SU608125A1 - Parametric monitoring device - Google Patents

Description

(54) DEVICE FOR CONTROL OF PARAMETERS

one

The invention relates to the field of automatic controp and may be used to increase the resolution of diagnostic procedures.

A device is known for failing a logical element containing a program block, a distributor and an analyzer and allowing a faulty element to be determined by test diagnostics methods. The disadvantage of a current device is the complexity of its construction.

It is also known to have a control device containing a pulse generator, blocks of standards and comparisons, which allow determining the failing element by successive analysis of the signal from each element and its standard 2, However, duplicated equipment must be used in a tick device.

The closest to the technical essence of the present invention is a device D. The control parameters, containing the control unit connected to the control panel and the first memory unit connected through the second memory unit to the distributor, the outputs of which are connected to the registration unit, the pulse parameter converter to the code, the analyzer and through the generator of stimulating signals and directly to the switch, the output of which is connected to the converter of the parameters of pulses into the code and to the analyzer, nnomu converter with pulse code parameters and with blocks of control and registration of

However, in such a device it is difficult to detect a failed logic element located in a chain of series-connected elements that do not have access to control points, i.e. low confidence control. .

The chain of the invention is to increase the credibility of the counter.

For this purpose, a current sensor unit and an amplitude discriminator, the output of which is connected to the input of the pulse parameter converter to the code, are introduced into the proposed device.

The drawing shows a block diagram of the proposed device.

The device contains a block of 1 current sensors, a discriminator 2 amplitudes, a switch 3, a generator of 4 stimulating signals, an analyzer 5, a converter 6 of parameters of a pulse into a code, a distributor 7, a block 8 of recording, a first block 9 of memory, a second block of U memory, control unit 11, control panel 12 and controlled object 13.

 The main task of the device is the determination of the defective item.

the change in the current in the bus power supply node. It is known that at the moment of switching the logic elements in the power supply circuit, current pulses occur. The current pulse caused by switching a faulty element or element from various types of closures differs in amplitude from the current pulse caused by switching a serviceable element.

The control takes place in two stages: at the first stage, the circuit is faulty with known methods of test diagnostics; at the second stage, you enter the number of the faulty circuit element and the type of non-carry according to the amplitude of the current pulse in the power supply circuit.

Consider the operation of a diagnostic device when determining the number of a faulty logic element in a circuit of successively connected logic elements, when the input and output of the controlled circuit are connected to the control points.

Assume that the fault is caused by the closure of an element to the earth or to the power bus or to the input of another logic element. On command from control unit 12, from the first memory unit 9, which is an external storage device, the second storage unit (random access memory) is rewritten the information necessary for carrying out diagnostic procedures. Further through distribute. T1 7 comes the command to turn on the generator 4 stimulating signals.

The generator of stimulating signals generates a difference corresponding to the switching of the logical elements of the object being monitored from a state of logical zero to a state of logical one or on the gob. Through switch 3, the generated differential enters the input of the faulty circuit of the monitored object, 13. The wave of switching from O to 1 or from I to O begins to propagate along the circuit under test.

The resulting current pulses in the power supply through the current sensors 1 are fed to the input of the discriminator 2 of amplitude, and then to the input of the converter. 6 parameters in the code. In the described case, the converter 6 determines the delay i) (the time of arrival of the differential from switch 3 to the input of the controlled circuit and the time of the appearance of the current pulse corresponding to the switching of the closing element.

The received information (delay time) goes to analyzer 5.

The propagation delay time for a logic circuit is known and recorded in the first memory block 9. This information comes from the first memory block 9 through the second memory block Yu and the distributor 7 to the analyzer 5.

In this case, the analyzer will determine the number of the faulty logic element using the following formula

T

 . zk

where T is the delay time between the input action and the switching moment of the closing element;

tjK is the average delay time of one element.

In this case, it is assumed that the time of the tail of the axis of all logical elements is the same.

In block 8, the registration panel lights up indicating the defective circuit or circuit element.

Other malfunctions are found similarly.

The nature of the malfunction is determined by the accuracy and amplitude of the current of the faulty element. In addition, the amplitude and polarity of the pulse are determined using / using the pulse-to-code converter and the analyzer 5, then using the information obtained from the external storage device 9, the analyzer 5 compares the measured amplitude and polarity presented in the corresponding code with reference information received from the first memory block. And according to the results of the comparison, the type of fault is displayed in the registration unit, for example: short circuit to the power bus, short circuit to the ground bus, open circuit.

The device will significantly increase the resolution of diagnostic procedures, simplify the device (essentially, two simple nodes are introduced: a block of current sensors and an amplitude discriminator). The cost of completing the corresponding devices will be negligible.