TW200511375A - Linear device - Google Patents

Linear device

Info

Publication number
TW200511375A
TW200511375A TW093125078A TW93125078A TW200511375A TW 200511375 A TW200511375 A TW 200511375A TW 093125078 A TW093125078 A TW 093125078A TW 93125078 A TW93125078 A TW 93125078A TW 200511375 A TW200511375 A TW 200511375A
Authority
TW
Taiwan
Prior art keywords
channel length
region
source
misfet
determined
Prior art date
Application number
TW093125078A
Other languages
English (en)
Inventor
Yasuhiko Kasama
Kenji Omote
Original Assignee
Ideal Star Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ideal Star Inc filed Critical Ideal Star Inc
Publication of TW200511375A publication Critical patent/TW200511375A/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78696Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0657Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/417Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
    • H01L29/41725Source or drain electrodes for field effect devices
    • H01L29/41733Source or drain electrodes for field effect devices for thin film transistors with insulated gate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312Gate electrodes for field effect devices
    • H01L29/42316Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42384Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thin Film Transistor (AREA)
TW093125078A 2003-08-19 2004-08-19 Linear device TW200511375A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003294807 2003-08-19
JP2003321027 2003-09-12

Publications (1)

Publication Number Publication Date
TW200511375A true TW200511375A (en) 2005-03-16

Family

ID=34197157

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093125078A TW200511375A (en) 2003-08-19 2004-08-19 Linear device

Country Status (4)

Country Link
US (1) US20060208324A1 (zh)
JP (2) JPWO2005018003A1 (zh)
TW (1) TW200511375A (zh)
WO (1) WO2005018003A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7495307B2 (en) 2003-11-20 2009-02-24 Ideal Star Inc. Columnar electric device
FR2941089B1 (fr) * 2009-01-15 2011-01-21 Commissariat Energie Atomique Transistor a source et drain filaires

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60161672A (ja) * 1984-02-02 1985-08-23 Seiko Instr & Electronics Ltd 薄膜トランジスタとその製造方法
JPS6266664A (ja) * 1985-09-19 1987-03-26 Toshiba Corp 駆動回路基板
JP2654055B2 (ja) * 1987-02-28 1997-09-17 キヤノン株式会社 半導体基材の製造方法
JP2721183B2 (ja) * 1988-07-20 1998-03-04 キヤノン株式会社 非線形光学素子
JPH09203910A (ja) * 1996-01-29 1997-08-05 Hitachi Ltd 線型固体スイッチ素子とその製造方法、および前記線型固体スイッチ素子を画素選択手段として用いた平面表示素子
JP4352621B2 (ja) * 2001-03-05 2009-10-28 パナソニック株式会社 透光性導電性線状材料、繊維状蛍光体及び織物型表示装置
US6437422B1 (en) * 2001-05-09 2002-08-20 International Business Machines Corporation Active devices using threads
CN100385699C (zh) * 2001-10-30 2008-04-30 1...有限公司 压电器件和其制造方法
JP4247377B2 (ja) * 2001-12-28 2009-04-02 独立行政法人産業技術総合研究所 薄膜トランジスタ及びその製造方法
JP4104445B2 (ja) * 2002-12-12 2008-06-18 株式会社イデアルスター 線状のデバイス

Also Published As

Publication number Publication date
JP2011254099A (ja) 2011-12-15
JPWO2005018003A1 (ja) 2007-11-01
WO2005018003A1 (ja) 2005-02-24
US20060208324A1 (en) 2006-09-21
JP5467207B2 (ja) 2014-04-09

Similar Documents

Publication Publication Date Title
EP1253634A3 (en) Semiconductor device
SE9602881L (sv) Halvledarkomponent för högspänning
TW200520237A (en) Semiconductor device with high-k gate dielectric
TW200505028A (en) Semiconductor device
TW200607090A (en) Novel isolated LDMOS IC technology
WO2006052025A3 (en) Semiconductor devices and method of manufacturing them
TW200625707A (en) Field effect transistor
EP2083449A3 (en) Device for Controlling Electrical Conduction Across a Semiconductor Body
ATE434267T1 (de) INTEGRIERTER SCHALTKREIS MIT ENGGEKOPPELTEM HOCHSPANNUNGSAUSGANG UND ßOFFLINEß TRANSISTORPAAR
SE0303106D0 (sv) Ldmos transistor device, integrated circuit, and fabrication method thereof
WO2003021685A1 (fr) Dispositif semi-conducteur et son procede de production
TW200707905A (en) Semiconductor device, power supply device, and information processing device
US10121891B2 (en) P-N bimodal transistors
GB2371921B (en) Architecture for circuit connection of a vertical transistor
TW200605355A (en) LDMOS device and method of fabrication
TW200505274A (en) Electro-luminescence device including a thin film transistor and method of fabricating an electro-luminescence device
TW200703666A (en) Thin film transistor
TW200608580A (en) Semiconductor device
JP2008235933A (ja) 半導体装置
WO2007050170A3 (en) Transistor device and method of making the same
TW200725710A (en) High voltage device and method to produce the same
TW200511375A (en) Linear device
KR20100138924A (ko) 높은 항복 전압 이중 게이트 반도체 디바이스
DE10345556A1 (de) Halbleiterbauelement mit verbessertem Temperaturverhalten
WO2016157813A1 (ja) 負荷駆動装置