SG150449A1 - Method for creating a memory defect map and optimizing performance using the memory defect map - Google Patents
Method for creating a memory defect map and optimizing performance using the memory defect mapInfo
- Publication number
- SG150449A1 SG150449A1 SG200805821-6A SG2008058216A SG150449A1 SG 150449 A1 SG150449 A1 SG 150449A1 SG 2008058216 A SG2008058216 A SG 2008058216A SG 150449 A1 SG150449 A1 SG 150449A1
- Authority
- SG
- Singapore
- Prior art keywords
- defect map
- memory
- memory defect
- creating
- optimizing performance
- Prior art date
Links
- 230000007547 defect Effects 0.000 title abstract 10
- 238000000034 method Methods 0.000 title abstract 3
- 101000578834 Synechocystis sp. (strain PCC 6803 / Kazusa) Methionine aminopeptidase A Proteins 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/1208—Error catch memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/838,585 US7949913B2 (en) | 2007-08-14 | 2007-08-14 | Method for creating a memory defect map and optimizing performance using the memory defect map |
Publications (1)
Publication Number | Publication Date |
---|---|
SG150449A1 true SG150449A1 (en) | 2009-03-30 |
Family
ID=40196686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200805821-6A SG150449A1 (en) | 2007-08-14 | 2008-08-04 | Method for creating a memory defect map and optimizing performance using the memory defect map |
Country Status (5)
Country | Link |
---|---|
US (1) | US7949913B2 (zh) |
EP (1) | EP2026356B1 (zh) |
CN (1) | CN101369247B (zh) |
SG (1) | SG150449A1 (zh) |
TW (1) | TWI370455B (zh) |
Cited By (1)
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---|---|---|---|---|
US8904228B2 (en) | 2011-12-07 | 2014-12-02 | Dell Products L.P. | Methods and systems for repairing memory |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11734393B2 (en) | 2004-09-20 | 2023-08-22 | Warner Bros. Entertainment Inc. | Content distribution with renewable content protection |
US20060064386A1 (en) | 2004-09-20 | 2006-03-23 | Aaron Marking | Media on demand via peering |
US8140890B2 (en) * | 2009-12-29 | 2012-03-20 | International Business Machines Corporation | Relocating bad block relocation (BBR) directory upon encountering physical media defect on a disk |
TWI459393B (zh) * | 2011-01-19 | 2014-11-01 | Phison Electronics Corp | 用於非揮發性記憶體的資料寫入方法、控制器與儲存裝置 |
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US8937845B2 (en) * | 2012-10-31 | 2015-01-20 | Freescale Semiconductor, Inc. | Memory device redundancy management system |
CN104111895A (zh) * | 2014-07-25 | 2014-10-22 | 记忆科技(深圳)有限公司 | 一种利用dram不良品的方法 |
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US9928924B2 (en) * | 2015-12-15 | 2018-03-27 | Qualcomm Incorporated | Systems, methods, and computer programs for resolving dram defects |
KR102420897B1 (ko) * | 2016-03-17 | 2022-07-18 | 에스케이하이닉스 주식회사 | 메모리 모듈, 이를 포함하는 메모리 시스템 및 그의 동작 방법 |
CN108735268B (zh) | 2017-04-19 | 2024-01-30 | 恩智浦美国有限公司 | 非易失性存储器修复电路 |
KR20190032793A (ko) * | 2017-09-20 | 2019-03-28 | 에스케이하이닉스 주식회사 | 메모리 모듈 |
US10978028B2 (en) * | 2018-09-17 | 2021-04-13 | Apple Inc. | Correction for defective memory of a memory-in-pixel display |
TWI676171B (zh) * | 2018-09-18 | 2019-11-01 | 華邦電子股份有限公司 | 記憶體裝置及其中斷處理方法 |
US11360840B2 (en) | 2020-01-20 | 2022-06-14 | Samsung Electronics Co., Ltd. | Method and apparatus for performing redundancy analysis of a semiconductor device |
Family Cites Families (77)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4209846A (en) * | 1977-12-02 | 1980-06-24 | Sperry Corporation | Memory error logger which sorts transient errors from solid errors |
