CN1450356A - Detection head for checking display control panel - Google Patents
Detection head for checking display control panel Download PDFInfo
- Publication number
- CN1450356A CN1450356A CN02153626A CN02153626A CN1450356A CN 1450356 A CN1450356 A CN 1450356A CN 02153626 A CN02153626 A CN 02153626A CN 02153626 A CN02153626 A CN 02153626A CN 1450356 A CN1450356 A CN 1450356A
- Authority
- CN
- China
- Prior art keywords
- gauge head
- display control
- carrying leg
- control board
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/94—Holders formed as intermediate parts for linking a counter-part to a coupling part
Abstract
The present invention relates to a detection head for checking display control panel. A plurality of probes 22a are provided on the tip of a probe carrying leg 14, and a press block carrying leg 16 for opening and closing relatively to the probe carrying leg 14 is provided. A press block 24 provided on the tip of the press block carrying leg 16 faces relatively to the probes 22a across the display panel 12 with a prescribed pressing force. Hereby, the relative pressing force between the probe carrying leg 14 and the press block carrying leg 16 is never applied to a support part or the display panel.
Description
Technical field
The present invention relates to be used to check the gauge head contact apparatus of display control board.
Background technology
In order to constitute various display device, a plurality of electrode integral body that display elements such as liquid crystal cell, organic electroluminescent, inorganic EL are used with supply capability are made display control board.In this display control board, the quality that is connected or on control panel, makes the integrated circuit of figure for quality, electrode and the element of checking each display element, the signal of checking usefulness to be delivered to the electrode of display control board from the control panel testing fixture of outside, export check result to testing fixture again.
At present, for this testing fixture is connected with display control board, use the gauge head contact making device.Each gauge head with given pressure respectively be assembled in display control board on electric contact of a plurality of electrodes, carry out desirable inspection.At present, above-mentioned control panel inspection all is to carry out some elements to light more simple checking such as inspection or resistance measurement inspection etc.In recent years, require when giving display control board thermal load or current capacity, carrying out initiatively, (active) checks.
Therefore, need initiatively check corresponding gauge head contact making device, and in present device,, therefore display control board and gauge head contact making device can not be placed on the heating arrangement that is used for providing thermal load because the size of contact point device own is big with various.
The main cause of this existing issue is in order to obtain the good needed contact pressure in gauge head contact, big and the high pressure-bearing side group plate of rigidity must to be arranged.
Promptly, at present, when required contact pressure is 10g between each electrode and the gauge head, in common display control board, electrode has about 400 lead-in wires, like this, be added in whole contact pressure and bear the pressure of part, therefore big the and substrate high rigidity that can bear this weight reliably will be set above 4kg.
Because like this, the big and rigidity height of gauge head contact making device size can not obtain being fit to the device of the small-sized and low rigidity of above-mentioned active inspection.
Summary of the invention
The objective of the invention is to reduce the gauge head contact making device of checking that display control board is used, particularly have the size of the gauge head contact making device of a plurality of gauge heads that can contact with a plurality of control panel electrodes simultaneously.Another object of the present invention is the gauge head contact making device that will provide the inspection display control board of low rigidity to use.
In order to achieve the above object, being characterized as of the gauge head contact making device that is used to check display control board of the present invention comprises that the top has the probe carrying leg of a plurality of gauge heads; Have the contact block in the position relative with gauge head, and the contact block carrying leg that opens and closes of probe carrying leg relatively; And between gauge head and contact block, clamp the control panel electrode of display control board, thereby give the hold down gag of relative snap-in force.
According to said structure, owing to utilize relativity power between probe carrying leg and the contact block carrying leg to obtain the contact pressure of each gauge head and electrode, therefore, on the supporting part of gauge head contact making device or display control board, do not apply any acting force.Like this, the high load side substrate of rigidity can be do not needed, the device of low rigidity can be formed.In addition, can reduce device size, the adverse effect that can also contact pressure not produced is passed to display control board.
In addition, being characterized as of the gauge head contact making device that is used to check display control board of the present invention, contact block carrying leg is made by latch plate, but its double as with probe carrying leg between give the hold down gag of relative snap-in force.
Being characterized as of the gauge head contact making device that is used to check display control board of the present invention on the top of probe carrying leg, is provided with and makes the reference field of display control board electrode with respect to the correct location of gauge head.
Being characterized as of the gauge head contact making device that is used to check display control board of the present invention on probe carrying leg, is provided with the eccentric wheel that is used to open and close contact block carrying leg.
Because gauge head contact making device size of the present invention can reduce, therefore can provide the gauge head contact making device that is fit to very much initiatively check etc.
Description of drawings
Fig. 1 checks the stereographic map of state for the display control board of first embodiment of expression the present invention.
Fig. 2 is for being illustrated in first embodiment probe carrying leg and the stereographic map that contacts block carrying leg decomposing state.
Fig. 3 is for contacting the roughly side view of closed condition of block carrying leg.
Fig. 4 is for contacting the roughly side view of open mode of block carrying leg.
Fig. 5 is the amplification sectional view of electrode and gauge head contact condition.
Fig. 6 is the key diagram of the relation of gauge head in the expression electrode separation state and base station.
Fig. 7 uses the display control board of the gauge head contact making device of first embodiment to check the key diagram of state for expression.
Fig. 8 is the sectional view of the major part of second embodiment of expression the present invention.
Fig. 9 is the side view of second embodiment.
Embodiment
Fig. 1～Fig. 6 represents preferred first embodiment of gauge head contact making device of the present invention.
Gauge head contact making device of the present invention is made of the structure with contact making device supporting display control board itself.As shown in Figure 1, contact making device itself is fixed on the cramp bar 10 with platform tee section, in supporting display control board 12, gauge head is contacted with the electrode of display control board 12.
The gauge head contact making device has probe carrying leg 14 and contacts block carrying leg 16.Probe carrying leg 14 is made of plastics, and utilizes to be located near the groove 14a of its root, combines with above-mentioned cramp bar 10, and cramp bar 10 and probe carrying leg 14 firmly fix by backplate 18 and the securing member 20 that is fixed on probe carrying leg 14 back sides.Utilize above-mentioned securing member 20 that cramp bar 10 and probe carrying leg 14 is fixing, be the gib screw that combines with the thread groove 14b screw thread that is located at probe carrying leg 14 lower ends by tightening, and cramp bar 10 is pressed on securely reach on the probe carrying leg 14.
Fixing gauge head fixing body 22 on the top of probe carrying leg 14.As everyone knows, even gauge head fixing body 22 constitutes by depressing the annular gauge head that also can stablize contact at low pin, on the thin plate of being made by insulating material metal fine is wound into annular, with cutting its part after the resin fixed base, the metal tip that will expose is as single gauge head.This annular gauge head fixing body 22 is securely fixed in the Xiang Duan of probe carrying leg 14 by supporting member 23.For each gauge head end of confirming annular gauge head correctly contacts with each electrode of display control board, be provided with view window 14c on the top of probe carrying leg 14, as required, can confirm the contact condition of gauge head and electrode with microscope etc.
On the top of probe carrying leg 14, also integrally be provided with the contact reference seat 14d of display control board 12, provide contact reference field 14e and contact pressure reference field 14f to display control board 12.Fig. 5 represents to utilize gauge head contact making device supporting display control board 12, and gauge head 22a is with the electrode 12a state of contact of given contact pressure and display control board 12.Fig. 6 represents the relation of display control board 12 by contact reference seat 14d and the gauge head 22a of gauge head contact making device Zhi Chengqian.As can be seen from Figure, p is measured from only outstanding one of contact pressure reference field 14f in the top of gauge head 22a, but as shown in Figure 5, during actual contact, only retreats this overhang p by gauge head 22a, desirable contact pressure can be given between gauge head 22a and the electrode 12a.Again as can be seen from Figure 2, above-mentioned contact reference seat 14d is located at two outsides of gauge head fixing body 22.
In the present invention, in order to support display control board 12, the gauge head contact making device comprise above-mentioned probe carrying leg 14 with can be relatively its open and close contact block carrying leg 16.In the illustrated embodiment, contact contact carrying leg 16 is for the flat board of being made by resilient material constitutes, and its base portion is securely fixed on the probe carrying leg 14.In addition, on the top of carrying leg 16, fixing the contact block 24 relative with above-mentioned gauge head fixing body 22.As shown in Figure 5, contact gauge head 24 constitutes by rubber sheet 24b being attached on the surface that is fixed on the aluminium base 24a on the contact block carrying leg 16.And for example shown in Figure 5, contact block carrying leg 16 is under the free posture of itself, constitute by will contact the structure that block 24 is pressed on the above-mentioned contact reference seat 14d by display control board 12, at this moment the snap-in force recently general pressure from the counter-force of each gauge head 22a is a lot of greatly, and for example snap-in force can reach more than the 4kg.
Feature of the present invention is, above-mentioned bigger snap-in force is to obtain by the relative snap-in force between probe carrying leg 14 and the contact block carrying leg 16, therefore there is no need as before, the device substrate of being placed by subtend bears the bigger snap-in force from pressing section.That is: the snap-in force between two carrying leg 14,16 to the support of gauge head contact making device without any the power effect, for example, in embodiment, even under the situation of cramp bar 10 supporting gauge head contact making devices, the snap-in force between above-mentioned two carrying leg 14,16 is to cramp bar 10 also not influence.Be not limited to cramp bar 10, as the support of gauge head contact making device, even for example be located under the situation of plug 14g as support of probe carrying leg 14 lower ends, the relative snap-in force of two carrying leg 14,16 is to intercalation part 14g also not influence.
In the present embodiment, above-mentioned contact block carrying leg 16 is in supporting contact block 24, because the elasticity of himself, can double as gives the hold down gag of the relative snap-in force between two carrying leg 14,16.Certainly, in the present invention, also can make contact block body carrying leg 16 free rotation ground supportings on probe carrying leg 14, give desirable snap-in force as hold down gag other spring part etc.
For contact block carrying leg 16 is opened and closed with respect to probe carrying leg 14, in the present embodiment, be provided with an offset cam 26.The camshaft 28 of offset cam 26 is by bearing 14h, the 14i supporting that is contained on the probe carrying leg 14, and by described rotation, offset cam 26 can open and close contact block carrying leg 16 from probe carrying leg 14.Fig. 3 represents to contact roughly closing state of block carrying leg 16, and Fig. 4 represents open mode.In order to rotate offset cam 26, on cam 26, integrally make lever 30, by actuator lever 30 is rotated with regulation, can open and close contact block carrying leg 16.
As mentioned above, according to present embodiment, self can support display control board 12 the gauge head contact making device, and supporting display control board 12 and obtain the snap-in force of desirable contact pressure, to the support of gauge head contact making device without any harmful effect.
Fig. 7 represents to utilize the advantage of present embodiment, can give the preferred embodiment of the testing fixture checked under the state of a plurality of display control boards with thermal load at the same time.
As shown in Figure 1, patchboard 32 is fixed on the plug 14g of probe carrying leg 14 lower ends of being located at the gauge head contact making device, and in this state, as shown in Figure 7, on a cramp bar 10,4 gauge head contact making device stationary positioned are on correct position.In addition, each display control board 12 is such as shown by arrows, is directed to contact block carrying leg 16 and is on the gauge head contact making device of open mode, and be supported to be fixed on the appropriate location.The display control board of embodiment has the liquid crystal cell of being made by noncrystal TFT or poly-silicon TFT.Poly-silicon TFT liquid crystal control panel makes to have integrated circuit pattern in its control panel.Like this, each gauge head contact making device is when clamping display control board 12, and by microscope 34, camera monitor 36 can be confirmed the correct contact position of each gauge head and electrode.Like this, be fixed on two pairs of gauge head contact making devices on the cramp bar 10 behind each display control board 12 of supporting, cramp bar 10 is such as shown by arrows, moves on the socket substrate 38, inserts in the socket of the given position on the socket substrate 38.As a result, the electrode of socket and each gauge head 22a can be electrically connected reliably, can finish with figure in being electrically connected of the testing fixture that do not illustrate.Certainly, the cable electrical such as FPC that do not illustrate among the available figure between each gauge head 22a and the patchboard 32 connect.Socket substrate 38 can be carried on the heating arrangement under the state that a plurality of display control boards 12 are installed, and when carrying out thermal load test, carries out the electrical specification inspection.
As mentioned above, according to the present invention device size is reduced, simultaneously can between each gauge head and electrode, obtain reliable contact pressure, therefore can be widely applicable for and carry out simple elements and light and check or apply the electrical specification inspection that various loads carry out.
As mentioned above, according to the present invention, itself can support display control board the gauge head contact making device, and gauge head contact making device of the present invention can be with respect to the display control board that is fixed on the substrate, the clamping action of stipulating.And for example the above, of the present invention being characterized as, probe carrying leg can not be applied to big load on the support of gauge head contact making device with the relative snap-in force that contacts the block carrying leg.Even under the situation that fixedly display control board is checked,, the position is moved because the gauge head contact making device has certain allowance.Therefore when checking display control board, apply big load can for the support of gauge head contact making device.But when display control board is fixed, gauge head contact element 4,10,18 itself has certain allowance and when the position is moved, then when the location that is used to check, will apply bigger power on display control board.
For fear of this point, as Fig. 8, shown in Figure 9, in second embodiment of the present invention, gauge head contact element 4,10,18 itself can rotate specified rate.
The structure of gauge head contact making device itself has some different with above-mentioned first embodiment, but is still probe carrying leg basically and contacts the structure staggered relatively that the block carrying leg has relative snap-in force.Here, the symbol of the part of second embodiment when adopting the value of symbol of same part corresponding in first embodiment, adds that 100 represent, omits its detailed description.
Under the situation of present embodiment, because display control board is fixed on the substrate etc., when with gauge head 122a with when contacting the electrode of block 124 clamping display control boards, because substrate is fixed, therefore, itself must move the gauge head contact making device at clamping direction.Because like this, in second embodiment,, integrally fixing revolution substrate 140 at the root of probe carrying leg 114.These revolution substrate 140 free rotation ground supportings are on base station 142.That is: above-mentioned revolution substrate 140 is fixed on the bolster 148 on the shaft bearing plate 144,146 that is supported on base station 142, and like this, can make gauge head contact making device itself is that freely rotate at the center with bolster 148.
In addition, on revolution substrate 140, be provided with revolution restricted part 140a.Utilization is fixed on the block 150 on the above-mentioned base station 142, can limit the counterclockwise turned position of Fig. 8.
With the opposite side of above-mentioned revolution restricted part 140a, be provided with spring mounting portion 140b.Utilization is placed on the energizing spring 152 between spring mounting portion 140b and the base station 142, counterclockwise acting force among Fig. 8 can be applied on the gauge head contact making device.The clockwise load that the deadweight of this acting force and gauge head contact making device produces is balance roughly, the result, the gauge head contact making device clamps display control board, when utilizing gauge head 122a to contact with electrode, the gauge head contact making device is that the center can freely be rotated with bolster 148, simultaneously, utilize the power of mobile generation at this moment and the acting force of deadweight of self and energizing spring 152, can carry out balanced compensated.Therefore, in this embodiment, the advantage that does not apply redundant force on display control board is arranged also.
In addition, the gauge head in the embodiment is represented as annular gauge head, also can use the conductor contact point element that forms figure on other pin type or flexible substrate.
Claims (4)
1. gauge head contact making device that is used to check display control board is characterized by and comprises:
The top has the probe carrying leg of a plurality of gauge heads;
On the position relative, have the contact block with gauge head, and the contact block carrying leg that can open and close with respect to probe carrying leg; And
Between gauge head and contact block, and give the hold down gag of relative snap-in force with the control panel electrode holder of display control board.
2. the gauge head contact making device that is used to check display control board as claimed in claim 1 is characterized by, and contact block carrying leg is made by latch plate, but double as with probe carrying leg between give the hold down gag of relative snap-in force.
3. the gauge head contact making device that is used to check display control board as claimed in claim 1 is characterized by, and on the top of probe carrying leg, is provided for making the reference field of display control board electrode with respect to the correct location of gauge head.
4. the gauge head contact making device that is used to check display control board as claimed in claim 2 is characterized by, and on probe carrying leg, is provided with the eccentric wheel that is used to open and close contact block carrying leg.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002106557A JP2003302439A (en) | 2002-04-09 | 2002-04-09 | Probe contact device for display panel inspection |
| JP2002106557 | 2002-04-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1450356A true CN1450356A (en) | 2003-10-22 |
Family
ID=28786431
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN02153626A Pending CN1450356A (en) | 2002-04-09 | 2002-11-27 | Detection head for checking display control panel |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP2003302439A (en) |
| KR (1) | KR100525818B1 (en) |
| CN (1) | CN1450356A (en) |
| SG (1) | SG99412A1 (en) |
| TW (1) | TW200305023A (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100740010B1 (en) * | 2005-11-18 | 2007-07-16 | 주식회사 파이컴 | Inspecting system of flat panel display |
| KR100768712B1 (en) * | 2006-05-04 | 2007-10-19 | 주식회사 대우일렉트로닉스 | Test device of organic electro display panel |
| KR100768713B1 (en) * | 2006-05-04 | 2007-10-19 | 주식회사 대우일렉트로닉스 | Test device of organic electro display panel |
| JP4808135B2 (en) * | 2006-11-09 | 2011-11-02 | 株式会社日本マイクロニクス | Probe positioning method, movable probe unit mechanism, and inspection apparatus |
| KR102171682B1 (en) * | 2019-08-07 | 2020-10-30 | 주식회사 디엠엔티 | Detachment device of probe block for display panel inspection |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09127154A (en) * | 1995-10-31 | 1997-05-16 | Oki Electric Ind Co Ltd | Probe positioner device |
| JPH10302640A (en) * | 1997-04-25 | 1998-11-13 | Osaki Eng Kk | Plasma display panel lighting inspection device |
| JP3958875B2 (en) * | 1998-07-24 | 2007-08-15 | 株式会社日本マイクロニクス | Prober and probe needle contact method |
| JP3897469B2 (en) * | 1998-11-17 | 2007-03-22 | 株式会社日本マイクロニクス | Inspection apparatus and inspection method for flat object |
| JP2001050858A (en) * | 1999-08-04 | 2001-02-23 | Micronics Japan Co Ltd | Inspection apparatus for display panel board |
| JP2001059972A (en) * | 1999-08-24 | 2001-03-06 | Ricoh Co Ltd | Device for lighting and inspecting liquid crystal display panel |
| KR100350513B1 (en) * | 2000-04-03 | 2002-08-28 | 박태욱 | Probe apparatus testing an electrode of Plasma Display Panel |
| JP2001318116A (en) * | 2000-05-11 | 2001-11-16 | Micronics Japan Co Ltd | Inspection apparatus for display panel board |
| JP3569486B2 (en) * | 2000-07-14 | 2004-09-22 | シャープ株式会社 | Inspection probe device |
-
2002
- 2002-04-09 JP JP2002106557A patent/JP2003302439A/en active Pending
- 2002-11-04 TW TW091132467A patent/TW200305023A/en unknown
- 2002-11-11 SG SG200206788A patent/SG99412A1/en unknown
- 2002-11-22 KR KR10-2002-0073186A patent/KR100525818B1/en not_active IP Right Cessation
- 2002-11-27 CN CN02153626A patent/CN1450356A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| KR20030080986A (en) | 2003-10-17 |
| JP2003302439A (en) | 2003-10-24 |
| SG99412A1 (en) | 2003-10-27 |
| KR100525818B1 (en) | 2005-11-03 |
| TW200305023A (en) | 2003-10-16 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |