WO2008139379A3 - Spectrum detector for uv radiation and manufacturing method therefore - Google Patents
Spectrum detector for uv radiation and manufacturing method therefore Download PDFInfo
- Publication number
- WO2008139379A3 WO2008139379A3 PCT/IB2008/051796 IB2008051796W WO2008139379A3 WO 2008139379 A3 WO2008139379 A3 WO 2008139379A3 IB 2008051796 W IB2008051796 W IB 2008051796W WO 2008139379 A3 WO2008139379 A3 WO 2008139379A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical filter
- light
- wavelength
- converting plate
- spectrum detector
- Prior art date
Links
- 238000001228 spectrum Methods 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 title 1
- 230000003287 optical effect Effects 0.000 abstract 4
- 239000004065 semiconductor Substances 0.000 abstract 1
- 230000003595 spectral effect Effects 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/1446—Devices controlled by radiation in a repetitive configuration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
- G01J3/0259—Monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02322—Optical elements or arrangements associated with the device comprising luminescent members, e.g. fluorescent sheets upon the device
Abstract
A spectrum detector (1; 32; 45; 50), for enabling determination of a spectral distribution in the UV-range, comprising a semiconductor substrate (6) having first (2a; 35 a) and second (2b; 35b) light-sensing structures formed therein. A first part of a wavelength converting plate (3) covers the first light-sensing structure (2a; 35a), and a first optical filter (4a; 38a) is provided on the first part of the wavelength converting plate (3), and a second part of a wavelength converting plate (3) covers the second light-sensing structure (2b; 35b), and a second optical filter (4b; 38b) is provided on the second part of the wavelength converting plate (3). The first optical filter (4a; 38a) is configured to selectively transmit light in a first wavelength range (11), and the second optical filter (4b; 38b) is configured to selectively transmit light in a second wavelength range (12), the second wavelength range (12) being different from the first wavelength range (11).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07107928 | 2007-05-10 | ||
EP07107928.9 | 2007-05-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008139379A2 WO2008139379A2 (en) | 2008-11-20 |
WO2008139379A3 true WO2008139379A3 (en) | 2009-01-08 |
Family
ID=39791466
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2008/051796 WO2008139379A2 (en) | 2007-05-10 | 2008-05-08 | Spectrum detector for uv radiation and manufacturing method therefore |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW200915551A (en) |
WO (1) | WO2008139379A2 (en) |
Families Citing this family (20)
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US9343490B2 (en) | 2013-08-09 | 2016-05-17 | Zena Technologies, Inc. | Nanowire structured color filter arrays and fabrication method of the same |
US8519379B2 (en) | 2009-12-08 | 2013-08-27 | Zena Technologies, Inc. | Nanowire structured photodiode with a surrounding epitaxially grown P or N layer |
US8269985B2 (en) | 2009-05-26 | 2012-09-18 | Zena Technologies, Inc. | Determination of optimal diameters for nanowires |
US8889455B2 (en) | 2009-12-08 | 2014-11-18 | Zena Technologies, Inc. | Manufacturing nanowire photo-detector grown on a back-side illuminated image sensor |
US9082673B2 (en) | 2009-10-05 | 2015-07-14 | Zena Technologies, Inc. | Passivated upstanding nanostructures and methods of making the same |
US9478685B2 (en) | 2014-06-23 | 2016-10-25 | Zena Technologies, Inc. | Vertical pillar structured infrared detector and fabrication method for the same |
US8866065B2 (en) | 2010-12-13 | 2014-10-21 | Zena Technologies, Inc. | Nanowire arrays comprising fluorescent nanowires |
US8229255B2 (en) | 2008-09-04 | 2012-07-24 | Zena Technologies, Inc. | Optical waveguides in image sensors |
US9515218B2 (en) | 2008-09-04 | 2016-12-06 | Zena Technologies, Inc. | Vertical pillar structured photovoltaic devices with mirrors and optical claddings |
US8748799B2 (en) | 2010-12-14 | 2014-06-10 | Zena Technologies, Inc. | Full color single pixel including doublet or quadruplet si nanowires for image sensors |
US8546742B2 (en) | 2009-06-04 | 2013-10-01 | Zena Technologies, Inc. | Array of nanowires in a single cavity with anti-reflective coating on substrate |
US9000353B2 (en) | 2010-06-22 | 2015-04-07 | President And Fellows Of Harvard College | Light absorption and filtering properties of vertically oriented semiconductor nano wires |
US9299866B2 (en) | 2010-12-30 | 2016-03-29 | Zena Technologies, Inc. | Nanowire array based solar energy harvesting device |
US8890271B2 (en) | 2010-06-30 | 2014-11-18 | Zena Technologies, Inc. | Silicon nitride light pipes for image sensors |
US8835831B2 (en) | 2010-06-22 | 2014-09-16 | Zena Technologies, Inc. | Polarized light detecting device and fabrication methods of the same |
US8299472B2 (en) | 2009-12-08 | 2012-10-30 | Young-June Yu | Active pixel sensor with nanowire structured photodetectors |
US8735797B2 (en) | 2009-12-08 | 2014-05-27 | Zena Technologies, Inc. | Nanowire photo-detector grown on a back-side illuminated image sensor |
US8791470B2 (en) | 2009-10-05 | 2014-07-29 | Zena Technologies, Inc. | Nano structured LEDs |
US8274039B2 (en) | 2008-11-13 | 2012-09-25 | Zena Technologies, Inc. | Vertical waveguides with various functionality on integrated circuits |
US9406709B2 (en) | 2010-06-22 | 2016-08-02 | President And Fellows Of Harvard College | Methods for fabricating and using nanowires |
Citations (14)
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US4822998A (en) * | 1986-05-15 | 1989-04-18 | Minolta Camera Kabushiki Kaisha | Spectral sensor with interference filter |
US5001532A (en) * | 1989-09-06 | 1991-03-19 | Rockwell International Corporation | Impurity band conduction detector having photoluminescent layer |
US5227648A (en) * | 1991-12-03 | 1993-07-13 | Woo Jong Chun | Resonance cavity photodiode array resolving wavelength and spectrum |
FR2697352A1 (en) * | 1992-10-26 | 1994-04-29 | Physique Rayon Lumie Lab | Electromagnetic energy concentrator with frequency shift - uses dopant that responds to electromagnetic excitation by emitting light at different frequency |
US5574286A (en) * | 1995-06-30 | 1996-11-12 | Huston; Alan L. | Solar-blind radiation detector |
US5784507A (en) * | 1991-04-05 | 1998-07-21 | Holm-Kennedy; James W. | Integrated optical wavelength discrimination devices and methods for fabricating same |
DE19723234A1 (en) * | 1997-06-03 | 1998-12-10 | Siemens Ag | Filters for filtering out spectral ranges and optical system for combustion analysis |
FR2765970A1 (en) * | 1997-07-11 | 1999-01-15 | Commissariat Energie Atomique | METHOD FOR MANUFACTURING AN OPTICAL FILTER MATRIX, OPTICAL FILTER MATRIX AND SPECTROMETRY DEVICE USING SUCH A MATRIX |
US6005252A (en) * | 1996-01-11 | 1999-12-21 | The Trustees Of Princeton University | Method and apparatus for measuring film spectral properties |
WO2000074140A1 (en) * | 1999-06-02 | 2000-12-07 | Intel Corporation | Image sensor response enhancement using fluorescent phosphors |
EP1239270A1 (en) * | 2001-02-21 | 2002-09-11 | Horiba, Ltd. | Optical detector |
US20040239939A1 (en) * | 2003-05-28 | 2004-12-02 | Onera | Stationary fourier transform spectrometer |
US20070145236A1 (en) * | 2005-12-22 | 2007-06-28 | Palo Alto Research Center Incorporated | Photosensing throughout energy range and in subranges |
DE102006039071A1 (en) * | 2006-08-09 | 2008-02-21 | Universität Kassel | Making optical filter array with two distributed Bragg reflectors and intervening Fabry Perot filter elements, employs nano-imprint procedure to form differentiated filter cavities |
-
2008
- 2008-05-07 TW TW97116855A patent/TW200915551A/en unknown
- 2008-05-08 WO PCT/IB2008/051796 patent/WO2008139379A2/en active Application Filing
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4822998A (en) * | 1986-05-15 | 1989-04-18 | Minolta Camera Kabushiki Kaisha | Spectral sensor with interference filter |
US5001532A (en) * | 1989-09-06 | 1991-03-19 | Rockwell International Corporation | Impurity band conduction detector having photoluminescent layer |
US5784507A (en) * | 1991-04-05 | 1998-07-21 | Holm-Kennedy; James W. | Integrated optical wavelength discrimination devices and methods for fabricating same |
US5227648A (en) * | 1991-12-03 | 1993-07-13 | Woo Jong Chun | Resonance cavity photodiode array resolving wavelength and spectrum |
FR2697352A1 (en) * | 1992-10-26 | 1994-04-29 | Physique Rayon Lumie Lab | Electromagnetic energy concentrator with frequency shift - uses dopant that responds to electromagnetic excitation by emitting light at different frequency |
US5574286A (en) * | 1995-06-30 | 1996-11-12 | Huston; Alan L. | Solar-blind radiation detector |
US6005252A (en) * | 1996-01-11 | 1999-12-21 | The Trustees Of Princeton University | Method and apparatus for measuring film spectral properties |
DE19723234A1 (en) * | 1997-06-03 | 1998-12-10 | Siemens Ag | Filters for filtering out spectral ranges and optical system for combustion analysis |
FR2765970A1 (en) * | 1997-07-11 | 1999-01-15 | Commissariat Energie Atomique | METHOD FOR MANUFACTURING AN OPTICAL FILTER MATRIX, OPTICAL FILTER MATRIX AND SPECTROMETRY DEVICE USING SUCH A MATRIX |
WO2000074140A1 (en) * | 1999-06-02 | 2000-12-07 | Intel Corporation | Image sensor response enhancement using fluorescent phosphors |
EP1239270A1 (en) * | 2001-02-21 | 2002-09-11 | Horiba, Ltd. | Optical detector |
US20040239939A1 (en) * | 2003-05-28 | 2004-12-02 | Onera | Stationary fourier transform spectrometer |
US20070145236A1 (en) * | 2005-12-22 | 2007-06-28 | Palo Alto Research Center Incorporated | Photosensing throughout energy range and in subranges |
DE102006039071A1 (en) * | 2006-08-09 | 2008-02-21 | Universität Kassel | Making optical filter array with two distributed Bragg reflectors and intervening Fabry Perot filter elements, employs nano-imprint procedure to form differentiated filter cavities |
Also Published As
Publication number | Publication date |
---|---|
WO2008139379A2 (en) | 2008-11-20 |
TW200915551A (en) | 2009-04-01 |
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