SU528570A1 - Device for determining functional tests for monitoring the health of relay structures - Google Patents

Description

3

The drawing shows the device being described, including a circular register 1 with constituent registers 2, the number of which corresponds to the number k of the elementary and a logical logic switch. For example, in the fiction

F - ab adc + ack.

(one)

describing the co-controlled relay structure, number / s -: 3. The number of elbmeps in each register 2 corresponds to the number m of variables in the corresponding elementary implicant. (For example, in the cmflik ab of the functions (1) there are two peremepnyh, therefore P1 2, the impcant adc contains three variables, therefore, etc.).

The tuner 3 is used to configure the ring register for a given number of / e registers 2 and m elements in each register. Tuner 3 may be performed, for example, on packet switches.

The block of elements 4 and 4 serves to control the outputs of the ring register 1 and is closed for the duration of the transition process in this register.

Each of the analyzers 5 with inputs 6, 7 and outputs 8, 9 contains, for example, a logical element AND 10, a delay element AND, diodes 12, performing the functions of a signal summing element, decoupling diodes 13, trigger 14. The number of analyzers in the device corresponds to the number of like variables.x, i.e., variables that are simultaneously included in two or more elementary imlicants of a function (for function (1) such like variables are a and c, therefore, r 2). Analyzers 5 are designed to analyze combinations of variables formed by a ring register 1, and to isolate combinations corresponding to sections of the relay structure. For the relay structure described by function (1), such sections are

(2)

a- be; bdk.

The block of elements And 15 controls the outputs of the analyzers 5 and the outputs of the ring register 1 with the block of elements And 4 open.

The switch block 16 is used to input the function (1) of the initial data when calculating the functional tests Tf.

Block triggers 17 generates code signals corresponding to the functional test sets. For the structure described by function (1), such code signals (Tf sets) will be

a b c d k 00110

(3) 11010 11101

In this case, the sets (3), respectively, are used: (00110) to control the short circuit of contact a; (1 1 O 1 0) - for

ontrol for short circuit contacts b, s; (1 1 101) - control for short circuit of contacts b, d, k.

The block of elements And 18 controls the outputs of the block of the triggers 17.

The block of elements And 18 controls the outputs of the test TF, coming from the outputs of the block of the flip-flops 17.

The pulse generator 20 generates emulsions arriving through the control element P 21 to the control trigger 22.

The delay elements 23, 24 delay control pulses, respectively, at the counting input of the ring register 1 and the pulse shaper 25. The pulse shaper 25 generates a pulse during which the unit 4 And 4 is in the open state.

The block of triggers 2 &, performed on the triggers 27, serves to store variable functions (1) corresponding to the contact structures, the states of which are reversed with respect to the initial states.

The block of elements 28 generates a control signal when all the triggers 27 go into one state. This determines the necessary and sufficient number of sets in the test.

Tf for short circuit control of any contact of the relay structure.

Control trigger 29 controls the AND element 21 and the trigger 27.

The delay elements 30 delay the code pulses from the output of the AND 4 block of units to the non-transition process time in the analyzers 5.

The outputs of the registers 2 ring register I is connected to the inputs of the block of elements P 4,

the outputs of which through the delay elements 30 and through the inputs 6 and the outputs 8 of the analyzers 5 are connected to the working inputs of the block of the P 15 elements. Each analyzer 5 has an identical circuit and, respectively, contains a logic element AND 10 and diodes 12, whose inputs are connected to the inputs of the analyzer 6 5. The output of the logical element And 10 through the delay element 11 is connected to the output 8 of the analyzer 5; the output of the delay element 11 through the diode 13 is connected to the “zero input of the trigger 14. The outputs of the diodes 12 are connected to a single input of the trigger 14, the zero input of which through the second diode 13 is connected to the input 7 of the analyzer 5, and the single output

trigger 14 - with the release of 9 analyzer 5.

The outputs of the block of elements 15 are connected to the counting inputs of the triggers of the block of flip-flops 17 and in parallel with the counting inputs of the flip-flops 27 of the block of flip-flops 26. The zero outputs of the triggers of the block of flip-flops 17 are connected to the registration block 19, and the single outputs of the triggers 27 of the block of trigger 26 through the block of elements And 28 are connected to a single input of the control of the Hiero trigger 29, zero and single outputs of which are connected respectively to the zero inputs of the flip-flops 27 of the block of the trigger 26 and the control input of the element 21. The impulse generator All 20 through the control element And 21 is connected to the counting input of the control trigger 22, the zero and single outputs of which are respectively connected to the control input of the block of elements And 18 and to the input of the delay element 23, in parallel through the block of switches 16 are connected to zero single inputs the triggers of the block of triggers 17 are connected in parallel to the inputs 7 of the analyzers 5, the outputs 9 of which are connected to the equalizing input of the block of elements 15. The output of the delay element 23 is connected via the delay element 24 and the pulse shaper 25 with the control input of the block of elements And 4 and in parallel connected with the counting input of the ring register 1, which is connected with the tuner 3. The operation of the device is as follows. Before turning the device into operation, the switches of the switch block 16 are set to alternate to the positions corresponding to the states of the variable functions (1). In this case, the right closed position of the corresponding switches corresponds to the variable with the bar, and the left closed polisation of the corresponding switches corresponds to the variables without the bar.

Using tuner 3, a ring register 1 is formed with a given number of registers 2 and a given number of elements in each register; the outputs of registers 2 are assigned the corresponding variables.

According to the source code, the initial (Exod) ring register 1 is reset, and the control triggers 22, 29 and the triggers 27 of the block of trigger 2 & - to zero states.

By the start command, the output of the generator 20 is opened, and the sequence of pulses through the open control element AND 21 begins to flow to the counting input of the control trigger 22.

The first pulse at the counting input of the control trigger 22 will translate the latter into a single state. In this case, the block of elements AND 18 is closed, and the control pulse from the single output of the control trigger 22 through the diodes 13 will transfer the triggers 14 of the analyzers 5 to the zero state, and the triggers of the block of trigger 17 will be transferred to the states depending on the position of the switches of the switch block 16. The control pulse through the delay element 23 is fed to the input of the delay element 24 and the counting input of the ring register 1. The latter changes the state, a code signal is generated at its outputs and is fed to the input of the closed AND 4 block of elements. mpuls output from the delay element 24 excites the pulse shaper 25, which generates a pulse which opens the AND unit 4.

Pulses of the code signal from the output of the block

elements And 4 are fed to the inputs 6 of the analyzers 5 and the inputs of the delay elements 30 (the delay time of the elements 30 is greater than the transition time in the analyzers 5). 5 Each analyzer 5 operates in three modes.

The first mode: the outputs 6 of the analyzer 5 signals from the output of the block of elements And 4 arrive; at the outputs 8, 9 of the analyzer 5 signals

10 is not formed, the block of elements AND 15 remains open. If all analyzers 5 devices operate in the first mode, then the code signal from the output of the block of elements And 4 passes only through the delay elements 30

5 and enters through the open block of elements 15 to the counting inputs of the trigger blocks of the trigger blocks 17 and 26.

The second mode: the outputs of the 6 analyzer 5 receives any number of single pulses,

0 is less than the maximum (for example, on the first left the analyzer 5 receives one or two pulses from the outputs of registers 2). In this case, the logical element And 10 does not work, and the pulses through the diodes 12 will translate

5, the trigger 14 in the one state and the block of elements AND 15 is closed. The code signal does not pass.

The third mode. The inputs 6 of the analyzer 5 receives the maximum number of "single

0 pulses (for example, the analyzer 5 to the nerve on the left receives three single pulses from the outputs of registers 2). In this case, the pulses through the diodes 12 will translate the trigger 14 into a single state and a block of elements AND 15

5 will close. However, a logical e, tement & n 10 will work n through a delay element 11 and the diode 13 will transfer the trigger 14 to the zero state, the block of elec- tants And 15 will open.

Thus, if all analyzers 5 operate in the third or first mode, then the code signal from the output of the I 4 block passes through the corresponding analyzers 5 n delay elements 30 and enters through the open block of I 15 elements to the counting

 inputs blocks triggers 17 and 26.

Therefore, nz of the entire set of code signals generated by the ring register 1. Only the code sets will be successively passed through the block of elements 15:

0-y-yy

oh

10,000, ..., 01100, 01011,

5 corresponding sections (2). The code (1 0000) corresponds to the section a. code (0110 0) - section be. code (O 1 O 1 1) - bdk section.

0 Codes (4), arriving sequentially at the counting inputs of the block of flip-flops 17, will change the state of the corresponding flip-flops of the block of flip-flops 17 and sets will be sequentially generated at the outputs of the latter

5 functional test T (3). Through an alternating impulse of a generator 20, an elemept block 18 sets up a test transferring register 19 to a block.

Simultaneously with the triggers of the block of triggers 17, the states of the triggers 27 change. As soon as all the triggers 27 go into one state, the block of elements 28 will trigger and the pulse at its output will trigger the trigger 29 into one, and the control element 21 will close and occur stop in the device. The register unit 19 will fix all the Tf functional test sets. For relatively complex relay structures, there is a certain set of Tf functional tests, Tf .. To obtain, for example, Tf ,, test sets, you must issue the command "Shift, i.e., transfer trigger 29 to zero condition. In this case, a control pulse is formed at the zero output of the trigger 29, which will transfer the triggers 27 to zero states, the control element I 21 will open, the cycle for obtaining test sets Tf ,, will be executed. Test suites Tf., Tf, ... Tf are defined similarly.

By the command "Stop the output of the generator 20 is closed, the operation of the device circuit is terminated.

In comparison with the known device, the proposed device contains new elements and new connections, which allow to automate the process of calculating functional tests, thus significantly by several tens, and for complex relay structures and by several hundred times increase the speed of the device. In this case, any possible sets of functional tests are calculated and the subjective errors of the calculator are eliminated, and consequently, the reliability of the results of the calculations is increased.

Claims (2)

1. The patent of England ЛЬ 1306702, М. кл. G On 11/04, 1973. 2. Avt. St. USSR L 402869, M. class. G 06f P / OO. 1971.