SG99412A1 - Probe contact apparatus for display panel inspection - Google Patents

Probe contact apparatus for display panel inspection

Info

Publication number
SG99412A1
SG99412A1 SG200206788A SG200206788A SG99412A1 SG 99412 A1 SG99412 A1 SG 99412A1 SG 200206788 A SG200206788 A SG 200206788A SG 200206788 A SG200206788 A SG 200206788A SG 99412 A1 SG99412 A1 SG 99412A1
Authority
SG
Singapore
Prior art keywords
display panel
carrying leg
press block
probe
probe contact
Prior art date
Application number
SG200206788A
Inventor
Kato Mamoru
Murakami Tetsurou
Kumazawa Hiroshi
Kawano Hajime
Mine Kei
Ninomiya Satoshi
Original Assignee
Tokyo Cathode Lab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Cathode Lab filed Critical Tokyo Cathode Lab
Publication of SG99412A1 publication Critical patent/SG99412A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/94—Holders formed as intermediate parts for linking a counter-part to a coupling part

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To miniaturize a probe contact device when inspecting a display panel. <P>SOLUTION: A plurality of probes 22a are provided on the tip of a probe carrying leg 14, and a press block carrying leg 16 for opening and closing relatively to the probe carrying leg 14 is provided. A press block 24 provided on the tip of the press block carrying leg 16 faces relatively to the probes 22a across the display panel 12 with a prescribed pressing force. Hereby, the relative pressing force between the probe carrying leg 14 and the press block carrying leg 16 is never applied to a support part or the display panel. <P>COPYRIGHT: (C)2004,JPO
SG200206788A 2002-04-09 2002-11-11 Probe contact apparatus for display panel inspection SG99412A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002106557A JP2003302439A (en) 2002-04-09 2002-04-09 Probe contact device for display panel inspection

Publications (1)

Publication Number Publication Date
SG99412A1 true SG99412A1 (en) 2003-10-27

Family

ID=28786431

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200206788A SG99412A1 (en) 2002-04-09 2002-11-11 Probe contact apparatus for display panel inspection

Country Status (5)

Country Link
JP (1) JP2003302439A (en)
KR (1) KR100525818B1 (en)
CN (1) CN1450356A (en)
SG (1) SG99412A1 (en)
TW (1) TW200305023A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100740010B1 (en) * 2005-11-18 2007-07-16 주식회사 파이컴 Inspecting system of flat panel display
KR100768712B1 (en) * 2006-05-04 2007-10-19 주식회사 대우일렉트로닉스 Test device of organic electro display panel
KR100768713B1 (en) * 2006-05-04 2007-10-19 주식회사 대우일렉트로닉스 Test device of organic electro display panel
JP4808135B2 (en) * 2006-11-09 2011-11-02 株式会社日本マイクロニクス Probe positioning method, movable probe unit mechanism, and inspection apparatus
KR102171682B1 (en) * 2019-08-07 2020-10-30 주식회사 디엠엔티 Detachment device of probe block for display panel inspection

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10302640A (en) * 1997-04-25 1998-11-13 Osaki Eng Kk Plasma display panel lighting inspection device
JP2000147044A (en) * 1998-11-17 2000-05-26 Micronics Japan Co Ltd Device and method for inspecting plate-shaped object to be inspected
JP2001050858A (en) * 1999-08-04 2001-02-23 Micronics Japan Co Ltd Inspection apparatus for display panel board
JP2001059972A (en) * 1999-08-24 2001-03-06 Ricoh Co Ltd Device for lighting and inspecting liquid crystal display panel
JP2001318116A (en) * 2000-05-11 2001-11-16 Micronics Japan Co Ltd Inspection apparatus for display panel board

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09127154A (en) * 1995-10-31 1997-05-16 Oki Electric Ind Co Ltd Probe positioner device
JP3958875B2 (en) * 1998-07-24 2007-08-15 株式会社日本マイクロニクス Prober and probe needle contact method
KR100350513B1 (en) * 2000-04-03 2002-08-28 박태욱 Probe apparatus testing an electrode of Plasma Display Panel
JP3569486B2 (en) * 2000-07-14 2004-09-22 シャープ株式会社 Inspection probe device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10302640A (en) * 1997-04-25 1998-11-13 Osaki Eng Kk Plasma display panel lighting inspection device
JP2000147044A (en) * 1998-11-17 2000-05-26 Micronics Japan Co Ltd Device and method for inspecting plate-shaped object to be inspected
JP2001050858A (en) * 1999-08-04 2001-02-23 Micronics Japan Co Ltd Inspection apparatus for display panel board
JP2001059972A (en) * 1999-08-24 2001-03-06 Ricoh Co Ltd Device for lighting and inspecting liquid crystal display panel
JP2001318116A (en) * 2000-05-11 2001-11-16 Micronics Japan Co Ltd Inspection apparatus for display panel board

Also Published As

Publication number Publication date
KR100525818B1 (en) 2005-11-03
JP2003302439A (en) 2003-10-24
KR20030080986A (en) 2003-10-17
CN1450356A (en) 2003-10-22
TW200305023A (en) 2003-10-16

Similar Documents

Publication Publication Date Title
MY134088A (en) Contact arm and electronic device testing apparatus using the same
DE60037293D1 (en) Probe test with constant pressure device
EP1045438B8 (en) Probe card for testing semiconductor device, and semiconductor device test method
WO2004038364A3 (en) In line test device and methods of use
GB0028544D0 (en) Device for the testing of fluid samples and process for making the device
EP1436620A4 (en) Methods and apparatus for conducting multiple measurements on a sample
AU2003218348A1 (en) Test probe alignment apparatus
AU8489698A (en) A test device and method for detecting the presence of a residue analyte in a sample
TW200506376A (en) Alignment features in a probing device
AU2001282891A1 (en) Contact apparatus particularly useful with test equipment
DK1158884T3 (en) Mattress assessment equipment
WO2004040324A3 (en) A method of and apparatus for testing for integrated circuit contact defects
AU2001276718A1 (en) Surface inspecting illumination device and surface inspecting apparatus
WO2006020133A3 (en) One time operating state detecting method and apparatus
DE60033047D1 (en) THREE-AXIS TEST PROCEDURE AND DEVICE
AU2002362097A1 (en) Apparatus and methods for testing pain sensitivity
AU4485800A (en) Automatic on-site drug testing system and method
AU2002340842A1 (en) Method, device and arrangement for measuring the dynamic behavior
AU2002249206A1 (en) Device and method for detecting the presence of an analyte
DE60233107D1 (en) Test strips containing control agents and timing agents
SG99412A1 (en) Probe contact apparatus for display panel inspection
AU2002326457A1 (en) Methods and apparatus for testing a semiconductor with temperature desoak
AU2002951034A0 (en) Testing process and apparatus
DE69839624D1 (en) HAND DEVICE FOR DETECTING HEARING DAMAGES
GB2388912B (en) Method and device for monitoring hydrogen concentration whilst testing the operability of the monitoring device