US4240143A (en) * | 1978-12-22 | 1980-12-16 | Burroughs Corporation | Hierarchical multi-processor network for memory sharing |
US4426688A (en) * | 1981-08-03 | 1984-01-17 | Ncr Corporation | Memory system having an alternate memory |
US4479214A (en) * | 1982-06-16 | 1984-10-23 | International Business Machines Corporation | System for updating error map of fault tolerant memory |
DE69034227T2 (de) * | 1989-04-13 | 2007-05-03 | Sandisk Corp., Sunnyvale | EEprom-System mit Blocklöschung |
WO1993000628A1 (en) * | 1991-06-26 | 1993-01-07 | Ast Research, Inc. | Multiprocessor distributed initialization and self-test system |
US5588112A (en) * | 1992-12-30 | 1996-12-24 | Digital Equipment Corporation | DMA controller for memory scrubbing |
DE69421379T2 (de) * | 1994-03-31 | 2000-05-11 | Stmicroelectronics, Inc. | Wiederverwendbarer Mehrwegsatz assoziativer Cache-Speicher |
US5539697A (en) * | 1994-08-03 | 1996-07-23 | Bi-Search Corporation | Method and structure for using defective unrepairable semiconductor memory |
DE69421925T2 (de) | 1994-09-30 | 2000-03-16 | Stmicroelectronics S.R.L. | Speichergerät mit Fehlerdetektion und -korrektur und Verfahren zum Schreiben und Löschen des Speichergeräts |
US5642506A (en) * | 1994-12-14 | 1997-06-24 | International Business Machines Corporation | Method and apparatus for initializing a multiprocessor system |
US5751641A (en) * | 1995-12-27 | 1998-05-12 | Sgs-Thomson Microelectronics, Inc. | Microprocessor memory test circuit and method |
US5764878A (en) * | 1996-02-07 | 1998-06-09 | Lsi Logic Corporation | Built-in self repair system for embedded memories |
US5758056A (en) * | 1996-02-08 | 1998-05-26 | Barr; Robert C. | Memory system having defective address identification and replacement |
US5774647A (en) * | 1996-05-15 | 1998-06-30 | Hewlett-Packard Company | Management of memory modules |
GB9614551D0 (en) | 1996-07-11 | 1996-09-04 | Memory Corp Plc | Memory system |
US6125392A (en) * | 1996-10-11 | 2000-09-26 | Intel Corporation | Method and apparatus for high speed event log data compression within a non-volatile storage area |
US5905858A (en) * | 1996-11-01 | 1999-05-18 | Micron Electronics, Inc. | System for method memory error handling |
US5862314A (en) * | 1996-11-01 | 1999-01-19 | Micron Electronics, Inc. | System and method for remapping defective memory locations |
US5996096A (en) * | 1996-11-15 | 1999-11-30 | International Business Machines Corporation | Dynamic redundancy for random access memory assemblies |
WO1999005599A1 (en) | 1997-07-28 | 1999-02-04 | Intergraph Corporation | Apparatus and method for memory error detection and error reporting |
US6035432A (en) * | 1997-07-31 | 2000-03-07 | Micron Electronics, Inc. | System for remapping defective memory bit sets |
US6154851A (en) * | 1997-08-05 | 2000-11-28 | Micron Technology, Inc. | Memory repair |
US5986950A (en) * | 1997-10-15 | 1999-11-16 | International Business Machines Corporation | Use of redundant circuits to improve the reliability of an integrated circuit |
TW333648B (en) * | 1997-10-30 | 1998-06-11 | Key Technology Corp | The connection structure and algorithm for flash memory |
GB9805054D0 (en) * | 1998-03-11 | 1998-05-06 | Process Intelligence Limited | Memory test system with buffer memory |
GB9806687D0 (en) * | 1998-03-27 | 1998-05-27 | Memory Corp Plc | Memory system |
US6173382B1 (en) * | 1998-04-28 | 2001-01-09 | International Business Machines Corporation | Dynamic configuration of memory module using modified presence detect data |
US6496945B2 (en) * | 1998-06-04 | 2002-12-17 | Compaq Information Technologies Group, L.P. | Computer system implementing fault detection and isolation using unique identification codes stored in non-volatile memory |
US6324657B1 (en) * | 1998-06-11 | 2001-11-27 | Micron Technology, Inc. | On-clip testing circuit and method for improving testing of integrated circuits |
US6260127B1 (en) * | 1998-07-13 | 2001-07-10 | Compaq Computer Corporation | Method and apparatus for supporting heterogeneous memory in computer systems |
JP4121634B2 (ja) | 1998-09-21 | 2008-07-23 | 株式会社アドバンテスト | メモリ試験装置 |
JP3266126B2 (ja) * | 1999-01-14 | 2002-03-18 | 日本電気株式会社 | ネットワーク障害情報管理システム及び記憶媒体 |
US7017020B2 (en) * | 1999-07-16 | 2006-03-21 | Broadcom Corporation | Apparatus and method for optimizing access to memory |
US6304989B1 (en) * | 1999-07-21 | 2001-10-16 | Credence Systems Corporation | Built-in spare row and column replacement analysis system for embedded memories |
US6601183B1 (en) * | 1999-09-30 | 2003-07-29 | Silicon Graphics, Inc. | Diagnostic system and method for a highly scalable computing system |
US6536005B1 (en) * | 1999-10-26 | 2003-03-18 | Teradyne, Inc. | High-speed failure capture apparatus and method for automatic test equipment |
US6499120B1 (en) * | 1999-12-30 | 2002-12-24 | Infineon Technologies Richmond, Lp | Usage of redundancy data for displaying failure bit maps for semiconductor devices |
US7111190B2 (en) * | 2001-02-23 | 2006-09-19 | Intel Corporation | Method and apparatus for reconfigurable memory |
US6820224B1 (en) * | 2000-04-04 | 2004-11-16 | Promos Technologies Inc. | Method and system for increasing yield in embedded memory devices |
US7269765B1 (en) | 2000-04-13 | 2007-09-11 | Micron Technology, Inc. | Method and apparatus for storing failing part locations in a module |
US6728907B1 (en) * | 2000-04-14 | 2004-04-27 | Microsoft Corporation | System and method for self-diagnosing system crashes |
JP2002025288A (ja) * | 2000-06-30 | 2002-01-25 | Hitachi Ltd | 半導体集積回路 |
US6990607B2 (en) * | 2000-09-27 | 2006-01-24 | Seagate Technology Llc | System and method for adaptive storage and caching of a defect table |
GB2382215A (en) * | 2000-09-28 | 2003-05-21 | Seagate Technology Llc | Critical event log for a disc drive |
US6622269B1 (en) * | 2000-11-27 | 2003-09-16 | Intel Corporation | Memory fault isolation apparatus and methods |
US7124412B2 (en) * | 2000-12-13 | 2006-10-17 | Intel Corporation | Extensible BIOS error log |
US7162668B2 (en) * | 2001-04-19 | 2007-01-09 | Micron Technology, Inc. | Memory with element redundancy |
US6725336B2 (en) * | 2001-04-20 | 2004-04-20 | Sun Microsystems, Inc. | Dynamically allocated cache memory for a multi-processor unit |
US6760869B2 (en) * | 2001-06-29 | 2004-07-06 | Intel Corporation | Reporting hard disk drive failure |
DE10143680C1 (de) * | 2001-08-30 | 2003-05-08 | Leibniz Inst Fuer Festkoerper | Verfahren zur Herstellung von Metallbändern mit hochgradiger Würfeltextur |
DE10147138B4 (de) * | 2001-09-25 | 2009-01-22 | Qimonda Ag | Verfahren zur Integration von imperfekten Halbleiterspeichereinrichtungen in Datenverarbeitungsvorrichtungen |
TW567414B (en) * | 2002-01-29 | 2003-12-21 | Admtek Inc | Dynamic built-in-self-skip method for shared memory fault recovery |
JP4268367B2 (ja) * | 2002-03-18 | 2009-05-27 | 博幸 荻野 | 半導体メモリの検査および欠陥救済方法、並びに半導体メモリの検査および欠陥救済回路 |
US7035953B2 (en) | 2002-05-03 | 2006-04-25 | Hewlett-Packard Development Company, L.P. | Computer system architecture with hot pluggable main memory boards |
US6754117B2 (en) * | 2002-08-16 | 2004-06-22 | Micron Technology, Inc. | System and method for self-testing and repair of memory modules |
US20040088614A1 (en) * | 2002-11-01 | 2004-05-06 | Ting-Chin Wu | Management system for defective memory |
US6889305B2 (en) * | 2003-02-14 | 2005-05-03 | Hewlett-Packard Development Company, L.P. | Device identification using a memory profile |
US7827375B2 (en) * | 2003-04-30 | 2010-11-02 | International Business Machines Corporation | Defensive heap memory management |
US7320100B2 (en) * | 2003-05-20 | 2008-01-15 | Cray Inc. | Apparatus and method for memory with bit swapping on the fly and testing |
US7065630B1 (en) * | 2003-08-27 | 2006-06-20 | Nvidia Corporation | Dynamically creating or removing a physical-to-virtual address mapping in a memory of a peripheral device |
US7346755B2 (en) * | 2003-09-16 | 2008-03-18 | Hewlett-Packard Development, L.P. | Memory quality assurance |
US7444564B2 (en) * | 2003-11-19 | 2008-10-28 | International Business Machines Corporation | Automatic bit fail mapping for embedded memories with clock multipliers |
US7251744B1 (en) | 2004-01-21 | 2007-07-31 | Advanced Micro Devices Inc. | Memory check architecture and method for a multiprocessor computer system |
JP2005234744A (ja) | 2004-02-18 | 2005-09-02 | Nec Corp | マルチプロセッサシステム及び障害処理方法 |
US7246269B1 (en) * | 2004-05-05 | 2007-07-17 | Advanced Micro Devices, Inc. | Efficient memory check architecture and method |
US7123051B1 (en) * | 2004-06-21 | 2006-10-17 | Altera Corporation | Soft core control of dedicated memory interface hardware in a programmable logic device |
US7873776B2 (en) * | 2004-06-30 | 2011-01-18 | Oracle America, Inc. | Multiple-core processor with support for multiple virtual processors |
US7272758B2 (en) * | 2004-08-31 | 2007-09-18 | Micron Technology, Inc. | Defective memory block identification in a memory device |
US8301938B2 (en) * | 2005-03-21 | 2012-10-30 | Hewlett-Packard Development Company, L.P. | Managing memory health |
US20070061637A1 (en) * | 2005-09-12 | 2007-03-15 | Lsi Logic Corporation | Process for conducting high-speed bitmapping of memory cells during production |
US7447955B2 (en) * | 2005-11-30 | 2008-11-04 | Advantest Corporation | Test apparatus and test method |
JP2007172778A (ja) * | 2005-12-26 | 2007-07-05 | Nec Electronics Corp | メモリテスト回路及びメモリテスト方法 |
US7478285B2 (en) * | 2005-12-30 | 2009-01-13 | Silicon Graphics, Inc. | Generation and use of system level defect tables for main memory |
US8121237B2 (en) * | 2006-03-16 | 2012-02-21 | Rambus Inc. | Signaling system with adaptive timing calibration |
US20080229143A1 (en) * | 2006-09-21 | 2008-09-18 | Sony Computer Entertainment Inc. | Management of available circuits to repair defective circuits |
KR20080090664A (ko) * | 2007-04-05 | 2008-10-09 | 삼성전자주식회사 | 포스트 패키지 리페어 제어회로를 구비하는 반도체메모리장치 및 포스트 패키지 리페어 방법 |
-
2007
- 2007-08-14 US US11/838,585 patent/US7949913B2/en active Active
-
2008
- 2008-08-04 SG SG200805821-6A patent/SG150449A1/en unknown
- 2008-08-08 TW TW097130224A patent/TWI370455B/zh active
- 2008-08-13 CN CN200810210500.2A patent/CN101369247B/zh active Active
- 2008-08-14 EP EP08014502.2A patent/EP2026356B1/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8904228B2 (en) | 2011-12-07 | 2014-12-02 | Dell Products L.P. | Methods and systems for repairing memory |
Also Published As
Publication number | Publication date |
---|---|
TW200917262A (en) | 2009-04-16 |
EP2026356A3 (en) | 2009-12-02 |
CN101369247A (zh) | 2009-02-18 |
TWI370455B (en) | 2012-08-11 |
US7949913B2 (en) | 2011-05-24 |
US20090049351A1 (en) | 2009-02-19 |
EP2026356A2 (en) | 2009-02-18 |
EP2026356B1 (en) | 2016-07-20 |
CN101369247B (zh) | 2013-06-05 |
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