AU2001282891A1 - Contact apparatus particularly useful with test equipment - Google Patents
Contact apparatus particularly useful with test equipmentInfo
- Publication number
- AU2001282891A1 AU2001282891A1 AU2001282891A AU8289101A AU2001282891A1 AU 2001282891 A1 AU2001282891 A1 AU 2001282891A1 AU 2001282891 A AU2001282891 A AU 2001282891A AU 8289101 A AU8289101 A AU 8289101A AU 2001282891 A1 AU2001282891 A1 AU 2001282891A1
- Authority
- AU
- Australia
- Prior art keywords
- particularly useful
- test equipment
- contact apparatus
- apparatus particularly
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2103/00—Two poles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
- H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US21783700P | 2000-07-13 | 2000-07-13 | |
US60217837 | 2000-07-13 | ||
PCT/US2001/022216 WO2002007265A1 (en) | 2000-07-13 | 2001-07-11 | Contact apparatus particularly useful with test equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001282891A1 true AU2001282891A1 (en) | 2002-01-30 |
Family
ID=22812718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001282891A Abandoned AU2001282891A1 (en) | 2000-07-13 | 2001-07-11 | Contact apparatus particularly useful with test equipment |
Country Status (5)
Country | Link |
---|---|
US (1) | US6652326B2 (en) |
JP (1) | JP2004504703A (en) |
AU (1) | AU2001282891A1 (en) |
TW (1) | TW531938B (en) |
WO (1) | WO2002007265A1 (en) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6331836B1 (en) * | 2000-08-24 | 2001-12-18 | Fast Location.Net, Llc | Method and apparatus for rapidly estimating the doppler-error and other receiver frequency errors of global positioning system satellite signals weakened by obstructions in the signal path |
US6822542B2 (en) * | 2001-07-26 | 2004-11-23 | Xytrans, Inc. | Self-adjusted subminiature coaxial connector |
DE60315813T2 (en) * | 2002-03-05 | 2008-05-21 | Rika Denshi America, Inc., Attleboro | DEVICE FOR AN INTERFACE BETWEEN ELECTRONIC HOUSINGS AND TEST DEVICES |
US6921299B2 (en) * | 2003-01-06 | 2005-07-26 | R & R Home Networking | Coupling device for coaxial cable and communication applications |
TWI241757B (en) * | 2003-05-16 | 2005-10-11 | Parry Chen | RF coaxial conductor |
FR2862355B1 (en) * | 2003-11-18 | 2006-02-10 | Ecl | SYSTEM FOR CONNECTING TWO TREES IN TRANSLATION |
CN2682641Y (en) * | 2003-11-20 | 2005-03-02 | 上海莫仕连接器有限公司 | Crimp connected conductive terminal |
US7321234B2 (en) * | 2003-12-18 | 2008-01-22 | Lecroy Corporation | Resistive test probe tips and applications therefor |
US20230204626A1 (en) * | 2003-12-31 | 2023-06-29 | Microfabrica Inc. | Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes |
US6927332B1 (en) * | 2004-03-22 | 2005-08-09 | Motorola, Inc. | Flexible test cable |
WO2006007440A1 (en) * | 2004-06-16 | 2006-01-19 | Rika Denshi America, Inc. | Electrical test probes, methods of making, and methods of using |
JP5185625B2 (en) * | 2004-12-13 | 2013-04-17 | インテスト コーポレイション | Reflection reduction signal module |
JP4632133B2 (en) * | 2005-09-26 | 2011-02-16 | セイコーエプソン株式会社 | Conductive connection device |
US7116121B1 (en) * | 2005-10-27 | 2006-10-03 | Agilent Technologies, Inc. | Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts |
US7598757B2 (en) * | 2005-12-06 | 2009-10-06 | Unitechno Inc. | Double ended contact probe |
KR100734296B1 (en) * | 2005-12-19 | 2007-07-02 | 삼성전자주식회사 | Socket pin having a self cleaning function and test apparatus including the socket pin |
JP4800804B2 (en) * | 2006-03-14 | 2011-10-26 | 日置電機株式会社 | Probes and measuring equipment |
US7545159B2 (en) * | 2006-06-01 | 2009-06-09 | Rika Denshi America, Inc. | Electrical test probes with a contact element, methods of making and using the same |
US7695322B2 (en) * | 2006-06-12 | 2010-04-13 | Southwest Microwave, Inc. Arizona Corporation | Coaxial connector |
US7728613B2 (en) * | 2006-11-20 | 2010-06-01 | Analog Devices, Inc. | Device under test pogo pin type contact element |
CN201029138Y (en) * | 2007-02-08 | 2008-02-27 | 富士康(昆山)电脑接插件有限公司 | Electric connector terminal |
JP4999079B2 (en) * | 2007-04-10 | 2012-08-15 | サンユー工業株式会社 | probe |
US7847191B2 (en) | 2007-11-06 | 2010-12-07 | Xerox Corporation | Electrical component, manufacturing system and method |
MY151561A (en) * | 2007-12-06 | 2014-06-13 | Test Tooling Solutions M Sdn Bhd | Eco contactor |
EP2144338A1 (en) * | 2008-07-11 | 2010-01-13 | Tyco Electronics Nederland B.V. | Coaxial probe |
US7922529B1 (en) * | 2009-11-23 | 2011-04-12 | Neocoil, Llc | High mating cycle low insertion force coaxial connector |
DE102010014940B4 (en) * | 2010-04-14 | 2013-12-19 | Semikron Elektronik Gmbh & Co. Kg | Power semiconductor module with connection elements |
CN103765227B (en) | 2011-08-30 | 2016-08-17 | 李诺工业股份有限公司 | Coaxial probe |
US8758066B2 (en) * | 2012-02-03 | 2014-06-24 | Interconnect Devices, Inc. | Electrical connector with insulation member |
US9627814B2 (en) * | 2012-04-04 | 2017-04-18 | Holland Electronics Llc | Moving part coaxial connectors |
CN104184003B (en) * | 2013-05-20 | 2016-03-23 | 中航光电科技股份有限公司 | A kind of RF coaxial adapters |
CN104865425B (en) * | 2014-02-24 | 2018-07-20 | 旺矽科技股份有限公司 | Probe device with spring sleeve type probe |
JP6359347B2 (en) * | 2014-06-02 | 2018-07-18 | 日本発條株式会社 | Probe unit and contact probe |
US9933455B2 (en) | 2015-05-04 | 2018-04-03 | Qualcomm Incorporated | Known good die testing for high frequency applications |
KR101954086B1 (en) | 2017-11-07 | 2019-03-06 | 리노공업주식회사 | A test probe assembly and test socket |
JP7096095B2 (en) * | 2018-07-27 | 2022-07-05 | 株式会社エンプラス | Sockets for contact pins and electrical components |
CN109030887A (en) * | 2018-08-10 | 2018-12-18 | 浙江金连接科技有限公司 | A kind of test probe beryllium-bronze imperial crown top pillar head |
US11973301B2 (en) | 2018-09-26 | 2024-04-30 | Microfabrica Inc. | Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making |
US11994535B2 (en) * | 2018-11-27 | 2024-05-28 | Nhk Spring Co., Ltd. | Probe unit |
CA3121476A1 (en) | 2018-11-30 | 2020-06-04 | Corning Optical Communications Rf Llc | Compressible electrical contacts with divaricated-cut sections |
WO2021108080A1 (en) * | 2019-11-30 | 2021-06-03 | Corning Optical Communications Rf Llc | Connector assemblies |
USD936611S1 (en) | 2019-11-30 | 2021-11-23 | Corning Optical Communications Rf Llc | Compressible electrical contact |
USD936610S1 (en) | 2019-11-30 | 2021-11-23 | Corning Optical Communications Rf Llc | Compressible electrical contact |
US11563294B2 (en) * | 2020-05-22 | 2023-01-24 | Corning Optical Communications Rf Llc | Spring-loaded interconnects having pre-configured flexible cable |
CN113805001A (en) * | 2021-09-09 | 2021-12-17 | 湖南电科院检测集团有限公司 | High-voltage product test device with protective measures |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3416125A (en) | 1966-10-20 | 1968-12-10 | Ostby & Barton Co | Co-axial connector |
JPS6114383U (en) * | 1984-06-29 | 1986-01-28 | 株式会社ヨコオ | contact probe |
JPH0637337Y2 (en) * | 1986-01-29 | 1994-09-28 | 横河・ヒユ−レツト・パツカ−ド株式会社 | Probe device |
JPH0624785Y2 (en) * | 1987-06-15 | 1994-06-29 | 株式会社横尾製作所 | Both ends movable contact pin |
US5157325A (en) * | 1991-02-15 | 1992-10-20 | Compaq Computer Corporation | Compact, wireless apparatus for electrically testing printed circuit boards |
US5175493A (en) | 1991-10-11 | 1992-12-29 | Interconnect Devices, Inc. | Shielded electrical contact spring probe assembly |
US5936421A (en) | 1994-10-11 | 1999-08-10 | Virginia Panel Corporation | Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith |
JP2002501289A (en) * | 1998-01-05 | 2002-01-15 | ライカ エレクトロニクス インターナショナル、 インコーポレイテッド | Coaxial contact assembly device |
JP2003526874A (en) * | 1998-11-25 | 2003-09-09 | リカ エレクトロニクス インターナショナル インコーポレイテッド | Electric contact device |
-
2001
- 2001-07-11 WO PCT/US2001/022216 patent/WO2002007265A1/en active Application Filing
- 2001-07-11 AU AU2001282891A patent/AU2001282891A1/en not_active Abandoned
- 2001-07-11 US US09/903,206 patent/US6652326B2/en not_active Expired - Fee Related
- 2001-07-11 JP JP2002513054A patent/JP2004504703A/en active Pending
- 2001-10-09 TW TW090124872A patent/TW531938B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2002007265A1 (en) | 2002-01-24 |
US20020013085A1 (en) | 2002-01-31 |
TW531938B (en) | 2003-05-11 |
JP2004504703A (en) | 2004-02-12 |
US6652326B2 (en) | 2003-11-25 |
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