TW200519394A - Semiconductor device and method testing the same - Google Patents

Semiconductor device and method testing the same

Info

Publication number
TW200519394A
TW200519394A TW093134494A TW93134494A TW200519394A TW 200519394 A TW200519394 A TW 200519394A TW 093134494 A TW093134494 A TW 093134494A TW 93134494 A TW93134494 A TW 93134494A TW 200519394 A TW200519394 A TW 200519394A
Authority
TW
Taiwan
Prior art keywords
test
output
circuit
semiconductor device
testing
Prior art date
Application number
TW093134494A
Other languages
Chinese (zh)
Other versions
TWI254799B (en
Inventor
Imagawa Kengo
Makuuchi Masami
Chujo Norio
Orihashi Ritsuro
Arai Yoshitomo
Original Assignee
Renesas Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Tech Corp filed Critical Renesas Tech Corp
Publication of TW200519394A publication Critical patent/TW200519394A/en
Application granted granted Critical
Publication of TWI254799B publication Critical patent/TWI254799B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3614—Control of polarity reversal in general
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

The invention is to solve an issue, in which a testing semiconductor devices and a method thereof that has plural output pins less than number of channel of of a semiconductor test equipment can simultaneously test the plural output pins. One preferred embodiment is that an LCD driver owning a semiconductor device enabling to drive a gate line of a LCD display panel. The semiconductor device includes an Ex-or circuit 6 reversing polarities of positive and negative voltage for driving the gate line, a test-state inverter circuit 9 controlling an output circuit for driving the gate line at a state high impedance, and more than one testing control terminal TEST for controlling states of the Ex-or circuit 6 and the test-state inverter circuit 9. While testing, only a pin in the gate output is set to output positive voltage VGH or negative voltage VGL. And other pins are set to high impedance so as to constitute simultaneous test realizing an output of plural gates.
TW093134494A 2003-12-03 2004-11-11 Semiconductor device and the method of testing the same TWI254799B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003404691 2003-12-03

Publications (2)

Publication Number Publication Date
TW200519394A true TW200519394A (en) 2005-06-16
TWI254799B TWI254799B (en) 2006-05-11

Family

ID=34779854

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093134494A TWI254799B (en) 2003-12-03 2004-11-11 Semiconductor device and the method of testing the same

Country Status (3)

Country Link
KR (1) KR100702564B1 (en)
CN (1) CN100419446C (en)
TW (1) TWI254799B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7990170B2 (en) 2006-10-20 2011-08-02 Sharp Kabushiki Kaihsa Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method
TWI403933B (en) * 2008-10-20 2013-08-01 Japan Display West Inc Liquid-crystal display panel and chopper-type comparator

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100749423B1 (en) 2006-08-09 2007-08-14 삼성에스디아이 주식회사 Organic light emitting display device and the driving method of inspector circuit of organic light emitting display device
KR101297657B1 (en) * 2013-05-02 2013-08-21 (주) 에이블리 A switch circuit for testing a semiconductor element

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3142435B2 (en) * 1994-02-15 2001-03-07 株式会社東芝 Semiconductor integrated circuit device
JPH1026655A (en) * 1996-07-11 1998-01-27 Yamaha Corp Testing apparatus for lsi
JP4020223B2 (en) * 1997-06-25 2007-12-12 ビオイ ハイディス テクノロジー カンパニー リミテッド LCD module drive circuit
JP5051942B2 (en) * 2000-02-01 2012-10-17 株式会社半導体エネルギー研究所 Semiconductor device
JP2003107128A (en) * 2001-09-27 2003-04-09 Ando Electric Co Ltd Semiconductor testing device and test method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7990170B2 (en) 2006-10-20 2011-08-02 Sharp Kabushiki Kaihsa Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method
TWI403933B (en) * 2008-10-20 2013-08-01 Japan Display West Inc Liquid-crystal display panel and chopper-type comparator

Also Published As

Publication number Publication date
KR20050053505A (en) 2005-06-08
CN100419446C (en) 2008-09-17
TWI254799B (en) 2006-05-11
KR100702564B1 (en) 2007-04-04
CN1624489A (en) 2005-06-08

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees