to 17: tray 17 I275132pif, oc 17a: through hole 18: recovery tray 19: cooling mechanism 20: chuck portion 20a: end portion 21: horizontal drive mechanism 30 · lifting plate 30a: pin 31, 32: lifting mechanism 40: box portion 50: suction portion 117: tray 117a: mounting member 117b: layered hole Part 130: lifting plate

Gl、G2、G3、G4 :閘門 W :基板 yl、y2 :距离隹 18Gl, G2, G3, G4: gate W: substrate yl, y2: distance 隹 18

Claims (1)

1275132 16226pif.doc 十、申請專利範圍: 處於1 高置’為-種將載置於處理托盤上並 心卜的基板,搬運至下一步的回收托盤上之基 板搬運裳置,其特徵在於’包括: 移單元’將前述處理托盤上的前述基板從前述 處理托盤轉移顺述_構件上; 述回::凡以:刖述保持構件從前述處理托盤移動到前 收杯ί ΐ?#單7° ’將在湘前述移動單元移動到前述回 = 持構件上所保持的基板,轉移到前述回 徵在^如^料·15帛1項所述的基板搬縣置,其特 1 轉移單元包括通過前述處理托盤上所設置的 貝通孔進行升降之升降銷,以及 、,藉由通過月ίι述貫通孔從前述處理托盤表面突 ,的頂端支持基板,並將從前述處理托盤上浮起的丄 板的背面端部與前述簡構件進行接合後 ^ 持構件上。 胃通孔退出,將刖述基板轉移到前述保 3.如申請專利範圍第2項所述的基板搬運裝置,其特 1275132 16226pif.doc 徵在於: 構件SI 2轉移早几包括升降前述回收托盤的第2升降 藉由前述第2升降構件升降前 =構件上被保持並移動到前述回上= 板’轉移到前述回收托盤上。 土 徵在^如中請專利範圍第1項所述的基板搬縣置,其特 f述處理托魅有部分麵且可升㈣載置構件; 载置;前述處理托盤並升降前述 托盤= 使前述載職 保持構件進行接人後,使置構件的背面端部以前述 丹卞延仃接口後,使刖述第丨升降構件下 心载置構件與基板—起轉移到前述保持構件上。、則 徵在^^料利顧第4項所述板搬運裝置,其特 盤的第2升降 構件前=2轉移單元包括升降前述回收托 且將在前 ,由前述第2升降構件升降前述回收托盤, 構件述回收托盤上的前述載置 述回收托盤上。 項中的任一項所述的基板 6·如申請專利範圍第 20 .1275132 16226pif.doc 搬運裝置,其特徵在於: 在刖述回收托盤上,設置有對從前述處理托盤所搬運 來的前述基板進行冷卻之冷卻單元。 # · Y 專利範圍帛1項所述的基板搬運裝置,其特 欲在於·喊^搞持構件的耐熱性材料為金屬或陶究。 8.如申請專機㈣丨項所述的 斷面呈矩形且兩端開放的管狀 、、邛刀疋王被切掉的形狀而具有中央開口。 9·如申請專利範圍第8 jg辦、+、 ,在::前述保持構件的中央二二=,其 二於基板的尺寸,且保持構件的—邊長度y2大於基 = 尺 其特徵在於,包括·· 狀態的基板之處理托 盤的收納 ι〇·—種基板處理裝置, 收納用於載置處於高溫 室;以及1275132 16226pif.doc X. Patent application scope: The substrate that is placed on the processing tray and placed on the high-level substrate is transported to the substrate of the next recycling tray, which is characterized by 'including : shifting unit 'transferring the aforementioned substrate on the processing tray from the processing tray to the component _ member; returning:: Describing: moving the holding member from the processing tray to the front receiving cup # #? #单 7° 'moving the moving unit to the substrate held by the above-mentioned returning member, shifting to the substrate in the above-mentioned retracement, and the special transfer unit includes a lifting pin for lifting and lowering the beacon hole provided in the processing tray, and a supporting plate which protrudes from the surface of the processing tray by a through hole, and which floats from the processing tray The rear end portion is joined to the aforementioned simple member to hold the member. The stomach through hole is withdrawn, and the substrate is transferred to the aforementioned substrate. The substrate handling device according to claim 2 is characterized in that: the component SI 2 transfer includes a lifting of the aforementioned recovery tray. The second lifting is transferred to the recovery tray by the second lifting member before and after the lifting and lowering of the member and moving to the aforementioned upper plate. In the case of the soil, please refer to the substrate in the first paragraph of the patent scope, and the special handling method has a partial surface and can be raised (4) to be placed on the substrate; the loading; the processing tray is raised and lowered to the tray = After the carrier holding member is accessed, the rear end portion of the placing member is extended to the holding member by the above-described tantalum member, and then the lower lifting member lower core mounting member and the substrate are transferred to the holding member. According to the fourth aspect, the second lifting member front/two transfer unit includes the lifting and lowering of the recovery tray, and the second lifting member is lifted and lowered by the second lifting member. The tray, the member on the recovery tray, is placed on the recovery tray. The substrate 6 according to any one of the preceding claims, wherein the substrate is transported from the processing tray, and the substrate is transported from the processing tray. Cooling unit for cooling. # · Y The substrate transfer device according to the first aspect of the invention is characterized in that the heat-resistant material of the member is made of metal or ceramic. 8. If the section of the special plane (4) is rectangular and the ends are open, the shape of the tube is cut off and has a central opening. 9. If the scope of the patent application is 8th, the center of the above-mentioned holding member is 2, the second is the size of the substrate, and the length y2 of the holding member is greater than the base = the ruler is characterized in that it includes ············································ 申請專利範圍第1〜9 項中的任1所述的基板搬運 21The substrate conveyance described in any one of claims 1 to 9
TW094106004A 2004-05-27 2005-03-01 Substrate carrying device and substrate processing device having the same TWI275132B (en)

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