SU1191980A1 - Растровый электронный микроскоп - Google Patents
Растровый электронный микроскоп Download PDFInfo
- Publication number
 - SU1191980A1 SU1191980A1 SU762399525A SU2399525A SU1191980A1 SU 1191980 A1 SU1191980 A1 SU 1191980A1 SU 762399525 A SU762399525 A SU 762399525A SU 2399525 A SU2399525 A SU 2399525A SU 1191980 A1 SU1191980 A1 SU 1191980A1
 - Authority
 - SU
 - USSR - Soviet Union
 - Prior art keywords
 - specimen
 - measured
 - measuring system
 - grid
 - measuring
 - Prior art date
 
Links
- 238000010894 electron beam technology Methods 0.000 claims abstract description 7
 - 238000006073 displacement reaction Methods 0.000 abstract description 6
 - 238000005259 measurement Methods 0.000 abstract description 4
 - 238000000926 separation method Methods 0.000 abstract 1
 - 230000002093 peripheral effect Effects 0.000 description 2
 - 238000013479 data entry Methods 0.000 description 1
 - 238000004377 microelectronic Methods 0.000 description 1
 - 238000000386 microscopy Methods 0.000 description 1
 - 238000012806 monitoring device Methods 0.000 description 1
 - 239000004065 semiconductor Substances 0.000 description 1
 - 230000000087 stabilizing effect Effects 0.000 description 1
 
Classifications
- 
        
- H—ELECTRICITY
 - H01—ELECTRIC ELEMENTS
 - H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
 - H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
 - H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
 - H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
 
 - 
        
- H—ELECTRICITY
 - H01—ELECTRIC ELEMENTS
 - H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
 - H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
 - H01J37/02—Details
 - H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
 
 
Landscapes
- Chemical & Material Sciences (AREA)
 - Analytical Chemistry (AREA)
 - Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
 - Length Measuring Devices By Optical Means (AREA)
 - Analysing Materials By The Use Of Radiation (AREA)
 
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| DD18851275A DD124091A1 (forum.php) | 1975-09-24 | 1975-09-24 | 
Publications (1)
| Publication Number | Publication Date | 
|---|---|
| SU1191980A1 true SU1191980A1 (ru) | 1985-11-15 | 
Family
ID=5501778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| SU762399525A SU1191980A1 (ru) | 1975-09-24 | 1976-09-20 | Растровый электронный микроскоп | 
Country Status (5)
| Country | Link | 
|---|---|
| DD (1) | DD124091A1 (forum.php) | 
| DE (1) | DE2635356C2 (forum.php) | 
| FR (1) | FR2326030A1 (forum.php) | 
| GB (1) | GB1532862A (forum.php) | 
| SU (1) | SU1191980A1 (forum.php) | 
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| AU534811B2 (en) * | 1979-07-03 | 1984-02-16 | Unisearch Limited | Atmospheric scanning electron microscope | 
| JPS5795056A (en) * | 1980-12-05 | 1982-06-12 | Hitachi Ltd | Appearance inspecting process | 
| JPS59112217A (ja) * | 1982-11-29 | 1984-06-28 | Toshiba Corp | 寸法測定方法 | 
| JPS59163506A (ja) * | 1983-03-09 | 1984-09-14 | Hitachi Ltd | 電子ビ−ム測長装置 | 
| WO1985004250A1 (en) * | 1984-03-20 | 1985-09-26 | Nixon, Larry, Sheldon | Method and apparatus for precision sem measurements | 
| US4677296A (en) * | 1984-09-24 | 1987-06-30 | Siemens Aktiengesellschaft | Apparatus and method for measuring lengths in a scanning particle microscope | 
| DE3802598C1 (forum.php) * | 1988-01-29 | 1989-04-13 | Karl Heinz 3057 Neustadt De Stellmann | 
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| US3876879A (en) * | 1973-11-09 | 1975-04-08 | Calspan Corp | Method and apparatus for determining surface characteristics incorporating a scanning electron microscope | 
- 
        1975
        
- 1975-09-24 DD DD18851275A patent/DD124091A1/xx unknown
 
 - 
        1976
        
- 1976-08-06 DE DE19762635356 patent/DE2635356C2/de not_active Expired
 - 1976-08-25 GB GB3538476A patent/GB1532862A/en not_active Expired
 - 1976-09-20 SU SU762399525A patent/SU1191980A1/ru active
 - 1976-09-21 FR FR7628344A patent/FR2326030A1/fr active Granted
 
 
Non-Patent Citations (1)
| Title | 
|---|
| Патент DE № 2236530, кл. Н 01 J 37/20, опублик. 1975. Патент US № 3648048, кл. Н 01 J 37/20, опублик. 1972.. * | 
Also Published As
| Publication number | Publication date | 
|---|---|
| DE2635356C2 (de) | 1984-08-16 | 
| DE2635356A1 (de) | 1977-04-07 | 
| FR2326030A1 (fr) | 1977-04-22 | 
| GB1532862A (en) | 1978-11-22 | 
| DD124091A1 (forum.php) | 1977-02-02 | 
| FR2326030B1 (forum.php) | 1982-03-19 | 
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