SG44452A1 - Integrated circuits which compensate for local conditions - Google Patents

Integrated circuits which compensate for local conditions

Info

Publication number
SG44452A1
SG44452A1 SG1996000524A SG1996000524A SG44452A1 SG 44452 A1 SG44452 A1 SG 44452A1 SG 1996000524 A SG1996000524 A SG 1996000524A SG 1996000524 A SG1996000524 A SG 1996000524A SG 44452 A1 SG44452 A1 SG 44452A1
Authority
SG
Singapore
Prior art keywords
compensate
integrated circuits
local conditions
local
conditions
Prior art date
Application number
SG1996000524A
Other languages
English (en)
Inventor
Masakazu Shoji
Original Assignee
At & T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by At & T Corp filed Critical At & T Corp
Publication of SG44452A1 publication Critical patent/SG44452A1/en

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • H03K19/00346Modifications for eliminating interference or parasitic voltages or currents
    • H03K19/00361Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • H03K19/00369Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Electromagnetism (AREA)
  • Automation & Control Theory (AREA)
  • Radar, Positioning & Navigation (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Logic Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Amplifiers (AREA)
SG1996000524A 1990-06-01 1991-05-24 Integrated circuits which compensate for local conditions SG44452A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/531,961 US5117130A (en) 1990-06-01 1990-06-01 Integrated circuits which compensate for local conditions

Publications (1)

Publication Number Publication Date
SG44452A1 true SG44452A1 (en) 1997-12-19

Family

ID=24119802

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996000524A SG44452A1 (en) 1990-06-01 1991-05-24 Integrated circuits which compensate for local conditions

Country Status (8)

Country Link
US (1) US5117130A (xx)
EP (1) EP0459715B1 (xx)
JP (1) JPH04230053A (xx)
KR (1) KR100219769B1 (xx)
DE (1) DE69127320T2 (xx)
ES (1) ES2104666T3 (xx)
HK (1) HK1001928A1 (xx)
SG (1) SG44452A1 (xx)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5247212A (en) * 1991-01-31 1993-09-21 Thunderbird Technologies, Inc. Complementary logic input parallel (clip) logic circuit family
US5254883A (en) * 1992-04-22 1993-10-19 Rambus, Inc. Electrical current source circuitry for a bus
FR2699023B1 (fr) * 1992-12-09 1995-02-24 Texas Instruments France Circuit à retard commandé.
US5408145A (en) * 1993-02-12 1995-04-18 Advanced Micro Devices, Inc. Low power consumption and high speed NOR gate integrated circuit
US5557223A (en) * 1993-06-08 1996-09-17 National Semiconductor Corporation CMOS bus and transmission line driver having compensated edge rate control
US5483184A (en) * 1993-06-08 1996-01-09 National Semiconductor Corporation Programmable CMOS bus and transmission line receiver
US5543746A (en) * 1993-06-08 1996-08-06 National Semiconductor Corp. Programmable CMOS current source having positive temperature coefficient
DE69428045T2 (de) * 1993-06-08 2002-04-18 National Semiconductor Corp., Santa Clara Programmierbarer cmos bus- und übertragungsleitungstreiber
EP0702859B1 (en) * 1993-06-08 1998-07-01 National Semiconductor Corporation Btl compatible cmos line driver
US5539341A (en) * 1993-06-08 1996-07-23 National Semiconductor Corporation CMOS bus and transmission line driver having programmable edge rate control
FR2734378B1 (fr) * 1995-05-17 1997-07-04 Suisse Electronique Microtech Circuit integre dans lequel certains composants fonctionnels sont amenes a travailler avec une meme caracteristique de fonctionnement
US5627456A (en) * 1995-06-07 1997-05-06 International Business Machines Corporation All FET fully integrated current reference circuit
JP2783243B2 (ja) * 1996-02-06 1998-08-06 日本電気株式会社 Cmos集積回路の故障検出方法及び装置
US5818260A (en) * 1996-04-24 1998-10-06 National Semiconductor Corporation Transmission line driver having controllable rise and fall times with variable output low and minimal on/off delay
US6870419B1 (en) 1997-08-29 2005-03-22 Rambus Inc. Memory system including a memory device having a controlled output driver characteristic
US6094075A (en) * 1997-08-29 2000-07-25 Rambus Incorporated Current control technique
US6008683A (en) * 1997-10-31 1999-12-28 Credence Systems Corporation Switchable load for testing a semiconductor integrated circuit device
US6188248B1 (en) * 1999-08-26 2001-02-13 Mips Technologies, Inc. Output synchronization-free, high-fanin dynamic NOR gate
US6646953B1 (en) * 2000-07-06 2003-11-11 Rambus Inc. Single-clock, strobeless signaling system
US7051130B1 (en) 1999-10-19 2006-05-23 Rambus Inc. Integrated circuit device that stores a value representative of a drive strength setting
US6321282B1 (en) 1999-10-19 2001-11-20 Rambus Inc. Apparatus and method for topography dependent signaling
US7079775B2 (en) 2001-02-05 2006-07-18 Finisar Corporation Integrated memory mapped controller circuit for fiber optics transceiver
US6396305B1 (en) * 2001-03-29 2002-05-28 Intel Corporation Digital leakage compensation circuit
US7119549B2 (en) * 2003-02-25 2006-10-10 Rambus Inc. Output calibrator with dynamic precision
JP4544458B2 (ja) * 2004-11-11 2010-09-15 ルネサスエレクトロニクス株式会社 半導体装置
US7750695B2 (en) * 2004-12-13 2010-07-06 Mosaid Technologies Incorporated Phase-locked loop circuitry using charge pumps with current mirror circuitry
US20080061836A1 (en) * 2006-08-22 2008-03-13 International Business Machines Corporation Current Mirror and Parallel Logic Evaluation

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4453094A (en) * 1982-06-30 1984-06-05 General Electric Company Threshold amplifier for IC fabrication using CMOS technology
US4714840A (en) * 1982-12-30 1987-12-22 Thomson Components - Mostek Corporation MOS transistor circuits having matched channel width and length dimensions
US4613772A (en) * 1984-04-11 1986-09-23 Harris Corporation Current compensation for logic gates
JPS6320913A (ja) * 1986-07-14 1988-01-28 Nec Corp 出力回路
IT1201848B (it) * 1986-10-02 1989-02-02 Sgs Microelettronica Spa Circuito di interfaccia logica ad alta stabilita' e bassa corrente di riposo
US4763021A (en) * 1987-07-06 1988-08-09 Unisys Corporation CMOS input buffer receiver circuit with ultra stable switchpoint
US4818901A (en) * 1987-07-20 1989-04-04 Harris Corporation Controlled switching CMOS output buffer
US4797580A (en) * 1987-10-29 1989-01-10 Northern Telecom Limited Current-mirror-biased pre-charged logic circuit
US4857767A (en) * 1988-03-03 1989-08-15 Dallas Semiconductor Corporation High-density low-power circuit for sustaining a precharge level
US4857764A (en) * 1988-06-30 1989-08-15 Harris Corporation Current compensated precharged bus

Also Published As

Publication number Publication date
DE69127320T2 (de) 1998-03-19
ES2104666T3 (es) 1997-10-16
JPH04230053A (ja) 1992-08-19
KR100219769B1 (ko) 1999-09-01
HK1001928A1 (en) 1998-07-17
US5117130A (en) 1992-05-26
DE69127320D1 (de) 1997-09-25
EP0459715B1 (en) 1997-08-20
EP0459715A2 (en) 1991-12-04
EP0459715A3 (en) 1993-05-19

Similar Documents

Publication Publication Date Title
HK1001928A1 (en) Integrated circuits which compensate for local conditions
EP0497595A3 (en) Local interconnect for integrated circuits
EP0478377A3 (en) Horizontal edge compensation circuits
EP0517368A3 (en) Local interconnect for integrated circuits
EP0478233A3 (en) Process for fabricating integrated circuits
EP0472818A3 (en) Built-in self test for integrated circuits
EP0473127A3 (en) Semiconductor integrated circuit
EP0522579A3 (en) Level-shifter circuit for integrated circuits
EP0489394A3 (en) Semiconductor integrated circuit
GB2263022B (en) Connecting box for forming branch circuits
GB9019982D0 (en) Semiconductor integrated circuit arrangements
EP0691683A3 (de) Schutzstruktur für ingegrierte Schaltungen
EP0461750A3 (en) Interconnect for integrated circuits
HK1008760A1 (en) Tray for integrated circuits
GB2264696B (en) Tray for integrated circuits
EP0516848A4 (en) Transistor saturation-preventing circuit
EP0492506A3 (en) Fast capacitive-load driving circuit for integrated circuits particularly memories
GB9226463D0 (en) Integrated circuits
GB2248152B (en) Coil circuits
GB2276033B (en) Integrated circuits
GB2248320B (en) Semiconductor integrated circuit
EP0552716A3 (en) Integrated transistor circuit
KR960014726B1 (en) Semiconductor integrated circuit
EP0464452A3 (en) Semiconductor integrated circuit
EP0441126A3 (en) Circuit for protecting the connections of an integrated circuit