TW200507285A - Visible wavelength detector systems and filters therefor - Google Patents

Visible wavelength detector systems and filters therefor

Info

Publication number
TW200507285A
TW200507285A TW093109806A TW93109806A TW200507285A TW 200507285 A TW200507285 A TW 200507285A TW 093109806 A TW093109806 A TW 093109806A TW 93109806 A TW93109806 A TW 93109806A TW 200507285 A TW200507285 A TW 200507285A
Authority
TW
Taiwan
Prior art keywords
visible wavelength
wavelength detector
detector systems
incident light
semiconductor structure
Prior art date
Application number
TW093109806A
Other languages
English (en)
Inventor
Takashi Harada
Kazuhiko Mizuno
John Allen Wheatley
Timothy Joseph Nevitt
Andrew John Ouderkirk
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of TW200507285A publication Critical patent/TW200507285A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/285—Interference filters comprising deposited thin solid films
    • G02B5/287—Interference filters comprising deposited thin solid films comprising at least one layer of organic material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H01L31/02165—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/09—Devices sensitive to infrared, visible or ultraviolet radiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
  • Optical Filters (AREA)
  • Light Receiving Elements (AREA)
TW093109806A 2003-04-08 2004-04-08 Visible wavelength detector systems and filters therefor TW200507285A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US46124303P 2003-04-08 2003-04-08

Publications (1)

Publication Number Publication Date
TW200507285A true TW200507285A (en) 2005-02-16

Family

ID=33299786

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093109806A TW200507285A (en) 2003-04-08 2004-04-08 Visible wavelength detector systems and filters therefor

Country Status (6)

Country Link
EP (1) EP1614164A1 (zh)
JP (1) JP2006523955A (zh)
KR (1) KR20060008871A (zh)
CN (1) CN1768436A (zh)
TW (1) TW200507285A (zh)
WO (1) WO2004093200A1 (zh)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7771103B2 (en) * 2005-09-20 2010-08-10 Guardian Industries Corp. Optical diffuser with IR and/or UV blocking coating
DE102009012755A1 (de) 2009-03-12 2010-09-16 Osram Opto Semiconductors Gmbh Strahlungsempfangendes Halbleiterbauelement und optoelektrisches Bauteil
JP5383755B2 (ja) * 2010-12-17 2014-01-08 株式会社日本触媒 光選択透過フィルター、樹脂シート及び固体撮像素子
JP2013041141A (ja) * 2011-08-17 2013-02-28 Asahi Glass Co Ltd 撮像装置、固体撮像素子、撮像装置用レンズ、及び近赤外光カットフィルタ
CN104364681B (zh) * 2012-06-25 2017-05-24 Jsr株式会社 固体摄影组件用光学滤波器及其用途
CN104236714B (zh) * 2013-06-07 2016-06-08 刘红超 一种探测目标波段强度的光谱传感器
CN104457993A (zh) * 2013-09-12 2015-03-25 刘红超 一种光谱传感器及其集成制造方法
CN106153194A (zh) * 2015-04-07 2016-11-23 刘红超 一种探测目标波段强度的光谱传感装置
JP6641105B2 (ja) * 2015-06-12 2020-02-05 株式会社トッパンＴｏｍｏｅｇａｗａオプティカルフィルム 光学フィルム、これを用いた偏光板、タッチパネル、ディスプレイ部材及び表示装置
CN107430225B (zh) 2015-12-01 2019-11-08 Ａｇｃ株式会社 光学滤波器和摄像装置
JP7099786B2 (ja) * 2016-07-12 2022-07-12 スリーエム イノベイティブ プロパティズ カンパニー 光学積層体、光学システム、および配向ポリマー多層光学フィルムの第１の反射帯域を変更する方法
WO2018213380A1 (en) * 2017-05-17 2018-11-22 Everix, Inc. Flexible, ultra-thin, hybrid absorptive-reflective thin-film filters and methods of making the same
CN111417873B (zh) * 2017-12-01 2021-11-09 3M创新有限公司 具有均一左谱带边缘的薄型多层反射器
CN108114913B (zh) * 2017-12-08 2020-04-10 凌云光技术集团有限责任公司 一种滤光片的选取方法及装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3996461A (en) * 1975-03-31 1976-12-07 Texas Instruments Incorporated Silicon photosensor with optical thin film filter
US5103337A (en) * 1990-07-24 1992-04-07 The Dow Chemical Company Infrared reflective optical interference film
US6034753A (en) * 1991-11-27 2000-03-07 Reveo, Inc. Circularly polarizing reflective material having super broad-band reflection and transmission characteristics and method of fabricating and using same in diverse applications
GB2321717A (en) * 1997-01-31 1998-08-05 Sharp Kk Cholesteric optical filters
US6107564A (en) * 1997-11-18 2000-08-22 Deposition Sciences, Inc. Solar cell cover and coating
US7095009B2 (en) * 2002-05-21 2006-08-22 3M Innovative Properties Company Photopic detector system and filter therefor

Also Published As

Publication number Publication date
WO2004093200A1 (en) 2004-10-28
JP2006523955A (ja) 2006-10-19
CN1768436A (zh) 2006-05-03
KR20060008871A (ko) 2006-01-27
EP1614164A1 (en) 2006-01-11

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