SU468315A1 - Wear Resistance Test Device - Google Patents

Description

They are the OTHOCVJTCH device to the measuring equipment for the testing of the relay. There are known devices for monitoring the stability of a relay, which contain elements for memorizing failures in the work of contacts made on triggers, elec- tants for stopping and jumping when a contact fault (contact closure, non-opening of contacts) is detected, and start elements. The purpose of the invention is to simplify the testing process. It is best for TeNf that is described (Equipped with a registering element, for example, Shch14 is of an imprint or storage type and co-partitioned by a tel. 1 block containing a generator of TOIU.IX pulses, a switch and an element of OS: The outputs of the fault memory elements are connected to the inputs of a com (the quota switch, the output of the stop signal element of the gags is connected to the trigger input of the hoop (the clock pulse generator, the output of the restart test KOMNtyTaTopa vs is connected to the input of the The test triggers, and the switch outputs are connected to the regression input - the uiero element. To assess the quality of the released relays, you need to know after what number of faults the malfunctions appear (self-depleting during the subsequent switching of short-circuiting or not opening contacts) or failures failures in subsequent commutations.) By knowing the time of occurrence of failures (failures), it is possible to more accurately predict the failure-free operation of the relay in the equipment, as well as reasonably choose the necessary time for the relay to work tele The drawing shows a structural diagram of the proposed instrument. In the diagram: 1 - device for testing the relay for durability; 2- distribution unit; 3 - common peinicT-. the triggering element; 4 - temporary (counting) device; 5, 6, 7 - exits of the memorization elements of failures; 8 - output elements

test stops; 9 - input elements start test; U - the output of the elements of the launch test; I-15 - switch inputs; 16 - output element of the stop switch and re-run the test; 17 - switch output connected to the input of the registering element; 18 - input recording element; 19 - input of temporary or counting device 1a :, 20 - output of temporary or counting device.

After connecting the relay to the device 1, a test is started (from input 9), and a temporary (counting) device is switched on via input 19.

If the tests are conducted without taking into account the time of occurrence of a fault, the temporary (counting) device is turned off.

If, for example, a fault occurs at the contact of the relay corresponding to the memory element connected to the output 5 of the device 1, the input 11 of the block 2 receives a signal (from the output 8 of the device to start the clock pulse generator). At the same time, the relay tests are stopped.

The clock pulse generator unit 2 drives the switch, which until then was in the initial position.

The switch alternately passes all the positions and when approaching the input 14 of block 2, to which information about the non-closure of the corresponding contact has been received, transmits this information with a conditional code to the common recording element 3, where it will be fixed. Each output 5, 6, 7 of device 1 and input 12, 13, 14, 15 of block 2 correspond to certain contact numbers and types of failures, HanpnNfep output 5 - non-closing ft contact, output 6 - non-splitting Yl-ro contact, etc. P

Simultaneously with the fixation of the form, the failure is fixed by element 3 and the number of commutations that occur before the occurrence of failure.

The described operations are performed during the time when the switch of the block 2 is in the position when the input 14 is connected.

Upon receipt of the next 1x pulses from the clock generator of block 2, the switch returns to its original position (if only the input 14 of block 2 fails).

If several failures occur simultaneously, the information in them alternately falls on inputs 12, 13, 14, 15 and is transmitted to element 3 in one switch operation cycle.

When the switch returns to its initial state, the element of stopping the switch and restarting the tests of the relay of the command and distribution unit 2 via its output 16 and input 9 of the device 1 resumes the test.

In the event of repeated failure in the same contact, it will be locked again when decoding test materials.

failure will be set, since the temporary (counting) device gives information that the failures have followed each other.

Subject invention

Claims (2)

1. A device for snubbing a relay for durability, comprising a generator of switching on relays, control delay elements, fault memory elements, elements of starting and stopping relay tests characterized in that. that, in order to simplify the testing process, it is equipped with a recording element, for example, of a digital printing or storage type, and a command-distribution unit containing a generator clock pulses, coscator and element stopping the switch and restarting the relay tests, with the outputs of the fault memory elements connected to the switch inputs, the output of the stop element The test is connected to the trigger input of the clock generator, the output of the switch stop element and the test restart is connected to the input of the test trigger elements, and the outputs Kok (mutator connected to the input reg regiriruyuschego element. 2. The device according to claim 1, so far so that, in order to fix the time of occurrence of a failure, it is equipped with a temporary device, which I run, which is connected to the test start elements, and the output through the command the distribution unit is connected to the input of the registering element. 67 d // 74, 77 75 // 7 15 YU nineteen