TW200517649A - Device and method for detecting broken edge of glass substrate - Google Patents
Device and method for detecting broken edge of glass substrateInfo
- Publication number
- TW200517649A TW200517649A TW093124826A TW93124826A TW200517649A TW 200517649 A TW200517649 A TW 200517649A TW 093124826 A TW093124826 A TW 093124826A TW 93124826 A TW93124826 A TW 93124826A TW 200517649 A TW200517649 A TW 200517649A
- Authority
- TW
- Taiwan
- Prior art keywords
- glass substrate
- broken edge
- detecting
- detecting broken
- pulses
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
The present invention provides a device and method for detecting the broken edge of glass substrate using the minimum limit of photo sensor in the production line of flat panel display when the glass substrate is moving. The device for detecting broken edge of glass substrate is configured on the lower portion or the upper portion of the moving position for the glass substrate. When the glass substrate is passing above or under at least two sensors, the present invention can calculate the number of pulses from the signal received by each sensor, and compare the determined time period and the calculated number of pulses with the default reference value, so as to determine if the glass substrate is damaged or not.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030082999A KR100583701B1 (en) | 2003-11-21 | 2003-11-21 | Device and method for detecting broken edge of glass substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200517649A true TW200517649A (en) | 2005-06-01 |
TWI255915B TWI255915B (en) | 2006-06-01 |
Family
ID=34737838
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093124826A TWI255915B (en) | 2003-11-21 | 2004-08-18 | Device and method for detecting broken edge of glass substrate |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2005156539A (en) |
KR (1) | KR100583701B1 (en) |
CN (1) | CN1619299A (en) |
TW (1) | TWI255915B (en) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4808510B2 (en) * | 2006-02-21 | 2011-11-02 | 大日本スクリーン製造株式会社 | Substrate crack detection device and substrate processing device |
JP4808509B2 (en) * | 2006-02-21 | 2011-11-02 | 大日本スクリーン製造株式会社 | Substrate crack detection device and substrate processing device |
KR100775024B1 (en) * | 2006-06-07 | 2007-11-08 | 주식회사 케이씨텍 | Device for testing edge of glass substrate and method thereof |
CN103364413A (en) * | 2012-04-10 | 2013-10-23 | 北京兆维电子(集团)有限责任公司 | Identifier detection and product grading control system and method |
CN103376062B (en) * | 2012-04-20 | 2015-12-02 | 洛阳北方玻璃技术股份有限公司 | Long method surveyed by a kind of glass |
CN102854832A (en) * | 2012-07-26 | 2013-01-02 | 蚌埠玻璃工业设计研究院 | Electrical control device for detection bridge in sheet glass cold end cutting area |
CN104103481A (en) * | 2013-04-10 | 2014-10-15 | 上海和辉光电有限公司 | Unfilled corner detection apparatus for glass substrate, dry etching machine table with the apparatus, and unfilled corner detection method |
CN103471512B (en) * | 2013-09-06 | 2016-08-17 | 中国建材国际工程集团有限公司 | A kind of glass plate width detecting system based on machine vision |
US9983452B2 (en) | 2014-07-15 | 2018-05-29 | Huawei Technologies Co., Ltd. | Method for detecting substrate crack, substrate, and detection circuit |
CN105319219B (en) * | 2014-07-23 | 2019-05-14 | 塞米西斯科株式会社 | Bad inspection system and method |
CN107131832B (en) * | 2016-02-29 | 2019-07-09 | 深圳市升瑞科仪光电有限公司 | LCD glass edging effect detection method and device |
CN105572144B (en) * | 2016-03-07 | 2018-11-20 | 凌云光技术集团有限责任公司 | Glass corner image collecting device and system |
CN107153071A (en) * | 2017-04-25 | 2017-09-12 | 武汉华星光电技术有限公司 | The detection means and detection method of a kind of glass substrate |
CN107219233A (en) * | 2017-05-22 | 2017-09-29 | 武汉华星光电技术有限公司 | A kind of device and method for detecting glass substrate breakage and crackle |
CN108226228B (en) * | 2018-01-29 | 2021-02-05 | 京东方科技集团股份有限公司 | Substrate to be detected, method and equipment for detecting glass breakage |
WO2020060772A1 (en) * | 2018-09-19 | 2020-03-26 | Corning Incorporated | Methods of measuring a size of edge defects of glass sheets using an edge defect gauge and corresponding edge defect gauge |
CN109283714A (en) * | 2018-11-12 | 2019-01-29 | 成都中电熊猫显示科技有限公司 | The detection method and detection device of bolster breakage in liquid crystal display panel crimping |
CN111964549B (en) * | 2020-07-08 | 2022-06-17 | 航天科工防御技术研究试验中心 | Detection method for judging defect of large-volume monolithic capacitor |
CN114441556A (en) * | 2021-12-28 | 2022-05-06 | 蚌埠中光电科技有限公司 | Online nondestructive detection and alarm system for substrate glass transmission process |
CN115855963A (en) * | 2023-02-28 | 2023-03-28 | 青岛融合光电科技有限公司 | Glass detection device and detection method |
CN116626034A (en) * | 2023-05-09 | 2023-08-22 | 彩虹(合肥)液晶玻璃有限公司 | Automatic detection mechanism for edges around glass substrate |
-
2003
- 2003-11-21 KR KR1020030082999A patent/KR100583701B1/en active IP Right Grant
-
2004
- 2004-08-18 TW TW093124826A patent/TWI255915B/en not_active IP Right Cessation
- 2004-09-03 CN CNA2004100740854A patent/CN1619299A/en active Pending
- 2004-09-24 JP JP2004276531A patent/JP2005156539A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
TWI255915B (en) | 2006-06-01 |
KR20050083200A (en) | 2005-08-26 |
KR100583701B1 (en) | 2006-06-08 |
CN1619299A (en) | 2005-05-25 |
JP2005156539A (en) | 2005-06-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |