SG74007A1 - Apparatus and method for dicing semiconductor wafers - Google Patents

Apparatus and method for dicing semiconductor wafers

Info

Publication number
SG74007A1
SG74007A1 SG1997000831A SG1997000831A SG74007A1 SG 74007 A1 SG74007 A1 SG 74007A1 SG 1997000831 A SG1997000831 A SG 1997000831A SG 1997000831 A SG1997000831 A SG 1997000831A SG 74007 A1 SG74007 A1 SG 74007A1
Authority
SG
Singapore
Prior art keywords
semiconductor wafers
dicing semiconductor
dicing
wafers
semiconductor
Prior art date
Application number
SG1997000831A
Other languages
English (en)
Inventor
James W Loomis
Richard T Tweedie
Original Assignee
Loomis Ind Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Loomis Ind Inc filed Critical Loomis Ind Inc
Publication of SG74007A1 publication Critical patent/SG74007A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B28—WORKING CEMENT, CLAY, OR STONE
    • B28D—WORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
    • B28D5/0052—Means for supporting or holding work during breaking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67092—Apparatus for mechanical treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68728—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T225/00—Severing by tearing or breaking
    • Y10T225/30—Breaking or tearing apparatus
    • Y10T225/307—Combined with preliminary weakener or with nonbreaking cutter
    • Y10T225/321—Preliminary weakener
    • Y10T225/325—With means to apply moment of force to weakened work
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T225/00—Severing by tearing or breaking
    • Y10T225/30—Breaking or tearing apparatus
    • Y10T225/371—Movable breaking tool

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Dicing (AREA)
SG1997000831A 1994-07-20 1995-07-20 Apparatus and method for dicing semiconductor wafers SG74007A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US27762294A 1994-07-20 1994-07-20

Publications (1)

Publication Number Publication Date
SG74007A1 true SG74007A1 (en) 2000-07-18

Family

ID=23061673

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997000831A SG74007A1 (en) 1994-07-20 1995-07-20 Apparatus and method for dicing semiconductor wafers

Country Status (5)

Country Link
US (1) US5769297A (de)
EP (1) EP0720521A4 (de)
JP (1) JPH09503352A (de)
SG (1) SG74007A1 (de)
WO (1) WO1996002362A1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19606653C1 (de) * 1996-02-23 1997-01-16 Leica Ag Einrichtung zum Brechen von Dreiecks-Glasmessern für die Ultra-Mikrotomie
US6205994B1 (en) * 1998-12-23 2001-03-27 Lucent Technologies, Inc. Scriber adapter plate
JP2001196328A (ja) * 2000-01-12 2001-07-19 Disco Abrasive Syst Ltd Ｃｓｐ基板の分割方法
US6371102B1 (en) * 2000-08-30 2002-04-16 Uni-Tek System, Inc. Device for cutting interconnected rectangular plate-shaped workpieces into a plurality or individual rectangular units
US20030051353A1 (en) * 2001-02-13 2003-03-20 Andreas Gartner Formation of a disk from a fracturable material
KR100522040B1 (ko) * 2003-08-29 2005-10-17 한국기계연구원 압착성형장치의 편심보정용 자가정렬 스테이지
JP4684569B2 (ja) * 2004-03-31 2011-05-18 株式会社ディスコ テープ拡張装置
JP4447392B2 (ja) * 2004-07-23 2010-04-07 株式会社ディスコ ウエーハの分割方法および分割装置
CN101198450A (zh) * 2005-06-16 2008-06-11 Nxp股份有限公司 拉伸持箔器的箔片的工具、从晶片移除晶粒的机器及方法
JP2007165851A (ja) * 2005-11-16 2007-06-28 Denso Corp ダイシングシートフレーム
JP5009101B2 (ja) * 2006-10-06 2012-08-22 株式会社荏原製作所 基板研磨装置
WO2013085480A1 (en) * 2011-12-05 2013-06-13 Rayotek Scientific, Inc. Vacuum insulated glass panel with spacers having improved characteristics and method of forming same
US9187947B2 (en) 2011-12-05 2015-11-17 Rayotek Scientific, Inc. Method of forming a vacuum insulated glass panel spacer
US9410358B2 (en) 2011-12-05 2016-08-09 Rayotek Scientific, Inc. Vacuum insulated glass panel with spacers coated with micro particles and method of forming same
JP6009885B2 (ja) * 2012-09-24 2016-10-19 株式会社ディスコ テープ拡張装置
JP6087707B2 (ja) * 2013-04-15 2017-03-01 株式会社ディスコ テープ拡張装置
JP6573444B2 (ja) * 2014-10-10 2019-09-11 リンテック株式会社 離間用接着シート
JP6420623B2 (ja) * 2014-10-10 2018-11-07 リンテック株式会社 離間装置および離間方法
JP2016081973A (ja) * 2014-10-10 2016-05-16 リンテック株式会社 離間装置および離間方法
JP6386866B2 (ja) * 2014-10-10 2018-09-05 リンテック株式会社 離間装置および離間方法
JP6427005B2 (ja) * 2014-12-26 2018-11-21 リンテック株式会社 離間装置
JP6848151B2 (ja) * 2017-05-29 2021-03-24 リンテック株式会社 離間装置および離間方法
EP3410473B1 (de) * 2017-05-30 2021-02-24 Infineon Technologies AG Anordnung und verfahren zum vereinzeln von substraten

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3567986A (en) * 1968-11-12 1971-03-02 Sylvania Electric Prod Cathode ray tube shadow mask supporting structure having straight springs mounted upon struck-out portions of the shadow mask frame
GB1243346A (en) * 1968-11-29 1971-08-18 Associated Semiconductor Mft Improvements in and relating to methods of separating into pieces plates of material
US3870196A (en) * 1973-09-28 1975-03-11 Laurier Associates Inc High yield method of breaking wafer into dice
US4018372A (en) * 1975-12-05 1977-04-19 The Fletcher-Terry Company Glass cutting method and apparatus
US4109841A (en) * 1976-05-26 1978-08-29 Ppg Industries, Inc. Apparatus for opening score lines in glass sheets
JPS5984438A (ja) * 1982-11-04 1984-05-16 Nec Corp シ−ト拡張装置
JPS60249246A (ja) * 1984-05-24 1985-12-09 Matsushita Electric Ind Co Ltd 電池の製造法
US4545515A (en) * 1984-07-06 1985-10-08 Fletcher-Terry Corporation Sheet cutting machine
US4653680A (en) * 1985-04-25 1987-03-31 Regan Barrie F Apparatus for breaking semiconductor wafers and the like
US4765376A (en) * 1987-04-28 1988-08-23 Northern Telecom Limited Lead straightening for leaded packaged electronic components

Also Published As

Publication number Publication date
EP0720521A4 (de) 1996-12-18
US5769297A (en) 1998-06-23
EP0720521A1 (de) 1996-07-10
WO1996002362A1 (en) 1996-02-01
JPH09503352A (ja) 1997-03-31

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